With Calibration Device Or Gauge For Nuclear Reactor Element Patents (Class 33/502)
  • Patent number: 11673256
    Abstract: A coordinate positioning machine that includes: a structure moveable within a working volume of the machine, a hexapod metrology arrangement for measuring the position of the structure within the working volume, and a non-hexapod drive arrangement for moving the structure around the working volume. Also, a coordinate positioning machine including a structure moveable within a working volume of the machine, a drive arrangement for moving the structure around the working volume in fewer than six degrees of freedom, and a metrology arrangement for measuring the position of the structure within the working volume in more degrees of freedom than the drive arrangement.
    Type: Grant
    Filed: March 8, 2021
    Date of Patent: June 13, 2023
    Assignee: RENISHAW PLC
    Inventor: Stephen Mark Angood
  • Patent number: 11554382
    Abstract: An apparatus and method for locating a position of a coating applicator in a coating process for applying coating material to an article. At least one positioning member is attached to a spray applicator at one end and carries a marker at an opposite end capable of depositing a visible track on a markable surface removably attached to the surface of the article to be coated. The positioning member provide a resilient biasing force on the marker to maintain the marker in contact with the surface of the article despite surface topography changes as the article and the marker move relative to each other. The visible track(s) define a centerline or the overall spray pattern of the spray applicator.
    Type: Grant
    Filed: July 14, 2022
    Date of Patent: January 17, 2023
    Inventor: Alexander I. Jittu
  • Patent number: 11484980
    Abstract: The instant-mount aspect of the present invention allows a user to rapidly accurately dismount a mounted CNC calibration device from a CNC work table, and rapidly replace the CNC calibration device to its previously mounted position within 0.0001, in seconds. The alignment aspect of the present invention allows faster and more robust high-accuracy alignment of a CNC calibration device once it is mounted on a CNC work table. The remote nest aspect of the present invention allows rapid re-positioning of a CNC calibration device within a CNC milling machine cabinet in a way that does not disrupt the data connection between the CNC control computer and the CNC calibration device, and allows for utilization of more of the worktable surface during milling operations.
    Type: Grant
    Filed: April 22, 2021
    Date of Patent: November 1, 2022
    Inventor: David Anderson
  • Patent number: 11478939
    Abstract: A position verification sensor produces a discrete output for determining an accuracy of mutual mechanical positioning with a key and includes: a substratum; a housing; a receiver pad that: receives contact with the key; produces a target output in contact with the key; and produces a null output in absence of contact with the key; an aperture cap having: a cap surface; and the keyway aperture that selectively communicates the key; and a compliant member that: rests in a primary position in an absence of the key disposed on the cap surface; receives the depression force from the aperture cap; reciprocatively depresses, from the primary position to a depressed position, in response to receiving the depression force and being pushed by the depression force from the key; and reciprocatively returns, from the depressed position to the primary position, when the key is removed from contact with the aperture cap.
    Type: Grant
    Filed: September 17, 2019
    Date of Patent: October 25, 2022
    Assignee: GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
    Inventors: Alexander Scott Klinger, Brian Adam Weiss
  • Patent number: 11421976
    Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.
    Type: Grant
    Filed: June 3, 2021
    Date of Patent: August 23, 2022
    Assignee: HITACHI, LTD.
    Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno
  • Patent number: 11391566
    Abstract: A rotary table for a coordinate measuring apparatus for receiving and mounting a workpiece to be measured is provided. The rotary table has a rotatable main rotary table body and a clamping chuck, which is arranged on the rotatable main rotary table body and which has a clamping chuck receptacle for receiving the workpiece to be measured, the rotary table also having at least one master, which is arranged outside the clamping chuck receptacle, and/or at least one fastener for a master, which is provided in addition to the clamping chuck receptacle. In addition, a coordinate measuring apparatus with a corresponding rotary table is provided.
    Type: Grant
    Filed: September 29, 2017
    Date of Patent: July 19, 2022
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Rainer Sagemueller, Christian Bayer
  • Patent number: 11320457
    Abstract: The invention is directed at a method of performing scanning probe microscopy on a substrate surface using a scanning probe microscopy system. A probe tip and substrate surface are moved relative to each other in one or more directions parallel to the scanning plane to position the probe tip to a scanning position on the substrate surface with the probe tip; a displacement is measured by an encoder of said probe tip in said one or more directions; and a fiducial pattern is provided fixed relative to the substrate surface, said fiducial pattern having a scannable structure that is scannable by said probe tip and said structure forming a grid of fiducial marks in said one or more dimensions; said grid dimensioned to allow for measuring placement deviations of the probe tip relative to the probe head by identifying one or more fiducial marks in the fiducial pattern.
