By Specular Reflection Patents (Class 356/612)
  • Patent number: 11789326
    Abstract: A display device includes a backlight module and a display panel. The display panel is disposed on the backlight module and includes two substrates, a sensor, and a light-shielding element. The sensor is disposed between the two substrates. The light-shielding element at least partially surrounds the sensor. A height of the light-shielding element is greater than a height of the sensor.
    Type: Grant
    Filed: February 11, 2022
    Date of Patent: October 17, 2023
    Assignee: Innolux Corporation
    Inventors: Hsiao Feng Liao, Shu-Fen Li, Chuan-Chi Chien, Po-Yang Chen, I-An Yao
  • Patent number: 11717042
    Abstract: Techniques for generating and using digital markups on digital images are presented. In an embodiment, a method comprises receiving, at an electronic device, a digital layout image that represents a form of a product for manufacturing a reference product; generating a digital markup layout by overlaying the digital markup image over the digital layout image; based on the digital markup layout, generating one or more manufacturing files comprising digital data for manufacturing the reference product; receiving a digital reference image of the reference product manufactured based on the one or more manufacturing files; identifying one or more found markup regions in the digital reference image; based on the found markup regions, generating a geometry map and an interactive asset image; based on, at least in part, the geometry map, generating a customized product image by applying a user pattern to the interactive asset image.
    Type: Grant
    Filed: July 23, 2021
    Date of Patent: August 8, 2023
    Assignee: ZAZZLE, INC.
    Inventor: Young Harvill
  • Patent number: 11635295
    Abstract: A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.
    Type: Grant
    Filed: February 13, 2020
    Date of Patent: April 25, 2023
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno, Akio Yazaki
  • Patent number: 11525923
    Abstract: Real-time three-dimensional (3D) map building method and device using a 3D lidar includes representing 3D map data of a surrounding environment acquired by using a 3D lidar attached to a moving object as voxels, acquiring an eigenvalue and an eigenvector for each voxel based on all 3D points in a 3D map represented as the voxels, detecting a 3D corresponding point in the voxel corresponding to all the 3D points of 3D data newly acquired by using the 3D lidar while the moving object travels, calculating a rotation transformation and a translation transformation for minimizing an error by minimizing an inner product value between the eigenvector weighted by the eigenvalue of the voxel to which the 3D corresponding point belongs and a vector generated from a 3D corresponding point, and updating the 3D map data based on the rotation transformation and the translation transformation.
    Type: Grant
    Filed: September 10, 2019
    Date of Patent: December 13, 2022
    Assignee: A.M.AUTONOMY CO., LTD.
    Inventor: Yongdeuk Shin
  • Patent number: 11525897
    Abstract: A light deflection system for a LIDAR system on an aerial vehicle and method of use are herein disclosed. The light deflection system includes a light deflection element having a first end and a second end. The light deflection element is rotatable and balanced about an axis extending from the first end to the second end. The light deflection element has a first side with a first reflective surface at a first angle in relation to the axis and deflects light in a nadir direction relative to the aerial vehicle. The light deflection element also has a second side having a second reflective surface at a second angle in relation to the axis. The first angle is different from the second angle and configured to deflective light at an oblique angle relative to the aerial vehicle.
    Type: Grant
    Filed: November 25, 2019
    Date of Patent: December 13, 2022
    Assignee: Pictometry International Corp.
    Inventor: Stephen L. Schultz
  • Patent number: 11487210
    Abstract: A method includes: providing a workpiece to a semiconductor apparatus, the workpiece comprising a material layer, wherein the material layer includes a plurality of areas extending along a first axis; scanning the workpiece in a first direction along the first axis to generate first topography measurement data; scanning the workpiece in a second direction along the first axis to generate second topography measurement data; and performing an exposure operation on the material layer according to the first topography measurement data and the second topography measurement data.
    Type: Grant
    Filed: August 12, 2021
    Date of Patent: November 1, 2022
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Yung-Yao Lee, Yeh-Chin Wang, Yang-Ann Chu, Yung-Hsiang Chen, Yung-Cheng Chen
  • Patent number: 11474205
    Abstract: An electronic device is provided. An electronic device includes a sensor, a display including a first surface and a second surface, a rear linear polarizer disposed at a front surface of the sensor module, a rear phase difference film disposed between a front surface of the rear linear polarizer and the second surface of the display, a front phase difference film disposed at the first surface of the display at a position corresponding to a location of the sensor, a front linear polarizer disposed at a front surface of the front phase difference film, and a front plate disposed at a front surface of the front linear polarizer.
