Abstract: An apparatus and method are provided for testing a semiconductor device (DUT). Generally, the apparatus includes an interface board with conductive elements adapted to electrically couple with the DUT and connected to a number of test circuits. Each test circuit resides on one of a number of daughter cards on the interface board, and provides test input signals to and receives output signals from the DUT to generate a result based on a program loaded to the daughter cards before testing begins. The apparatus further includes a controller to drive the interface board and store test results. In one embodiment, the interface board is a load board for back end testing. In another embodiment, the interface board is a probe card for front end testing. Preferably, the apparatus is capable of testing DUTs including memory arrays, logic circuits or both, and the daughter cards are capable of being re-programmed and re-used on different DUTs.

Abstract: Described is a circuit comprising an oscillator, an amplifier unit and a control unit. The amplifier unit is coupled to the oscillator and to the control unit; and the control unit is arranged to regulate a load capacitance to the oscillator at startup.

Abstract: A method and device for trading off inhibit disturb against bit-line disturb in a non-volatile memory where a threshold shift per inhibit disturb is increased, a threshold shift per bit-line disturb is decreased and the total threshold shift over the expected lifetime of the non-volatile memory due to inhibit disturbs is approximately equalized with the total threshold shift over the expected lifetime of the non-volatile memory due to bit-line disturbs.

Abstract: A method is provided for forming a borderless contact to a local interconnect (LI) line on a substrate. Generally, the method includes steps of (i) depositing a nitride layer over a number of LI lines on the substrate, to substantially cover the LI lines; (ii) etching the nitride layer to form spacers adjacent to sidewalls of at least one of the number of LI lines and to expose at least a portion of a top surface of the LI line; (iii) depositing an inter-layer dielectric, such as an oxide, over the number of LI lines on the substrate and the spacers formed adjacent thereto; and (iv) performing a contact etch to etch contact openings through the inter-layer dielectric to expose the portion of the top surface of the underlying LI line. Other embodiments are also disclosed.

Abstract: A system includes a current sense amplifier to receive an input voltage based on a sense current provided to load circuitry. The current sense amplifier is configured to generate an output voltage from the input voltage based, at least in part, on one or more reconfigurable characteristics of the current sense amplifier. The system also includes a microcontroller to compare the output voltage from the current sense amplifier to one or more programmable thresholds. The microcontroller is configured to direct a current controller to regulate the sense current provided to the load circuitry according to the comparison.

Abstract: An apparatus having a plurality of power supply domains and a plurality of logic components. Each of the plurality of logic components residing within a different one of the plurality of power supply domains. Each of the plurality of logic components is configured to operate with a corresponding clock signal within a respective one of the plurality of power supply domains.

Abstract: Methods and apparatus for programming and sensing a bi-nitride layer trapped-charge memory device in one of a first and second programmed states or one of a first and second erased states, where the first and second programmed states correspond to first and second uniform trapped charge distributions of a first charge type and the first and second erased states correspond to first and second uniform trapped charge distributions of a second charge type.

Abstract: A system and method of loading a programmable counter includes storing a first digital divide value in a register. The first digital divide value is then loaded from the register to a programmable counter. The method further includes writing a second digital divide value to the register at a time responsive to a time remaining to complete a counting cycle of the programmable counter.

Abstract: A controller circuit provides communication paths between multiple host devices and a target device. The controller circuit includes a first host idle detection circuit that determines when a first host interface (I/F) is in an idle state, an idle state being when the first host I/F is not communicating with the controller circuit. A switch circuit can selectively enables a controllable communication path between a second host I/F and a target device I/F. A first response circuit can be coupled to the first host I/F and output predetermined responses from the first host I/F in response to communications received on the first host I/F. The first response circuit outputting a predetermined response when at least the controller circuit has enabled the controllable communication path between a second host I/F and the target device I/F and disabled the controllable communication path between the first host I/F and the target device I/F.

Abstract: Circuits and methods for aligning two or more signals including a first and second signal. In one embodiment, a shift register generates two or more shifted copies of the second signal, and each of a plurality of phase detectors receives the first signal and one of the shifted copies of the second signal, each phase detector providing an output indicating whether the first signal is substantially aligned with the shifted copy of the second signal. A multiplexer may also be provided for receiving each of the shifted copies of the second signal, the multiplexer having a plurality of select lines coupled with the output signals of the phase detectors. Some embodiments may include a power saving mode.