    Type: Grant
    Filed: July 24, 2019
    Date of Patent: May 3, 2022
    Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
    Inventors: Roelof Willem Herfst, Anton Adriaan Bijnagte, Jan Jacobus Benjamin Biemond, Klara Maturova
  • Patent number: 11293745
    Abstract: In an inspection master, an upper-surface oblique reference portion opened obliquely upward is provided on an upper surface of a master main body including the upper surface and a peripheral surface. In an inspection master, a peripheral-surface oblique reference portion opened obliquely upward is provided on a peripheral surface of a master main body including an upper surface and the peripheral surface. In either of those cases, an upper-surface vertical reference portion opened vertically can be provided on the upper surface, and a peripheral-surface lateral reference portion opened laterally can be provided on the peripheral surface. Further, a reference ball for use in obtaining an inclination angle of the master main body inclined during accuracy inspection for a five-axis processing machine is provided at a center portion of the upper surface.
    Type: Grant
    Filed: June 20, 2019
    Date of Patent: April 5, 2022
    Assignee: ASANUMA GIKEN CO., LTD.
    Inventor: Susumu Asanuma
  • Patent number: 11280646
    Abstract: A system generating an electrical signal based on at least one physical quantity, includes sensor units each generating an individual electrical signal in response to the at least one physical quantity, a selecting unit selecting a first number of sensor units from the sensor units and outputting a first combined electrical signal based on the first number of sensor units, and a calibrating unit determining a second number of sensor units to be selected based on the first combined electrical signal.
    Type: Grant
    Filed: February 27, 2019
    Date of Patent: March 22, 2022
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Ge Shen, Jun Zhang, Songhua Hu
  • Patent number: 11248898
    Abstract: A measurement apparatus includes a horizontal plate. The horizontal plate includes a first plate end, a second plate end disposed away from the first plate end in a longitudinal direction, a first plate surface extending between the first plate end and the second plate end, and a second plate surface extending between the first plate end and the second plate end. The second plate surface is disposed away from the first plate surface in a normal direction. A first support member extends from the first plate end longitudinally toward the second plate end and protrudes in a direction normally away from the second plate surface. A second support member extends from the first plate end longitudinally toward the second plate end and protrudes in a direction normally away from the second plate surface. A measurement bar contacts the first support member and the second support member.
    Type: Grant
    Filed: August 23, 2019
    Date of Patent: February 15, 2022
    Assignee: RJ Reynolds Tobacco Company
    Inventors: Van L. Gough, Edmond S. Smith
  • Patent number: 11231273
    Abstract: A system and method of calibrating a measuring instrument is provided. The system includes a support system for quickly and easily securing a low thermal expansion length reference bar in position. The reference bar is coupled to the support beam using a kinematic mounting system that is designed to reduce or eliminate errors associated with over-constraining the reference bar. The system is optimized for field calibration of certain measuring instruments, such as measuring instruments having articulating arms. Opposed first and second ends of the reference bar include respective first and second retroflectors and/or first and second probe receivers at known distances relative to each other, thereby facilitating calibration of the measuring instrument.
    Type: Grant
    Filed: July 22, 2020
    Date of Patent: January 25, 2022
    Assignee: BRUNSON INSTRUMENT COMPANY
    Inventor: Mark J. Meuret
  • Patent number: 11118891
    Abstract: The present disclosure is intended to provide an automatic three-dimensional measurement-based inspection system for workpieces which enables three-dimensional measurement-based inspection to be performed more efficiently. An automatic three-dimensional measurement-based inspection system for workpieces includes: an automated warehouse having a measurement target repository for storing a workpiece to undergo measurement-based inspection performed by a three-dimensional measurement apparatus, and having a measurement-purpose repository for storing the workpiece conveyed from the measurement target repository by a stacker crane when the three-dimensional measurement apparatus is going to perform the measurement; and the three-dimensional measurement apparatus provided is a three-dimensional measurement region that is adjacent to the measurement-purpose repository.
    Type: Grant
    Filed: January 15, 2020
    Date of Patent: September 14, 2021
    Assignee: FANUC CORPORATION
    Inventors: Noboru Kurokami, Yuuya Miyahara, Yasushi Okajima
  • Patent number: 11085793
    Abstract: A an inertial measurement unit determines performance degradation of a linear axis and includes: an accelerometer that, when disposed on a motion member of the linear axis including the motion member and a base member: measures acceleration of the motion member; and provides a displacement of the motion member in response to movement of the motion member; and a rate gyroscope that: measures an angular rate of movement of the motion member; and provides a yield angle for the motion member in response to movement of the motion member, wherein the displacement and yield angle determine performance degradation of the linear axis based on an error in linear movement of the motion member along the base member.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: August 10, 2021
    Assignee: GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
    Inventor: Gregory Vogl
  • Patent number: 11027382
    Abstract: The instant-mount aspect of the present invention allows a user to rapidly accurately dismount a mounted CNC calibration device from a CNC work table, and rapidly replace the CNC calibration device to its previously mounted position within 0.0001, in seconds. The alignment aspect of the present invention allows faster and more robust high-accuracy alignment of a CNC calibration device once it is mounted on a CNC work table. The remote nest aspect of the present invention allows rapid re-positioning of a CNC calibration device within a CNC milling machine cabinet in a way that does not disrupt the data connection between the CNC control computer and the CNC calibration device, and allows for utilization of more of the worktable surface during milling operations.