    Type: Grant
    Filed: April 14, 2020
    Date of Patent: October 18, 2022
    Inventors: Il Kim, Hyeongsoon Park, Jeonggyu Jo, Dareum Kang, Chohee Park, Seongwoo Choi
  • Patent number: 11443486
    Abstract: An arrangement for obtaining body measurements of a person includes a garment configured to be form fitted to the person, a reference target, and a handheld digital camera. A surface of the garment includes a plurality of first fiducials which are photogrammetrically analyzable. The reference target includes a plurality of second fiducials that are photogrammetrically analyzable. The plurality of second fiducials on the reference target facilitate producing a 3D model true to scale and in a recognized orientation to a surface on which the person is standing. The handheld digital camera acquires a plurality of successive images of the garment and reference target as the digital camera is moved around the person. A computer processes the plurality images by methods of photogrammetry to produce a 3D model of the body. A portable stabilization device may be held by the person to reduce movement and control arm spacing during image acquisition.
    Type: Grant
    Filed: August 28, 2019
    Date of Patent: September 13, 2022
    Assignee: SIZE STREAM LLC
    Inventors: David Allen Bruner, Stephen Philip Christie, Jerry Michael King, Ryan Matthew Matis, Mark Elliott Neumann, Susan Leigh Simon, Bryan William Taylor, Warren Peter Wright
  • Patent number: 11361584
    Abstract: A fingerprint identification device, a touch display panel and a method for controlling fingerprint identification are provided in embodiments of the disclosure. The fingerprint identification device includes: a photoelectric sensor; and an optical waveguide, arranged on a touch substrate at another side, and configured to be in touch with a fingerprint, and comprising waveguide material portions and medium material portions, each of the waveguide material portions and each of the medium material portions being spaced apart from each other; and a light irradiating into the waveguide material portions is delivered to the surface(s) of the waveguide material portions facing away from the touch substrate after total reflections at interfaces between the medium material portions and the waveguide material portions.
    Type: Grant
    Filed: October 19, 2017
    Date of Patent: June 14, 2022
    Assignee: BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Jifeng Tan, Yafeng Yang
  • Patent number: 11047675
    Abstract: Disclosed are a method and an apparatus for inspection of workpieces and products having curved and, in particular, spherical surfaces. The method is based on scanning inspected objects with a narrow probing beam of electromagnetic radiation and concurrently measuring the radiation scattered on the surface. The method and apparatus improve the detectability of features and imperfections on inspected surfaces by providing invariable parameters and conditions of scanning, robust mechanical stability of scanning systems, high positioning accuracy of the probing electromagnetic beam and efficient collection of the scattered radiation. The apparatus allows surface defect classification, determining defect dimensions and convenient automation of inspection.
    Type: Grant
    Filed: May 27, 2019
    Date of Patent: June 29, 2021
    Inventors: Valerie Peidous, Vassili Peidous, Nina Peydus
  • Patent number: 10761318
    Abstract: Provided is a mirror device including a mirror which is supported to be flappable around a fast axis and supported to be flappable around a slow axis and in which a resonance frequency of flapping thereof with respect to the fast axis is a first value and a resonance frequency of the flapping thereof with respect to the slow axis is a second value lower than the first value; a signal extracting portion configured to obtain from a slow axis coil a synthesized signal including an induced signal generated in the slow axis coil due to an operation of flapping the mirror around the fast axis and configured to extract the induced signal from the synthesized signal; and a signal generating portion configured to generates a driving signal so that the flapping of the mirror with respect to the fast axis is in a resonance state according to the induced signal.
    Type: Grant
    Filed: March 16, 2017
    Date of Patent: September 1, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventor: Akira Takahashi
  • Patent number: 10387712
    Abstract: A display panel and a display apparatus are provided. The display panel includes: an organic light emitting display panel including an array substrate and organic light emitting configurations disposed on the array substrate; a fingerprint identification module arranged in a display region and arranged at a side facing away from the organic light emitting configurations of the array substrate; an angle limiting film arranged between the organic light emitting display panel and the fingerprint identification module. The fingerprint identification module includes a first substrate, at least one fingerprint identification unit for performing fingerprint identification according to light rays reflected, through a touch body, on the fingerprint identification unit.
    Type: Grant
    Filed: November 14, 2017
    Date of Patent: August 20, 2019
    Assignee: SHANGHAI TIANMA MICRO-ELECTRONICS CO., LTD.
    Inventors: Yang Zeng, Qing Zhang, Lihua Wang, Liang Xie, Lingxiao Du, Hong Ding, Huiping Chai, Kang Yang, Qijun Yao
  • Patent number: 10227171
    Abstract: The present disclosure relates generally to systems and methods for creating protective packaging. A device comprises a processor and a memory. The memory contains computer readable instructions that, when executed by the processor, cause the processor to receive, from an external sensor, data that is indicative of physical characteristics for an object to be packaged, determine a type of object to which the object to be packaged corresponds based on the physical characteristics, select one or more type of packaging elements for packaging the object based on the type of object, and cause a packaging machine to create packaging elements of the selected type.
