Abstract: This application provides a measurement signal circuit and a measurement method thereof. The measurement signal circuit includes: a first switch, the first switch being electrically coupled to a first node, a second node and a third node; a second switch, a control end of the second switch being electrically coupled to the first node, a first end of the second switch being electrically coupled to a fourth node, and a second end of the second switch being electrically coupled to the third node; and a third switch, a control end of the third switch being electrically coupled to a fifth node, a first end of the third switch being electrically coupled to the third node, and a second end of the third switch being electrically coupled to a pad.

Abstract: A display screen quality detection method, an apparatus, an electronic device and a storage medium. The method includes receiving a quality detection request sent by a console deployed on a display screen production line, where the quality detection request includes a display screen image captured by an image capturing device on the display screen production line, performing image preprocessing on the display screen image, and inputting the preprocessed display screen image into a defect detection model to obtain a defect detection result, where the defect detection model is obtained by training with a historical defect display screen image using a deep convolutional neural network structure and an instance segmentation algorithm, determining, according to the defect detection result, quality of a display screen corresponding to the display screen image. The technical solution has high defect detection accuracy, good system performance, and high business expansion capability.

Abstract: A display device includes pixels, a serial-to-parallel converter (SPC), a row driver, a column driver, and a switch. The pixels are arranged in rows and columns which include a first column and a first row. A first pixel resides at an intersection of the first row and first column. The SPC extracts, from a signal sent by a graphics controller, pixel data and a command. The row driver initiates a refresh of the pixels residing in the first row based on the pixel data. The column driver transmits the pixel data to the first column. During the refresh, the switch allows transmission of the pixel data to the first pixel when the command indicates that the first pixel is to be refreshed and prevents transmission of pixel data to the first pixel when the command indicates that the first pixel is not to be refreshed.

Abstract: A method in a high integrity device for verifying the integrity, continuity, and availability (ICA) of information displayed on an uncertified display is provided. The method comprises creating, on the high integrity device, application data for display on an uncertified display device; transmitting the application data to the uncertified display device; receiving, at the high integrity device from an optical sensing device, a captured image of the display; determining, at the high integrity device, an expected display image to be displayed on the uncertified display device; comparing, at the high integrity device, the captured image of the display to the expected display image; identifying, at the high integrity device, a loss of ICA if one or more frames in the captured image fails the comparison with the expected display image; and causing the annunciation of a message indicating the loss of ICA when a loss of ICA is identified.

Abstract: A method for verifying the integrity, continuity, and availability (ICA) of information displayed on an uncertified display is provided. The method comprises creating, on the high integrity device, application data for display on an uncertified display device; transmitting the application data to the uncertified display device for display; receiving, at the high integrity device from the uncertified display device, a captured image of the display captured using a screen capture feature on the uncertified display device; determining, at the high integrity device, an expected display image; comparing, at the high integrity device, the captured image of the display to the expected display image; identifying, at the high integrity device, a loss of ICA if one or more frames in the captured image fails the comparison with the expected display image; and causing the annunciation of a message indicating the loss of ICA when a loss of ICA is identified.

Abstract: A display panel is provided. In the display panel, a plurality of pixels respectively including a plurality of sub pixels are arranged in a matrix form on a glass. Each of the plurality of sub pixels includes a driving circuit disposed on the glass and configured to receive a pulse amplitude modulation (PAM) data voltage and a pulse width modulation (PWM) data voltage, and an inorganic light emitting device mounted on the driving circuit and configured to be electrically connected to the driving circuit, and to emit a light based on a driving current provided from the driving circuit. The PAM data voltage is applied at once to the plurality of pixels included in the display panel. The driving circuit is configured to control a grayscale of a light emitted by the inorganic light emitting device by controlling a pulse width of a driving current having an amplitude corresponding to the applied PAM data voltage based on the applied PWM data voltage.

Abstract: A system and method for white spot Mura defects on a display. The system is configured to pre-process an input images to generate a plurality of image patches. A feature vector is then extracted for each of the plurality of image patches. The feature vector includes at least one image moment feature and at least one texture feature. A machine learning classifier then determines the presence of a defect in each patch using the feature vector.

Abstract: A display integrity system for use in a mounting adapter configured to mount a personal electronic device (PED) on an aircraft is disclosed. The display integrity system includes a transparent surface configured to overlay the display surface of a PED when the PED is mounted in the mounting adapter. The transparent surface includes one or more regions embedded with one or more coating layers that when activated with a select excitation wavelength are configured to emit visible light to annunciate a message indicating a problem with an image displayed on the PED. The display integrity system further includes a lighting source housed in the mounting adapter and configured to provide light in the select excitation wavelength when activated to illuminate the transparent surface and an imaging device mounted in the mounting adapter and configured to capture an image of the PED display for transmission to a server for integrity checking.

