By Specular Reflection Patents (Class 356/612)
-
Patent number: 11789326Abstract: A display device includes a backlight module and a display panel. The display panel is disposed on the backlight module and includes two substrates, a sensor, and a light-shielding element. The sensor is disposed between the two substrates. The light-shielding element at least partially surrounds the sensor. A height of the light-shielding element is greater than a height of the sensor.Type: GrantFiled: February 11, 2022Date of Patent: October 17, 2023Assignee: Innolux CorporationInventors: Hsiao Feng Liao, Shu-Fen Li, Chuan-Chi Chien, Po-Yang Chen, I-An Yao
-
Patent number: 11717042Abstract: Techniques for generating and using digital markups on digital images are presented. In an embodiment, a method comprises receiving, at an electronic device, a digital layout image that represents a form of a product for manufacturing a reference product; generating a digital markup layout by overlaying the digital markup image over the digital layout image; based on the digital markup layout, generating one or more manufacturing files comprising digital data for manufacturing the reference product; receiving a digital reference image of the reference product manufactured based on the one or more manufacturing files; identifying one or more found markup regions in the digital reference image; based on the found markup regions, generating a geometry map and an interactive asset image; based on, at least in part, the geometry map, generating a customized product image by applying a user pattern to the interactive asset image.Type: GrantFiled: July 23, 2021Date of Patent: August 8, 2023Assignee: ZAZZLE, INC.Inventor: Young Harvill
-
Patent number: 11635295Abstract: A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.Type: GrantFiled: February 13, 2020Date of Patent: April 25, 2023Assignee: Hitachi, Ltd.Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno, Akio Yazaki
-
Patent number: 11525923Abstract: Real-time three-dimensional (3D) map building method and device using a 3D lidar includes representing 3D map data of a surrounding environment acquired by using a 3D lidar attached to a moving object as voxels, acquiring an eigenvalue and an eigenvector for each voxel based on all 3D points in a 3D map represented as the voxels, detecting a 3D corresponding point in the voxel corresponding to all the 3D points of 3D data newly acquired by using the 3D lidar while the moving object travels, calculating a rotation transformation and a translation transformation for minimizing an error by minimizing an inner product value between the eigenvector weighted by the eigenvalue of the voxel to which the 3D corresponding point belongs and a vector generated from a 3D corresponding point, and updating the 3D map data based on the rotation transformation and the translation transformation.Type: GrantFiled: September 10, 2019Date of Patent: December 13, 2022Assignee: A.M.AUTONOMY CO., LTD.Inventor: Yongdeuk Shin
-
Patent number: 11525897Abstract: A light deflection system for a LIDAR system on an aerial vehicle and method of use are herein disclosed. The light deflection system includes a light deflection element having a first end and a second end. The light deflection element is rotatable and balanced about an axis extending from the first end to the second end. The light deflection element has a first side with a first reflective surface at a first angle in relation to the axis and deflects light in a nadir direction relative to the aerial vehicle. The light deflection element also has a second side having a second reflective surface at a second angle in relation to the axis. The first angle is different from the second angle and configured to deflective light at an oblique angle relative to the aerial vehicle.Type: GrantFiled: November 25, 2019Date of Patent: December 13, 2022Assignee: Pictometry International Corp.Inventor: Stephen L. Schultz
-
Patent number: 11487210Abstract: A method includes: providing a workpiece to a semiconductor apparatus, the workpiece comprising a material layer, wherein the material layer includes a plurality of areas extending along a first axis; scanning the workpiece in a first direction along the first axis to generate first topography measurement data; scanning the workpiece in a second direction along the first axis to generate second topography measurement data; and performing an exposure operation on the material layer according to the first topography measurement data and the second topography measurement data.Type: GrantFiled: August 12, 2021Date of Patent: November 1, 2022Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.Inventors: Yung-Yao Lee, Yeh-Chin Wang, Yang-Ann Chu, Yung-Hsiang Chen, Yung-Cheng Chen
-
Patent number: 11474205Abstract: An electronic device is provided. An electronic device includes a sensor, a display including a first surface and a second surface, a rear linear polarizer disposed at a front surface of the sensor module, a rear phase difference film disposed between a front surface of the rear linear polarizer and the second surface of the display, a front phase difference film disposed at the first surface of the display at a position corresponding to a location of the sensor, a front linear polarizer disposed at a front surface of the front phase difference film, and a front plate disposed at a front surface of the front linear polarizer.Type: GrantFiled: April 14, 2020Date of Patent: October 18, 2022Inventors: Il Kim, Hyeongsoon Park, Jeonggyu Jo, Dareum Kang, Chohee Park, Seongwoo Choi
-