    Type: Grant
    Filed: December 23, 2016
    Date of Patent: March 12, 2019
    Assignee: PREGIS INTELLIPACK LLC
    Inventors: Thomas D. Wetsch, George Bertram, Edward Eisenberger
  • Patent number: 10161796
    Abstract: An LED lighting based multispectral imaging system for color measurement is provided, including a main control computer and an enclosed type lamp box, where a digital camera is provided at the top of the lamp box, and an LED lamp set control apparatus, a drawer type bearing platform, and an LED lamp set are provided at the bottom of the lamp box. A to-be-measured object is placed on the drawer type bearing platform. The main control computer controls spectral power distribution of the LED lamp set to be in a reciprocal relationship with a spectral sensitivity curve of the digital camera and extracts a camera response and performs calculation, to obtain spectral reflectivity of each pixel of the to-be-measured object.
    Type: Grant
    Filed: June 22, 2018
    Date of Patent: December 25, 2018
    Assignee: Wenzhou University
    Inventors: Guihua Cui, Xiukai Ruan, Qibo Cai, Yanhua Tan, Wenbin Xie, Jinjin Chu, Yaowu Liu, Ting Xu, Yaoju Zhang, Haiyong Zhu, Yuxing Dai
  • Patent number: 9919425
    Abstract: An autonomous robot comprises a robot body, a drive configured to propel the robot, a sensor system disposed on the robot body, and a navigation controller circuit in communication with the drive and the sensor system. The sensor system comprises at least one proximity sensor comprising a sensor body, and a first emitter, a second emitter and a receiver housed by the sensor body, wherein the receiver detects objects in a bounded detection volume of the receiver field of view aimed outward and downward beyond a periphery of the robot body. The receiver is disposed above and between the first and second emitters, the emitters having a twice-reshaped emission beams angled upward to intersect the receiver field of view at a fixed range of distances from the periphery of the robot body to define the bounded detection volume.
    Type: Grant
    Filed: July 1, 2015
    Date of Patent: March 20, 2018
    Assignee: iRobot Corporation
    Inventors: Tom Bushman, James Herman, Seth Blitzblau, Nathan J. Deschaine, Andrew Scott Reichel
  • Patent number: 9784838
    Abstract: A scanning device includes a scanner, which includes a base and a gimbal, mounted within the base so as to rotate relative to the base about a first axis. A receive mirror is mounted within the gimbal so as to rotate about a second axis, perpendicular to the first axis. A detector is mounted on the gimbal so as to rotate with the gimbal about the first axis and receive light reflected from the receive mirror while the receive mirror rotates about the second axis. A collection lens is mounted on the gimbal so as to rotate with the gimbal about the first axis while collecting the light so as to focus the light onto the detector by reflection from the receive mirror while the receive mirror rotates about the second axis.
    Type: Grant
    Filed: November 26, 2014
    Date of Patent: October 10, 2017
    Assignee: APPLE INC.
    Inventors: Alexander Shpunt, Noel Axelrod, Raviv Erlich, Yuval Gerson
  • Patent number: 9329027
    Abstract: A measuring unit is set up to determine a relative position and relative orientation between the measuring unit and an arrangement of at least three optical elements. The measuring unit comprises a length measuring device, which emits measuring beams at at least three locations spaced apart from one another, and at least one beam directing device set up to direct the measuring beams to optical elements of the arrangement. The beam directing device is controllable in order to guide at least one of the measuring beams to a plurality of optical elements of the arrangement in a time-sequential manner in order to carry out a plurality of length measuring operations in a time-sequential manner in such a manner that, in the plurality of length measuring operations, each measuring beam of the at least one measuring beam strikes precisely one of the optical elements. A total of six lengths are measured in this manner.
    Type: Grant
    Filed: July 26, 2011
    Date of Patent: May 3, 2016
    Assignee: Carl Zeiss AG
    Inventors: Oliver Schmidt, Christian Koos, Bernd Spruck, Frank Höller
  • Patent number: 9115982
    Abstract: An interchangeable chromatic range sensor (CRS) probe for a coordinate measuring machine (CMM). The CRS probe is capable of being automatically connected to a CMM under program control. In one embodiment, in order to make the CRS probe compatible with a standard CMM auto exchange joint, all CRS measurement light transmitting and receiving elements (e.g., the light source, wavelength detector, optical pen, etc.) are included in the CRS probe assembly. The CRS probe assembly also includes an auto exchange joint element that is attachable through a standard auto exchange joint connection to a CMM. In one embodiment, in order to provide the required signals through the limited number of connections of the standard CMM auto exchange joint (e.g., 13 pins), a low voltage differential signaling (LVDS) serializer may be utilized for providing additional control and data signals on two signal lines.