    Type: Grant
    Filed: November 12, 2018
    Date of Patent: June 8, 2021
    Inventor: David Anderson
  • Patent number: 10962347
    Abstract: A measuring system (15) includes a measuring arm receiving unit (18) mounted on the housing (49) or on an axial pin (30) connected to the housing (49) for conjoint rotation so as to be rotatable or pivotable about the axis of rotation (D). A measuring arm (16) can be arranged on the measuring arm receiving unit (18). A motor unit (24) generates a motor torque about the axis of rotation (D) on the measuring arm receiving unit (18). The measuring arm unit (18) is mounted by a ball bearing guide unit (39) to be rotatable about the axis of rotation (D) in the peripheral direction and displaceably along the axis of rotation (D) in the axial direction A. An axial position of the measuring arm unit (18) in the axial direction is defined with the aid of a magnetic axial bearing device (46) and is maintained during operation.
    Type: Grant
    Filed: June 20, 2018
    Date of Patent: March 30, 2021
    Assignee: Carl Mahr Holding GmbH
    Inventors: Matthias Rudkowski, Andreas Lange
  • Patent number: 10942020
    Abstract: A system for providing state information for at least a part of a tool positioning machine embodied as manipulating machine or as coordinate measuring machine is provided. The system comprises the tool positioning machine defining a machine coordinate system and having a base and a machine structure. The structure comprises a tool head and structural components for linking the tool head to the base, at least one drive mechanism for providing movability of the machine structure relative to the base, a position determining system for deriving at least one coordinate of the machine structure in the machine coordinate system and a controlling unit adapted for controlling movement of the machine structure. The system comprises a calibration setup. A calibration component is mounted on the machine structure and defines a moveable reference point, another calibration component is arranged with defined spatial relation to the base and provides a nominal calibration position.
    Type: Grant
    Filed: October 9, 2018
    Date of Patent: March 9, 2021
    Assignee: HEXAGON TECHNOLOGY CENTER GMBH
    Inventors: Silvan Meile, Claudio Iseli
  • Patent number: 10830568
    Abstract: An object of the present invention is to provide a measurement device and a measurement system which make it possible to obtain various pieces of driving information and realize accurate analysis of an operation state. A measurement device according to an embodiment comprises: a main body which comprises a probe having a gauge head which can be moved, in a relative manner, relative to an object to be measured, and a move mechanism for moving the gauge head; and a control section which controls driving of the move mechanism, and comprises a generation section for generating driving information of the main body, in association with identification information of the probe, in response to driving of the move mechanism, and a recording section for recording the driving information.
    Type: Grant
    Filed: October 1, 2018
    Date of Patent: November 10, 2020
    Assignee: MITUTOYO CORPORATION
    Inventors: Yuuto Karasawa, Mitsuru Fukuda, Kazumi Mizukami
  • Patent number: 10663110
    Abstract: In the present disclosure, systems and apparatuses for stabilizing a metrology device may be provided. The metrology device may be connected with a metrology apparatus that may prevent and/or correct for unintended movement of the metrology device. The metrology apparatus may include a base plate having a top surface and a bottom surface, and the base plate may include a plurality of holes from the top surface to the bottom surface. The metrology apparatus may further include a plurality of suspension rods, and a distal end of a respective suspension rod may be positioned through a respective hole such that a first portion of the distal end is disposed on the top surface of the base plate and a second portion of the distal end is disposed on the bottom surface of the base plate. The metrology device may be connected to the bottom surface of the base plate such that at least a portion of an assembly cell is within a field of view of the metrology device.
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: May 26, 2020
    Assignee: DIVERGENT TECHNOLOGIES, INC.
    Inventor: Oussama Rawas
  • Patent number: 10627204
    Abstract: A step gauge and a reference gauge block are placed in a temperature-controlled chamber in parallel with each other. A temperature of the step gauge is changed to a first temperature and a second temperature using a measurement-target temperature adjuster and the temperature-controlled chamber. A distance between a first surface and a second surface of the step gauge is relatively measured at each of the first and second temperatures with reference to a distance between a first reference surface and a second reference surface of the reference gauge block. A coefficient of thermal expansion of the measurement target is calculated from the length of the measurement target at the first temperature and the length of the measurement target at the second temperature.