Abstract: The present invention discloses a method and a system of showing colors for a mosaic display device, in which sending the reference control signal to the first LCD to control the first pixel unit in the first LCD to show the reference colors; determining the reference three stimulus values of the reference colors; determining the calibration three stimulus values closest to the reference three stimulus values; and then sending the calibration control signal to the second LCD to control the second pixel unit in the second LCD to show the calibration colors corresponding to the calibration three stimulus values. Accordingly, the consistency calibration process of the color display for different LCDs is accomplished, and thus, to make the display result of the second LCD and the display result of the first LCD come close to the same.

Abstract: An image correction method of projector and an image correction system are provided. An image capturing apparatus shoots a physical calibration panel to obtain a first image, and shoots an outputting image of a calibration panel pattern on a projection screen outputted from the projector to obtain a second image. A processor analyzes the first image to obtain a first calibration parameter and a first homography matrix, and performs an undistorting operation for the second image based on the first calibration parameter to obtain a third image. The processor analyzes the third image to obtain a second calibration parameter and a second homography matrix of the projector. The processor performs a compensating operation for an original image to be outputted from the projector based on the second calibration parameter, the second homography matrix and the first homography matrix to obtain a compensated image.

Abstract: An information management method in a control system that collects log information regarding usage of a plurality of devices, the information management method including: a step of receiving judgment information indicating whether or not the log information is to be provided to a service operator from each of the plurality of devices; and a step of providing a command for causing a first image, which represents a device indicated by the judgment information as a device that provides the log information to a service operator, and a second image, which represents a device indicated by the judgment information as a device that does not provide the log information to a service operator, to be displayed in display modes that differ from each other to a display device associated with the identifier in response to an access by the display device.

Abstract: A display processor of a display system may receive an image that includes a test pattern. An input checksum may be associated with the test pattern. Hardware units of the display processor may process the image. The display system may generate an output checksum based at least in part on the test pattern after processing of the image. The display system may detect a fault in the hardware units of the display processor based on determining a difference between the input checksum and the output checksum.

Abstract: A computer implemented method of software testing may include obtaining multiple interactive elements from an event-driven software application. The interactive elements may be configured to be selected by a user and when selected result in an event in the event-driven software application. The method may also include determining which of the interactive elements may be user interactive in a first state of the event-driven software application. In some embodiments, determining which of the interactive elements may be user interactive may include obtaining one or more coordinates of a first interactive element and determining if the first interactive element is a top layer interactive element at any one of the one or more coordinates. The method may further include testing the event-driven software application based on the user interactive elements.

Abstract: A method for achieving code domain isolation. A first set of data is received in a first domain format. The first set of data is changed to a second domain format. The first set of data in the second domain format is captured. The first set of data in the second domain format is changed to a third domain format. The first set of data in the third domain format is prepared for receipt by a user computer system.

Abstract: A circuit structure of a test-key and a test method thereof are provided. The circuit structure comprises a plurality of transistors, a first conductive contact, a plurality of second conductive contacts and a plurality of third conductive contacts. The transistors are arranged in a matrix. The first conductive contact is electrically connected to one source/drain of each transistor in each column of the matrix. Each second conductive contact is electrically connected to the other source/drain of each transistor in a corresponding column of the matrix. Each third conductive contact is electrically connected to the gate of each transistor in a corresponding row of the matrix. In the method, a plurality of driving pulses are provided to the third conductive contacts in sequence, and a plurality of output signals are read from the second conductive contacts to perform an element-character analyzing operation when a row of the transistors is turned on.

Abstract: Disclosed herein is a display device including: a pixel array part configured to include scan lines disposed along rows, signal lines disposed along columns, and pixels that are disposed at intersections of the scan lines and the signal lines and are arranged in a matrix; and a drive part configured to have at least a write scanner that sequentially supplies a control signal to the scan lines to thereby carry out line-sequential scanning and a signal selector that supplies a video signal to the signal lines in matching with the line-sequential scanning.

