Abstract: The present disclosure relates to a system for detecting and analyzing droplets of feedstock material being ejected from an additive manufacturing device. The system makes use of a split ring resonator (SRR) probe including a ring element having a gap, with the gap being positioned adjacent a path of travel of the droplets of feedstock material. An excitation signal source is used for supplying an excitation signal to the SRR probe. An analyzer analyzes signals generated by the SRR probe in response to perturbations in an electric field generated by the SRR probe as the droplets of feedstock material pass the ring element. The signals are indicative of dimensions of the droplets of feedstock material.

Abstract: An electrical property testing device of an evaluation board includes a main circuit board, a voltage detecting unit, a storing unit, a processing unit and an adapter board. The voltage detecting unit is configured to detect a plurality of voltage values of the signal pads. The storing unit stores a plurality of standard voltage values corresponding to the signal pads. The processing unit is electrically connected to the voltage detecting unit and the storing unit. The processing unit receives the voltage values and determines whether the voltage values match the standard voltage values to generate a determining result. The adapter board includes a plurality of conductive pads. The conductive pads are correspondingly connected to the signal pads of the evaluation board. The voltage detecting unit detects the voltage values of the signal pads of the evaluation board via the conductive pads.

Abstract: The present disclosure relates to a battery probe set configured to plug into a battery tester and impinge upon one or more terminals of a battery. The battery probe set includes first and second probe assemblies, each including a housing with gripping portions and conductive ports, probe stems of varying lengths that attach to the housing, and probe tips that couple to the probe stems. The housing, probe stem, and probe tips are electrically coupled via conductive paths. The first and second probe assemblies are electrically coupled via a transverse connector, permitting the location of probe plugs onto one of the probe assemblies that is configured to be pluggable into the battery tester. The probe tips are interchangeable and include a light source.

Abstract: A direct current (DC) power rail probe includes a single-ended probe tip, and a two-path circuit having an input coupled to the single-ended probe tip and an output configured for connection to measurement equipment such as an oscilloscope. The two-path circuit includes an alternating current (AC) path in parallel with a feed-forward (FF) path, the AC path including a capacitive element, and the FF path including a series connection of at least one resistive element and an amplifier. The probe tip and two-path circuit are selectively operable in a non-attenuating mode and an attenuating mode.

Abstract: An electrical apparatus that includes: an electronic substrate having a plurality of pads for connecting to an electronic component placed on the electronic substrate; a shield placed on a surface of the electronic substrate, the shield having a plurality of openings with the plurality of openings aligned over the plurality of pads and at least a portion of each of the plurality of openings being conductive; connection means to connect the conductive portions of each of the plurality of openings to a fault detect and error handling circuit; and the fault detect and error handling circuit to detect a short circuit between at least one of the conductive portions and the pad aligned with the opening containing the at least one of the conductive portions.

Abstract: A buried perimeter loop wire break detector with a base unit and probe unit. The base unit injects different frequencies into the two ends of the loop wire and the probe unit detects the frequencies at a test location along the wire. If a signal is not detected, that indicates the direction toward the break. By halving the distance along the wire toward the break and retesting, the location is quickly determined. Both frequencies and amplitude are measured, sometimes with amplification, both earth and wired grounds may be employed, and a micro-ohmmeter measures resistance of the loop wire to indicate satisfactory operation.

Abstract: The disclosure includes a contact device for electrical test, the contact device for electrical test including a second body portion, a first body portion stacked above the second body portion, a middle portion stacked above the first body portion, and having a first protrusion that is sharp and has a first apex portion, the first protrusion being formed on an upper side of the middle portion, and the first body portion, the middle portion, and the contact portion are sequentially and upwardly stacked, the middle portion and the contact portion include materials different from each other, and a first protrusion is provided inside the second protrusion.

Abstract: A board connector used in a printed circuit board assembly and includes a shell, a pin and an elastic member. The shell has a chamber therein and a hole on a surface thereof. The pin is configured to accommodate in the chamber, wherein at least one part of the pin protrudes out of the shell via the hole. The elastic member is configured to locate in the chamber. The pin is located between the surface of the shell and the elastic member.

