Flaw Detector Patents (Class 348/125)
  • Patent number: 11906445
    Abstract: Provided are embodiments for performing automated defect detection for a flexible member using image processing. The techniques include monitoring, by one or more sensors, a flexible member to obtain sensor data, converting the sensor data from the one or more sensors to image data, and receiving reference image data to compare to the image data. The techniques also include determining a defect based on the comparison and threshold setting information for the flexible member, and transmitting a notification based on the defect.
    Type: Grant
    Filed: December 6, 2018
    Date of Patent: February 20, 2024
    Assignee: GOODRICH CORPORATION
    Inventors: Basavaraja Kotyal Mahadevappa, Nitin Kumar Goyal, Shyam Sundar S. Iyer
  • Patent number: 11839746
    Abstract: A device captures images of a plurality of objects, such as a bottle and a syringe, for the secure production of medicinal preparations. The device includes at least one pair of image capturing cameras, arranged one facing the other; one reflective element for each of the cameras; and the two reflective elements of the same camera pair being arranged between the cameras and each oriented so as to reflect, in the direction of the associated camera, images of a production area of a medicinal preparation. The image capture device additionally includes: a stationary part formed by positioners that are designed to be secured against an enclosure of the medicinal preparation production area, a base which is intended to be secured to the stationary part, and a half-baseplate which is mounted such that it can rotate relative to the base, with the half-baseplate carrying at least one of the cameras.
    Type: Grant
    Filed: March 5, 2019
    Date of Patent: December 12, 2023
    Assignee: Eurekam
    Inventors: Gaël Le Baccon, Olivier Conan
  • Patent number: 11800066
    Abstract: Systems and methods are described where a ground control station in communication with a UAV can render a low latency (but possibly lossy), essentially real-time video captured by the UAV, or render a substantially lossless, reconstructed version of the video stream, depending upon a video latency period selected by a user. The user is able to select the desired video latency period, for example via the ground control station, and can change the video latency period as desired including in real-time as the UAV is in flight and capturing video.
    Type: Grant
    Filed: August 12, 2019
    Date of Patent: October 24, 2023
    Assignee: Sentera, Inc.
    Inventor: Brian Eickhoff
  • Patent number: 11769415
    Abstract: Methods, apparatus, systems and articles of manufacture are disclosed to validate data communicated by a vehicle. An example apparatus an anomaly detector to, in response to data communicated by a vehicle, at least one of compare an estimated speed with a reported speed or compare a location of the vehicle with a reported location. The apparatus including the anomaly detector further to generate an indication of the vehicle in response to the comparison. The apparatus further includes a notifier to discard data sent by the vehicle and notify surrounding vehicles of the data communicated by the vehicle.
    Type: Grant
    Filed: April 9, 2021
    Date of Patent: September 26, 2023
    Assignee: Intel Corporation
    Inventors: Liuyang Yang, Yair Yona, Moreno Ambrosin, Xiruo Liu, Hosein Nikopour, Shilpa Talwar, Kathiravetpillai Sivanesan, Sridhar Sharma, Debabani Choudhury, Kuilin Clark Chen, Jeffrey Ota, Justin Gottschlich
  • Patent number: 11747666
    Abstract: A windowing device includes: a windowing module including a dimming transparent substrate and a semiconductor temperature adjustment element, the dimming transparent substrate being provided with different light transmittances when the dimming transparent substrate has different adjustment parameters; a temperature adjustment circuitry configured to input a current to the semiconductor temperature adjustment element and adjust a temperature of the semiconductor temperature adjustment element; a temperature sensor configured to detect a temperature of an environment where the windowing module is located; and a controller configured to input a circuitry adjustment signal to the temperature adjustment circuitry when the temperature detected by the temperature sensor is beyond a predetermined temperature range, as to adjust a temperature of the dimming transparent substrate to be within the predetermined temperature range.
    Type: Grant
    Filed: March 26, 2021
    Date of Patent: September 5, 2023
    Assignees: BEIJING BOE SENSOR TECHNOLOGY CO., LTD., BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Yongbo Wang, Jing Yu, Chen Meng, Wei Sun, Zhong Hu, Dahai Hu
  • Patent number: 11705700
    Abstract: Electrical power cable preparation techniques to connect to cable accessories for use in a power grid are described. In an example, a system comprises a cross-section sensing module. The cross-section sensing module comprises a camera configured to capture at least one image of an end-face of an electrical cable, a housing configured to position the end-face of the electrical cable substantially perpendicular to an optical axis of the camera and at an imaging distance from the camera, and at least one optical marker configured to indicate a diameter of the electrical cable. The system further comprises an electrical cable preparation device configured to cut at least one layer of an electrical cable, and a computing device configured to display a user interface, the user interface configured to accept user inputs controlling at least one setting of the cross-section sensing module and electrical cable preparation device.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: July 18, 2023
    Assignees: 3M Innovative Properties Company, Connected Intelligence Systems Ltd.