    Type: Grant
    Filed: November 30, 2017
    Date of Patent: April 21, 2020
    Assignee: MITUTOYO CORPORATION
    Inventors: Takeshi Hagino, Yuichiro Yokoyama
  • Patent number: 10627202
    Abstract: A step gauge includes: measurement blocks each having reference measurement surfaces; interval blocks each interposed between a pair of ones of the measurement blocks to keep a distance between the pair of ones of the measurement blocks at a predetermined distance, the measurement blocks and the interval blocks being alternately aligned one by one in one direction. The measurement blocks and the interval blocks each have a coefficient of linear thermal expansion of less than 0.03×10?6(1/K) and have through holes aligned in the one direction. The step gauge further includes a tie rod inserted in the through holes and countersunk screws respectively fixed to ends of the tie rod. The tie rod is made of a material having a coefficient of linear thermal expansion of less than 0.5×10?6(1/K).
    Type: Grant
    Filed: April 25, 2018
    Date of Patent: April 21, 2020
    Assignee: MITUTOYO CORPORATION
    Inventors: Tatsuya Narumi, Akihiko Matsuura, Kentaro Yano
  • Patent number: 10591270
    Abstract: A method of operating an articulated arm CMM is provided. Instructions for the CMM can be inputted to the CMM arm by an action chosen from the group consisting of placing the arm in a predefined position and moving the arm in a predefined manner.
    Type: Grant
    Filed: May 17, 2018
    Date of Patent: March 17, 2020
    Assignee: Hexagon Technology Center GmbH
    Inventors: Laurent Desforges, Jean-Paul De Lemos
  • Patent number: 10533852
    Abstract: A leveling sensor, a load port including a leveling sensor, and a method of leveling a load port using a load port are disclosed. In an embodiment, a sensor includes an accelerometer configured to detect leveling and vibration of a load port and produce a plurality of data; a plurality of indicator lights configured to display a level measurement and a level direction based on the leveling of the load port; a processor configured to process the data produced by the accelerometer; and a wired connection configured to connect the processor to an external device.
    Type: Grant
    Filed: February 14, 2019
    Date of Patent: January 14, 2020
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yi-Lin Wang, Jung-Tang Wu, Chin-Szu Lee, Hua-Sheng Chiu
  • Patent number: 10481575
    Abstract: A thermal compensation control system for a machine tool having a milling cutter and a cutter driver includes a tool setting probe, a temperature sensor, a workpiece touch probe, and a controller. The cutter driver is connected to the milling cutter to drive the milling cutter to process the work piece based on a control signal. The tool setting probe is configured to detect a cutter length of the milling cutter. The temperature sensor is configured to sense a measured temperature of the cutter driver or the milling cutter. The workpiece touch probe is configured to measure processing errors of the processed work piece. The controller is configured to generate the control signal based on a processing instruction, a temperature compensation model, the cutter length, and the measured temperature. The controller is further configured to determine whether to modify the temperature compensation model based on the processing errors.
    Type: Grant
    Filed: December 27, 2017
    Date of Patent: November 19, 2019
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Sheng-Ming Ma, Ta-Jen Peng, Yung-Chih Lin, Chien-Hung Chen, Ke-Hen Chen, Shin-Tzong Su
  • Patent number: 10416647
    Abstract: A non-transitory computer readable storage medium has instructions executed by a processor to compute an x-axis axial position based upon a first host border measurement signal, a second host border measurement signal, first x-axis axial measurement signals and second x-axis axial measurement signals. A y-axis axial position is computed based upon the first host border measurement signal, the second host border measurement signal, first y-axis axial measurement signals and second y-axis axial measurement signals. A z-axis axial position is computed based upon the first host border measurement signal, the second host border measurement signal, first z-axis axial measurement signals and second z-axis axial measurement signals. The operation of a computer numerical control milling machine is coordinated based upon the x-axis axial position, the y-axis axial position and the z-axis axial position.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: September 17, 2019
    Assignee: BENEFICIAL MACHINE TOOLS LLC
    Inventors: George Benedict, Oscar Lim
  • Patent number: 10286614
    Abstract: A method and system for assisting in the manufacture of composite parts such as those used for various high-strength assemblies such as aircraft wings, vertical stabilizers, racing car shells, boat hulls, and other parts which are required to have a very high strength to weight ratio. The system uses laser technology to measure the resultant surfaces of a first manufactured composite part. A computer system analyzes and compares the as-built dimensions with the required production specifications. Supplemental composite filler plies are designed including shape and dimensions. These plies are nested together into a single composite sheet and manufactured to minimize wasted material. The plies are then cut out and applied to the first part guided by a laser projection system for locating the plies on the part. The part is then re-cured. The final assembly is then re-measured for compliance with production dimensions.
