Patents Assigned to Government of the United States of America as Represented by the Director, National Security Agency
  • System and method for performing scanning tunneling microscopy on current-carrying samples
    Patent number: 10976344
    Abstract: A scanning tunneling microscopy based potentiometry system and method for the measurements of the local surface electric potential is presented. A voltage compensation circuit based on this potentiometry system and method is developed and employed to maintain a desired tunneling voltage independent of the bias current flow through the film. The application of this potentiometry system and method to the local sensing of the spin Hall effect is outlined herein, along with the experimental results obtained.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: April 13, 2021
    Assignees: University of Maryland, College Park, Government of the United States of America as Represented by the Director, National Security Agency
    Inventors: Ting Xie, Michael Dreyer, Isaak D. Mayergoyz, Robert E. Butera, Charles S. Krafft