    Inventors: Douglas B. Gundel, Assaf Kaufman, Uri Bar-Ziv
  • Patent number: 11676265
    Abstract: A method and an image processing device for mura detection on a display are proposed. The method includes the following steps. An original image of the display is received and segmented into region of interest (ROI) patches. A predetermined range of spatial frequency components are filtered out from the ROI patches to generate filtered ROI patches. A mura defect is identified from the display according to the filtered ROI patches and predetermined mura patterns.
    Type: Grant
    Filed: July 31, 2020
    Date of Patent: June 13, 2023
    Assignee: Novatek Microelectronics Corp.
    Inventors: Chih-Yu Chu, Po-Yuan Hsieh, Chieh-En Lee, Chung-Hao Tien, Shih-Hsuan Chen
  • Patent number: 11651481
    Abstract: Disclosed is a quaternion multi-degree-of-freedom neuron-based multispectral welding image recognition method, comprising: using three cameras having different wavebands to obtain multispectral weld pool images, and respectively performing pre-processing and edge extraction on the weld pool images having the different wavebands obtained at a same moment by the three cameras; establishing a quaternion-based multispectral weld pool image edge model; extracting low-frequency features after a quaternion discrete cosine transform; using a quaternion-based multi-degree-of-freedom neuron network to perform classification, training and recognition on edge features of the multispectral weld pool images. Compared to traditional means, the present invention has multiple recognition information sources, strong anti-interference capabilities and high recognition accuracy.
    Type: Grant
    Filed: October 28, 2020
    Date of Patent: May 16, 2023
    Assignee: NANTONG UNIVERSITY
    Inventors: Liang Hua, Hongkun Zhu, Yuqing Liu, Ling Jiang, Ran Chen, Kexin Shi
  • Patent number: 11645744
    Abstract: An inspection device includes: an analyzer to calculate a parameter representing a feature of image data of an object having no defect by performing dimensionality reduction on the image data, and perform dimensionality reduction on image data of an object to be inspected by using the parameter; a restorer to generate restored data obtained by restoring the image data of the object to be inspected subjected to the dimensionality reduction; a corrector to filter the restored data by using a filter for correcting an error between the restored data and the image data of the object to be inspected, thereby generating corrected restored data; a determiner to output a determination result indicating whether the object to be inspected is defective, based on a difference of each pixel between the image data of the object to be inspected and the corrected restored data; and an interface to output the determination result.
    Type: Grant
    Filed: December 6, 2016
    Date of Patent: May 9, 2023
    Assignee: Mitsubishi Electric Corporation
    Inventor: Kazuyuki Miyazawa
  • Patent number: 11633255
    Abstract: An image capturing and illumination system comprises a headband, a camera head mounted on the headband and having a camera lens defining a focal point, and a fiber-optic lens assembly for transmitting light therefrom. The fiber-optic lens assembly includes a pair of laterally spaced-apart lenses flanked on opposite sides of the camera lens for directing beams of light toward the focal point.
    Type: Grant
    Filed: September 29, 2020
    Date of Patent: April 25, 2023
    Assignee: SUNOPTIC TECHNOLOGIES LLC
    Inventors: Walter Orozco, Frank Robson, Brandon Closson
  • Patent number: 11632939
    Abstract: A system for external fish parasite monitoring in aquaculture, the system comprising: —a camera (52) suitable to be submerged in a sea pen suitable for containing fish, the camera being arranged for capturing images of the fish; and —an electronic image processing system (86) configured for identifying external fish parasites on the fish by analyzing the captured images, characterized by a camera and lighting rig (10) having a vertical support member (14), an upper boom (16) articulated to a top end of the support member (14) and carrying an upper lighting array (22), a lower boom (18) articulated to a lower end of the support member (14) and carrying a lower lighting array (24), and a housing (20) attached to the support member and carrying the camera (52), wherein the upper and lower lighting arrays (22, 44) are configured to illuminate, from above and from below, a target region inside a field of view of the camera (52).
    Type: Grant
    Filed: December 19, 2018
    Date of Patent: April 25, 2023
    Assignee: Intervet Inc.
    Inventors: Russel Howe, Zachary Lizer, James Wallace Sarrett, Peter Jon Abrahamson, Jascha Tucker Little
  • Patent number: 11635646
    Abstract: A detecting device and a detecting method thereof and a detecting apparatus are provided. The detecting device includes a stage, a light detection unit and a first, light, source, the stage includes a bearing surface for bearing an object to be detected, the light detection unit is located on a side of the stage, the first light source is located on a side of the stage that is opposite to the light detection unit, and light emitted from the, first light source is at least partially emitted to the light detection unit.