Abstract: A flexible electric probe can include: a flexible substrate; and probe line conductors on the flexible substrate, the probe line conductors being essentially parallel to each other and having separations of about 5-50 microns. The flexible electric probe can further include connection conductors on the flexible substrate, the connection conductors and the probe line conductors electrically connected to each other, the probe line conductors positioned in first and second offset patterns with regard to the connection conductors.

Abstract: The invention relates to a sliding test device for electronic components, which mainly comprises a base, a sliding frame and a pressing member, wherein an electronic component to be tested is placed in a chip receiving module of the base, and the sliding frame is slidably moved with respect to the base under sliding engagement between a first sliding guide and a second sliding guide so that a pressing block of the pressing member is aligned with the electronic component presses the electronic component. According to the present invention, the pressing member presses the electronic component and exerts a sufficient contact force on the electronic component, and a reaction force caused by the contact force and the elastic restoring force of probes is internally balanced in the device.

Abstract: An oscilloscope probe includes: a connector pod; a probe identification module disposed in the connector pod, the probe identification module having a cross-sectional area; and a resistor disposed in the connector pod, and in-line with the probe identification module and having a substantially identical cross-sectional area as the probe identification module.

Abstract: The invention is a contacting device suitable for measurements and/or other contact tests, the device comprising a head unit comprising a plunger (14) having a broadened portion (28) at its first end, and a head element (16) being on a second end of the plunger (14); a tube element (10) having a third end and a fourth end opposite the third end, receiving the broadened portion (28) of the plunger (14) at the third end, and keeping the broadened portion (28) in its inner space by means of an inward-projecting flange portion (18) arranged at the third end; and a resilient element (20) being arranged in the inner space of the tube element (10) being supported against the end portion of the broadened portion (28) and against the closed fourth end of the tube element (10). The second end of the plunger (14) projects out from the tube element (10) in case the broadened portion (28) is abutted against the flange portion (18).

Abstract: Embodiments of a connecting element for connecting a first electrical assembly to a second electrical assembly may comprise a rigid, tubular outer housing made of an electrically conductive material and an electrical cable running inside the outer housing along a longitudinal axis of the outer housing. The electrical cable may include at least one inner conductor and a dielectric layer surrounding the at least one inner conductor. At least one segment of the outer housing may be reshaped along the longitudinal axis in such a way as to fix the electrical cable inside the outer housing.

Abstract: An inductive current transformer for transforming a primary current into a secondary current, has a secondary winding with two terminals, an electronic device for transmitting information to an external measuring device, a first inductive coupling device connected to the secondary winding, and a power supply device which is coupled to the secondary winding via the first inductive coupling device and which is adapted to generate a supply voltage for the electronic device from the secondary electric current of the secondary winding.

Abstract: This electrical connection socket for relaying exchange of electrical signals between a first electrical component and a second electrical component, is provided with: a metallic casing which has a communication hole for communication between the upper surface and lower surface of the metallic casing, to the lower surface side of which the first electrical component is attached, and to the upper surface of which the second electrical component is attached; a signal pin which is disposed in the communication hole so as to be separated from the inner wall surface of the communication hole, one end of which is electrically connected to a terminal of the first electrical component, and the other end of which is electrically connected to a terminal of the second electrical component; an annular first holding member which is, in the upper region of the communication hole, press-fitted in the communication hole; and an annular second holding member which is, in the lower region of the communication hole, press-fitte

Abstract: A probe pin includes a coil spring extending and contracting along a center line, a first contact disposed on one side of the center line and having a rectangular cross section, and a second contact disposed on the other side of the center line and having a rectangular cross section. The first contact and the second contact are supported so as to be reciprocable via the spring coil and are electrically connected to each other. In particular, a contact surface of at least one of the first contact and the second contact is an inclined surface inclined so as to descend along a thickness direction.