Patent number: 11443486Abstract: An arrangement for obtaining body measurements of a person includes a garment configured to be form fitted to the person, a reference target, and a handheld digital camera. A surface of the garment includes a plurality of first fiducials which are photogrammetrically analyzable. The reference target includes a plurality of second fiducials that are photogrammetrically analyzable. The plurality of second fiducials on the reference target facilitate producing a 3D model true to scale and in a recognized orientation to a surface on which the person is standing. The handheld digital camera acquires a plurality of successive images of the garment and reference target as the digital camera is moved around the person. A computer processes the plurality images by methods of photogrammetry to produce a 3D model of the body. A portable stabilization device may be held by the person to reduce movement and control arm spacing during image acquisition.Type: GrantFiled: August 28, 2019Date of Patent: September 13, 2022Assignee: SIZE STREAM LLCInventors: David Allen Bruner, Stephen Philip Christie, Jerry Michael King, Ryan Matthew Matis, Mark Elliott Neumann, Susan Leigh Simon, Bryan William Taylor, Warren Peter Wright
-
Patent number: 11361584Abstract: A fingerprint identification device, a touch display panel and a method for controlling fingerprint identification are provided in embodiments of the disclosure. The fingerprint identification device includes: a photoelectric sensor; and an optical waveguide, arranged on a touch substrate at another side, and configured to be in touch with a fingerprint, and comprising waveguide material portions and medium material portions, each of the waveguide material portions and each of the medium material portions being spaced apart from each other; and a light irradiating into the waveguide material portions is delivered to the surface(s) of the waveguide material portions facing away from the touch substrate after total reflections at interfaces between the medium material portions and the waveguide material portions.Type: GrantFiled: October 19, 2017Date of Patent: June 14, 2022Assignee: BOE TECHNOLOGY GROUP CO., LTD.Inventors: Jifeng Tan, Yafeng Yang
-
Patent number: 11047675Abstract: Disclosed are a method and an apparatus for inspection of workpieces and products having curved and, in particular, spherical surfaces. The method is based on scanning inspected objects with a narrow probing beam of electromagnetic radiation and concurrently measuring the radiation scattered on the surface. The method and apparatus improve the detectability of features and imperfections on inspected surfaces by providing invariable parameters and conditions of scanning, robust mechanical stability of scanning systems, high positioning accuracy of the probing electromagnetic beam and efficient collection of the scattered radiation. The apparatus allows surface defect classification, determining defect dimensions and convenient automation of inspection.Type: GrantFiled: May 27, 2019Date of Patent: June 29, 2021Inventors: Valerie Peidous, Vassili Peidous, Nina Peydus
-
Patent number: 10761318Abstract: Provided is a mirror device including a mirror which is supported to be flappable around a fast axis and supported to be flappable around a slow axis and in which a resonance frequency of flapping thereof with respect to the fast axis is a first value and a resonance frequency of the flapping thereof with respect to the slow axis is a second value lower than the first value; a signal extracting portion configured to obtain from a slow axis coil a synthesized signal including an induced signal generated in the slow axis coil due to an operation of flapping the mirror around the fast axis and configured to extract the induced signal from the synthesized signal; and a signal generating portion configured to generates a driving signal so that the flapping of the mirror with respect to the fast axis is in a resonance state according to the induced signal.Type: GrantFiled: March 16, 2017Date of Patent: September 1, 2020Assignee: HAMAMATSU PHOTONICS K.K.Inventor: Akira Takahashi
-
Patent number: 10387712Abstract: A display panel and a display apparatus are provided. The display panel includes: an organic light emitting display panel including an array substrate and organic light emitting configurations disposed on the array substrate; a fingerprint identification module arranged in a display region and arranged at a side facing away from the organic light emitting configurations of the array substrate; an angle limiting film arranged between the organic light emitting display panel and the fingerprint identification module. The fingerprint identification module includes a first substrate, at least one fingerprint identification unit for performing fingerprint identification according to light rays reflected, through a touch body, on the fingerprint identification unit.Type: GrantFiled: November 14, 2017Date of Patent: August 20, 2019Assignee: SHANGHAI TIANMA MICRO-ELECTRONICS CO., LTD.Inventors: Yang Zeng, Qing Zhang, Lihua Wang, Liang Xie, Lingxiao Du, Hong Ding, Huiping Chai, Kang Yang, Qijun Yao
-
Patent number: 10227171Abstract: The present disclosure relates generally to systems and methods for creating protective packaging. A device comprises a processor and a memory. The memory contains computer readable instructions that, when executed by the processor, cause the processor to receive, from an external sensor, data that is indicative of physical characteristics for an object to be packaged, determine a type of object to which the object to be packaged corresponds based on the physical characteristics, select one or more type of packaging elements for packaging the object based on the type of object, and cause a packaging machine to create packaging elements of the selected type.Type: GrantFiled: December 23, 2016Date of Patent: March 12, 2019Assignee: PREGIS INTELLIPACK LLCInventors: Thomas D. Wetsch, George Bertram, Edward Eisenberger
