Patents Assigned to Hitachi, Ltd.
  • Publication number: 20210157676
    Abstract: A distributed storage places data units and parity units constituting a stripe formed by divided data into storage nodes in a distributed manner. In reference to determination formulas, either a full-stripe parity calculation method or an RPM parity calculation method is selected so as to minimize an amount of network traffic.
    Type: Application
    Filed: March 3, 2020
    Publication date: May 27, 2021
    Applicant: HITACHI, LTD.
    Inventors: Kazushi NAKAGAWA, Mitsuo HAYASAKA, Yuto KAMO
  • Publication number: 20210156939
    Abstract: An object of the present invention is to provide an MRI apparatus capable of optimally setting imaging conditions for map measurement depending on a target value and its required accuracy, and a method for controlling the MRI apparatus. An imaging unit of the MRI apparatus includes, as a pulse sequence, a pulse sequence for the T1 map measurement that includes a first signal acquisition sequence and a plurality of signal acquisition sequences executed after application of an inverted pulse and at different signal acquisition times from the inverted pulse. An imaging controller of the MRI apparatus controls the imaging conditions of each of the plurality of signal acquisition sequences, for example, the signal acquisition time from the inverted pulse and the number of signal acquisition sequences depending on the T1 value of an imaging target and the required accuracy.
    Type: Application
    Filed: June 12, 2020
    Publication date: May 27, 2021
    Applicant: Hitachi, Ltd.
    Inventors: Akihiro Odaka, Kousuke Itou
  • Publication number: 20210158574
    Abstract: A calculation device comprises a color evaluation unit that acquires a sensor color and four or more reference colors from photography data from a measurement time when an indication object was photographed in a second photography environment; determines coefficients for color conversion between a first and the second photography environments based on the amount of change from color information for the reference colors in the first photography environment, which has been read from a calculation device storage unit, to color information for the reference colors in the second photography environment, which has been acquired from the photography data; and uses the sensor color acquired from the photography data from the measurement time and the color conversion coefficients to correct the sensor color to the color that would have been photographed in the first photography environment by solving a conversion formula including terms representing an affine transformation consisting of translation.
    Type: Application
    Filed: March 20, 2019
    Publication date: May 27, 2021
    Applicant: HITACHI, LTD.
    Inventors: Yuji SUWA, Kohhei AIDA, Shunsuke MORI, Shigetaka TSUBOUCHI, Masahiro KAWASAKI, Yoshifumi SEKIGUCHI
  • Patent number: 11016698
    Abstract: A storage system is coupled to another storage system and a higher-level apparatus via a network, and copies write data received from the higher-level apparatus to the other storage system. This storage system is provided with interface units, each provided with a plurality of ports that can be coupled to the network; and a plurality of controllers coupled to a respective one of the interface units. Each controller has a processor unit. When each processor unit receives write data from the higher-level apparatus via a first port coupled to the interface unit that is coupled to the controller to which the processor unit belongs, the processor unit selects, from among the ports of the interface unit coupled to the controller to which the processor unit belongs, a second port for transmitting the write data to the other storage system, and transmits the write data to the other storage system.
    Type: Grant
    Filed: July 4, 2017
    Date of Patent: May 25, 2021
    Assignee: HITACHI, LTD.
    Inventors: Kazuki Hongo, Yasuhiko Yamaguchi
  • Patent number: 11016758
    Abstract: Proposal of data analysis components is enabled to be performed irrespective of the quantity of an implementation history of data analysis, and thus efficiency and cost reduction of production of software for data analysis are promoted. A data utilization platform server 101 is configured to includes a arithmetic device 112 which executes processing of generating analysis relationship information prescribing linkage between analysis target data and an analysis component executing analysis processing for the analysis target table on the basis of a relationship among a plurality pieces of the analysis target data collected from a plurality of predetermined systems; and processing of specifying a combination of a plurality of the analysis components available for predetermined data designated as an analysis target by a user on the basis of the analysis relationship information.