Abstract: An electric connection socket for relaying electric signals between a circuit substrate and an electric component includes: a metal housing which has a through hole enabling communication between the top surface and the bottom surface thereof, and on the top surface of which the electric component is mounted and on the bottom surface of which the circuit substrate is mounted; and a signal pin inserted into the through hole to configure a coaxial line between the inner wall surfaces of the through hole, and which is electrically connected at one end to a signal path pad electrode of the circuit substrate and is electrically connected at the other end to a signal path terminal of the electric component. The metal housing is arranged on the circuit substrate such that an air gap is formed between the bottom surface of the metal housing and the top surface of the circuit substrate.

Abstract: A quasi-isotropic antenna includes: a feeder; a loop antenna configured to radiate a first radio wave based on a feeding from the feeder; and a dipole antenna adjacent to the loop antenna, and configured to radiate a second radio wave by resonating based on a resonant-coupling with the loop antenna, wherein a radiation pattern of the first radio wave is orthogonal to a radiation pattern of the second radio wave.

Abstract: Systems for interfacing a printed circuit board assembly (PCBA) adapter module to a receiver housing are provided. The receiver housing may have a first interface mounted on the receiver housing via a first mount and the PCBA adapter module may have a second interface mounted on the adapter module via a second mount. One of the interfaces has a protruding feature that aligns the interfaces when matingly engaged, while the other interface has a centering hole opposite the protruding feature. The first centering hole is enlarged with respect to an axis of an insertion-angle plane such that the protruding feature substantially clears the centering hole without causing either interface to exceed a limit of free-play between that interface and its respective mount.

Abstract: Novel techniques are described for discharging high voltage components. For example, a tool is provided to discharge high-voltage capacitors in electrical appliances prior to servicing those appliances. The tool can include a handle structure electrically and physically isolated from a head structure by an elongated body. The elongated body can house at least a portion of a discharge circuit configured to discharge high-voltage components and to indicate (visually, audibly, etc.) whether voltage is present on components being discharged. The head structure can include multiple probes adapted to electrically couple the tool with the high-voltage components and through which to discharge the components.

Abstract: Machine with flying probes for testing electronic boards comprising a conveyor for loading/unloading the boards into/from the testing station, a plurality of flying probes suitable to interact with predetermined points of each board and a plurality of contacting devices arranged at the sides of the working volume of the flying probes and suitable to cooperate with contact areas arranged on one edge of the board.

Abstract: A monitoring system includes a surgical implant configured for implantation in vivo and having at least one sensing fiber configured to measure a preselected physiological parameter, and a receiving unit in wireless communication with the at least one sensing fiber and configured to receive measurements of the preselected physiological parameter. A surgical system includes an end effector having a plurality of fasteners, and a surgical implant securable to tissue via the plurality of fasteners. The surgical implant includes at least one sensing fiber configured to measure a preselected physiological parameter.

Abstract: A probing device includes a chuck configured to support a device under test (DUT), and includes a probe card disposed above the chuck. The probe card includes an inlet configured to convey a gas into the probe card, and an outlet configured to blow the gas at a predetermined temperature from the probe card toward the chuck. A method includes providing a chuck, a DUT disposed on the chuck and a probe card disposed above the DUT, and blowing a gas at a predetermined temperature from the probe card toward the DUT.

Abstract: Methods for forming single crystal silicon ingots in which plural sample rods are grown from the melt are disclosed. A parameter related to the impurity concentration of the melt or ingot is measured. In some embodiments, the sample rods each have a diameter less than the diameter of the product ingot.

Abstract: A system for testing an integrated-circuit wafer, the system including a probe card having a probe needle and a probe body enclosing a pressure chamber. The probe body includes a unitary sidewall, a first end cap substantially closing a first end of the probe body, except for an outlet passage in the first end cap, and an inlet passage configured to introduce compressed gas into the pressure chamber. The probe needle is within the pressure chamber and is supported by the probe body. A free end of the probe needle extends through the outlet passage. The ends of the probe needle are separated by a first bend in the probe needle, which has a center of curvature that is located between the probe needle and a longitudinal centerline of the unitary sidewall. Methods of using a probe card are also disclosed.

