Patents Assigned to Altman Associates, Inc.
  • Patent number: 4269515
    Abstract: A system for inspecting a printed circuit board constituted by an insulating board having a conductive pattern thereon which creates interconnections between circuit elements mounted on the board. In this system, a laser beam is deflected in the X and Y directions to generate a raster scan which is optically split in a manner making it possible to simultaneously examine corresponding sections of the conductive pattern on the board and on the artwork from which the board is derived. The artwork possesses the same scale and the same orientation as the desired conductive pattern on the board and therefore represents the nominal pattern required therefor. In this simultaneous examination, a comparison is made in an associated computer between the dimensions of the conductors in the pattern and the spacings therebetween on the board and on the artwork to determine the extent of the disparities therebetween.
    Type: Grant
    Filed: August 7, 1979
    Date of Patent: May 26, 1981
    Assignee: Altman Associates, Inc.
    Inventor: Norman G. Altman
  • Patent number: 4193087
    Abstract: An electro-optical computer-controlled scanning system adapted to accurately and rapidly digitize an engineering or other line drawing and to store the digital data, making it possible to reassemble a stored drawing with virtually the same fidelity as the original document. Use is made of a laser beam scanner having a wide angle deflector to sweep the beam in the X and Y directions to a degree sufficient to traverse the X and Y dimensions of the drawing being digitized and a narrow angle deflector for sweeping the beam in the X and Y directions to a degree sufficient to examine any selected region of the drawing. Information is extracted from the drawing in a two-mode procedure, the first carrying out a low-resolution survey along a narrow stripe extending in the X direction across the drawing to determine whether any drawing information is contained therein.
    Type: Grant
    Filed: May 22, 1978
    Date of Patent: March 11, 1980
    Assignee: Altman Associates, Inc.
    Inventor: Norman G. Altman
  • Patent number: 4168126
    Abstract: An electro-optical measuring system wherein a scanning laser or light beam is precisely translated in a direction parallel to itself at a constant rate to define a time-varying sensing field whose energy is picked up by a photoelectric detector that yields an output signal. An object whose dimension is to be measured is inserted in the field whereby the output signal of the detector takes the form of a pulse whose leading edge is developed by the traversal of the beam across one boundary of the object, thereby blocking passage of the energy to the detector, and whose trailing edge is developed by the traversal of the beam across the opposite boundary of the object to restore the energy pick-up. The width or time duration of the pulse is an exact index to the distance between these boundaries, the time duration being converted into a measurement reading.
    Type: Grant
    Filed: July 5, 1977
    Date of Patent: September 18, 1979
    Assignee: Altman Associates, Inc.
    Inventors: Norman G. Altman, J. Rodney Worden