    Type: Grant
    Filed: January 14, 2019
    Date of Patent: April 25, 2023
    Assignees: FUZHOU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Jian Li, Nianren Wang, Yang Liu, Xuehuan Song, Tao Wu, Jian Wang, Qi Zhang, Qi Xu
  • Patent number: 11610484
    Abstract: A system includes a support, a sensor coupled to the support and arranged to output signals in a direction towards a haul road on which a machine traverses, an indicator coupled to the support, a first line coupled to the support, and a second line coupled to the support. Sensor data is received from the sensor, and based on the sensor data, a position of the machine on the haul road is determined. An alignment of the machine on the haul road is determined, where the alignment is associated with the machine maintaining contact with the first line and the second line. An indication is displayed for laterally aligning the machine on the haul road.
    Type: Grant
    Filed: November 30, 2021
    Date of Patent: March 21, 2023
    Assignee: Caterpillar Inc.
    Inventors: Christopher A. Willey, Eric Ruth, Zachary Carter
  • Patent number: 11555789
    Abstract: Methods of autonomous diagnostic verification and detection of defects in the optical components of a vision-based inspection system are provided. The method includes illuminating a light panel with a first light intensity pattern, capturing a first image of the first light intensity pattern with a sensor, illuminating the light panel with a second light intensity pattern different than the first light intensity pattern, capturing a second image of the second light intensity pattern with the sensor, comparing the first image and the second image to generate a comparison of images, and identifying defects in the light panel or the sensor based upon the comparison of images. Systems adapted to carry out the methods are provided as are other aspects.
    Type: Grant
    Filed: September 19, 2019
    Date of Patent: January 17, 2023
    Assignee: Siemens Healthcare Diagnostics Inc.
    Inventors: Yao-Jen Chang, Benjamin S. Pollack, Rayal Raj Prasad Nalam Venkat, Venkatesh NarasimhaMurthy
  • Patent number: 11538149
    Abstract: Provided is a spot detection device including an imager configured to capture a display panel displaying a first image of a first grayscale and a second image of a second grayscale different from the first grayscale and generate image data, and a spot detector configured to receive the image data from the imager in order to detect a spot. The image data includes first image data obtained by capturing the first image, second image data obtained by capturing the second image, and a plurality of third image data obtained by capturing portions of the first image.
    Type: Grant
    Filed: June 5, 2020
    Date of Patent: December 27, 2022
    Inventors: Seyun Kim, Hoisik Moon, Mingyu Kim, Sangcheol Park, Jae-Seok Choi
  • Patent number: 11408729
    Abstract: The disclosure provides a metrology system, comprising: a lens assembly configured to receive reflected light from a sample surface and split the reflected light into at least a first reflected beam and a second reflected beam; an imaging unit configured to receive the first reflected beam to generate imaging data of the sample surface, wherein the imaging data includes distribution information of at least one detection area located in at least one detection region of the sample; a film thickness measuring unit configured to receive the second reflected beam, and obtain film thickness data of a specified object in the detection area; and a processing unit, communicatively coupled to the imaging unit and the film thickness measuring unit, and configured to: determine a detection path of the at least one detection area based on the distribution information, and cause the film thickness measuring unit to obtain film thickness data of the detection area based on the detection path, wherein, on an optical path, sp
    Type: Grant
    Filed: January 22, 2018
    Date of Patent: August 9, 2022
    Assignee: Skyverse Technology Co., Ltd.
    Inventor: Lu Chen
  • Patent number: 11336866
    Abstract: This aircraft inspection support device includes a first imaging unit configured to capture a measurement information image displayed on a measurement instrument-side display unit of a specific measurement instrument associated with a model of an aircraft or an inspection target of an aircraft component, the measurement instrument-side display unit being configured to display measurement information on the inspection target, and an operator-side display unit configured to display the measurement information image so as to be visible to an inspection operator who is performing an inspection operation near the inspection target.
    Type: Grant
    Filed: October 17, 2019
    Date of Patent: May 17, 2022
    Assignee: Shimadzu Corporation
    Inventors: Hiroshi Horikawa, Hiroshi Yagi, Takashi Tanaka, Koji Morita, Hirotaka Sato, Masuto Kitamura
  • Patent number: 11295439
    Abstract: A method, a device and a computer program product for image processing are proposed. In the method, a first training image and region information are obtained. The region information indicates a region of a defect in the first training image. A second training image with the defect at least partially removed is generated using an image generator based on the first training image and the region information. The image generator is trained to recover the first training image by replacing pixels included in the region indicated by the region information. The image generator is updated based on the second training image. In this way, the image including the defect can be accurately and efficiently recovered.
