Patents Assigned to Agilent Technologies, Inc.
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Patent number: 6743990Abstract: A volume adjustment apparatus for a switch. One embodiment of the volume adjustment apparatus may comprise a plate member sized to fit over a main channel in the switch displaces an excess of a liquid switching element from the main channel of the switch. At least one collection chamber is formed in the plate member overlapping the main channel of the switch to receive the displaced excess liquid switching element.Type: GrantFiled: December 12, 2002Date of Patent: June 1, 2004Assignee: Agilent Technologies, Inc.Inventor: Marvin Glenn Wong
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Patent number: 6744256Abstract: Disclosed are methods and apparatus for testing opto-electronic devices. Test data is shifted into a first boundary-scan cell. A test is then launched from the first boundary-scan cell by outputting the shifted test data to a signal generator. The signal generator, in turn, provides conditioned test data to an opto-electronic transmitter, in response to the shifted test data and at least one constraint for operating the opto-electronic transmitter. Finally, a response to the test is captured.Type: GrantFiled: October 29, 2001Date of Patent: June 1, 2004Assignee: Agilent Technologies, Inc.Inventors: Kenneth Paul Parker, Myunghee Lee
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Patent number: 6744953Abstract: Planar optical waveguide apparatus and methods for fabricating planar optical waveguide apparatus. The apparatus has a core layer and a cladding layer, the core layer having at least one optical waveguide, and an alignment structure spaced from and positioned with respect to the at least one optical waveguide to facilitate measuring a position of the at least one optical waveguide. The alignment structure has a first alignment structure, such as a reflecting member, to facilitate measuring a height of the at least one optical waveguide; and a second alignment structure, such as alignment marks, to facilitate measuring positions of the at least one optical waveguide in a plane of the at least one optical waveguide. The method includes forming both the optical waveguide and at least a portion of the alignment structure simultaneously in a single processing step to ensure that the optical waveguide and the alignment structure are in perfect registration.Type: GrantFiled: September 7, 2001Date of Patent: June 1, 2004Assignee: Agilent Technologies, Inc.Inventors: Brian Elliot Lemoff, William Gong, Richatd P. Tella, Tirumala R. Ranganath
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Patent number: 6745148Abstract: Method and apparatus for constructing diagrams representing the relationship between variable quantities. According to the method, at least one first measurement point representing the relationship between the variable quantities is provided for initially constructing the diagram. Thereafter, at least one location is selected at which the relationship between the variable quantities is to be measured, the at least one location being selected as a function of the at least one measurement point. The relationship between the variable quantities is then measured at the at least one location to provide at least one additional measurement point for further constructing the diagram. The invention permits diagrams, such as V Curve diagrams, Bathtub Curve diagrams and Eye Diagrams, to be constructed in less time and using fewer measurement points than conventional diagram construction procedures.Type: GrantFiled: June 3, 2002Date of Patent: June 1, 2004Assignee: Agilent Technologies, Inc.Inventor: Daniel Yves Abramovitch
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Patent number: 6745140Abstract: An electronic test system with a test results view filter that enables the user to filter the test results of a test program according to their particular datapoint value status. The test results view filter is preferably comprised of graphical elements representing a plurality of test results view filter option buttons grouped together in said test results view filter. Each test result view filter option button is capable of filtering an entire test program for their respective datapoint value status and displaying said filtered datapoint value status. The test results view filter option buttons are selected from the group consisting of: all datapoint value status, failed datapoint value status, marginal datapoint value status, and selected datapoint value status.Type: GrantFiled: October 23, 2001Date of Patent: June 1, 2004Assignee: Agilent Technologies, Inc.Inventor: Christopher K. Sutton
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Patent number: 6744262Abstract: A method, apparatus and article of manufacture to aid in the characterization of a device establishes a device S-parameter matrix (SD) to represent electrical behavior of the device, an adapter T-parameter matrix (Ta) to represent all possible electrical paths through circuits to all device ports of the device, and a cascaded S-parameter matrix (Sc) to represent the circuits cascaded with the device. Values for the adapter T-parameter matrix are obtained either through measurement or modeling. The device cascaded with the circuits is measured to obtain values for the cascaded S-parameter matrix, permitting use of a general solution for the device S-parameter matrix as a function of the adapter T-parameter matrix and the cascaded S-parameter matrix.Type: GrantFiled: March 14, 2002Date of Patent: June 1, 2004Assignee: Agilent Technologies, Inc.Inventor: Vahe' A. Adamian