Abstract: A display device and a repairing method for the same are disclosed. The display device includes a substrate, a pixel array, at least one gate driver unit, at least one source driver unit, a first repair line, a second repair line, a first dummy line, and a second dummy line. The first repair line is disposed between the pixel array and the source driver unit. The second repair line is disposed opposite to the first repair line on the pixel array. The first dummy line and the second dummy line are respectively disposed at two sides of the pixel array and crossing the gate lines, the first repair line, and the second repair line. A signal transmission is not required to go around the outmost periphery of the gate driver unit in a repairing process. As a result, the signal attenuation can be decreased effectively.

Abstract: A liquid crystal display is capable of detecting a failure of a gate driver, and a method of testing the same are provided. The liquid crystal display includes a liquid crystal display panel on which liquid crystal cells connected to thin film transistors (TFTs) located at crossings between gate lines and data lines are formed, a data driver that drives the data lines of the liquid crystal display panel, and a gate driver which includes first to nth stages (n is a natural number larger than 1) formed on the liquid crystal display panel that generates normal scan signals for turning on the TFTs in a normal mode, and that generates test scan signals for turning off the TFTs in a test mode.

Abstract: A color temperature adjusting device includes a display unit that displays a first pointer indicating default values of chromaticity x, y and a second pointer indicating an adjustment value of the chromaticity x, y within a frame in a corresponding manner to scales of the x coordinate and the y coordinate marked on the frame, an operating unit that is used to change the x coordinate and/or the y coordinate of the second pointer, and a control unit that sends out the adjustment value indicated by the second pointer by an operation of the operating unit, to the monitor through a communication processing unit, and in a case where the monitor changes the color temperature, receives the values of the chromaticity x, y from the monitor through the communication processing unit so as to reflect and display the values of the chromaticity x, y on the display unit.

Abstract: In one embodiment of the present invention, a liquid crystal driving semiconductor IC for driving a display panel includes an output terminal connected to the display panel, an output circuit block including a DAC circuit, and a spare output block including a DAC circuit, the DAC circuits and being connectable to the output terminal. The IC includes an op amp for comparing output signal from the DAC circuit with that of the DAC circuit, and judging circuit for judging, based on the comparison result of the op amp, whether the DAC circuit is defective, and switches and for, if the DAC circuit is defective, connecting the spare DAC circuit to the output terminal in replacement of the defective DAC circuit. This provides an IC for driving a display device, which IC has concrete measures to easily detect a defect in an output circuit, and can perform self-healing for the defect in the output circuit.

Abstract: A repair step of repairing a pixel resulting in a defective bright spot so as to display the pixel in black is included. In the repair step, a drain portion of a TFT of the pixel resulting in the defective bright spot is shorted to a corresponding gate line, and in the pixel resulting in the defective bright spot, a semiconductor layer portion of the TFT is cut to allow electrical isolation between a corresponding source line and the corresponding gate line.

Abstract: Compensation is performed for initial nonuniformity or aging of drive transistors and electroluminescent (EL) emitters in 3T1C EL subpixels of an EL display, such as an organic light-emitting diode (OLED) display. A readout transistor connected to the EL emitter is used to readout the voltage of the emitter and compensation for ?Vth, ?VEL, and OLED efficiency loss is performed using a model. Measurements are taken during a frame by driving a target subpixel at a higher luminance for a shorter time, then using the remaining time in the frame to measure. Measurements can be taken with an A/D converter or with a ramp generator and comparator. Compensation is performed for each subpixel individually.

Abstract: A display device includes a plurality of pixels connected with a plurality of gate lines and a plurality of data lines, a data driving part applying a data signal to the plurality of data lines, a gate driving part applying a gate signal to the plurality of gate lines, and a plurality of protection circuits connected with the plurality of data lines, wherein each of the plurality of protection circuits comprises a first transistor including a control terminal connected with a first signal line, an input terminal connected with a data line, and an output terminal connected with a second signal line, a second transistor including a control terminal connected with the second signal line, an input terminal connected with the second signal line, and an output terminal connected with the first signal line, and a storage capacitor is connected between the control terminal of the first transistor and the output terminal of the first transistor.

Abstract: A scan IC includes a switch circuit and a logic circuit. The switch circuit includes first and second transistors and a level shift circuit. First and second control signals that change between a logical “1” and a logical “0” are applied to an input terminal of the logic circuit. The logic circuit applies a third control signal to the first transistor and applies a fourth control signal to the second transistor based on the applied first and second control signals. A detection circuit is connected to the input terminal of the logic circuit. An abnormality of the scan IC is detected by the detection circuit.