-
Patent number: 10161796Abstract: An LED lighting based multispectral imaging system for color measurement is provided, including a main control computer and an enclosed type lamp box, where a digital camera is provided at the top of the lamp box, and an LED lamp set control apparatus, a drawer type bearing platform, and an LED lamp set are provided at the bottom of the lamp box. A to-be-measured object is placed on the drawer type bearing platform. The main control computer controls spectral power distribution of the LED lamp set to be in a reciprocal relationship with a spectral sensitivity curve of the digital camera and extracts a camera response and performs calculation, to obtain spectral reflectivity of each pixel of the to-be-measured object.Type: GrantFiled: June 22, 2018Date of Patent: December 25, 2018Assignee: Wenzhou UniversityInventors: Guihua Cui, Xiukai Ruan, Qibo Cai, Yanhua Tan, Wenbin Xie, Jinjin Chu, Yaowu Liu, Ting Xu, Yaoju Zhang, Haiyong Zhu, Yuxing Dai
-
Patent number: 9919425Abstract: An autonomous robot comprises a robot body, a drive configured to propel the robot, a sensor system disposed on the robot body, and a navigation controller circuit in communication with the drive and the sensor system. The sensor system comprises at least one proximity sensor comprising a sensor body, and a first emitter, a second emitter and a receiver housed by the sensor body, wherein the receiver detects objects in a bounded detection volume of the receiver field of view aimed outward and downward beyond a periphery of the robot body. The receiver is disposed above and between the first and second emitters, the emitters having a twice-reshaped emission beams angled upward to intersect the receiver field of view at a fixed range of distances from the periphery of the robot body to define the bounded detection volume.Type: GrantFiled: July 1, 2015Date of Patent: March 20, 2018Assignee: iRobot CorporationInventors: Tom Bushman, James Herman, Seth Blitzblau, Nathan J. Deschaine, Andrew Scott Reichel
-
Patent number: 9784838Abstract: A scanning device includes a scanner, which includes a base and a gimbal, mounted within the base so as to rotate relative to the base about a first axis. A receive mirror is mounted within the gimbal so as to rotate about a second axis, perpendicular to the first axis. A detector is mounted on the gimbal so as to rotate with the gimbal about the first axis and receive light reflected from the receive mirror while the receive mirror rotates about the second axis. A collection lens is mounted on the gimbal so as to rotate with the gimbal about the first axis while collecting the light so as to focus the light onto the detector by reflection from the receive mirror while the receive mirror rotates about the second axis.Type: GrantFiled: November 26, 2014Date of Patent: October 10, 2017Assignee: APPLE INC.Inventors: Alexander Shpunt, Noel Axelrod, Raviv Erlich, Yuval Gerson
-
Patent number: 9329027Abstract: A measuring unit is set up to determine a relative position and relative orientation between the measuring unit and an arrangement of at least three optical elements. The measuring unit comprises a length measuring device, which emits measuring beams at at least three locations spaced apart from one another, and at least one beam directing device set up to direct the measuring beams to optical elements of the arrangement. The beam directing device is controllable in order to guide at least one of the measuring beams to a plurality of optical elements of the arrangement in a time-sequential manner in order to carry out a plurality of length measuring operations in a time-sequential manner in such a manner that, in the plurality of length measuring operations, each measuring beam of the at least one measuring beam strikes precisely one of the optical elements. A total of six lengths are measured in this manner.Type: GrantFiled: July 26, 2011Date of Patent: May 3, 2016Assignee: Carl Zeiss AGInventors: Oliver Schmidt, Christian Koos, Bernd Spruck, Frank Höller
-
Patent number: 9115982Abstract: An interchangeable chromatic range sensor (CRS) probe for a coordinate measuring machine (CMM). The CRS probe is capable of being automatically connected to a CMM under program control. In one embodiment, in order to make the CRS probe compatible with a standard CMM auto exchange joint, all CRS measurement light transmitting and receiving elements (e.g., the light source, wavelength detector, optical pen, etc.) are included in the CRS probe assembly. The CRS probe assembly also includes an auto exchange joint element that is attachable through a standard auto exchange joint connection to a CMM. In one embodiment, in order to provide the required signals through the limited number of connections of the standard CMM auto exchange joint (e.g., 13 pins), a low voltage differential signaling (LVDS) serializer may be utilized for providing additional control and data signals on two signal lines.Type: GrantFiled: May 23, 2014Date of Patent: August 25, 2015Assignee: Mitutoyo CorporationInventors: Benjamin Keith Jones, Scott Allen Harsila, Andrew Michael Patzwald, David William Sesko
-