    Type: Grant
    Filed: October 16, 2019
    Date of Patent: April 5, 2022
    Assignee: International Business Machines Corporation
    Inventors: Fan Li, Guo Qiang Hu, Jun Zhu, Sheng Nan Zhu, JingChang Huang, Yuan Yuan Ding, Peng Ji
  • Patent number: 11107206
    Abstract: In various embodiments, a defective pixel detection application automatically detects defective pixels in video content. In operation, the defective pixel detection application computes a first set of pixel intensity gradients based on a first frame of video content and a first neighborhood of pixels associated with a first pixel. The defective pixel detection application also computes a second set of pixel intensity gradients based on the first frame and a second neighborhood of pixels associated with the first pixel. Subsequently, the defective pixel detection application computes a statistical distance between the first set of pixel intensity gradients and the second set of pixel intensity gradients. The defective pixel detection application then determines that the first pixel is defective based on the statistical distance.
    Type: Grant
    Filed: September 26, 2018
    Date of Patent: August 31, 2021
    Assignee: NETFLIX, INC.
    Inventors: Subhabrata Bhattacharya, Adithya Prakash, Rohit Puri
  • Patent number: 11092555
    Abstract: A single-shot metrology for direct inspection of an entirety of the interior of an EUV vessel is provided. An EUV vessel including an inspection tool integrated with the EUV vessel is provided. During an inspection process, the inspection tool is moved into a primary focus region of the EUV vessel. While the inspection tool is disposed at the primary focus region and while providing a substantially uniform and constant light level to an interior of the EUV vessel by way of an illuminator, a panoramic image of an interior of the EUV vessel is captured by way of a single-shot of the inspection tool. Thereafter, a level of tin contamination on a plurality of components of the EUV vessel is quantified based on the panoramic image of the interior of the EUV vessel. The quantified level of contamination is compared to a KPI, and an OCAP may be implemented.
    Type: Grant
    Filed: July 20, 2020
    Date of Patent: August 17, 2021
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Chun-Lin Louis Chang, Shang-Chieh Chien, Shang-Ying Wu, Li-Kai Cheng, Tzung-Chi Fu, Bo-Tsun Liu, Li-Jui Chen, Po-Chung Cheng, Anthony Yen, Chia-Chen Chen
  • Patent number: 11080836
    Abstract: An appearance inspection system includes a setting part, a movement mechanism, and a control part. The setting part sets a route passing through a plurality of imaging positions in order. The setting part sets the route so that a first time necessary for the movement mechanism to move an imaging device from a first imaging position to a second imaging position among the plurality of imaging positions is longer than a second time necessary for a process of changing a first imaging condition corresponding to the first imaging position to a second imaging condition corresponding to the second imaging position by the control part. The control part starts the process of changing the first imaging condition to the second imaging condition earlier by the second time or more than a scheduled time at which the imaging device arrives at the second imaging position.
    Type: Grant
    Filed: January 18, 2019
    Date of Patent: August 3, 2021
    Assignee: OMRON Corporation
    Inventors: Yutaka Kato, Yasuhito Uetsuji
  • Patent number: 11037286
    Abstract: There are provided a classifier and a method of classifying defects in a semiconductor specimen. The classifier enables assigning each class to a classification group among three or more classification groups with different priorities. Classifier further enables setting purity, accuracy and/or extraction requirements separately for each class, and optimizing the classification results in accordance with per-class requirements. During training, the classifier is configured to generate a classification rule enabling the highest possible contribution of automated classification while meeting per-class quality requirements defined for each class.
    Type: Grant
    Filed: September 28, 2017
    Date of Patent: June 15, 2021
    Assignee: Applied Materials Israel Ltd.
    Inventors: Assaf Asbag, Ohad Shaubi, Kirill Savchenko, Shiran Gan-Or, Boaz Cohen, Zeev Zohar
  • Patent number: 10984523
    Abstract: A seam inspection apparatus can automatically determine the quality of an image of a seam of a sewn product. The seam inspection apparatus includes an image data acquisition unit that acquires image data of a seam of a sewn product, a feature extraction unit that extracts a feature quantity of the seam from the image data of the seam of the sewn product acquired by the image data acquisition unit, and a quality determination unit that performs quality determination of the seam based on the feature quantity of the seam.
    Type: Grant
    Filed: May 28, 2019
    Date of Patent: April 20, 2021
    Assignee: FANUC CORPORATION
    Inventor: Kenji Takahashi
  • Patent number: 10947663
    Abstract: A seam inspection device includes an imaging device and a processing device. The imaging device shoots a sewing object supported by a throat plate of a sewing machine and having seams formed therein. And the processing device detects an abnormality of the seam based on an image of the sewing object acquired by the imaging device.