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: May 25, 2021
    Assignee: HITACHI, LTD.
    Inventors: Hidenori Yamamoto, Takeshi Handa, Yuko Yamashita, Kenji Kawasaki, Syuuichirou Sakikawa, Takashi Tsuno
  • Patent number: 11015159
    Abstract: A single-use cell culturing apparatus and a culturing bag are provided, each of which can improve efficiency of stirring a culture solution and further reduce a possibility of leakage of the culture solution. The single-use cell culturing apparatus of the present invention includes a housing that accommodates the culturing bag which is flexible and can seal the culture solution inside thereof. The housing has, on an inner surface thereof, a curved convex-shaped protrusion provided at a portion of a contact face at which the housing is in contact with the culturing bag. The culturing bag of the present invention is accommodated in the housing of the single-use cell culturing apparatus; is flexible; and can seal the culture solution inside thereof. The culturing bag includes a concave portion having a shape corresponding to the curved convex protrusion disposed on a part of the housing.
    Type: Grant
    Filed: July 1, 2016
    Date of Patent: May 25, 2021
    Assignees: HITACHI, LTD., FUJIMORI KOGYO CO., LTD.
    Inventors: Masaru Nanba, Takashi Andou, Yui Sugita, Sei Murakami, Hiroyuki Matsuda
  • Patent number: 11018876
    Abstract: Provided is a signature verification system comprising: a signature terminal including a biometric information acquisition unit for acquiring biometric information of a user, a public template certificate generation unit for generating a public template certificate by subjecting the biometric information to predetermined processing, a key pair generation unit for generating a pair of a secret key and a public key, and a public key certificate generation unit for generating a public key certificate by providing a biometric signature to the public key with the biometric information used as a key; and a verification terminal including a public key certificate verification unit for receiving a transaction including the public template certificate, the public key certificate, and a signature to verify the validity of the public key certificate using the public template certificate, and a signature verification unit for verifying the signature using the public key certificate.
    Type: Grant
    Filed: May 16, 2017
    Date of Patent: May 25, 2021
    Assignee: HITACHI, LTD.
    Inventors: Yosuke Kaga, Kenta Takahashi, Masakazu Fujio, Ken Naganuma
  • Patent number: 11016515
    Abstract: A system operation decision-making assistance device includes: a state mode clustering unit that calculates, on the basis of measurement data DB1 of a power system and a clustering parameter DB3, which state mode, from among prescribed state modes, applies to a power system; a state mode collation unit that collates state transition data DB4 indicating transitions between state modes and the calculated state mode to calculate state transition probability data, which is the probability of transitioning from the calculated state mode to each state mode defined in the state transition data; and an accident shift pattern calculation unit that calculates important accident cases on the basis of a system model DB2, an importance parameter DB5 including the importance of a power system accident, the measurement data, and the calculated state transition probability data.
    Type: Grant
    Filed: October 6, 2017
    Date of Patent: May 25, 2021
    Assignee: HITACHI, LTD.
    Inventors: Kenta Kirihara, Nao Saito, Taichiro Kawahara, Masahiro Yatsu
  • Patent number: 11016828
    Abstract: A task support system and method improve an operator's handling of an unknown new event. The task support system and method handle an event that occurred in a management target, in relation to an unknown event, and one or more event types are evaluated as event type candidates. A first event type candidate group having a high confidence score among the evaluated event type candidates is extracted and a first candidate confidence score is calculated from each confidence score of each event type candidate of the first event type candidate group. A first candidate importance is calculated from first importance held by an event type corresponding to each event type candidate belonging to the first event type candidate group and information other than the first importance. A diagram corresponding to each event is represented in a coordinate space by using the first candidate confidence score and the first candidate importance.
    Type: Grant
    Filed: March 9, 2020
    Date of Patent: May 25, 2021
    Assignee: HITACHI, LTD.