Patent number: 9110224Abstract: A reflector with focused output is disclosed. The reflector comprises a reference parabolic portion and a plurality of non-reference parabolic portions. A focal length of the plurality of non-reference parabolic portions is determined from a focal length of the reference parabolic portion. In one embodiment, the focal length of the plurality of non-reference parabolic portions is a perpendicularly projected distance from a focus of the reference parabolic portion onto a central axis of the plurality of non-reference parabolic portions. In one embodiment, the focal lengths of the reference parabolic portion and the plurality of non-reference parabolic portions are scaled by a constant. A method of designing a reflector and an obstruction light that uses the reflector is also disclosed.Type: GrantFiled: March 1, 2011Date of Patent: August 18, 2015Assignee: TRI-CONCEPT TECHNOLOGY LIMITEDInventor: Chak Lam Peter Yip
-
Patent number: 9091942Abstract: A system and method for assessing line edge roughness (LER) is disclosed. An artificial conformal liner on a simulation test structure absorbs the same amount of light that otherwise would be scattered in the dark-field by a rough surface. A RCWA based scatterometry model is used to model absorption and the absorption is correlated to line edge roughness, which allows RCWA to be used in effect to model LER.Type: GrantFiled: November 18, 2011Date of Patent: July 28, 2015Assignee: International Business Machines CorporationInventor: Nedal R. Saleh
-
Patent number: 9091633Abstract: A method for locating the center of a beam profile, comprises the steps of: providing a beam profile; selecting one or more strips through the beam profile; identifying distinct regions of intensity along the one or more strips and labelling them consistently; calculating a combined average intensity for each labelled region, using data from the one or more strips; plotting the average intensity against the labelled regions and comparing the results with a plot of the actual intensity obtained by taking a cross-section through the center of at least one of the one or more strips; and optimizing the location of the center of at least one of the one or more strips so as to obtain the best fit between the average intensity plot and the actual intensity plot to thereby identify the center of the beam profile.Type: GrantFiled: May 26, 2011Date of Patent: July 28, 2015Assignee: Nightingale—EOS Ltd.Inventor: Stephen Morris
-
Publication number: 20150146216Abstract: The invention relates to a method and a device for optically measuring the interior of a seamless pipe which is manufactured by rolling or of a pipe which is welded with a longitudinal seam and is manufactured from sheet-metal plates shaped to form half-shells or from a shaped sheet-metal plate or from a metal strip which is unwound from a coil, comprising a sensor means (9) which emits a laser beam (10) in the interior of the pipe (3). In such a method and device, an internal measurement of seamless pipes or pipes which are welded with a longitudinal seam is to be provided with which it is easily possible to determine and model precisely the ovalness and straightness of the pipe (3) in a station.Type: ApplicationFiled: August 8, 2013Publication date: May 28, 2015Inventors: Michael Krauhausen, Ruediger Neugebauer, Manfred Kolbe, Manfred Topueth, Norbert Pesch, Alexander Schulze, Jochen Vochsen, Heinrich Oberwelland
-
Publication number: 20150131108Abstract: A system for inspecting railroad ties in a railroad track includes a light generator, an optical receiver and a processor. The light generator is oriented to project a beam of light across the railroad track while moving along the railroad track in a travel direction. The optical receiver is oriented to receive at least a portion of the beam of light reflected from the railroad track and configured to generate image data representative of a profile of at least a portion of the railroad track. The processor is configured to analyze the image data by applying one or more algorithms configured to find boundaries of a railroad tie and determine one or more condition metrics associated with the railroad tie.Type: ApplicationFiled: January 19, 2015Publication date: May 14, 2015Inventors: John J. Kainer, Charles W. Aaron, Gregory T. Grissom, Antonio R. Mauricio, Jeb E. Belcher, David M. Pagliuco, Wilson T. Wamani, John A. Nagel, II, Christopher M. Villar, Steven C. Orrel, Zechariah Bertilson
-
Patent number: 9030673Abstract: An automated motorized assembly may be utilized to move a laser reflector on inside or outside surfaces, along edges of barrel shape structures. The laser reflector may be used to reflect laser signals back to a laser tracker metrology system locked in on the laser reflector. The laser tracker may follow the laser reflector as it moves along an edge of a barrel shape structure, acquiring circumferential data. The laser reflector may be moved to different positions to enable obtaining different circumferential rows of data. The automated motorized assembly may comprise a movement component that ensures consistent, continued, and/or tight movement along the traversed edge. The movement component may comprise a plurality of wheels and/or rollers, and one or more motors for driving at least some of the wheels and/or rollers. The automated motorized assembly may be controlled by user input, which may be communicated wirelessly.Type: GrantFiled: April 6, 2012Date of Patent: May 12, 2015Assignee: The Boeing CompanyInventor: Barry Theophile Cooke
-