    Type: Grant
    Filed: March 14, 2019
    Date of Patent: March 16, 2021
    Assignee: JUKI CORPORATION
    Inventors: Kimiko Fujie, Koji Hiraoka
  • Patent number: 10937144
    Abstract: One aspect provides a method, including: operating a mobile pipe inspection platform to obtain sensor data for the interior of a pipe; analyzing, using a processor, the sensor data using a trained model, where the trained model is trained using a dataset including sensor data of pipe interiors and one or more of: metadata identifying pipe feature locations contained within the sensor data of the dataset and metadata classifying pipe features contained within the sensor data of the dataset; performing one or more of: identifying, using a processor, a pipe feature location within the sensor data; and classifying, using a processor, a pipe feature of the sensor data; and thereafter producing, using a processor, an output including one or more of an indication of the identifying and an indication of the classifying. Other aspects are described and claimed.
    Type: Grant
    Filed: November 8, 2018
    Date of Patent: March 2, 2021
    Assignee: RedZone Robotics, Inc.
    Inventors: Justin Starr, Galin Konakchiev, Foster J Salotti, Mark Jordan, Nate Alford, Thorin Tobiassen, Todd Kueny, Jason Mizgorski
  • Patent number: 10930037
    Abstract: An image processing device including an object detection unit for detecting one or more images of objects from an input picture image, on the basis of a model pattern of the object, and a detection result display unit for graphically superimposing and displaying a detection result. The detection result display unit includes a first frame for displaying the entire input picture image and a second frame for listing and displaying one or more partial picture images each including an image detected. In the input picture image displayed in the first frame, a detection result is superimposed and displayed on all the detected images, and in the partial picture image displayed in the second frame, a detection result of an image corresponding to each partial picture image is superimposed and displayed.
    Type: Grant
    Filed: February 24, 2017
    Date of Patent: February 23, 2021
    Assignee: Fanuc Corporation
    Inventors: Yuta Namiki, Fumikazu Warashina
  • Patent number: 10922519
    Abstract: A method of detecting a texture includes: in each of a plurality of time periods included in a texture detection phase, forming a light-shielding region in a light transmitting hole forming layer, wherein the light-shielding region only includes a part of a plurality of light transmitting holes, and imaging regions of a texture to be detected on a photosensitive sensing layer through the light transmitting hole forming layer do not overlap; in different time periods of the plurality of time periods, positions of parts of the plurality of light transmitting holes included in the light-shielding regions are different; and splicing images of the texture to be detected formed on the photosensitive sensing layer in the plurality of time periods together.
    Type: Grant
    Filed: January 30, 2018
    Date of Patent: February 16, 2021
    Assignee: BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Xiaoliang Ding, Haisheng Wang, Chun Wei Wu, Yingming Liu, Rui Xu, Wei Liu
  • Patent number: 10916005
    Abstract: Systems, methods, and related technologies for automated inspection are described. In certain aspects, one or more images of a reference part can be captured and the one or more images of the reference part can be processed to generate an inspection model of the reference part. One or more regions of the inspection model can be associated with one or more analysis parameters. An inspection plan can be generated based on the inspection model and the one or more analysis parameters. Based on the inspection plan, one or more images of a part to be inspected can be captured and the one or more images of the part can be processed in relation to the analysis parameters to compute one or more determinations with respect to the part. One or more outputs can be providing based on the one or more determinations.
    Type: Grant
    Filed: November 24, 2015
    Date of Patent: February 9, 2021
    Assignee: Kitov Systems Ltd
    Inventors: Nir Avrahami, Joseph Rubner
  • Patent number: 10906676
    Abstract: A processing plant, in particular for making respective products, in particular defined by articles or packages of respective articles, the articles being preferably in the form of articles of the tissue industry, the plant including at least one unit for detecting products, in particular defective products, especially defective articles and/or packages, preferably for detecting defective rolls and/or packs.
    Type: Grant
    Filed: February 25, 2016
    Date of Patent: February 2, 2021
    Assignee: PULSAR S.R.L.
    Inventor: Massimo Franzaroli
  • Patent number: 10903098
    Abstract: There is provided a technique that includes a first controller configured to acquire event data generated at a time of transferring a substrate and alarm data generated at a time of occurrence of a transfer error, a recorder configured to, while recording a transfer operation of the substrate as first image data, record the transfer operation of the substrate as second image data having a higher resolution than the first image data, a second controller configured to store the first image data in a first memory based on the event data, and store the second image data in a second memory based on the alarm data, and an operating controller configured to display at least the first image data and the second image data. The second controller displays both the first image data and the second image data on a same screen.
    Type: Grant
    Filed: July 30, 2019
    Date of Patent: January 26, 2021
    Assignee: KOKUSAI ELECTRIC CORPORATION
    Inventors: Akihiko Yoneda, Kazuhide Asai, Tetsuyuki Maeda, Naoya Miyashita, Nobuyuki Miyakawa, Tadashi Okazaki, Hideo Yanase
  • Patent number: 10890747
    Abstract: A magnifying observation apparatus obtains a plurality of first luminance images by controlling an illumination section so as to illuminate an observation target with illumination light from a first illumination direction and controlling a change section and an imaging section so as to image the observation target, obtains a plurality of second luminance images by controlling the illumination section so as to illuminate the observation target with illumination light from a second illumination direction symmetric with the first illumination direction about an optical axis and controlling the change section and the imaging section so as to image the observation target in a plurality of different focal positions, and generates a roughness enhancement image that enhances roughness on the surface of the observation target by applying depth synthesis and roughness enhancement.