    Type: Grant
    Filed: May 23, 2014
    Date of Patent: August 25, 2015
    Assignee: Mitutoyo Corporation
    Inventors: Benjamin Keith Jones, Scott Allen Harsila, Andrew Michael Patzwald, David William Sesko
  • Patent number: 9110224
    Abstract: A reflector with focused output is disclosed. The reflector comprises a reference parabolic portion and a plurality of non-reference parabolic portions. A focal length of the plurality of non-reference parabolic portions is determined from a focal length of the reference parabolic portion. In one embodiment, the focal length of the plurality of non-reference parabolic portions is a perpendicularly projected distance from a focus of the reference parabolic portion onto a central axis of the plurality of non-reference parabolic portions. In one embodiment, the focal lengths of the reference parabolic portion and the plurality of non-reference parabolic portions are scaled by a constant. A method of designing a reflector and an obstruction light that uses the reflector is also disclosed.
    Type: Grant
    Filed: March 1, 2011
    Date of Patent: August 18, 2015
    Assignee: TRI-CONCEPT TECHNOLOGY LIMITED
    Inventor: Chak Lam Peter Yip
  • Patent number: 9091942
    Abstract: A system and method for assessing line edge roughness (LER) is disclosed. An artificial conformal liner on a simulation test structure absorbs the same amount of light that otherwise would be scattered in the dark-field by a rough surface. A RCWA based scatterometry model is used to model absorption and the absorption is correlated to line edge roughness, which allows RCWA to be used in effect to model LER.
    Type: Grant
    Filed: November 18, 2011
    Date of Patent: July 28, 2015
    Assignee: International Business Machines Corporation
    Inventor: Nedal R. Saleh
  • Patent number: 9091633
    Abstract: A method for locating the center of a beam profile, comprises the steps of: providing a beam profile; selecting one or more strips through the beam profile; identifying distinct regions of intensity along the one or more strips and labelling them consistently; calculating a combined average intensity for each labelled region, using data from the one or more strips; plotting the average intensity against the labelled regions and comparing the results with a plot of the actual intensity obtained by taking a cross-section through the center of at least one of the one or more strips; and optimizing the location of the center of at least one of the one or more strips so as to obtain the best fit between the average intensity plot and the actual intensity plot to thereby identify the center of the beam profile.
    Type: Grant
    Filed: May 26, 2011
    Date of Patent: July 28, 2015
    Assignee: Nightingale—EOS Ltd.
    Inventor: Stephen Morris
  • Publication number: 20150146216
    Abstract: The invention relates to a method and a device for optically measuring the interior of a seamless pipe which is manufactured by rolling or of a pipe which is welded with a longitudinal seam and is manufactured from sheet-metal plates shaped to form half-shells or from a shaped sheet-metal plate or from a metal strip which is unwound from a coil, comprising a sensor means (9) which emits a laser beam (10) in the interior of the pipe (3). In such a method and device, an internal measurement of seamless pipes or pipes which are welded with a longitudinal seam is to be provided with which it is easily possible to determine and model precisely the ovalness and straightness of the pipe (3) in a station.
    Type: Application
    Filed: August 8, 2013
    Publication date: May 28, 2015
    Inventors: Michael Krauhausen, Ruediger Neugebauer, Manfred Kolbe, Manfred Topueth, Norbert Pesch, Alexander Schulze, Jochen Vochsen, Heinrich Oberwelland
  • Publication number: 20150131108
    Abstract: A system for inspecting railroad ties in a railroad track includes a light generator, an optical receiver and a processor. The light generator is oriented to project a beam of light across the railroad track while moving along the railroad track in a travel direction. The optical receiver is oriented to receive at least a portion of the beam of light reflected from the railroad track and configured to generate image data representative of a profile of at least a portion of the railroad track. The processor is configured to analyze the image data by applying one or more algorithms configured to find boundaries of a railroad tie and determine one or more condition metrics associated with the railroad tie.
    Type: Application
    Filed: January 19, 2015
    Publication date: May 14, 2015
    Inventors: John J. Kainer, Charles W. Aaron, Gregory T. Grissom, Antonio R. Mauricio, Jeb E. Belcher, David M. Pagliuco, Wilson T. Wamani, John A. Nagel, II, Christopher M. Villar, Steven C. Orrel, Zechariah Bertilson
  • Patent number: 9030673
    Abstract: An automated motorized assembly may be utilized to move a laser reflector on inside or outside surfaces, along edges of barrel shape structures. The laser reflector may be used to reflect laser signals back to a laser tracker metrology system locked in on the laser reflector. The laser tracker may follow the laser reflector as it moves along an edge of a barrel shape structure, acquiring circumferential data. The laser reflector may be moved to different positions to enable obtaining different circumferential rows of data. The automated motorized assembly may comprise a movement component that ensures consistent, continued, and/or tight movement along the traversed edge. The movement component may comprise a plurality of wheels and/or rollers, and one or more motors for driving at least some of the wheels and/or rollers. The automated motorized assembly may be controlled by user input, which may be communicated wirelessly.
