Patents by Examiner Neel Shah
  • Patent number: 9753063
    Abstract: An arrangement for use in a utility meter includes at least one circuit path, a three phase service switch, and a three phase monitoring unit. The at least one circuit path operably couples a source of electrical energy to a load. The service switch is operably coupled to the at least one circuit path and is configurable in an open state and a closed state. The monitoring unit is operably coupled to the at least one circuit path between the load and the service switch and is configured to detect a presence and an absence of line voltage on the load. The monitoring unit is further configured (i) to generate an open circuit signal responsive to the detection of the absence of line voltage on the load, and (ii) to generate a closed circuit signal responsive to the detection of the presence of line voltage on the load.
    Type: Grant
    Filed: December 29, 2014
    Date of Patent: September 5, 2017
    Assignee: Landis+Gyr Inc.
    Inventor: Anibal Diego Ramirez
  • Patent number: 9752999
    Abstract: This application relates to a moisture ingress sensor. In particular, this application relates to a moisture ingress sensor that can detect liquid ingress into an electronic device. The moisture ingress sensor can include a resistor, an N-channel MOSFET, an operation amplifier, comparators, and an AND logic gate. The moisture ingress sensor is configured to provide a lower power means for accurately detecting moisture in an electronic device. Multiple areas of the electronic device can include the moisture ingress sensor in order to optimize the detection of moisture for at a variety of regions of the electronic device. Additionally, the electronic device can record signals from the moisture ingress sensor and shut down components of the electronic device that could be affected by the detected moisture. Furthermore, the moisture ingress sensor can be tuned to detect one or more types of liquids.
    Type: Grant
    Filed: May 29, 2014
    Date of Patent: September 5, 2017
    Assignee: Apple Inc.
    Inventors: Kirill Kalinichev, Kevin M. Keeler, Brian C. Menzel
  • Patent number: 9744335
    Abstract: Methods and apparatuses for detecting tension on a tendon and/or mechanical deformation (e.g., breakage) of one or more steering tendon of a steerable and flexible articulating device. Theses apparatuses may have one or more tendons that are each electrically conductive and configured to steer the apparatus when tension is applied to the proximal end of the tendon. Tension and/or breakage (or other deformation) of one or more of these tendons may be detected by monitoring the electrical resistance of the tendons.
    Type: Grant
    Filed: March 30, 2016
    Date of Patent: August 29, 2017
    Assignee: Auris Surgical Robotics, Inc.
    Inventor: Allen Jiang
  • Patent number: 9739802
    Abstract: A multi-electrode conductive probe, a manufacturing method of insulating trenches and a measurement method using the multi-electrode conductive probe are disclosed. The conductive probe includes a base, a plurality of support elements, a plurality of tips and a conductive layer. The base has a surface and a plurality of protrusions. The protrusions are configured on the surface in a spacing manner, and an insulating trench is disposed between the two adjacent protrusions. The support elements are disposed at the base and protrude from the base. The tips are disposed on the end of the support elements away from the base. The conductive layer covers the surface of the base, the protrusions, the support elements and the tips. Portions of the conductive layer on the two adjacent support elements are electrically insulated from each other by at least an insulating trench.
    Type: Grant
    Filed: December 23, 2014
    Date of Patent: August 22, 2017
    Assignee: NATIONAL CHENG KUNG UNIVERSITY
    Inventors: Bernard Haochih Liu, Chun-Chieh Tien, Jui-Teng Cheng, Yu-Lun Cheng
  • Patent number: 9733281
    Abstract: A voltage sensor system for sensing voltage in a conductor, the voltage sensor system including a first plate, a first electrode disposed a first distance away from the first plate, a second plate, a second electrode disposed a second distance away from the second plate, a control unit structured to control one of the first plate and the second plate to be grounded and the other of the first plate and the second plate to be electrically floating, and a differential amplifier electrically connected to the first electrode and the second electrode and being structured to output an output voltage that is proportional to a difference in voltage between the first electrode and the second electrode.