    Type: Grant
    Filed: October 8, 2019
    Date of Patent: January 12, 2021
    Assignee: KEYENCE CORPORATION
    Inventors: Woobum Kang, Hayato Ohba
  • Patent number: 10881316
    Abstract: A method for automatically determining the 3D position and orientation of a radio-opaque medical object in a living body using single-plane fluoroscopy comprising: (a) capturing a stream of digitized 2D images from a single-plane fluoroscope; (b) detecting an image of the medical object in a subset of the digital 2D images; (c) applying to the digital 2D images calculations which preserve original pixel intensity values and permit statistical calculations thereon, using (i) multiple sequential determinations of a midline of the medical object image, (ii) a plurality of unfiltered raw-data cross-sectional intensity profiles perpendicular to each sequentially-determined midline, (iii) removal of outlier profiles from each plurality of profiles, and (iv) statistically combining each plurality of profiles to estimate image dimensions; (d) applying conical projection and radial elongation corrections to the image measurements; and (e) calculating the 3D position and orientation of the medical object from the corre
    Type: Grant
    Filed: March 19, 2018
    Date of Patent: January 5, 2021
    Assignee: APN Health, LLC
    Inventors: Jasbir Sra, Barry Belanger, Mark Palma, Donald Brodnick, Bruce Langenbach
  • Patent number: 10879135
    Abstract: A method for inline inspection during semiconductor wafer fabrication is provided. The method includes forming a plurality of test structures on a semiconductor wafer along two opposite directions. An offset distance between a sample feature and a target feature of each of the test structures increases gradually along the two opposite directions. The method further includes producing an image of the test structures. The method also includes performing image analysis of the image to recognize a position with an extreme of a gray level. In addition, the method includes calculating an overlay error according to the recognized position.
    Type: Grant
    Filed: December 16, 2019
    Date of Patent: December 29, 2020
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD
    Inventors: Shang-Wei Fang, Jing-Sen Wang, Yuan-Yao Chang, Wei-Ray Lin, Ting-Hua Hsieh, Pei-Hsuan Lee, Yu-Hsuan Huang
  • Patent number: 10796192
    Abstract: The present disclosure generally relates to automated detection of railroad track features. Images of a railroad track are captured and analyzed to identify track features such as anchors, spikes, rail ties, tie plates, and joints. Various image processing techniques are utilized to accurately distinguish between track features and other objects in the captured images. Track features identified in the images are assigned identifiers and locations and stored in a database so that a status and/or condition of the track features may be monitored for maintenance purposes.
    Type: Grant
    Filed: March 22, 2018
    Date of Patent: October 6, 2020
    Assignee: HARSCO TECHNOLOGIES LLC
    Inventor: Javier Fernandez
  • Patent number: 10766135
    Abstract: A teach pendant for teaching a robot includes an operation unit disposed on a first surface of the teach pendant, to perform an input operation; a display unit disposed on the first surface; and a camera disposed on a second surface opposite the first surface of the teach pendant. An image captured by the camera is displayed on the display unit.
    Type: Grant
    Filed: November 21, 2018
    Date of Patent: September 8, 2020
    Assignee: Fanuc Corporation
    Inventors: Norimitsu Uemura, Masaaki Uematsu
  • Patent number: 10761035
    Abstract: This diagnosis support apparatus is a diagnosis support apparatus of a vacuum degassing tank having an immersion tube that extends downward, the diagnosis support apparatus including a camera that is configured to capture an image of an inner circumferential surface of an immersion tube seen from below at an angle in a state of being disposed outside the inner circumferential surface of the immersion tube in a plan view and acquire the image as data and an image processor that is configured to be connected to the camera and carry out image-processing of the data.
    Type: Grant
    Filed: December 6, 2017
    Date of Patent: September 1, 2020
    Assignee: NIPPON STEEL CORPORATION
    Inventors: Susumu Kudo, Michio Nitta, Masaki Miyashita, Seiya Fujita, Naoki Watabe
  • Patent number: 10746536
    Abstract: There is provided an optical displacement meter capable of accurately measuring a profile of a measurement object even when multiple reflections are caused. At the time of setting, reference data indicating a reference profile of a measurement object is registered by a registration unit, and a mask region is set to the reference data by a setting unit. At the time of measurement, reflected light from the measurement object is received by a light receiving unit, and a peak in an output light receiving amount distribution is detected by a peak detection unit. Temporary profile data of the measurement object is generated by a profile generation unit based on a position of the detected peak. A position of the mask region for the temporary profile is corrected by a correction unit.