    Type: Grant
    Filed: October 26, 2015
    Date of Patent: May 14, 2019
    Inventors: Michael Spellman, Jeff Godfrey, Gregory MacLean
  • Patent number: 10281255
    Abstract: A method for performing measurements using a test element, comprising: arranging a test element in a measurement region of a coordinate-measuring apparatus, wherein the test element is arranged on a base of the coordinate-measuring apparatus or at/on a first, rotatable part of a rotating apparatus arranged within the measurement region, and wherein the test element is arranged in a first pose relative to the base or to the first part. performing a measurement by incorporating the test element in the first pose, arranging the test element with the movement device in a second pose on the base or on the first part using the movement device, performing a measurement by incorporating the test element in the second pose.
    Type: Grant
    Filed: December 20, 2016
    Date of Patent: May 7, 2019
    Assignee: CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH
    Inventors: Dominik Seitz, Rainer Sagemueller
  • Patent number: 10222193
    Abstract: A series of nominally identical production workpieces are measured on a workshop coordinate measuring apparatus. They are corrected using correction values generated by comparing coordinate values of a reference workpiece measured on the workshop apparatus with corresponding values derived from external measurements. To reduce the care and skill required, the external measurements are used to determine reference values of a geometric property of a feature of the reference workpiece, rather than coordinate values corresponding directly to those made on the workshop apparatus. Corresponding coordinate values are then generated from knowledge of the perfect form of the feature of the reference workpiece.
    Type: Grant
    Filed: August 26, 2015
    Date of Patent: March 5, 2019
    Assignee: RENISHAW PLC
    Inventors: Leo Christopher Somerville, Kevyn Barry Jonas
  • Patent number: 10209048
    Abstract: A double ball-bar measuring system includes a calibration unit, at least two double ball-bars and a measuring module. Among the double ball-bars, at least one is a measuring double ball-bar and at least one is a reference double ball-bar. The measuring double ball-bar is installed on a measurement apparatus to measure or calibrate a target machine. The reference double ball-bar is disposed on the calibration unit to measure thermal errors. When the target machine is driven for measurement or calibration, the geometric and thermal errors of the measuring double ball-bar are compensated so that the measurement apparatus can achieve highly accurate measurement.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: February 19, 2019
    Assignee: NATIONAL TSING HUA UNIVERSITY
    Inventor: Wei-Tai Lei
  • Patent number: 10189137
    Abstract: There is provided a tool shape measuring apparatus that allows detection of shape abnormality in a tool having a plurality of cutting edges with a simple configuration. A light receiving section 6 includes a light receiving face 9 perpendicular to an optical axis 6b of a light receiving lens 6a. In the light receiving face 9, there are disposed a plurality of line sensors 8 arranged in different directions from each other, each line sensor having a plurality of sensor elements arranged in one direction. The line sensor 8 is disposed across a first area not reached by the irradiation light L as being completely blocked by the tool 4, a second area disposed adjacent the first area and reached by the irradiation light L with a portion thereof being blocked, and a third area disposed adjacent the second area and reached by the irradiation light L not blocked at all.
    Type: Grant
    Filed: June 30, 2015
    Date of Patent: January 29, 2019
    Assignee: Big Daishowa Co., Ltd.
    Inventors: Masataka Yauchi, Kouichi Uemura, Reina Oohashi, Shunsuke Kumasaki, Akihito Funashoku
  • Patent number: 10168134
    Abstract: A portable articulated arm coordinate measurement machine (AACMM) is provided. The AACMM having a manually positionable articulated arm having first and second ends, the arm including a plurality of connected arm segments, each of the arm segments including at least one position transducer for producing position signals, at least one of the position signals passing between two of the arm segments through a first slip ring assembly. A first a first electronic circuit is provided that receives the position signals. A base section is connected to the second end. A probe assembly includes a probe end and a cover. The cover rotates about an axis extending through the probe assembly, the cover having at least one indentation formed thereon. The probe assembly is connected to the first end. The AACMM measures a three-dimensional coordinate of a point in space associated with the probe end.
    Type: Grant
    Filed: October 27, 2016
    Date of Patent: January 1, 2019
    Assignee: FARO TECHNOLOGIES, INC.
    Inventors: Simon Raab, Marc M. Barber
  • Patent number: 10146205
    Abstract: A method which allows an operator to quickly form a clear picture with regard to the positioning accuracy of a machine part that is displaceable along an axis by means a drive controlled by a controller includes specifying with the controller nominal position values of the machine part in relation to a single axis, wherein the nominal position values are defined by a sine function; displacing the machine part with respect to the single axis in accordance with the nominal position values; determining with a measuring device actual position values of the machine part in relation to the single axis; and visualizing the actual position values of the machine part in relation to the single axis graphically in a circular representation.