Abstract: A picture quality controlling method including determining a charge characteristic compensation data of a link sub-pixel electrically connected to a defect sub-pixel and a normal sub-pixel, judging a first and second display surfaces different in brightness from each other, determining a first compensation data which compensates a brightness of the first display surface, modulating the test data using the first compensation data, determining a second compensation data that corrects a brightness of a bordering part inclusive of a part of the first display surface and a part of the second display surface between the first and second display surfaces, adding the first and second compensation data, storing the charge characteristic compensation data and the added compensation data at a memory; adjusting a video data to be displayed in the link sub-pixel using the charge characteristic compensation data, and adjusting video data to be displayed in the first display surface and the bordering part using the added co

Abstract: A display includes a substrate provided with a display region and a non-display region. A plurality of display electrodes are arranged on the substrate. A plurality of switching elements are respectively connected to the display electrodes. Each of the switching elements includes a control electrode and a data electrode. A plurality of scan lines are respectively connected to the control electrodes of the switching elements. A plurality of data lines are respectively connected to the data electrodes of the switching elements. A scan line electrostatic protection and test circuit is provided in the non-display region and connected to the scan lines The scan line electrostatic protection and test circuit includes an electrostatic protection circuit provided with a protection element which is normally in a non-conduction state and is set in a conduction state by generated static electricity, and an inspection circuit to inspect a conduction state of the scan lines by way of the protection element.

Abstract: An OLED display and a driving method of an inspection circuit are provided. The OLED display may include a data driver, a scan driver, a driving transistor, a switching transistor, an organic light emitting diode, and an inspection circuit. The data driver and scan driver may apply a data signal and a scan signal. The driving transistor may generate a current corresponding to a voltage supplied to a first electrode and a control electrode. The switching transistor may apply the data signal to the driving transistor. The organic light emitting diode may be electrically connected to the driving transistor. The inspection circuit may include a three-phase inverter circuit having an input and an output terminal. The input terminal may supply a first power voltage to the output terminal when the output terminal decides an output signal regardless of a signal input to the input terminal.

Abstract: A testing system of a liquid crystal display panel including a substrate, a driving circuit, a first testing pad, and a second testing pad is provided. The substrate includes a pixel array whose one side has a pixel testing area. The driving circuit is formed on the substrate and connected to the other side of the pixel testing area for providing a signal to the pixel array. The first testing pad is connected to the driving circuit. The second testing pad is connected to the pixel testing area. The testing method of the liquid crystal display panel includes: respectively testing whether the liquid crystal display panel and the pixel testing area have a defect and accordingly generating a first testing pattern and a second testing pattern; combining the first testing pattern and the second testing pattern to determine whether the defect occurs at the driving circuit or the pixel array.

Abstract: An apparatus for testing a driving circuit for a display is disclosed. The apparatus includes a selecting circuit, a reference voltage generator and an analog-to-digital converter (ADC). The selecting circuit includes many input terminals and an output terminal. The input terminals are respectively coupled to many output pins of the driving circuit, while the selecting circuit is used for selecting one of the output pins to electrically connect the output terminal of the selecting circuit. The reference voltage generator is coupled to at least one of the output pins for generating a reference voltage. The ADC is coupled to the output terminal of the selecting circuit for outputting a digital value based on a difference between an output voltage outputted from the output terminal of the selecting circuit and the reference voltage produced by the reference voltage generator.

Abstract: In a mother substrate for a lower substrate, a substrate for a display panel and a method of manufacturing a display panel, the substrate for the display panel includes a lower substrate and an upper substrate facing the lower substrate. The lower substrate includes an inspection line that receives a first inspection signal externally provided, a gate driving part that outputs a second inspection signal in response to the first inspection signal from the inspection line, and a pixel part driven in response to the second inspection signal. The inspection line is disposed on a grinding area. Thus, the display panel may have an enhanced productivity and an improved yield, on which the gate driving part is formed.

Abstract: A method of controlling a picture quality of a flat panel display for automatically analyzing a shape, a size, and brightness of a display stain of indeterminate shape having an irregular pattern, and compensating brightness of the display stain of indeterminate shape on the basis of the analyzed result is disclosed.

Abstract: A test signal is supplied to a test switch provided between a D/A converter for selecting and outputting a gray scale voltage of the driving circuit and an amplifier for amplifying and supplying an output voltage at the D/A converter to set a test mode, and an output voltage of the D/A converter is directly measured by a measuring device through the test switch to measure an ON resistance of a gray scale voltage selection circuit of the D/A converter.