Abstract: The present invention is intended to provide a vertical probe and a jig which has sufficient flexibility for contact reaction force from the electrical contact to be inspected, easy insertion and assembly of the probe even with narrow pitch, and enables cost reduction and delivery time reduction, wherein means for driving and positioning relative positions of upper and lower hole plates is provided, the straight pins as materials of vertical probes are inserted into the upper and lower hole plates, plastic deformation is applied to the straight pin by driving and positioning the relative position of the upper and lower hole plates, a symmetrical arched shape is provided, and a bending point is formed in the vicinity of the lower side of the upper hole plate and in the vicinity of the upper side of the lower hole plate.

Abstract: A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.

Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.

Abstract: A method for producing a modularly configurable plug comprises inserting a cable insulator in a pre-shaped outer cable contact, positioning an inner cable contact of a cable in the cable insulator, and bending the pre-shaped outer cable contact to form a cable section. The cable section is adapted to a diameter of the cable and a diameter of the inner cable contact. The method further comprises positioning an inner interface contact in an interface insulator and inserting the interface insulator in an outer interface contact to form an interface section. The interface section is connected to the cable section. The interface section has one of a plurality of different lengths or one of a plurality of different shapes interchangeably connected to the cable section.

Abstract: A laser treatment unit for performing eye surgery, including a contact glass which can be placed onto the eye and through which a treatment laser beam (2) passes. A safety mechanism displaceably holds the contact glass such that the contact glass retreats when the contact glass is subjected to the action of a force contrary to the direction of incidence of the laser beam. The safety mechanism enables this retreating when a force is greater than a force limit value (Fmin) and holds the contact glass in a fixed manner when the force is less than the force limit value.

Abstract: A novel coupling system may include a head-end circuit for coupling a probe via a cable to an instrument, delivering power to the probe over the cable while the cable carries signal(s) from the probe to the instrument. The head-end circuit may include a first terminal for coupling to the probe via a cable, and may further include a second terminal for coupling to the instrument. The head-end circuit may apply direct-current (DC) power to the cable, and may remove a DC voltage offset resulting from the applied DC power before a signal from the probe reaches the instrument. The head-end circuit may include a common node coupled to the first terminal, a current source coupling the common node to a supply voltage, and a voltage source coupling the common node to a second terminal that couples to the instrument.

Abstract: An inspection jig may include: an electrode; a probe, the probe having a rear end portion and a tip portion to contact a bump; and a support member supporting the probe. The probe may include: an outer tubular body that is electrically conductive; and an inner tubular body that is electrically conductive, the inner tubular body being inserted into the outer tubular body. The outer tubular body may include outer spring parts to bias the rear end portion. The inner tubular body may include inner spring parts. The tip portion may be a first end of the inner tubular body, and protrudes from a first end of the outer tubular body. The support member may hold the outer tubular body such that the rear end portion is brought into contact with the electrode by the biasing force of the outer spring parts.

Abstract: An inspection system includes a plurality of prober units each configured to bring probes of a probe card into contact with devices formed on a substrate on a stage, and a tester configured to apply electrical signals to the devices on the substrate through the probe card to inspect electrical characteristics of the devices. The plurality of prober units are arranged such that a plurality of units each of which has the prober units stacked in multiple stages are arranged in multiple rows in a horizontal direction, and at least one test unit constituting a main part of the tester is arranged to a side of a predetermined prober unit among the plurality of prober units.

Abstract: A circuit board testing device electrically coupled to a measurement gauge tests a circuit board. The circuit board testing device includes a processor configured to configure measurement parameters of the measurement gauge, configure measurement rules for testing the circuit board, confirm a circuit of the circuit board to be tested according to the record of test data, control the measurement gauge to test the circuit of the circuit board to be tested when the measurement gauge is electrically coupled to the circuit of the circuit board to be tested, receive measurement data returned by the measurement gauge, and analyze a faulty region of the circuit board according to the record of test data and the measurement data.