Abstract: A circuit including a first pin connection, a second pin connection, a first diode-switch arrangement and a second diode-switch arrangement. The first diode-switch arrangement is connected in series and configured to allow a current to pass from the second pin connection to the first pin connection. The second diode-switch arrangement is connected in series and configured to allow a current to pass from the first pin connection to the second pin connection. An energized state of the first and second diode-switch arrangements is determined according to a voltage detected on the first or second pin connection.

Abstract: An impedance matching circuit has a reference impedance. A comparator has a first input coupled to a terminal of the reference impedance and has an output. A pull-up counter is coupled to the output of the single comparator.

Abstract: A memory access device includes logic to switch data from a processor memory bus to a memory bus in a first operational mode, and to switch data from a test bus to the memory bus in a second operational mode, and logic to switch address signals from the processor memory bus to the memory bus in the first operational mode. In the second operational mode the device accepts from the test bus a starting memory address for memory reads and writes, and automatically and independently of the test bus adjusts a memory address for reads and writes during burst memory operations.

Abstract: A capacitance measurement circuit includes a current source, a switch, and a comparator. The current source is coupled to drive a current through a circuit node. The switch is coupled to the circuit node to switch the current into a device under test (“DUT”) capacitor. The comparator includes first and second input ports. The comparator is coupled to compare a first voltage received on the first input port against a reference voltage received on the second input port. The first voltage is related to the current driven through the circuit node, a frequency at which the switch is switched, and a capacitance of the DUT capacitor.

Abstract: An operational amplifier and a method for amplifying a signal. Embodiments provide a convenient and effective mechanism for reducing die area, design time and design verification time by sharing compensation components between the common-mode and differential feedback networks of the operational amplifier. As such, fewer compensation components are required, thereby reducing component die area. Additionally, given that the compensation components are shared between the common-mode and differential feedback networks, the feedback networks can be stabilized together with fewer compensation components to specify and verify, thereby reducing design and design verification time. Further, embodiments provide a compensation component coupling which does not couple directly to virtual ground, thereby reducing the noise of the operational amplifier.

Abstract: A method is provided for sensing displacement of an optical sensor relative to a surface, the sensor having at least first and second arrays with a plurality of photosensitive elements. The method involves: (i) generating for each array first set of quasi-sinusoidal signals at a first time and a second set of quasi-sinusoidal signals at a second time in response to motion of light received thereon; (ii) computing from said first and second sets of signals phase angle changes for signals received from each array; (iii) computing from said first and second sets of signals radius values for signals received from each array; (iv) computing unwrapped phase angle changes for signals received from each array; and (v) combining said unwrapped phase angle changes for each of said arrays using radius-weighted-averaging to provide a single weighted average of unwrapped phase angle change resulting from said motion of light.

Abstract: An integrated circuit device may include a reconfigurable analog signal switching fabric comprising a plurality of global buses that are selectively connected to external pins by pin connection circuits in response to changeable analog routing data, and a plurality of local buses that are selectively connected to analog blocks and/or global buses by routing connection circuits in response to the analog routing data; and at least one processor circuit that executes predetermined operations in response to instruction data.

Abstract: A method of operating a touch-sensing surface may include determining a presence of at least one conductive object at the touch-sensing surface by performing a search measurement of a first set of sensor elements of the touch-sensing surface, and in response to determining the presence of the at least one conductive object, determining a location of the at least one conductive object by performing a tracking measurement of a second set of sensor elements of the touch-sensing surface.

Abstract: A method and apparatus for protecting a sense transistor in a sense amplifier during memory programming and erase operations, and for increasing the coupling efficiency of the memory device during the programming and erase operations may include floating a first terminal and a second terminal of the sense transistor while programming and erasing the memory device.

Abstract: The present invention is directed to a trimming circuit and method for replica type voltage regulators. A voltage regulator circuit includes an operational amplifier (OPAMP) and a n-type metal oxide silicon (NMOS) device. An output of the OPAMP is coupled to a gate terminal of the NMOS device. The voltage regulator circuit includes a potential divider circuit comprising a plurality of discrete devices coupled in series. A source terminal of the NMOS device is coupled to the potential divider circuit to form an output feedback node. The body of the NMOS device is biased variably across a plurality of tap points formed between consecutive discrete devices in the potential divider circuit.