    Type: Grant
    Filed: April 6, 2012
    Date of Patent: May 12, 2015
    Assignee: The Boeing Company
    Inventor: Barry Theophile Cooke
  • Patent number: 9025164
    Abstract: The invention relates to a method for ascertaining material characteristics of an object, in particular optical properties of preferably semi-transparent objects. The aim of the invention is to obtain material characteristics without complex measuring methods. This is achieved in that spectrally resolved data from measured data of the object are calculated with spectrally resolved data of a reference body in order to ascertain the material characteristics, the measured data being ascertained with a confocal 3D measuring system.
    Type: Grant
    Filed: March 28, 2011
    Date of Patent: May 5, 2015
    Assignee: Degudent GmbH
    Inventors: Thomas Ertl, Raimund Hibst, Karl Stock, Rainer Graser, Michael Zint
  • Patent number: 9025165
    Abstract: Of two pairs of biaxial goniometers and a uniaxial straight-ahead stage, one pair of biaxial goniometers and the uniaxial straight-ahead stage are subjected to fully-closed feedback control (follow-up control) under which output from a QPD is directly input into an axis drive motor, and the remaining pair of biaxial goniometers are subjected to semi-closed feedback control (constant-value control), encoder outputs on all the axes and QPD output are acquired simultaneously, measurement point coordinates and normal vectors derived from the encoder outputs are corrected with the QPD output, thereby eliminating influence of steady-state deviation in a goniometer control system.
    Type: Grant
    Filed: June 15, 2011
    Date of Patent: May 5, 2015
    Assignee: Osaka University
    Inventors: Katsuyoshi Endo, Junichi Uchikoshi, Yasuo Higashi
  • Patent number: 8994956
    Abstract: A device for observation, by reflection, of the structural details of an object (2) that exhibits a behavior that is at least partially specular, located in an exposure area, which includes: at least one radiation source with an emission surface (6) possessing at least two distinct zones (26, 27) emitting streams of radiation, where at least one of the characteristics differs from one zone to the next; an optical projection system that is located in line with the radiation source in relation to the exposure zone, in the path of the radiation; an optical exposure system (18) designed to optically link the entry aperture (14) of the optical projection system and the emission surface (6); a projection surface (10) that is linked optically with the object in the exposure zone, and whose received radiation depends on the deflection on the object (2).
    Type: Grant
    Filed: October 29, 2008
    Date of Patent: March 31, 2015
    Assignee: Signoptic Technologies
    Inventor: Becker François
  • Publication number: 20150073654
    Abstract: A method is provided for determining a roadway irregularity in a roadway section illuminated by at least one headlight of a vehicle. The method has a step of recognizing an instantaneous light distribution of the at least one headlight of the vehicle which is produced in the roadway section. The method also has a step of determining the roadway irregularity based on the instantaneous light distribution and a light distribution characteristic for the at least one headlight.
    Type: Application
    Filed: July 3, 2012
    Publication date: March 12, 2015
    Inventor: Johannes Foltin
  • Patent number: 8964281
    Abstract: An optical probe includes a laser light source that emits laser light, a collimator lens that converts the laser light into parallel light, a light shape changing section that converts the parallel light into linear laser light, an irradiating section to irradiate an object with a selected part of the linear laser light, an image pickup section that picks up an image of the object based on the laser light reflected from the object, and a controller that controls irradiation of the linear laser light. The linear laser light is composed of a plurality of parts including one end part and the other end part; and the irradiating section irradiates the object with the parts of the linear laser light sequentially from the one end part to the other end part.
    Type: Grant
    Filed: September 12, 2012
    Date of Patent: February 24, 2015
    Assignee: Mitutoyo Corporation
    Inventors: Masaoki Yamagata, Kentaro Nemoto
  • Publication number: 20150015870
    Abstract: The present disclosure relates to a method of monitoring wafer topography. A position and orientation of a plurality first alignment shapes disposed on a surface of a wafer are measured. Wafer topography as a function of wafer position is modeled by subjecting the wafer to an alignment which simultaneously minimizes misalignment between the wafer and a patterning apparatus and maximizes a focus of radiation on the surface. A non-correctable error is determined as a difference between the modeled wafer topography and a measured wafer topography. A maximum non-correctable error per field is determined for a wafer, and a mean variation in the maximum non-correctable error across each field within each wafer of a lot is determined, both within a layer and across layers. These values are then verified against a set of statistical process control rules to determine if they are within a specification limit of the manufacturing process.