    Type: Grant
    Filed: December 29, 2014
    Date of Patent: August 15, 2017
    Assignee: EATON CORPORATION
    Inventors: Abhijeet Vikram Kshirsagar, Mark Allan Juds, Gayatri Shashikant Dharne
  • Patent number: 9733277
    Abstract: A centralized voltage control device connected, via a communication network, to local voltage control devices connected to voltage control apparatuses, including: a transmission and reception unit receiving the number of times a tap position is changed per fixed time of the voltage control apparatus from the local voltage control device; a dead-zone-width updating unit increasing a dead zone width when the number of times a tap position is changed in a voltage control apparatus of a transformer type is a threshold or larger; and a voltage-upper-and-lower-limit-value determining unit determining the voltage upper limit value and the voltage lower limit value for each local voltage control device and issuing a command regarding these values to each local voltage control device, and determining the voltage upper limit value and the voltage lower limit value of the voltage control apparatus of a transformer type on the basis of the dead zone width.
    Type: Grant
    Filed: November 26, 2012
    Date of Patent: August 15, 2017
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventor: Nobuhiko Itaya
  • Patent number: 9709603
    Abstract: A current sensing system constituted of: an impedance element; a switching network arranged to alternately couple a first end of the impedance element between a supply voltage and return, the impedance element arranged to develop a voltage there across reflecting a current flow to a load coupled to the second end of the impedance element; a first stage amplifier, a first and second input thereof respectively coupled to the first and second end of the impedance element, a power supply input thereof coupled to a voltage greater than the supply voltage and a return thereof coupled to the first end of the impedance element, the amplifier having a first and second output, the potential difference reflecting the impedance element voltage times a first stage gain; and a second stage amplifier, a first and second input thereof respectively coupled to a first and second output of the first stage amplifier.
    Type: Grant
    Filed: March 24, 2015
    Date of Patent: July 18, 2017
    Assignee: Microsemi Corporation
    Inventor: Bruce Ferguson
  • Patent number: 9709599
    Abstract: An apparatus includes a membrane film and a plurality of needle tips with cylinder shapes. The membrane film includes a plurality of signal traces. The needle tips are disposed on the membrane film and are electrically connected to the signal traces. The needle tips are configured to probe a device-under-test (DUT).
    Type: Grant
    Filed: January 9, 2014
    Date of Patent: July 18, 2017
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventor: Ming-Cheng Hsu
  • Patent number: 9689933
    Abstract: A magnetic field sensor, comprising a suspending mass block, a group of Y direction displacement sensors, a group of Z direction displacement sensors and a power supply; wherein the mass block, the Y direction displacement sensors and the Z direction displacement sensors respectively comprise a plurality of metal layers and a dielectric layer between two metal layers. In the mass block, a region corresponding to the Y direction displacement sensors and a region corresponding to the Z direction displacement sensors respectively comprise at least two metal layers connected by a via. The Y direction displacement sensors include two electrodes, each comprising at least two metal layers connected by a via; the Z direction displacement sensor includes two electrodes, each comprising at least two metal layers connected by a via; and the power supply provides a current flowing through the mass block selectively in X or Y direction.
    Type: Grant
    Filed: March 19, 2015
    Date of Patent: June 27, 2017
    Assignee: Sagatek Co., Ltd.
    Inventors: Kuei-Ann Wen, Tai-Wei Chiang
  • Patent number: 9684030
    Abstract: Disclosed is drum-type IC burn-in and test equipment including burn-in equipment. The burn-in equipment includes therein a first working platform, a second working platform, a drum-type burn-in device, and a parts pickup device. The first working platform includes a first parts disposition section and a parts feeding device. The second working platform includes a parts transferring device. The drum-type burn-in device is rotatably mounted between the first and second working platforms and includes multiple planar sections circumferentially mounted thereto with each planar section having at least one burner mounted thereon. This arrangement allows a parts feeding device to sequentially dispose unburned ICs and a parts transferring device to sequentially pick up completely-burned ICs. As such, the drum-type burn-in device helps increase the number of ICs disposed and also helps improve the throughput and increase the manufacturing speed.