Patent number: 9025164Abstract: The invention relates to a method for ascertaining material characteristics of an object, in particular optical properties of preferably semi-transparent objects. The aim of the invention is to obtain material characteristics without complex measuring methods. This is achieved in that spectrally resolved data from measured data of the object are calculated with spectrally resolved data of a reference body in order to ascertain the material characteristics, the measured data being ascertained with a confocal 3D measuring system.Type: GrantFiled: March 28, 2011Date of Patent: May 5, 2015Assignee: Degudent GmbHInventors: Thomas Ertl, Raimund Hibst, Karl Stock, Rainer Graser, Michael Zint
-
Patent number: 9025165Abstract: Of two pairs of biaxial goniometers and a uniaxial straight-ahead stage, one pair of biaxial goniometers and the uniaxial straight-ahead stage are subjected to fully-closed feedback control (follow-up control) under which output from a QPD is directly input into an axis drive motor, and the remaining pair of biaxial goniometers are subjected to semi-closed feedback control (constant-value control), encoder outputs on all the axes and QPD output are acquired simultaneously, measurement point coordinates and normal vectors derived from the encoder outputs are corrected with the QPD output, thereby eliminating influence of steady-state deviation in a goniometer control system.Type: GrantFiled: June 15, 2011Date of Patent: May 5, 2015Assignee: Osaka UniversityInventors: Katsuyoshi Endo, Junichi Uchikoshi, Yasuo Higashi
-
Patent number: 8994956Abstract: A device for observation, by reflection, of the structural details of an object (2) that exhibits a behavior that is at least partially specular, located in an exposure area, which includes: at least one radiation source with an emission surface (6) possessing at least two distinct zones (26, 27) emitting streams of radiation, where at least one of the characteristics differs from one zone to the next; an optical projection system that is located in line with the radiation source in relation to the exposure zone, in the path of the radiation; an optical exposure system (18) designed to optically link the entry aperture (14) of the optical projection system and the emission surface (6); a projection surface (10) that is linked optically with the object in the exposure zone, and whose received radiation depends on the deflection on the object (2).Type: GrantFiled: October 29, 2008Date of Patent: March 31, 2015Assignee: Signoptic TechnologiesInventor: Becker François
-
Publication number: 20150073654Abstract: A method is provided for determining a roadway irregularity in a roadway section illuminated by at least one headlight of a vehicle. The method has a step of recognizing an instantaneous light distribution of the at least one headlight of the vehicle which is produced in the roadway section. The method also has a step of determining the roadway irregularity based on the instantaneous light distribution and a light distribution characteristic for the at least one headlight.Type: ApplicationFiled: July 3, 2012Publication date: March 12, 2015Inventor: Johannes Foltin
-
Patent number: 8964281Abstract: An optical probe includes a laser light source that emits laser light, a collimator lens that converts the laser light into parallel light, a light shape changing section that converts the parallel light into linear laser light, an irradiating section to irradiate an object with a selected part of the linear laser light, an image pickup section that picks up an image of the object based on the laser light reflected from the object, and a controller that controls irradiation of the linear laser light. The linear laser light is composed of a plurality of parts including one end part and the other end part; and the irradiating section irradiates the object with the parts of the linear laser light sequentially from the one end part to the other end part.Type: GrantFiled: September 12, 2012Date of Patent: February 24, 2015Assignee: Mitutoyo CorporationInventors: Masaoki Yamagata, Kentaro Nemoto
-
Publication number: 20150015870Abstract: The present disclosure relates to a method of monitoring wafer topography. A position and orientation of a plurality first alignment shapes disposed on a surface of a wafer are measured. Wafer topography as a function of wafer position is modeled by subjecting the wafer to an alignment which simultaneously minimizes misalignment between the wafer and a patterning apparatus and maximizes a focus of radiation on the surface. A non-correctable error is determined as a difference between the modeled wafer topography and a measured wafer topography. A maximum non-correctable error per field is determined for a wafer, and a mean variation in the maximum non-correctable error across each field within each wafer of a lot is determined, both within a layer and across layers. These values are then verified against a set of statistical process control rules to determine if they are within a specification limit of the manufacturing process.Type: ApplicationFiled: July 12, 2013Publication date: January 15, 2015Inventors: Chun-Hsien Lin, Kuo-Hung Chao, Yi-Ping Hsieh, Yen-Di Tsen, Jui-Chun Peng, Heng-Hsin Liu, Jong-I Mou
-
Publication number: 20150015894Abstract: Illustrative embodiments of determining geometric characteristics of reflective surfaces are disclosed. In at least one illustrative embodiment, a method of determining geometric characteristics of reflective surfaces includes sensing electromagnetic waves with a sensor, where the electromagnetic waves have been reflected off a reflective surface of a specimen from a target structure including a feature point. The method further includes determining a displacement of the feature point of the target structure indicated by the sensed electromagnetic waves relative to reference data indicating a reference location for the feature point and determining a surface slope of a point of the reflective surface based on the determined displacement of the feature point of the target structure.Type: ApplicationFiled: July 9, 2014Publication date: January 15, 2015Inventors: Hareesh V. Tippur, Chandru Periasamy