    Inventors: Keita Suzuki, Akihiro Urano
  • Patent number: 11017512
    Abstract: According to one embodiment, a depth map used for a reflection model is generated based on a power image as a blood flow image. A reflection image is generated from the depth map according to the reflection model. By synthesizing the reflection image 70 with the power image, a weighted power image is generated. Using the same method as described above, a weighted velocity image may be generated.
    Type: Grant
    Filed: March 22, 2019
    Date of Patent: May 25, 2021
    Assignee: Hitachi, Ltd.
    Inventor: Takehiro Tsujita
  • Patent number: 11016138
    Abstract: A diagnostic system for a power conversion apparatus including a semiconductor device and performing a switching operation for carrying and interrupting a main current to a main current is disclosed. This system includes a trigger circuit that acquires reference time for the switching operation; and a delay time calculation circuit that acquires first time at which the main current takes a first main current set value and second time at which the main current takes a second main current set value, and that detects numerical data about a difference between the first time and the reference time and numerical data about a difference between the second time and the reference time.
    Type: Grant
    Filed: May 9, 2016
    Date of Patent: May 25, 2021
    Assignee: Hitachi, Ltd.
    Inventors: Yoshinobu Kimura, Junichi Sakano, Kimihisa Furukawa, Takashi Ogawa, Renichi Yamada
  • Patent number: 11014184
    Abstract: Some examples include a computing device that receives optical signal information based on respective optical signals received through a plurality of optical fibers during a welding operation. For example, the plurality of optical fibers may be positioned to receive electromagnetic radiation from a weld area during the welding operation. The computing device may compare the optical signal information corresponding to a first one of the optical fibers with the optical signal information corresponding to a second one of the optical fibers. Based at least partially on the comparing, the computing device may determine whether at least one of a weld geometry or a welding arc is irregular. The computing device may perform at least one action based on determining that at least one of the weld geometry or the welding arc is irregular.
    Type: Grant
    Filed: April 23, 2018
    Date of Patent: May 25, 2021
    Assignee: HITACHI, LTD.
    Inventors: Jiye Wang, Wei Yuan
  • Patent number: 11018528
    Abstract: Provided is a power conversion device by which an inverter MOS transistors included in an inverter can be prevented from short-circuiting. It has a DC/DC converter unit converting a voltage of DC power to be inputted, a transformation unit transforming the DC power converted by the DC/DC converter unit, an inverter unit converting the DC power transformed by the transformation unit to AC power, a control unit driving/controlling the inverter unit, a wireless power reception unit receiving power fed by wireless power feed to supply it to the control unit, a wireless power transmission unit transmitting power to the wireless power reception unit, and a power supply unit supplying power to the wireless power transmission unit.
    Type: Grant
    Filed: April 6, 2016
    Date of Patent: May 25, 2021
    Assignee: HITACHI, LTD.
    Inventors: Yoshikazu Sugiyama, Katsuei Ichikawa, Yasuaki Norimatsu
  • Patent number: 11016461
    Abstract: A control system includes: an operation interface generates operation amount information and priority information on the basis of an operation amount; an automatic control unit generates an automatic control output based on a predetermined input; a safety verification unit verifies the safety of the automatic control output; and an output control unit produces a control output in accordance with the automatic control output or the operation amount information on the basis of the automatic control output, the operation amount information, the priority information, and the safety verification result from the safety verification unit. The control output is generated in accordance with the automatic control output, in accordance with the operation amount information only when the control output is verified as safe by the safety verification unit, or in accordance with the operation amount information regardless of whether the control output is verified as safe by the safety verification unit.
    Type: Grant
    Filed: February 22, 2017
    Date of Patent: May 25, 2021
    Assignee: HITACHI, LTD.
    Inventor: Nobuyasu Kanekawa
  • Patent number: 11011344
    Abstract: An interferometric electron microscope with increased irradiating electric current density which causes electron waves to interfere with each other and includes: an electron source; an irradiating lens system a focusing lens system an observational plane an artificial grating disposed between the electron source and the irradiating lens system and diffracting the electron beam emitted from the electron source to produce a first electron wave and a second electron wave; an electron beam biprism deflecting the first electron wave and the second electron wave to pass the first electron wave through the specimen for use as an object wave and to use the second electron wave as a reference wave; and an electron beam biprism in a focusing system deflecting the objective wave and the reference wave to superimpose the objective wave and the reference wave on the observational plane to produce an image.
