Abstract: An apparatus for testing the surface properties of a material is disclosed. The apparatus includes an indentor which is suspended above the surface of a sample and dropped onto the sample. Several testing methods are also disclosed. Surface toughness is measured by dropping the indentor from a variable height and inspecting the surface for failure. Thin film strength is tested by making several drops from various heights and inspecting the surface for flaking of the layer. In addition, damping capacity can be measured by comparing the kinetic energy of the resulting from the drop of the indentor to the strain energy measured by a probe on the opposing surface of the sample.
Type:
Grant
Filed:
June 28, 1988
Date of Patent:
August 29, 1989
Assignee:
Magnetic Peripherals Inc.
Inventors:
Amarjit S. Brar, Jagdish P. Sharma, Suryanarayana Kaja