-
Publication number: 20140368835Abstract: A three-dimensional shape measuring apparatus includes a light source, a digital mirror device applying stripe pattern light alternately including a light portion and a dark portion with which information about the height of an inspection target portion can be acquired by reflecting light emitted from the light source, and an imaging portion imaging the inspection target portion to which the stripe pattern light is applied. The digital mirror device includes a plurality of mirrors arranged in a diamond pattern.Type: ApplicationFiled: April 25, 2014Publication date: December 18, 2014Applicant: YAMAHA HATSUDOKI KABUSHIKI KAISHAInventor: Nobuaki TABATA
-
Patent number: 8908256Abstract: An optical probe includes a laser light source that emits laser light, a collimator lens that converts the laser light into parallel light, a light shape changing section that converts the parallel light into linear laser light, an irradiating section to irradiate an object with a selected part of the linear laser light, an image pickup section that picks up an image of the object based on the laser light reflected from the object, and a controller that controls irradiation of the linear laser light. The linear laser light is composed of a plurality of parts including one end part and the other end part; and the irradiating section irradiates the object with the parts of the linear laser light sequentially from the one end part to the other end part.Type: GrantFiled: September 12, 2012Date of Patent: December 9, 2014Assignee: Mitutoyo CorporationInventors: Masaoki Yamagata, Kentaro Nemoto
-
Publication number: 20140313519Abstract: Mapping apparatus includes a transmitter, which is configured to emit, in alternation, at least two beams comprising pulses of light along respective beam axes that are mutually offset transversely relative to a scan line direction of a raster pattern. A scanner is configured to scan the two or more beams in the raster pattern over a scene. A receiver is configured to receive the light reflected from the scene and to generate an output indicative of a time of flight of the pulses to and from points in the scene. A processor is coupled to process the output of the receiver so as to generate a 3D map of the scene.Type: ApplicationFiled: March 13, 2014Publication date: October 23, 2014Applicant: PrimeSense Ltd.Inventors: Alexander Shpunt, Ronen Einat, Zafrir Mor
-
Patent number: 8823950Abstract: A shape measurement apparatus includes a distance measurement meter configured to emit and receive the beam in relation to the object; a beam deflection mechanism configured to deflect the beam from the distance measurement meter; and a control unit configured to determine at least one of a maximum beam deflection angle due to the beam deflection mechanism and the distance between a detected surface and the beam deflection mechanism when the beam is incident perpendicularly to the detected surface of the object, so that an error of a first measurement error that depends on a change in a spot diameter of the beam on the detected surface and a second measurement error that depends on an incidence angle on the detected surface of the beam is no more than a threshold value of a permitted error.Type: GrantFiled: August 5, 2013Date of Patent: September 2, 2014Assignee: Canon Kabushiki KaishaInventor: Akihiro Nakauchi
-
Publication number: 20140218730Abstract: The present invention provides a measurement apparatus which measures a position of a surface to be measured, comprising a light detection unit configured to detect light reflected by the surface to be measured, a confocal optical system configured to irradiate the surface to be measured with light and guide the light traveling from the surface to be measured to the light detection unit, and a control unit configured to determine a position of the surface to be measured, based on an output from the light detection unit, wherein the control unit obtains a plurality of signals to be used for determining the position of the surface to be measured, selects one of the plurality of signals, and obtains the position of the surface to be measured, based on the selected signal.Type: ApplicationFiled: February 3, 2014Publication date: August 7, 2014Applicant: CANON KABUSHIKI KAISHAInventors: Tsuyoshi Yamazaki, Hiroyuki Yuki
-
Patent number: 8797515Abstract: An apparatus and a method capable of measuring large deformation with a high accuracy and dynamically, using speckle interference, utilizes an optical path where one laser beam out of two laser beams becomes non-collimated light and a plane parallel transparent plate, and can form carrier fringes. More specifically, the transparent plate is arranged on the optical path where the non-collimated light is formed, or is removed from the optical path, or a refractive index, or a thickness of the transparent plate arranged on the optical path, or a tilt angle relative to an optical axis is changed. The phase analysis can be performed from fringe images corresponding to the deformation, by performing repetitively the above-described processing and acquisition of the speckle interference pattern.Type: GrantFiled: May 24, 2011Date of Patent: August 5, 2014Assignee: Canon Kabushiki KaishaInventor: Takashi Sugimoto
-