    Type: Grant
    Filed: February 25, 2016
    Date of Patent: December 4, 2018
    Assignee: Siemens Aktiengesellschaft
    Inventors: Ricky Berghold, Lars Immenroth, Robert Pulawski, Johannes Welker
  • Patent number: 10099337
    Abstract: A lens processing system used for removing a lens blank (98, 110) from an edging block (40). The system includes an elongated collet (22) that engages the mating edging block (40). The block (40) includes an enlarged groove (41) that receives a pair of blades (65, 66) extended upwardly from the floor (75) of the collet (22). Each lens blank (98,110) is formed to include a series of surface markings (191,192) to verify proper functioning of the edging machine that forms a finished lens. Each lens blank also includes a series of circular markings (117,133) arranged in diagonal rows to verify the accurate drilling of bores with the lens blank (98,110).
    Type: Grant
    Filed: September 5, 2016
    Date of Patent: October 16, 2018
    Inventor: James Gregory Goerges
  • Patent number: 10088304
    Abstract: A thickness measurement system includes a composite carrier assembly and a thickness sensor system. The composite carrier assembly includes a sample carrier and a gauge standard carrier. The sample carrier and gauge standard carrier are configured to simultaneously support a sample and a gauge standard, respectively. The thickness sensor system is configured to generate a signal representative of a thickness of the sample and to be calibrated with the gauge standard while the sample and the gauge standard are simultaneously supported by the sample carrier and the gauge standard carrier, respectively.
    Type: Grant
    Filed: February 4, 2016
    Date of Patent: October 2, 2018
    Assignee: OCEAN INDUSTRIES, LLC
    Inventors: John A. Kane, II, John A. Kane, III
  • Patent number: 10065319
    Abstract: A tool calibration apparatus for a robot manipulator having a tool is disclosed. The tool calibration apparatus comprises a base, an X-axis measurement device, a Y-axis measurement device and a Z-axis measurement device. Each of the X-axis measurement device, the Y-axis measurement device and the Z-axis measurement device comprises a measuring plate and a sensor. The measuring plates of the X-axis measurement device, the Y-axis measurement device and the Z-axis measurement device move in a direction along the X-axis, Y-axis, and Z-axis, respectively. The sensors of the X-axis measurement device, the Y-axis measurement device and the Z-axis measurement device measure a displacement of the corresponding measuring plate. According to the displacements, information of a tool center point of the tool is acquired so as to calibrate the tool center point.
    Type: Grant
    Filed: May 4, 2016
    Date of Patent: September 4, 2018
    Assignee: DELTA ELECTRONICS, INC.
    Inventors: Cheng-Hao Huang, Chih-Ming Hsu
  • Patent number: 10066922
    Abstract: A manual measuring system (an articulated three-dimensional coordinate measuring machine or a gantry three-dimensional coordinate measuring machine) allows a measuring probe to be manually moved while enabling a user to focus on making measurements and allows the user to manually move the measuring probe in order to facilitate and accelerate measurements. The manual measuring system includes a sub-monitor (portable terminal) that is mounted near the tip of the measuring probe. It is possible to display on the sub-monitor a guided route for the measuring probe to a measurement point or to indicate on the sub-monitor that the measuring probe has entered a measurement allowable range or to allow the user to direct by means of the sub-monitor to obtain a measurement value by the measuring probe.
    Type: Grant
    Filed: December 28, 2016
    Date of Patent: September 4, 2018
    Assignee: MITUTOYO CORPORATION
    Inventors: Shinsaku Abe, Kozaburo Suzuki
  • Patent number: 9976852
    Abstract: A system includes an environment for programming workpiece inspection operations for a coordinate measurement machine (CMM). The environment includes a user interface comprising a program simulation portion configured to display a 3D view of the workpiece and/or representations of inspection operations to be performed on the workpiece. The user interface further includes auxiliary collision avoidance volume (CAV) creation elements that create CAV's that are represented in the 3D view. The 3D CAVs and/or their representations have integrated graphical modification properties which are controllable in the user interface. The modification properties are activated by selection of a face of the CAV representation, without the explicit activation of a separate modification control element mode or tool. This results in a simplified and intuitive user interface. Users perform a constrained set graphical modifications in the 3D view using an input device, to modify a CAV.
    Type: Grant
    Filed: August 29, 2016
    Date of Patent: May 22, 2018
    Assignees: Mitutoyo Corporation, Mitutoyo Europe Gmbh
    Inventors: Brenan N. Kelley, Kareem G. Fawell, Matthew Buza, Dahai Yu
  • Patent number: 9952044
    Abstract: A calibration block for calibrating a touch probe includes a calibration block body forming a bored hole providing a concave measurement surface, and a three dimensional object protruding from the calibration block body and providing a convex measurement surface, wherein the convex measurement surface provides opposing measurement contact points in at least two dimensions.
    Type: Grant
    Filed: February 1, 2016
    Date of Patent: April 24, 2018
    Assignee: Rolls-Royce North American Technologies, Inc.