    Type: Application
    Filed: July 12, 2013
    Publication date: January 15, 2015
    Inventors: Chun-Hsien Lin, Kuo-Hung Chao, Yi-Ping Hsieh, Yen-Di Tsen, Jui-Chun Peng, Heng-Hsin Liu, Jong-I Mou
  • Publication number: 20150015894
    Abstract: Illustrative embodiments of determining geometric characteristics of reflective surfaces are disclosed. In at least one illustrative embodiment, a method of determining geometric characteristics of reflective surfaces includes sensing electromagnetic waves with a sensor, where the electromagnetic waves have been reflected off a reflective surface of a specimen from a target structure including a feature point. The method further includes determining a displacement of the feature point of the target structure indicated by the sensed electromagnetic waves relative to reference data indicating a reference location for the feature point and determining a surface slope of a point of the reflective surface based on the determined displacement of the feature point of the target structure.
    Type: Application
    Filed: July 9, 2014
    Publication date: January 15, 2015
    Inventors: Hareesh V. Tippur, Chandru Periasamy
  • Publication number: 20140368835
    Abstract: A three-dimensional shape measuring apparatus includes a light source, a digital mirror device applying stripe pattern light alternately including a light portion and a dark portion with which information about the height of an inspection target portion can be acquired by reflecting light emitted from the light source, and an imaging portion imaging the inspection target portion to which the stripe pattern light is applied. The digital mirror device includes a plurality of mirrors arranged in a diamond pattern.
    Type: Application
    Filed: April 25, 2014
    Publication date: December 18, 2014
    Applicant: YAMAHA HATSUDOKI KABUSHIKI KAISHA
    Inventor: Nobuaki TABATA
  • Patent number: 8908256
    Abstract: An optical probe includes a laser light source that emits laser light, a collimator lens that converts the laser light into parallel light, a light shape changing section that converts the parallel light into linear laser light, an irradiating section to irradiate an object with a selected part of the linear laser light, an image pickup section that picks up an image of the object based on the laser light reflected from the object, and a controller that controls irradiation of the linear laser light. The linear laser light is composed of a plurality of parts including one end part and the other end part; and the irradiating section irradiates the object with the parts of the linear laser light sequentially from the one end part to the other end part.
    Type: Grant
    Filed: September 12, 2012
    Date of Patent: December 9, 2014
    Assignee: Mitutoyo Corporation
    Inventors: Masaoki Yamagata, Kentaro Nemoto
  • Publication number: 20140313519
    Abstract: Mapping apparatus includes a transmitter, which is configured to emit, in alternation, at least two beams comprising pulses of light along respective beam axes that are mutually offset transversely relative to a scan line direction of a raster pattern. A scanner is configured to scan the two or more beams in the raster pattern over a scene. A receiver is configured to receive the light reflected from the scene and to generate an output indicative of a time of flight of the pulses to and from points in the scene. A processor is coupled to process the output of the receiver so as to generate a 3D map of the scene.
    Type: Application
    Filed: March 13, 2014
    Publication date: October 23, 2014
    Applicant: PrimeSense Ltd.
    Inventors: Alexander Shpunt, Ronen Einat, Zafrir Mor
  • Patent number: 8823950
    Abstract: A shape measurement apparatus includes a distance measurement meter configured to emit and receive the beam in relation to the object; a beam deflection mechanism configured to deflect the beam from the distance measurement meter; and a control unit configured to determine at least one of a maximum beam deflection angle due to the beam deflection mechanism and the distance between a detected surface and the beam deflection mechanism when the beam is incident perpendicularly to the detected surface of the object, so that an error of a first measurement error that depends on a change in a spot diameter of the beam on the detected surface and a second measurement error that depends on an incidence angle on the detected surface of the beam is no more than a threshold value of a permitted error.
    Type: Grant
    Filed: August 5, 2013
    Date of Patent: September 2, 2014
    Assignee: Canon Kabushiki Kaisha
    Inventor: Akihiro Nakauchi
  • Publication number: 20140218730
    Abstract: The present invention provides a measurement apparatus which measures a position of a surface to be measured, comprising a light detection unit configured to detect light reflected by the surface to be measured, a confocal optical system configured to irradiate the surface to be measured with light and guide the light traveling from the surface to be measured to the light detection unit, and a control unit configured to determine a position of the surface to be measured, based on an output from the light detection unit, wherein the control unit obtains a plurality of signals to be used for determining the position of the surface to be measured, selects one of the plurality of signals, and obtains the position of the surface to be measured, based on the selected signal.