    Type: Grant
    Filed: December 26, 2014
    Date of Patent: June 20, 2017
    Inventor: An-Sung Wang
  • Patent number: 9678109
    Abstract: An apparatus and a method are disclosed herein. The apparatus is disclosed that includes a probe head and a circuit board. The probe head includes a metal housing and pins. The pins penetrate through the metal housing. The circuit board is configured to test a semiconductor device and includes a ground pad. The ground pad is electrically coupled between the metal housing and the circuit board.
    Type: Grant
    Filed: January 9, 2014
    Date of Patent: June 13, 2017
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventor: Ming-Cheng Hsu
  • Patent number: 9671735
    Abstract: Provided is a differential transformer magnetic permeability sensor that accurately suppress a variation of output level of each sensor even if a position shift occurs in forming a detection coil, a reference coil, and a drive coil as planar coils. The differential transformer magnetic permeability sensor includes a first coil layer including a first drive coil constituted of a first wire of a flat winding and a detection coil constituted of a second wire of a flat winding, a second coil layer including a second drive coil constituted of a third wire of a flat winding and a reference coil constituted of a fourth wire of a flat winding. The first drive coil and the second drive coil are connected so that drive current have the same direction, while the detection coil and the reference coil are connected so that induced current have opposite directions.
    Type: Grant
    Filed: December 18, 2015
    Date of Patent: June 6, 2017
    Assignee: KYOCERA Document Solutions Inc.
    Inventor: Yukihiro Aikawa
  • Patent number: 9664497
    Abstract: A magnetic field sensor with a magnet is disposed proximate to a ferromagnetic target object having at least one ferromagnetic surface. The magnetic field sensor is operable to sense a relative location between the magnetic field sensor and the ferromagnetic target object along a movement line. In some embodiments, the target object is also spinning about a rotation axis parallel to the movement line. A corresponding method is described.
    Type: Grant
    Filed: December 15, 2014
    Date of Patent: May 30, 2017
    Assignee: Allegro MicroSystems, LLC
    Inventors: Thomas Kerdraon, Andreas P. Friedrich, Yannick Vuillermet
  • Patent number: 9651470
    Abstract: The invention relates to a device and a method for fluidic cell guidance for flow cytometry or analyte enrichment. This allows magnetically marked analytes, in particular cells (1), to be dynamically enriched and individually detected in the flow from a sample, in particular magnetoresistively. For cell guidance, guiding ridges (12) are arranged in a flow channel (100), and so, in addition to a magnetic enrichment force (10z) and the shearing force of the flow (10y), a deflecting force (10x) caused by the fluidic obstacles (12) also acts on the cells (1) to be detected.
    Type: Grant
    Filed: July 24, 2012
    Date of Patent: May 16, 2017
    Assignee: Siemens Aktiengesellschaft
    Inventors: Oliver Hayden, Michael Johannes Helou, Sandro Francesco Tedde
  • Patent number: 9651600
    Abstract: A power up detecting system for generating one of a first power up detecting signal and a second power up detecting signal as the final power up detecting signal, according to power provided by a power supplier. The power up detecting system comprises: a power up detecting module, controlled by a control signal to generate the first power up detecting signal in a first mode and to generate the second power up detecting signal in a second mode, wherein a voltage level of the first power up detecting signal is transited when the power reaches a first predetermined voltage value, and the voltage level of the second power up detecting signal is transited when the power reaches a second predetermined voltage value; where the first predetermined voltage value is higher than the second predetermined voltage value.
    Type: Grant
    Filed: November 25, 2015
    Date of Patent: May 16, 2017
    Assignee: NANYA TECHNOLOGY CORP.