    Type: Grant
    Filed: February 11, 2020
    Date of Patent: May 18, 2021
    Assignees: HITACHI, LTD., RIKEN
    Inventors: Toshiaki Tanigaki, Tetsuya Akashi, Ken Harada
  • Patent number: 11007650
    Abstract: A robot procurement apparatus stores a deficient or surplus number of robots in each of service areas where robots provide services and performs a procurement process of determining a procurement target robot to a dispatch destination service area that is the service area to which the robot is to be dispatched based on the deficient or surplus number of robots in the dispatch destination service area and the deficient or surplus number of robots in any service area other than the dispatch destination service area. The robot procurement apparatus sets the deficient or surplus number of robots in each of the service areas based on load of the robot in the service area.
    Type: Grant
    Filed: March 23, 2018
    Date of Patent: May 18, 2021
    Assignee: HITACHI, LTD.
    Inventors: Jingze Dai, Hideya Yoshiuchi
  • Patent number: 11010269
    Abstract: A distributed processing system includes a plurality of information processing apparatuses communicably coupled to one another and is capable of performing parallel processing in which the information processing apparatus performs predetermined processing in parallel with the other information processing apparatuses.
    Type: Grant
    Filed: May 29, 2018
    Date of Patent: May 18, 2021
    Assignee: HITACHI, LTD.
    Inventors: Hiroaki Konoura, Masafumi Kinoshita, Nobuyuki Chaki
  • Patent number: 11008415
    Abstract: In a conventional self-healing material, although the resin properties after self-healing are restored to the same level as the initial refractoriness and strength of the resin, no further extension of life can be expected. A resin cured product according to the present invention includes: a first vinyl monomer having an ester bond; a second vinyl monomer having a hydroxyl group; a transesterification reaction catalyst; and a boron compound.
    Type: Grant
    Filed: July 7, 2017
    Date of Patent: May 18, 2021
    Assignee: HITACHI, LTD.
    Inventors: Yuri Kajihara, Takahito Muraki, Yasuhiko Tada, Jun Nunoshige, Takeshi Kondo
  • Patent number: 11009431
    Abstract: There is provided a failure mode specifying system or the like that suitably specifies a failure mode of an apparatus. A failure mode specifying system 10 includes a communication portion 11 that obtains data including a detection value of a sensor 22 which is installed in an apparatus 20, an apparatus structural parameter estimating portion 14 that estimates a predetermined apparatus structural parameter based on a structure and properties of the apparatus 20, based on the data which is obtained by the communication portion 11, a failure mode specifying portion 16 that specifies a failure mode indicating a kind of failure or failure sign of the apparatus 20, based on the apparatus structural parameter, and an input-output portion 18 that presents the failure mode which is specified by the failure mode specifying portion 16.
    Type: Grant
    Filed: November 9, 2018
    Date of Patent: May 18, 2021
    Assignee: HITACHI, LTD.
    Inventors: Takayuki Uchida, Tomoaki Hiruta, Toshiaki Kono, Yasuharu Namba
  • Patent number: 11010238
    Abstract: A management system of a storage system specifies a matching rate between an occurred fault and each of one or more registered faults on the basis of fault analysis information which is information indicating, for each fault, a relation between a fault in the storage system and a fault detail including knowledge base information. Each of the one or more registered faults is a fault in which the information is registered in the fault analysis information. The management system displays information related to the registered fault including the specified matching rate with respect to each of the one or more registered faults.
    Type: Grant
    Filed: August 1, 2017
    Date of Patent: May 18, 2021
    Assignee: HITACHI, LTD.
    Inventors: Takaaki Gonoji, Toshimichi Kishimoto