    Type: Grant
    Filed: July 16, 2019
    Date of Patent: August 18, 2020
    Assignee: Keyence Corporation
    Inventor: Yoshitaka Tsuchida
  • Patent number: 10748274
    Abstract: A computer-implemented method of automatically locating a portion of interest in image or matrix data derived from an item under consideration includes: identifying parts of the image or matrix data that satisfy a preset threshold as objects which are possibly parts of the portion of the interest; applying at least one preselected filter to the data corresponding to the objects to find a set of objects consisting of the objects most likely to be part of the portion of interest; sorting the objects of the set into clusters according to a predefined criterion; and using a known characteristic of the portion of interest to identify which one of the clusters corresponds to the portion of interest.
    Type: Grant
    Filed: February 21, 2018
    Date of Patent: August 18, 2020
    Assignee: FUJITSU LIMITED
    Inventor: Joseph Townsend
  • Patent number: 10714667
    Abstract: A method of manufacturing a light emitting device includes forming light emitting devices on a support portion, each of the light emitting devices including first to third light emitting cells respectively emitting light of different colors; supplying test power to at least a portion of the light emitting devices using a multi-probe; acquiring an image from the light emitted from the portion of the light emitting devices to which the test power is supplied using an image sensor; identifying normal light emitting devices of the portion of the light emitting devices by determining whether a defect is present in each of the light emitting devices of the portion of the light emitting devices by comparing the image acquired by the image sensor with a reference image; and based on the identifying step, measuring optical characteristics of each of the light emitting devices identified as normal of the portion of the light emitting devices.
    Type: Grant
    Filed: June 27, 2018
    Date of Patent: July 14, 2020
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hye Seok Noh, Young Jin Choi, Yong Il Kim, Han Kyu Seong, Dong Gun Lee, Jin Sub Lee
  • Patent number: 10707109
    Abstract: A substrate processing apparatus includes carry in/out station, transfer station, processing station, and image capturing unit. The carry in/out station includes first conveyance device that takes out and conveys substrate from cassette. The transfer station is disposed adjacent to the carry in/out station, and includes substrate placement unit on which the substrate conveyed by the first conveyance device is placed. The processing station is disposed adjacent to the transfer station, and includes second conveyance device that takes out and conveys the substrate from the substrate placement unit, and a plurality of processing units that processes the substrate conveyed by the second conveyance device. The image capturing unit is disposed in the transfer station, and captures an image of the peripheral edge portion of one of the upper and lower surfaces of the substrate and the end surface of the substrate.
    Type: Grant
    Filed: September 21, 2018
    Date of Patent: July 7, 2020
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Satoshi Morita, Ryoji Ikebe, Yasuaki Noda, Norihisa Koga, Keisuke Hamamoto, Masato Hosaka
  • Patent number: 10699408
    Abstract: A tree examining system is provided which employs a thermographic image which electronically differentiates individual areas of a total area of a tree by areas according to temperature differential. Pixels in individual areas determined as abnormal are assigned a color which differentiates them from adjacent areas determined as normal. A displayable colorized image thereby produced provides a map viewable by a user to cut or trim the tree to remove the abnormal areas shown colorized therein.
    Type: Grant
    Filed: April 18, 2019
    Date of Patent: June 30, 2020
    Inventor: David Brown
  • Patent number: 10699402
    Abstract: To provide a fabric type identifying apparatus and a fabric type identifying method enabling to stably identify a type of fabric with high accuracy. A fabric type identifying apparatus A for identifying a type of a fabric F provided with a color thread T at an edge portion includes a camera 51 for photographing the fabric F, and an image processing apparatus 52 for receiving an image input and photographed by the camera 51. The image processing apparatus 52 acquires a color value of the color thread T from the received image of the fabric F, and identifies the type of the fabric F on a basis of the color value. Since the type of the fabric F is identified on the basis of the color of the color thread T, the type of the fabric F is enabled to be stably identified with high accuracy regardless of stretching and shrinking of the fabric F.
    Type: Grant
    Filed: October 21, 2016
    Date of Patent: June 30, 2020
    Assignee: PUREX CO., LTD.
    Inventor: Yasuhiko Enami
  • Patent number: 10685432
    Abstract: An apparatus and a method are disclosed, each of which applies a plurality of different spatial filters to one input image to generate a plurality of filtered images; calculates, for each of a plurality of pixels included in each of the plurality of filtered image, a score indicating a value determined by a difference from a corresponding one of a plurality of model groups, using the plurality of model groups that respectively correspond to the plurality of filtered images and each including one or more models having a parameter representing a target shape; calculates an integrated score indicating a result of integrating the scores of the respective plurality of pixels corresponding to each other over the plurality of filtered images; and determines an abnormality based on the integrated score.