Abstract: A current measuring module for measuring a current flowing through the substrate holder using an inspection substrate is provided. The substrate holder includes a plurality of holder electric contacts. The plurality of holder electric contacts contact a substrate to supply the held substrate with a current. The substrate holder holds the inspection substrate for measuring the current flowing through the substrate holder. The plurality of holder electric contacts contact a plurality of respective independent substrate electric contacts disposed on the inspection substrate. The inspection substrate includes a plurality of measurement points connected to the plurality of respective substrate electric contacts with wirings and substrate side connectors electrically connected to the plurality of measurement points. The current measuring module includes a plurality of inspection probes configured to contact the plurality of respective measurement points on the inspection substrate.

Abstract: An apparatus is provided for generating a transmission wave. The apparatus includes a plurality of antennas and a plurality of signal generators. The plurality of antennas has polarization diversity. The plurality of signal generators are each coupled to one of the antennas and configured to generate a continuous twisted wave by driving each of the antennas using independent, coordinated, and distinct sinusoidal waves, and having a twist frequency and a carrier frequency, the twist frequency lower than the carrier frequency. A method is also provided.

Abstract: An electrical contact and an electric component socket configured to be electrically connected to an electric component, wherein the electrical contact is capable of preventing a defect that a contacting portion of the electrical contact bites into a terminal of the electric component, leaving an indentation or giving rise to a state where burrs are liable to occur. An electrical contact has a contacting portion that comes in contact with a terminal of an electric component, the contacting portion includes a plurality of convex portions provided around a center in a tip portion of the contacting portion, the convex portions have flat portions on an outer circumferential side, and peak-shaped portions extending from the flat portions toward the center to come in contact with the terminal, and the contacting portion includes valley-shaped portions, each valley-shaped portion being formed between the respective convex portions in the plurality of convex portions.

Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.

Abstract: An electrical connection device includes: a probe head (20) including a guide hole (200), in which a shape perpendicular to an extending direction of the guide hole (200) is a shape formed by round-chamfering corner portions of a polygonal shape; and a probe (10) held by the probe head (20) in a state of penetrating the guide hole (200), wherein notches which go along an axial direction of the probe (10) are formed on angle regions of the probe (10), the angle regions facing the corner portions (200C) of the guide hole (200).

Abstract: Example methods and apparatus to correct remote sensor signals are disclosed. An example apparatus includes a sensor to generate a signal and a first memory to store calibration data associated with the sensor. The example apparatus also includes a second memory to store the calibration data and a first processor proximate to the sensor and the first memory to retrieve the calibration data from the first memory. In addition, the example apparatus includes a second processor, proximate to the second memory and remotely situated relative to the first processor. The second processor is to receive the signal from the sensor, receive the calibration data from first processor, and correct the signal based on the calibration data.

Abstract: A method for electrostatic discharge (ESD) testing and analysis includes performing, by an ESD testing device, ESD testing on pins of an integrated circuit (IC) device to generate pre-stress ESD test data for each of the pins and post-stress ESD test data for each of the pins, determining, current shifts according to first data points of voltage-current (IV) curves of the pre-stress ESD test data corresponding to the IC device pins and to second data points of IV curves of the post-stress ESD test data corresponding to the respective pins of the IC device, assigning, by the device, a test result classification for each of the pins according to a relationship between a test threshold and the current shift for the respective pin, and displaying, by a workstation, a visually coded map of the IC device indicating the test result classification for each of the pins.

Abstract: A continuity testing and cleaning fixture includes a continuity test area disposed on a portion of a first surface of the fixture, wherein the continuity test area comprises an upper region comprising at least 99.99 wt % tungsten. The continuity testing and cleaning fixture may be used in a method involving contacting at least two conductive elements of a probe card with a continuity test area of a continuity testing and cleaning fixture, wherein the continuity test area comprises an upper region comprising at least 99.99 wt % tungsten; determining an electrical resistance between the at least two conductive elements; and cleaning the at least two conductive elements with at least one cleaning zone of the continuity testing and cleaning fixture in response to determining the electrical resistance to be above a first threshold.