    Inventor: Geoffrey L. Gatton
  • Patent number: 9915516
    Abstract: There is provided a method for controlling a shape measuring apparatus which continues to perform nominal scanning measurement to a workpiece having a slightly large deviation from a design data. A scanning path to move a stylus tip is calculated based on design data of a workpiece. The stylus tip is moved along the scanning path. It is monitored whether a distance between the scanning path and an actual workpiece is excessive. When the distance between the scanning path and the actual workpiece is excessive, a trajectory difference error is generated. When the trajectory difference error is generated, geometric correction is performed to the design data so that the design data approaches to the actual workpiece. Scanning measurement is performed based on the design data after the geometric correction.
    Type: Grant
    Filed: April 28, 2016
    Date of Patent: March 13, 2018
    Assignee: MITUTOYO CORPORATION
    Inventor: Takashi Noda
  • Patent number: 9746858
    Abstract: A control device of the present invention estimates warm-up time that it takes for a warm-up of a machine based on the temperature of the machine to be warmed up and the saturation temperature that is unique to the machine. Warm-up start time is calculated based on the obtained warm-up time and predefined warm-up end time. In this way, the warm-up can be efficiently performed as the warm-up can be performed for an appropriate period of time in consideration of the saturation temperature unique to the machine.
    Type: Grant
    Filed: October 20, 2014
    Date of Patent: August 29, 2017
    Assignee: Fanuc Corporation
    Inventor: Kaname Matsumoto
  • Patent number: 9618331
    Abstract: A method and equipment based on detecting the polarization property of a polarization maintaining fiber (PMF) probe for measuring structures of a micro part are provided. The provided method relates to how to accomplish measuring structures of a micro part by transforming two or three-dimensional contact displacements into polarization property changes of the PMF probe, and how to reconstruct the structure geometry of a micro part. The provided equipment can be used to bring the spherical tip of the PMF probe into contact with a micro part, to determine coordinates of contact points, and to reconstruct the structure geometry of a micro part. The provided method and equipment feature high sensitivity, low probing force, high inspecting aspect ratio and immunity to environment interference.
    Type: Grant
    Filed: December 31, 2014
    Date of Patent: April 11, 2017
    Assignee: HARBIN INSTITUTE OF TECHNOLOGY
    Inventors: Jiwen Cui, Junying Li, Kunpeng Feng, Jiubin Tan
  • Patent number: 9612107
    Abstract: A length artifact has a first side wall, a second side wall, and a base portion, the first side wall and the second side wall separated by an air gap at least four millimeters wide, the base portion being attached to a bottom of the first side wall and the second side wall, the base portion further having a first platform region that includes a first nest and a second platform region that includes a second nest, the first nest and the second nest configured to accept a spherical surface of a retroreflector target.
    Type: Grant
    Filed: March 19, 2015
    Date of Patent: April 4, 2017
    Assignee: FARO TECHNOLOGIES, INC.
    Inventor: Robert E. Bridges
  • Patent number: 9575163
    Abstract: A system and method of calibrating a laser tracker is provided. The system includes a support system for quickly and easily moving an artifact to a desired position and orientation and for holding the artifact in the position and orientation. An adjustable alignment mirror is coupled to a first end of the artifact so that the more accurate ranging system of the laser tracker can be isolated to determine a reference length of the artifact. Additional measurements are then taken to exercise one or more error source within the tracker. The support system includes a positioner and a support beam for positioning and supporting the artifact. The artifact is coupled to the support beam using kinematic clamps that are designed to reduce or eliminate errors associated with over-constraining the artifact.
    Type: Grant
    Filed: July 10, 2015
    Date of Patent: February 21, 2017
    Assignee: Brunson Instrument Company
    Inventors: Aaron A. Hudlemeyer, Mark J. Meuret
  • Patent number: 9541385
    Abstract: An error correction method for coordinate positioning apparatus is described. The method comprises (i) taking a first data set comprising one or more first data values, each first data value describing a position on the surface of a first object, (ii) taking a second data set comprising one or more second data values, each second data value describing a position on the surface of the first object, and (iii) calculating an error map comprising one or more error values, each error value describing a positional difference between the surface as described by the first data set and the surface as described by the second data set. The surface normal of the first object is known at each position described by each first data value and step (iii) comprises calculating each error value by determining the positional difference substantially in the direction of the known surface normal.
    Type: Grant
    Filed: March 4, 2011
    Date of Patent: January 10, 2017
    Assignees: RENISHAW PLC, METROLOGY SOFTWARE PRODUCTS LIMITED
    Inventors: Kevyn Barry Jonas, Geoffrey McFarland, Peter Russell Hammond, Anthony Brown
  • Patent number: 9500078
    Abstract: A segment roundness measuring device including a correction means that corrects the positional deviation of the turning center of an erector turning portion resulting from eccentricity on the basis of an angle detected by an angle detector and distances measured by three or more distance meters arranged at angular positions different from each other in the erector turning portion.