Abstract: The present invention provides A monitoring system comprising a display device, an abnormality detection means for monitoring an object and when detecting an abnormality of the monitored object, outputting an abnormality signal, and a display control means for causing the display device to present an abnormality display, further comprising a latch means for retaining the output state resulting from receipt of an abnormality signal, thereby continuing to output a latch signal until reset, and a reset device for resetting the latch device, wherein the display control device determines in what manner the display device presents an abnormality display, depending on whether an abnormality signal and a latch signal are each transmitted or not.

Abstract: A method of economically manufacturing display devices having a matrix of drivable pixels arranged in rows and columns arranged to be driven by IC drivers, including the steps of including a plurality of sensor signal lines in the display device that are selectively connectable to certain of the pixel rows, a plurality of sensor signal lines selectively connectable to certain of the pixel columns, transmitting test signals to test predetermined ones of the rows and columns of pixels, and connecting pixel driving circuits to those display devices exhibiting uniform pixel brightness in response to the test signals.

Abstract: A short detection circuit to detect a short condition in a backlight module, wherein the backlight module comprises a WLED circuit having a first terminal connected to an output voltage and second terminal connected to a driver IC. The short detection circuit comprises: a PMOS, a NMOS, a load and a detection module. The gate of the PMOS receives a first voltage and the source of the PMOS connects to the second terminal; the gate of the NMOS receives a reference voltage, the drain of the NMOS connects to the drain of the PMOS and the source of the NMOS connects to a detection terminal. The voltage of the detection terminal becomes a high state when the WLEDs have a short condition; and the detection module is connected to the detection terminal, when the voltage of the detection terminal becomes a high state, the detection module detects a short condition.

Abstract: The present invention relates to a flat display apparatus and a flat display apparatus testing method, and is, for example, applicable to a liquid crystal display apparatus where drive circuits are integrally formed on an insulating substrate. The present invention is capable of carrying out a reliable screening of defective pixels so as to effectively avoid deterioration in reliability even in cases where transistors with low withstand voltages are employed. A common line-side wiring pattern COM of wiring patterns LCC and COM of a capacitor of pixels is connected to a precharge circuit externally in an independent manner.

Abstract: A lifetime of a display is optimized by determining whether to control at least a portion of a display based on a lifetime metric. A plurality of display control options is identified in response to determining to control the portion of the display, and one of the display control options is selected.

Abstract: A system 100 for testing light-emitting diode (LED) displays is disclosed. The system is implemented within a portable handheld housing and includes a computing module 102, a test module 104, and an adaptor module 106. The computing module 102 includes a rechargeable battery 118 for providing electrical power to the system; a processor 122 for running operational software for testing an LED display 108; and a user interface 114 that allows a user to select from multiple test options for testing the LED display and that displays measured operational attributes of the display to the user. The test module 104 includes a nonvolatile memory unit for storing test images to be displayed on the LED display, and a data acquisition and control circuit for communicating power and control signals for displaying the test images on the LED display, and for measuring operational attributes of the LED display.

Abstract: A method of inspecting a flat panel display including inputting an image data signal into the flat panel display, obtaining an image displayed on the flat panel display in response to the input image data signal with a camera, extracting a raw brightness information corresponding to each location from the obtained image, calculating a fitting brightness information corresponding to each location through the curve fitting based on the raw brightness information, calculating a brightness difference corresponding to each location between the raw brightness information and the fitting brightness information, and detecting stain locations with the brightness difference beyond a predetermined permitted limit.

Abstract: In a mother substrate for a lower substrate, a substrate for a display panel and a method of manufacturing a display panel, the substrate for the display panel includes a lower substrate and an upper substrate facing the lower substrate. The lower substrate includes an inspection line that receives a first inspection signal externally provided, a gate driving part that outputs a second inspection signal in response to the first inspection signal from the inspection line, and a pixel part driven in response to the second inspection signal. The inspection line is disposed on a grinding area. Thus, the display panel may have an enhanced productivity and an improved yield, on which the gate driving part is formed.

Abstract: Each of a gate driver and a source driver periodically receives a clock signal and a start pulse, where the start pulse has a certain width and is shifted as shift data in the gate driver or source driver in synchronism with the clock signal. A logic circuit composed of an NAND gate and an inverter receives the start pulse and the shift data, the shift data being the output that is supplied after a predetermined delay from the last stage with respect to the shift direction. The output of the inverter is used to test scanning circuits. This provides a display device and a scanning circuit testing method, which enable the scanning circuits to be judged both surely and quickly, without increasing the area or complexity of the circuit.