Abstract: A coaxial electrical interconnect is disclosed. The coaxial electrical interconnect can include an inner conductor including an electrically conductive spring probe. The coaxial electrical interconnect can also include an outer conductor including a plurality of electrically conductive spring probes disposed about the inner conductor. Each spring probe can have a barrel and a plunger biased out of the barrel. The plunger can have a first plunger portion external to the barrel and a second plunger portion disposed partially in the barrel. The first and second plunger portions can have different diameters. A barrel of the spring probe of the inner conductor can be located proximate a plunger of at least one of the spring probes of the outer conductor.

Abstract: An abnormal state latch unit comprises: an detection circuit that masks an abnormality position signal; a timer circuit that starts motion when the abnormality position signal indicates the occurrence of an abnormality based on the abnormality position signal, and completes the motion and outputs a reset signal after passage of a predetermined period; and a latch circuit that latches the abnormality position signal output from the detection circuit when the reset signal is output. The detection circuit masks the abnormality position signal when the latch circuit makes latching motion to disable an output from the detection circuit. The timer circuit masks an input to the timer circuit when the latch circuit makes the latching motion to maintain a state indicating completion of the motion. Abnormality voltage signals generated by an signal generation circuit are wired-OR connected and supplied through a single signal line to a monitor circuit.

Abstract: A contact terminal may include an outer tubular body being tubular and conductive and an inner tubular body being tubular and conductive, that is inserted into a cylinder of the outer tubular body. An outer first spring part that is elastic in an axial direction of the outer tubular body and whose winding direction is a first direction to be formed into a helical shape, may be formed on the outer tubular body. An inner first spring part that is elastic in an axial direction of the inner tubular body and whose winding direction is a second direction that is opposite to the first direction to be formed into a helical shape, may be formed on the inner tubular body.

Abstract: A contact terminal may include a tubular body made of an electrically conductive material; and stick-shaped first and second central conductors made of an electrically conductive material. The first and second central conductors may include first and second stick-shaped bodies, first and second clasped portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies, and first and second swell portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies. The first and second central conductors are arranged to have a distal end portion of the first and second swell portions inserted into a joining portion of the tubular body, and to have a distal end surface of the first swell portion and a distal end surface of the second swell portion opposite each other with a gap therebetween.

Abstract: A voltmeter probe has a metal probe tip projecting from an elongated insulating handle. The handle has a longitudinal axis and a radially projecting finger guard with an inner diameter and an outer diameter. A barrier covers the terminal. The barrier has an aperture configured to provide access for the probe tip to be inserted through the barrier into contact with the terminal, including access for the finger guard to be inserted through the barrier. The aperture has dimensions of length and width, including no width that is not less than the outer diameter of the finger guard.

Abstract: Apparatuses and methods for passively monitoring the integrity of current sensing devices and associated circuitry in protective devices such as Ground Fault Circuit Interrupters and Arc Fault Circuit Interrupters are provided. A protection circuit interrupter employs a capacitively coupled noise signal obtained by an arrangement of one or both of the line side arms relative to a Rogowski coil. The noise signal is monitored while the line and load sides of a protective circuit interrupter are disconnected, and the connection of the line and load sides disabled if the noise signal fails to correlate sufficiently to a reference noise cycle. When the line and load sides are connected, the RMS value of the observed current signal is monitored such that the line and load sides are disconnected if the observed current signal fails to meet an RMS threshold.

Abstract: A power supply unit including a slide rail that has an opening at an upper side a slider that slides along the slide rail, a first connector that is fixed to one end portion of the slide rail, a second connector that is fixed to the slider, and a flexible cable that is housed inside the slide rail, that has one end connected to the first connector, and that has another end folded back and connected to the second connector.

Abstract: A wafer testing system and associated methods of use and manufacture are disclosed herein. In one embodiment, the wafer test system includes an interposer having a first surface and a second surface facing away from the first surface. The system also includes a wafer translator having a first side facing the second surface of the interposer and a second side facing away from the first side and toward a wafer, the first side carrying a plurality of first terminals at a first scale and the second side carrying a plurality of second terminals at a second scale. The first scale is greater than the second scale.