    Type: Grant
    Filed: November 12, 2013
    Date of Patent: November 22, 2016
    Assignee: HITACHI ZOSEN CORPORATION
    Inventor: Toshiyuki Okada
  • Patent number: 9482746
    Abstract: A method of measuring with a coordinate measurement device and a target sensor a sense characteristic and a surface set associated with the sense characteristic, the method including the steps of: providing the target sensor having a body, a first retroreflector, a sensor, and a sensor processor, providing the coordinate measurement device, sending the first beam of light from the coordinate measurement device to the first retroreflector; receiving the second beam of light from the first retroreflector; measuring the orientational set and the translational set, the translational set based at least in part on the second beam of light; determining the surface set; sensing the sense characteristic; and saving the surface set and the sense characteristic.
    Type: Grant
    Filed: April 11, 2012
    Date of Patent: November 1, 2016
    Assignee: FARO TECHNOLOGIES, INC.
    Inventor: Robert E. Bridges
  • Patent number: 9446495
    Abstract: A lens processing system used for removing a lens blank (98, 110) from an edging block (40). The system includes an elongated collet (22) that engages the mating edging block (40). The block (40) includes an enlarged groove (41) that receives a pair of blades (65, 66) extended upwardly from the floor (75) of the collet (22). Each lens blank (98,110) is formed to include a series of surface markings (191,192) to verify proper functioning of the edging machine that forms a finished lens. Each lens blank also includes a series of circular markings (117,133) arranged in diagonal rows to verify the accurate drilling of bores with the lens blank (98,110).
    Type: Grant
    Filed: September 26, 2013
    Date of Patent: September 20, 2016
    Inventor: James Gregory Goerges
  • Patent number: 9429409
    Abstract: An inner diameter measuring device (4) for measuring an inner diameter by inserting an inner diameter measuring unit into an inside of a hollow member to be measured, comprises a supporting shaft (18) having the inner diameter measuring unit supported at a forward end, and a supporting mechanism unit (30) for cantilever-supporting the supporting shaft, wherein the supporting mechanism unit has a frame (31), a spherical bearing (33) and a deflection adjusting unit (35), wherein the shaft is supported by the frame via the spherical bearing, an end portion (32) of the supporting shaft is passed through the spherical bearing and is extended, and a position of an end of the end portion in vertical direction is adjusted by the deflection adjusting unit.
    Type: Grant
    Filed: February 7, 2013
    Date of Patent: August 30, 2016
    Assignee: IHI Corporation
    Inventors: Michiko Baba, Kouzou Hasegawa, Norimasa Taga
  • Patent number: 9383198
    Abstract: A method reduces errors in a turning device during a determination of coordinates of a work piece or during machining of the work piece. The turning device allows a rotational movement of the work piece about a rotation axis of the turning device. The method includes measuring errors in the turning device on account of deviations between actual positions and actual orientations of the rotation axis, on the one hand, and corresponding ideal positions and ideal orientations of the rotation axis, on the other hand, in a range of rotation angles. Expected error values of the turning device are determined from error measurements and are used to correct the turning device.
    Type: Grant
    Filed: March 22, 2013
    Date of Patent: July 5, 2016
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Rainer Sagemueller, Dominik Seitz, Thomas Engel
  • Patent number: 9366592
    Abstract: An arm type three-dimensional measuring apparatus includes: a multi-jointed arm mechanism including a probe in a distal end; a processing part for computing a position of the probe, the probe being manually moved; a sensor which is formed in each axis of the multi-jointed arm mechanism and detects at least a force in one predetermined direction and torques in two predetermined axial directions generated in an attitude state of the multi-jointed arm mechanism, wherein the processing part computes a deflection amount in each axis of the multi-jointed arm mechanism based on an output of the sensor and sequentially computes a position of the probe based on the deflection amount.
    Type: Grant
    Filed: November 18, 2014
    Date of Patent: June 14, 2016
    Assignee: MITUTOYO CORPORATION
    Inventor: Tomonori Goto
  • Patent number: 9335143
    Abstract: A form measuring apparatus includes a probe for measuring a measured object; a rotary table on which the measured object is placed; and a coordinate system calculator calculating coordinate axes configuring a coordinate system for the rotary table. The coordinate system calculator calculates, based on a position of a master ball fixated to the rotary table, a center of a circle traced by the master ball when the rotary table is rotated; calculates a rotary table coordinate system having the center of the circle as an origin point; and corrects coordinates of the origin point based on a calibrated diameter value of a gauge fixated to the rotary table, a first diameter value of the gauge measured by a first measurement in which the probe approaches the gauge in a first direction, and a second diameter value of the gauge measured by a second measurement.
    Type: Grant
    Filed: August 20, 2014
    Date of Patent: May 10, 2016
    Assignee: MITUTOYO CORPORATION
    Inventors: Takashi Noda, Hiroshi Kamitani, Tomohiro Usui