Patent number: 8797552Abstract: A non-contact laser triangulation scanning apparatus for generating a three-dimensional image of the surface of an object based on the 3D surface position and surface contrast information. The apparatus comprises a laser source, a first optical unit, a second optical unit, a photosensitive positional detector having a plurality of sensor elements, and an incident light measurement device. According to generated timing signals having a predetermined time interval, a reset timing of the sensor elements of the photosensitive positional detector is controlled. The incident light measurement device measures an amount of a certifying laser light after one timing signal. An amount of a measurement laser light is determined dependent on the measured amount of the certifying laser light. The three-dimensional image is generated by combining position data derived from signals of the positional detector with contrast data derived at least from signals of the incident light measurement device.Type: GrantFiled: July 3, 2009Date of Patent: August 5, 2014Assignees: Leica Geosystems AG, Hexagon Metrology Kabushiki KaishaInventors: Satoshi Suzuki, Kengo Suzuki, Masaki Takabayashi, Yoichi Sano, Masahiro Suzuki
-
Patent number: 8786866Abstract: In one aspect, an apparatus for determining an internal profile of a measured device is provided, which method in one embodiment may include: a housing having a first axis, a measuring device configured to emit a light beam along a second axis offset from the first axis; a deflection device configured to direct the emitted light beam to an inner surface of the measured device; and a driver configured to rotate the measuring device about the first axis.Type: GrantFiled: March 2, 2012Date of Patent: July 22, 2014Assignee: Baker Hughes IncorporatedInventors: Frederik Goeing, Marc Aldag, Gunnar Michaelis, Harald Grimmer
-
Publication number: 20140198321Abstract: In related art, consideration is not given to that a spatial distribution of scattered light changes in various direction such as forward/backward/sideways according to a difference in micro roughness. Particularly, although a step-terrace structure appearing on an epitaxial growth wafer produces anisotropy in the scattered light distribution, consideration is not given to this point in the related art. The invention includes a process in which light is illuminated to a sample surface, plural detection optical systems mutually different in directions of optical axes detect a spatial distribution of scattered light, and a spatial frequency spectrum of the sample surface is calculated.Type: ApplicationFiled: July 27, 2012Publication date: July 17, 2014Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Masaaki Ito, Takahiro Jingu, Hisashi Hatano
-
Publication number: 20140153001Abstract: An optical scanning device includes a substrate, which is etched to define an array of two or more parallel micromirrors and a support surrounding the micromirrors. Respective spindles connect the micromirrors to the support, thereby defining respective parallel axes of rotation of the micromirrors relative to the support. One or more flexible coupling members are connected to the micromirrors so as to synchronize an oscillation of the micromirrors about the respective axes.Type: ApplicationFiled: March 13, 2013Publication date: June 5, 2014Applicant: PRIMESENSE LTD.Inventor: PRIMESENSE LTD.
-
Patent number: 8705050Abstract: A mechanism for providing thermal compensation when measuring surface topography at an elevated temperature using a non-contact vibration transducer, such as a laser Doppler vibrometer (LDV). Thermal compensation is provided to a detector output signal to correct for thermal diffraction of a reflected portion of a beam of radiant energy directed at a surface of a test object. The thermal compensation is based on a calculated deviation between the detector output signal r2 at an elevated temperature and the detector output signal r1 at approximately room temperature.Type: GrantFiled: October 6, 2010Date of Patent: April 22, 2014Assignee: International Business Machines CorporationInventor: Arvind K. Sinha
-
Publication number: 20140104622Abstract: A system for obtaining the external shape of motor vehicles can be applied to car-washing apparatuses. The system is able to reproduce the external shape of motor vehicles. The system has means for detecting the outer shape of a motor vehicle, a central operating control unit, and software means for handling and processing data loaded on the central operating control unit.Type: ApplicationFiled: May 18, 2012Publication date: April 17, 2014Inventor: Gino Geminiani
-
Patent number: 8670114Abstract: A laser tracker system for measuring six degrees of freedom may include a main optics assembly structured to emit a first laser beam, a pattern projector assembly structured to emit a second laser beam shaped into a two-dimensional pattern, and a target. The target may include a retroreflector and a position sensor assembly. A center of symmetry of the retroreflector may be provided on a different plane than a plane of the position sensor assembly. A method of measuring orientation of a target may include illuminating the target with a laser beam comprising a two-dimensional pattern, recording a position of the two-dimensional pattern on a position sensor assembly to create a measured signature value of the two-dimensional pattern, and calculating an orientation of the target based on the measured signature value.Type: GrantFiled: May 13, 2013Date of Patent: March 11, 2014Assignee: FARO Technologies, Inc.Inventors: Robert E. Bridges, Lawrence B. Brown, John M. Hoffer, Jr.