    Type: Application
    Filed: February 3, 2014
    Publication date: August 7, 2014
    Applicant: CANON KABUSHIKI KAISHA
    Inventors: Tsuyoshi Yamazaki, Hiroyuki Yuki
  • Patent number: 8797515
    Abstract: An apparatus and a method capable of measuring large deformation with a high accuracy and dynamically, using speckle interference, utilizes an optical path where one laser beam out of two laser beams becomes non-collimated light and a plane parallel transparent plate, and can form carrier fringes. More specifically, the transparent plate is arranged on the optical path where the non-collimated light is formed, or is removed from the optical path, or a refractive index, or a thickness of the transparent plate arranged on the optical path, or a tilt angle relative to an optical axis is changed. The phase analysis can be performed from fringe images corresponding to the deformation, by performing repetitively the above-described processing and acquisition of the speckle interference pattern.
    Type: Grant
    Filed: May 24, 2011
    Date of Patent: August 5, 2014
    Assignee: Canon Kabushiki Kaisha
    Inventor: Takashi Sugimoto
  • Patent number: 8797552
    Abstract: A non-contact laser triangulation scanning apparatus for generating a three-dimensional image of the surface of an object based on the 3D surface position and surface contrast information. The apparatus comprises a laser source, a first optical unit, a second optical unit, a photosensitive positional detector having a plurality of sensor elements, and an incident light measurement device. According to generated timing signals having a predetermined time interval, a reset timing of the sensor elements of the photosensitive positional detector is controlled. The incident light measurement device measures an amount of a certifying laser light after one timing signal. An amount of a measurement laser light is determined dependent on the measured amount of the certifying laser light. The three-dimensional image is generated by combining position data derived from signals of the positional detector with contrast data derived at least from signals of the incident light measurement device.
    Type: Grant
    Filed: July 3, 2009
    Date of Patent: August 5, 2014
    Assignees: Leica Geosystems AG, Hexagon Metrology Kabushiki Kaisha
    Inventors: Satoshi Suzuki, Kengo Suzuki, Masaki Takabayashi, Yoichi Sano, Masahiro Suzuki
  • Patent number: 8786866
    Abstract: In one aspect, an apparatus for determining an internal profile of a measured device is provided, which method in one embodiment may include: a housing having a first axis, a measuring device configured to emit a light beam along a second axis offset from the first axis; a deflection device configured to direct the emitted light beam to an inner surface of the measured device; and a driver configured to rotate the measuring device about the first axis.
    Type: Grant
    Filed: March 2, 2012
    Date of Patent: July 22, 2014
    Assignee: Baker Hughes Incorporated
    Inventors: Frederik Goeing, Marc Aldag, Gunnar Michaelis, Harald Grimmer
  • Publication number: 20140198321
    Abstract: In related art, consideration is not given to that a spatial distribution of scattered light changes in various direction such as forward/backward/sideways according to a difference in micro roughness. Particularly, although a step-terrace structure appearing on an epitaxial growth wafer produces anisotropy in the scattered light distribution, consideration is not given to this point in the related art. The invention includes a process in which light is illuminated to a sample surface, plural detection optical systems mutually different in directions of optical axes detect a spatial distribution of scattered light, and a spatial frequency spectrum of the sample surface is calculated.
    Type: Application
    Filed: July 27, 2012
    Publication date: July 17, 2014
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Masaaki Ito, Takahiro Jingu, Hisashi Hatano
  • Publication number: 20140153001
    Abstract: An optical scanning device includes a substrate, which is etched to define an array of two or more parallel micromirrors and a support surrounding the micromirrors. Respective spindles connect the micromirrors to the support, thereby defining respective parallel axes of rotation of the micromirrors relative to the support. One or more flexible coupling members are connected to the micromirrors so as to synchronize an oscillation of the micromirrors about the respective axes.
    Type: Application
    Filed: March 13, 2013
    Publication date: June 5, 2014
    Applicant: PRIMESENSE LTD.
    Inventor: PRIMESENSE LTD.
  • Patent number: 8705050
    Abstract: A mechanism for providing thermal compensation when measuring surface topography at an elevated temperature using a non-contact vibration transducer, such as a laser Doppler vibrometer (LDV). Thermal compensation is provided to a detector output signal to correct for thermal diffraction of a reflected portion of a beam of radiant energy directed at a surface of a test object. The thermal compensation is based on a calculated deviation between the detector output signal r2 at an elevated temperature and the detector output signal r1 at approximately room temperature.
    Type: Grant
    Filed: October 6, 2010
    Date of Patent: April 22, 2014
    Assignee: International Business Machines Corporation
    Inventor: Arvind K. Sinha
  • Publication number: 20140104622
    Abstract: A system for obtaining the external shape of motor vehicles can be applied to car-washing apparatuses. The system is able to reproduce the external shape of motor vehicles. The system has means for detecting the outer shape of a motor vehicle, a central operating control unit, and software means for handling and processing data loaded on the central operating control unit.