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Patent number: 6744508Abstract: A method and apparatus for sampling optical input signal is presented. The apparatus includes a split waveplate for spatially rotating polarization direction of a first portion (for example half, or 50 percent) of the input signal to a first rotated direction and spatially rotating polarization direction of a second portion (for example the other 50 percent) of the input signal to a second rotated direction orthogonal to the first rotated direction. The apparatus further includes a sum frequency generator, for example a PPLN crystal, aligned to the first rotated direction to sample the input signal. The rotation of the two halves of the input signal is achieved using a split half-waveplate.Type: GrantFiled: October 24, 2001Date of Patent: June 1, 2004Assignee: Agilent Technologies, Inc.Inventors: Roger L. Jungerman, Randall King
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Patent number: 6740829Abstract: A high frequency electrical relay uses a conducting liquid in the switching mechanism. The relay uses an actuator, such as a piezoelectric element, to cause the switch actuator to insert into a cavity in a static switch contact structure. The cavity has sides and a pad on its end that are wettable by the conducting liquid. The cavity is filled with the conducting liquid, which may be liquid metal. The volume of conducting liquid is chosen so that when the actuator returns to its rest position, the electrical contact is maintained by surface tension and by wetting of the contact pads on both the static switch contact structure and the actuator.Type: GrantFiled: April 14, 2003Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventor: Marvin Glenn Wong
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Patent number: 6741106Abstract: A pad driver method and apparatus is presented. The pad driver includes a dual path configuration. The dual path includes a first path and a second path. Both paths include a pre-driver. The first path and the second path communicate high voltage signals and low voltage signals. The pre-driver in the first path drives a pFET device. The pre-driver in the second path drives an nFET device. The pFET and nFET devices provide an output signal, which drives a pad. Each pre-driver further includes a first path and a second path. The first path in the pre-driver supports high voltage operation and the second path in the pre-driver supports low voltage operation.Type: GrantFiled: September 26, 2002Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventor: Guy Harlan Humphrey
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Patent number: 6741134Abstract: A DC feedback control circuit for compensating for a DC voltage level shift in a transimpedance amplifier circuit having a transistor as a high speed switching device. The DC feedback control circuit includes a filter for determining a DC voltage level at an output of the amplifier circuit and a differential pair of transistors for comparing the DC voltage level with a reference voltage. A pair of current mirrors mirror a current dependent on the comparison of the DC voltage level with the reference voltage and apply the mirrored current to an emitter of the transistor so as to maintain a substantially constant bias current through the switching transistor.Type: GrantFiled: May 21, 2002Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventors: Clifford Neil Didcock, Charles Ronald Cook, Michael Geoffrey Andrew Wilson, Charles Graeme Ritchie
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Patent number: 6741947Abstract: A system includes a plurality of nodes. The plurality of nodes each communicate signals pursuant to a single channel plan. The channel plan includes predefined characteristics for each of a plurality of signal channels. The system further includes a spectrum analyzer, a switch, and a controller. The switch connects the spectrum analyzer to the nodes. The controller tests communication signals on at least one of the nodes by conducting a test plan. The test plan prescribes performance of at least an average power test. The controller also derives a total node power based on the average power test results.Type: GrantFiled: November 30, 1999Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventors: James Wichelman, Craig Chamberlain, Eric N. Flink
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Patent number: 6741952Abstract: An instrumentation system which provides relatively precise time correlation among obtained measurements without dependence on trigger signal timing. An instrumentation system according to the present teachings includes a set of instruments each having a clock and an event buffer for periodically logging a data record. Each data record includes a set of measurement data and a time-stamp obtained from the corresponding clock. The instrumentation system includes mechanisms for maintaining a synchronized time in the clocks and mechanisms for stopping the logging in the event buffers in response to an event of interest. Once event logging is stopped, the data records in the event buffers may be correlated using their time-stamps and a time-stamp associated with the event of interest.Type: GrantFiled: February 15, 2002Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventor: John C. Eidson
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Patent number: 6741641Abstract: An electronic system parameter, such as time deviation (TDEV), is measured by reference to an input series of data samples received and processed to produce in real-time first and second time-varying series of measurements for the parameter.Type: GrantFiled: May 18, 2000Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventors: Alex Ballantyne, David Taylor
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Patent number: 6741953Abstract: A data acquisition circuit and method according to embodiments of the invention insert overflow states into a data storage unit among samples of input data and associated time tags that are of interest. The overflow states allow multiple overflows of the time tags without intervening samples of input data being stored, thus allowing the infrequent capture of samples of the input data while maintaining accurate timing data. Also, the overflow states obviate the need to store an overflow status flag with each stored sample of input data and time tag in the data storage unit.Type: GrantFiled: April 10, 2002Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventors: Adrian M. Hernandez, John David Hansen, John J. Sinnott