    Type: Grant
    Filed: January 16, 2018
    Date of Patent: June 16, 2020
    Assignee: Ricoh Company, Ltd.
    Inventors: Ryosuke Kasahara, Takuya Tanaka
  • Patent number: 10681296
    Abstract: In various embodiments, methods and related apparatuses for sealing down pixel sizes in quantum film-based image sensors are disclosed. In one embodiment, an image sensor circuit is disclosed that includes circuit includes an optically sensitive layer, a first pixel having a first electrode coupled to a first region of optically sensitive layer, a second pixel having a second electrode coupled to a second region of optically sensitive layer, and a readout circuit having at least one transistor that is shared among the first pixel and the second pixel. In a first time interval, the transistor is used in a readout of a signal related to illumination of the first pixel over an integration period. During a second time interval, the transistor is used in a readout of a signal related to illumination of the second pixel over an integration pixel. The signals thusly read constitute a time-domain multiplexed (TDM) signal.
    Type: Grant
    Filed: May 24, 2018
    Date of Patent: June 9, 2020
    Assignee: INVISAGE TECHNOLOGIES, INC.
    Inventors: Emanuele Mandelli, Dario Clocchiatti, Aurelien Philippe Bouvier
  • Patent number: 10679055
    Abstract: A system and methods for radiometric anomaly detection using non-target clustering, wherein a hierarchy generator organizes the image information content into a hierarchical data representation structure, and a non-target clustering engine processes the hierarchical model to identify large homogeneous regions and significantly dissimilar smaller regions within them based on search criteria.
    Type: Grant
    Filed: November 3, 2017
    Date of Patent: June 9, 2020
    Assignee: DIGITALGLOBE, INC.
    Inventors: Georgios Ouzounis, Kostas Stamatiou
  • Patent number: 10670497
    Abstract: Device and method for analysis of tyres are presented. The device includes a support frame, a flange, and first/second image acquisition systems. According to one aspect, the first acquisition system is two-dimensional and includes a first camera having a first optical axis, a first focal plane, a first focal point, and a first depth of field, and a first illumination system that illuminates around the first focal point. According to another aspect, the second image acquisition system is three-dimensional and includes a second camera having a second optical axis, a second focal plane, and a second depth of field, and a second illumination system. A translation plane, substantially orthogonal to the first optical axis, is defined by the first focal point, and an intersection between the second optical axis and the second depth of field.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: June 2, 2020
    Assignee: PIRELLI TYRE S.P.A
    Inventors: Alessandro Held, Vincenzo Boffa, Fabio Regoli, Valeriano Ballardini, Giuseppe Casadio Tozzi
  • Patent number: 10672116
    Abstract: A substrate inspection system and substrate inspection method for setting an inspection region having a three-dimensional shape and/or a two-dimensional arbitrary shape as a region of interest on an image of a substrate. The substrate inspection method includes: generating and displaying a 2D image of a substrate based on image data acquired from the substrate having an inspection object; receiving first input information including arbitrary point data or line data for setting a region of interest at a plurality of particular positions of the 2D image from a user; and displaying the region of interest corresponding to the point data or the line data as a 2D region of interest having an arbitrary shape in accordance with the first input information.
    Type: Grant
    Filed: January 29, 2016
    Date of Patent: June 2, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Ae Seo, Yeon Hee Lee, Won Mi Ahn, Hye In Lee, Jong Hui Lee
  • Patent number: 10621406
    Abstract: A method of sorting is described, and which includes providing a product stream formed of individual objects of interest having feature aspects which can be detected; generating multiple images of each of the respective objects of interest; classifying the feature aspects of the objects of interest; identifying complementary images by analyzing some of the multiplicity of images; fusing the complementary images to form an aggregated region representation of the complementary images; and sorting the respective objects of interest based at least in part upon the aggregated region representation which is formed.
    Type: Grant
    Filed: September 15, 2017
    Date of Patent: April 14, 2020
    Assignee: Key Technology, Inc.
    Inventors: Peter Lodewyckx, Marc Van Daele, Timothy Justice
  • Patent number: 10616558
    Abstract: A 3D track assessment method is disclosed for identifying and assessing features of a railway track bed based on 3D elevation and intensity data gathered from the railway track bed.
    Type: Grant
    Filed: July 19, 2019
    Date of Patent: April 7, 2020
    Assignee: TETRA TECH, INC.
    Inventor: Darel Mesher
  • Patent number: 10616556
    Abstract: A 3D track assessment method is disclosed for identifying and assessing features of a railway track bed based on 3D elevation and intensity data gathered from the railway track bed.
    Type: Grant
    Filed: July 19, 2019
    Date of Patent: April 7, 2020
    Assignee: TETRA TECH, INC.
    Inventor: Darel Mesher