-
Publication number: 20140055794Abstract: A shape measurement apparatus includes a distance measurement meter configured to emit and receive the beam in relation to the object; a beam deflection mechanism configured to deflect the beam from the distance measurement meter; and a control unit configured to determine at least one of a maximum beam deflection angle due to the beam deflection mechanism and the distance between a detected surface and the beam deflection mechanism when the beam is incident perpendicularly to the detected surface of the object, so that an error of a first measurement error that depends on a change in a spot diameter of the beam on the detected surface and a second measurement error that depends on an incidence angle on the detected surface of the beam is no more than a threshold value of a permitted error.Type: ApplicationFiled: August 5, 2013Publication date: February 27, 2014Applicant: CANON KABUSHIKI KAISHAInventor: Akihiro Nakauchi
-
Publication number: 20140043621Abstract: Provided herein is an apparatus, including a photon detector array configured to receive photons scattered from features in a surface of an article; and a characterization means for characterizing the features in the surface of the article, wherein the characterization means contrasts signals from the photon detector array corresponding to two sets of photons scattered from features in the surface of the article, and the two sets of photons respectively originate from photon emitters at different locations.Type: ApplicationFiled: June 28, 2013Publication date: February 13, 2014Inventors: Joachim Walter Ahner, Stephen Keith McLaurin, Samuel Kah Hean Wong, Henry Luis Lott
-
Patent number: 8625110Abstract: A method of inspecting a structure. The method includes preparing preliminary spectrums of reference diffraction intensities according to critical dimensions of reference structures, obtaining a linear spectrum from the preliminary spectrums in a set critical dimension range, radiating light to respective measurement structures formed on a substrate, measuring measurement diffraction intensities of the light diffracted by the measurement structures, and obtaining respective critical dimensions of the measurement structures from the measurement diffraction intensities using the linear spectrum.Type: GrantFiled: March 30, 2010Date of Patent: January 7, 2014Assignee: Samsung Electronics Co., Ltd.Inventors: Seouk-Hoon Woo, Jeong-Ho Yeo, Byeong-Ok Cho, Joo-On Park, Chang-Min Park, Won-Sun Kim
-
Patent number: 8614796Abstract: A method is disclosed for measuring a profile of a reflecting face of an end (2) of a pipe section. An electrical field is generated between the face and suspended particles (19) in the ambient air of the face. The particles (19) are attracted to the face by the electrical field and matt-finishing the face. The face is then sensed with a laser beam (16) and scattered light (17) is reflected by the face and measured by a sensor (11), thereby determining a face profile.Type: GrantFiled: February 16, 2009Date of Patent: December 24, 2013Assignee: Rattunde & Co GmbHInventor: Ulrich Rattunde
-
Patent number: 8599371Abstract: A method of obtaining high dynamic range, spectrally, spatially and angularly resolved radiance of a sample surface of a sample by an electromagnetic irradiator irradiating electromagnetic radiation of controlled spectral distribution onto the sample surface and, using an electromagnetic sensitive sensor to register the reflected spectral distribution. The spectral distribution of the intensity of the electromagnetic field is modeled to have been reflected by a plurality of spatially well defined part-surfaces of the sample surface.Type: GrantFiled: January 23, 2009Date of Patent: December 3, 2013Inventor: Mikael Lindstrand
-
Publication number: 20130308139Abstract: A device and a method for measuring at least one surface section of an object that is mounted on a carrier includes at least one reference object that can be fixed relative to the carrier, and a holder that can be moved relative to the reference object in at least one first direction and on which a reference body and a distance measuring device are arranged. The reference body and the distance measuring device are mounted in a rotatable manner relative to each other. The distance measuring device is designed to determine a first distance to a first point of the surface section of the object and a second distance to a second point of the reference body wherein the second point corresponds to the first point.Type: ApplicationFiled: February 8, 2012Publication date: November 21, 2013Applicant: LUPHOS GMBHInventors: Christian Am Weg, Gernot Berger, Thilo May, Ralf Nicolaus, Jurgen Petter