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Patent number: 6740908Abstract: An enhanced extended drift heterostructure (EEDH) photodiode and method of making provide enhanced electron response. The EEDH photodiode includes adjacent first and second light absorption layers, an ohmic anode contact interfaced to the first layer and a cathode contact interfaced to the second layer. The cathode contact includes either a Schottky cathode contact or an ohmic cathode contact and a contact layer. The EEDH photodiode optionally further includes one or more of a carrier block layer interfaced to the first layer, a graded characteristic in the first layer, and a collector layer interfaced to the second layer. The first layer has a doping concentration that is greater than doping concentrations of the second layer and the optional collector layer. The first and second layers have band gap energies that facilitate light absorption. The optional layers have band gap energies that are relatively nonconducive to light absorption.Type: GrantFiled: March 18, 2003Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventor: Kirk S. Giboney
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Patent number: 6741133Abstract: A high output amplifier includes a comparison amplifier having a first input, a second input, and an output, wherein a set voltage is applied to the first input, a voltage of the output is coupled to the second input, and the output is generated in response to a difference between the voltage applied to the first input and the voltage coupled to the second input. The high output amplifier also includes a low-pass filtering device that receives and performs low-pass filtering on the output of the comparison amplifier, a conversion device that converts the output of the low-pass filtering device to complementary signals, and a push-pull output device, driven by the complementary signals, that supplies electrical current to a load, wherein an increase in the electrical current supplied by the push-pull output device is decreased by changes in the load due to the low-pass filtering device.Type: GrantFiled: June 19, 2002Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventors: Kenji Kinsho, Hideo Akama
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Patent number: 6741946Abstract: A preferred system for facilitating automated test equipment functionality within integrated circuits includes automated test equipment (ATE) configured to electrically interconnect with an integrated circuit and to provide at least one signal to the integrated circuit. A first parametric test circuit, internal to the integrated circuit, also is provided. The first parametric test circuit is adapted to electrically communicate with the automated test equipment so that, in response to receiving a signal from the automated test equipment, the first parametric test circuit measures at least one parameter of a first pad of the integrated circuit.Type: GrantFiled: March 7, 2003Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventors: John G. Rohrbaugh, Jeffrey R. Rearick, Shad R. Shepston
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Patent number: 6739763Abstract: A method for aligning optical components in an optical assembly. The method comprises the steps of pre-aligning the optical fiber to the optical device, measuring a coupling efficiency of the optical fiber to the optical device, applying energy to a support means, the energy being sufficient to enable the support means to become ductile, and applying a force to the support means in a direction which increases the coupling efficiency.Type: GrantFiled: September 6, 2002Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventor: Simon Meadowcroft
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Patent number: 6740871Abstract: A self-calibrating scanning system and method are used in the analysis of biomolecules on a microarray. The self-calibrating scanning system comprises an excitation light source, an optical portion, a detection portion and a calibration portion that includes a calibration apparatus and compensation portion. The calibration apparatus comprises a light source having a highly reproducible or calibrated light based on a preselected or reference light level. The calibration apparatus emits the calibrated light that is measured by the detection portion of the scanning equipment. If the detection components are stable, the components will measure a constant output value for the calibrated light over time. As a detection component changes with time, the output value will change for the same calibrated light. The method comprises the steps of initially calibrating the detection portion of the scanning system and subsequently calibrating the detection portion to compensate for sensitivity changes.Type: GrantFiled: June 23, 2003Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventors: Kenneth L. Staton, Andreas N. Dorsel
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Patent number: 6741767Abstract: The present invention uses the deflection of a piezoelectric element to move an optical element into contact with the face of an optical path to redirect an optical signal. In its undeflected state, the optical signal is reflected from the angled face of the optical path by internal reflection. When the piezoelectric actuator moves the optical element into contact with the angled face of the optical path, the index of refraction of the optical path is matched and the optical signal enters the optical element and passes through.Type: GrantFiled: March 28, 2002Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventor: Marvin Glenn Wong