    Type: Application
    Filed: May 18, 2012
    Publication date: April 17, 2014
    Inventor: Gino Geminiani
  • Patent number: 8670114
    Abstract: A laser tracker system for measuring six degrees of freedom may include a main optics assembly structured to emit a first laser beam, a pattern projector assembly structured to emit a second laser beam shaped into a two-dimensional pattern, and a target. The target may include a retroreflector and a position sensor assembly. A center of symmetry of the retroreflector may be provided on a different plane than a plane of the position sensor assembly. A method of measuring orientation of a target may include illuminating the target with a laser beam comprising a two-dimensional pattern, recording a position of the two-dimensional pattern on a position sensor assembly to create a measured signature value of the two-dimensional pattern, and calculating an orientation of the target based on the measured signature value.
    Type: Grant
    Filed: May 13, 2013
    Date of Patent: March 11, 2014
    Assignee: FARO Technologies, Inc.
    Inventors: Robert E. Bridges, Lawrence B. Brown, John M. Hoffer, Jr.
  • Publication number: 20140055794
    Abstract: A shape measurement apparatus includes a distance measurement meter configured to emit and receive the beam in relation to the object; a beam deflection mechanism configured to deflect the beam from the distance measurement meter; and a control unit configured to determine at least one of a maximum beam deflection angle due to the beam deflection mechanism and the distance between a detected surface and the beam deflection mechanism when the beam is incident perpendicularly to the detected surface of the object, so that an error of a first measurement error that depends on a change in a spot diameter of the beam on the detected surface and a second measurement error that depends on an incidence angle on the detected surface of the beam is no more than a threshold value of a permitted error.
    Type: Application
    Filed: August 5, 2013
    Publication date: February 27, 2014
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Akihiro Nakauchi
  • Publication number: 20140043621
    Abstract: Provided herein is an apparatus, including a photon detector array configured to receive photons scattered from features in a surface of an article; and a characterization means for characterizing the features in the surface of the article, wherein the characterization means contrasts signals from the photon detector array corresponding to two sets of photons scattered from features in the surface of the article, and the two sets of photons respectively originate from photon emitters at different locations.
    Type: Application
    Filed: June 28, 2013
    Publication date: February 13, 2014
    Inventors: Joachim Walter Ahner, Stephen Keith McLaurin, Samuel Kah Hean Wong, Henry Luis Lott
  • Patent number: 8625110
    Abstract: A method of inspecting a structure. The method includes preparing preliminary spectrums of reference diffraction intensities according to critical dimensions of reference structures, obtaining a linear spectrum from the preliminary spectrums in a set critical dimension range, radiating light to respective measurement structures formed on a substrate, measuring measurement diffraction intensities of the light diffracted by the measurement structures, and obtaining respective critical dimensions of the measurement structures from the measurement diffraction intensities using the linear spectrum.
    Type: Grant
    Filed: March 30, 2010
    Date of Patent: January 7, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Seouk-Hoon Woo, Jeong-Ho Yeo, Byeong-Ok Cho, Joo-On Park, Chang-Min Park, Won-Sun Kim
  • Patent number: 8614796
    Abstract: A method is disclosed for measuring a profile of a reflecting face of an end (2) of a pipe section. An electrical field is generated between the face and suspended particles (19) in the ambient air of the face. The particles (19) are attracted to the face by the electrical field and matt-finishing the face. The face is then sensed with a laser beam (16) and scattered light (17) is reflected by the face and measured by a sensor (11), thereby determining a face profile.
    Type: Grant
    Filed: February 16, 2009
    Date of Patent: December 24, 2013
    Assignee: Rattunde & Co GmbH
    Inventor: Ulrich Rattunde
  • Patent number: 8599371
    Abstract: A method of obtaining high dynamic range, spectrally, spatially and angularly resolved radiance of a sample surface of a sample by an electromagnetic irradiator irradiating electromagnetic radiation of controlled spectral distribution onto the sample surface and, using an electromagnetic sensitive sensor to register the reflected spectral distribution. The spectral distribution of the intensity of the electromagnetic field is modeled to have been reflected by a plurality of spatially well defined part-surfaces of the sample surface.
    Type: Grant
    Filed: January 23, 2009
    Date of Patent: December 3, 2013
    Inventor: Mikael Lindstrand
  • Publication number: 20130308139
    Abstract: A device and a method for measuring at least one surface section of an object that is mounted on a carrier includes at least one reference object that can be fixed relative to the carrier, and a holder that can be moved relative to the reference object in at least one first direction and on which a reference body and a distance measuring device are arranged. The reference body and the distance measuring device are mounted in a rotatable manner relative to each other. The distance measuring device is designed to determine a first distance to a first point of the surface section of the object and a second distance to a second point of the reference body wherein the second point corresponds to the first point.
    Type: Application
    Filed: February 8, 2012
    Publication date: November 21, 2013
    Applicant: LUPHOS GMBH
    Inventors: Christian Am Weg, Gernot Berger, Thilo May, Ralf Nicolaus, Jurgen Petter