    Inventor: Wayne A. Batt
  • Patent number: 9638763
    Abstract: A resonant impedance sensing system includes a negative impedance control loop incorporating the resonator as a loop filter, and including a class D negative impedance stage implemented with a class D comparator, and a loop control stage implemented with an output comparator clocked (D_clk) by the class D comparator. The class D comparator receives resonator oscillation voltage, and generates a class D switching output synchronized with resonator oscillation frequency. A discrete current source (such as a current DAC) drives the resonator through an H-bridge switched by the class D switching output, so that the time average of the discrete drive current corresponds to resonator oscillation amplitude.
    Type: Grant
    Filed: December 30, 2014
    Date of Patent: May 2, 2017
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventor: George P. Reitsma
  • Patent number: 9634558
    Abstract: The present invention discloses a negative charge pump feedback circuit, wherein the feedback circuit is connected between an AND gate and the output terminal of the negative charge pump, and a clock signal is connected to the negative charge pump through the AND gate and under the control of the feedback signal, with the feedback circuit including a switch-capacitor circuit and a comparator; a first terminal of a first capacitor of the switch-capacitor circuit is connected to the output terminal of the negative charge pump through a first switch, and grounded through a second switch; a first terminal of a second capacitor is connected to a second terminal of the first capacitor, grounded though a third switch, and connected to the comparator though a fourth switch; an adjustable capacitor is connected in parallel to both terminals of the second capacitor; a positive-phase input terminal of the comparator is connected to a reference voltage.
    Type: Grant
    Filed: December 21, 2014
    Date of Patent: April 25, 2017
    Assignee: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING CORPORATION
    Inventor: Guoyou Feng
  • Patent number: 9632453
    Abstract: A differential transformer magnetic permeability sensor includes a substrate, a drive coil, a first differential coil, a second differential coil, a first interconnection pattern, and a second interconnection pattern. The first differential coil is disposed at a side of a first surface of the substrate, and an induced voltage is generated therein when the drive coil is driven. The second differential coil is disposed at a side of a second surface of the substrate, and an induced voltage is generated therein when the drive coil is driven. The first interconnection pattern is located on the first surface and allows the first differential coil to serve as a reference coil, and the second differential coil as a sensing coil. The second interconnection pattern is located on the second surface and allows the second differential coil to serve as a reference coil, and the first differential coil as a sensing coil.
    Type: Grant
    Filed: March 26, 2015
    Date of Patent: April 25, 2017
    Assignee: KYOCERA Document Solutions Inc.
    Inventor: Yukihiro Aikawa
  • Patent number: 9618554
    Abstract: A system and method for performing radiation source analysis on a device under test (DUT) uses discrete Fourier transform on measured field components values at different sampling locations away from the DUT to derive field component values at locations on the DUT. The results of the discrete Fourier transform are multiplied by a complex phase adjustment term as a function of distance from the sampling locations to the DUT to translate the measured field component values back to the locations on the surface of the DUT.
    Type: Grant
    Filed: December 24, 2014
    Date of Patent: April 11, 2017
    Assignee: Amber Precision Instruments, Inc.
    Inventor: Hamed Kajbaf
  • Patent number: 9618568
    Abstract: A method of testing a semiconductor device using the test equipment includes loading an undivided printed circuit board (PCB) including unit PCBs in a test equipment. A semiconductor device is mounted in each of the unit PCBs. Product information of the undivided PCB loaded in the test equipment is confirmed. The undivided PCB whose product information has been confirmed is electrically connected to one of a plurality of main testers of the test equipment. Each of the main testers includes a main test interface directly connected to a cloud server in which firmwares for various kinds of tests are stored. The product information of the undivided PCB is transmitted to the main tester electrically connected to the undivided PCB. The main tester to which the product information has been transmitted performs a main test of the undivided PCB using the product information. The undivided PCB on which the main test has been performed by the main tester is unloaded from the test equipment.
    Type: Grant
    Filed: November 12, 2013
    Date of Patent: April 11, 2017
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Young-Chul Lee, Nam-Hong Lee, Kyung-Sook Lee, Jung-Hyun Park, Sang-Youl Lee