Abstract: Lower level of data latch holding a digital image data and a positive selector arranged immediately above positive gradation voltage line, for selecting positive analog gradation voltage of positive gradation levels are take as a set, and upper level of data latch holding a digital image data and a negative selector arranged immediately above negative gradation voltage line, for selecting negative analog gradation voltage of negative gradation levels are take as a set. Two sets are arranged in alignment in vertical direction. A plurality of sets of vertically aligned sets are arranged horizontally to shorten a length in horizontal direction with respect to gradation voltage lines.

Abstract: A source driver circuit provides a source driving signal to a disconnected source line. The source driver circuit includes a shift register, a latch unit, a DAC unit, a buffer unit, and a source line repair circuit. A source line repair circuit receives a common voltage signal and a source driving signal corresponding to the disconnected source line, selects an amplifier having a same polarity type as a polarity type of an amplifier constituting the buffer unit in response to a source driving signal to provide an output signal of the selected amplifier to the disconnected source line. The source driver circuit includes the source line repair circuit which may select the amplifier having the same polarity as the polarity of the amplifier of the buffer, and thus may safely provide the source driving signal to the disconnected source line.

Abstract: A method of testing a drive circuit including a scan line drive circuit and a data line drive circuit for driving a display is disclosed. The display may include a plurality of scan lines and a plurality of data lines, each of said scan lines including an initial terminal coupled to said scan line drive circuit, each of said data lines including an initial terminal coupled to said data line drive circuit. The method includes: coupling each of said scan lines and each of said data lines to a first testing pad and a second testing pad respectively; sending a first testing signal to an input terminal of said scan line drive circuit and sending a second testing signal to an input terminal of said data line drive circuit; and testing at said first testing pad and said second testing pad respectively.

Abstract: A method of inspecting a display panel having a substrate and a plurality of fluorescent layers including measuring bright and dark signals reflected by the fluorescent layers while moving the substrate or an illuminating means generating the signals and an imaging means receiving the signals in a direction across the plurality of fluorescent layers at predetermined intervals, and measuring an application volume for each fluorescent layer from the signals obtained by the imaging means.

Abstract: An apparatus for testing a display device includes a display device to display test patterns, a graphic process unit to supply analog mode signals and digital mode signals to the display device, and a control unit to allow test patterns of an analog testing mode and test patterns of a digital testing mode to be sequentially displayed on the display device upon receiving a control signal from the graphic process unit, and to output a control signal to the display device to sequentially change display characteristics of an image according to an on-screen-display mode testing menus.

Abstract: A method and apparatus for implementing a video test generator having an overlay cursor and an associated scope trigger are presented. A user interface permits a user to move a cursor across a displayed image, and to select a scope trigger point in the analog video stream based on the location of the cursor in the displayed image. Video waveforms associated with particular image pixels of interest or groups of pixels are observed on an oscilloscope by placing the cursor over the subject pixels or pixels on the video display and using the derived scope trigger to time the capture of the video waveform on the oscilloscope. The cursor is generated by tracking the horizontal and vertical position of the cursor, and altering or substituting out the video signal where the pattern of the cursor should appear.

Abstract: An interface and a method for image data transmission that is used for data transmission through a plurality of data lines is described, the correctness of the transmitted data being checked by reference to control data. The checking capability is achieved in that at least one item of control data is transmitted through each data line.

Abstract: A method for testing overclock frequency of VGA includes the following steps. Step A is to receive a new clock parameter of a GPU and a new memory clock parameter, which determine the operation of the VGA. Step B is to make use of the clock parameter of the GPU and the memory clock parameter received from step A to set up the VGA through a software approach so that the VGA is operating with the clock parameters. Step C is to call three dimensional application program interfaces so that the VGA within the pre-defined time limit can execute to show a three dimensional picture in a window and output the three dimensional picture to the display connected to the VGA and executing the lighting instruction, create mesh instruction, object rotation instruction, spherical warp instruction and 3D immediate mode instruction so as to normally display the three dimensional picture.

Abstract: A display unit of which inspection process to inspect a connector for faulty connection can be automated. The display unit comprises a display section, a display driver IC among a plurality of types of display driver ICs capable of driving and controlling the display section, and an MPU sending a command and display data to the display driver IC. The display driver IC comprises an ID setting circuit and a command decoder decoding the command from the MPU. The MPU reads an ID information so as to control the display driver IC among a plurality of types of display driver ICs according to the corresponding control contents in the storage section among the plurality of types of control contents for a plurality of types of display driver ICs.