Patents Assigned to Nuctech Company Limited
  • Patent number: 10489939
    Abstract: A spectral CT image reconstructing method includes: collecting incomplete original projection data in each of a plurality of energy windows; performing a projection data cross estimation using corresponding original projection data in at least one pair of energy windows constituted by different energy windows of the plurality of energy windows to obtain estimated projection data, wherein each pair of energy windows comprises a first energy window and a second energy window; combining the original projection data and the corresponding estimated projection data to obtain complete projection data; and reconstructing a spectral CT image using the complete projection data.
    Type: Grant
    Filed: August 22, 2016
    Date of Patent: November 26, 2019
    Assignees: TSINGHUA UNIVERSITY, NUCTECH COMPANY LIMITED
    Inventors: Yuxiang Xing, Li Zhang, Huayu Zhang, Le Shen
  • Patent number: 10474897
    Abstract: The disclosure relates to smart security inspection systems and methods. One illustrative method may comprise distributing, by the system, a security inspection tray to a person to be inspected through an unpacking station and associating/binding information regarding the person to be inspected to a baggage identifier, and identifying the baggage identifier, obtaining the information of the person to be inspected according to the baggage identifier, obtaining pre-stored risk information according to the information of the person to be inspected, performing differentiated security inspections on the person to be inspected and/or baggage according to the risk information, and associating/binding the obtained data to the information of the person to be inspected. Further implementations relate to features such as processing identity information, controlling flow in the baggage handling area(s), imaging baggage, packing the baggage, and finishing the security inspection.
    Type: Grant
    Filed: September 20, 2016
    Date of Patent: November 12, 2019
    Assignee: Nuctech Company Limited
    Inventors: Jia Xu, Hu Tang, Qingping Huang, Ying Fan
  • Patent number: 10473795
    Abstract: A large-area X-ray gas detector includes a housing having an inner cavity and a ray entrance communicated with the inner cavity, a thin entrance window and a signal collection module. The inner cavity is filled with a working gas which is a non-electronegativity gas sensitive to the X-ray. The entrance window is hermetically connected to the ray entrance such that the X-ray enters into the inner cavity. The signal collection module comprises an anode wire electrode layer and a cathode electrode layer arranged parallel with each other in the inner cavity, in which the anode wire electrode layer has an anode wire for accessing to a high voltage, and the cathode electrode layer is grounded. The anode wire electrode layer collects electrons generated by the working gas under an action of the X-ray.
    Type: Grant
    Filed: July 3, 2018
    Date of Patent: November 12, 2019
    Assignee: NUCTECH COMPANY LIMITED
    Inventors: Yongqiang Wang, Qingjun Zhang, Yuanjing Li, Ziran Zhao, Lifeng Sun, Nan Bai, Xingliang Zhai
  • Patent number: 10466372
    Abstract: The present invention discloses an X-ray beam intensity monitoring device and an X-ray inspection system. The X-ray beam intensity monitoring device comprises an intensity detecting module and a data processing module, wherein the intensity detecting module is adopted to be irradiated by the X-ray beam and send a detecting signal, the data processing module is coupled with the intensity detecting module to receive the detecting signal and output an X-ray beam intensity monitoring signal, wherein the X-ray beam intensity monitoring signal includes a dose monitoring signal for the X-ray beam and a brightness correction signal for correcting signal values of the X-ray beam. The X-ray beam intensity monitoring device can simultaneously perform dose monitoring and brightness monitoring, thereby improving the service efficiency of the X-ray beam intensity monitoring device. Moreover, the monitoring result of the X-ray beam intensity can be more accurate and reliable.
    Type: Grant
    Filed: December 29, 2015
    Date of Patent: November 5, 2019
    Assignees: TSINGHUA UNIVERSITY, NUCTECH COMPANY LIMITED
    Inventors: Kejun Kang, Shuwei Li, Qingjun Zhang, Yuanjing Li, Yulan Li, Ziran Zhao, Yinong Liu, Yaohong Liu, Weibin Zhu, Xiaolin Zhao, Huishao He
  • Patent number: 10458928
    Abstract: Embodiments of the present disclosure provide a collimating device and a ray inspection device. The collimating device comprises: a beam guiding cylinder, a first collimator mounted at an inlet end of the beam guiding cylinder; a second collimator mounted an outlet end of the beam guiding cylinder; a beam guiding cylinder adjusting device disposed adjacent to the inlet of the beam guiding cylinder to adjust a direction of the beam guiding cylinder such that the first collimator is aligned with the first direction. The outlet end of the beam guiding cylinder is fixed to the frame and the second collimator is aligned with an object to be irradiated by a radiation beam, and the beam guiding cylinder is configured to have flexibility to allow the adjusting device to adjust a direction towards which the inlet end of the beam guiding cylinder is directed, in a direction transverse to the first direction.
    Type: Grant
    Filed: May 19, 2016
    Date of Patent: October 29, 2019
    Assignees: Nuctech Company Limited, Nuctech Jiangsu Company Limited
    Inventors: Zhiqiang Chen, Wanlong Wu, Ziran Zhao, Guangwei Ding, Ming Ruan, Xilei Luo
  • Patent number: 10448904
    Abstract: The present disclosure provides a decomposition method based on basis material combination. In the present disclosure, a scanned object is divided into a plurality of regions, the basis material combinations used in each of the divided regions are different each other, and the scanned object is re-divided according to the re-determined equivalent atomic number of its each point until the change on decomposition coefficient meets certain conditions. Thereby, a decomposition method based on dynamic basis material combinations is realized, which reduces a decomposition error caused by improper selection of the basis material combination and improves the accuracy of the decomposition and substance identification of the multi-energy CT.
    Type: Grant
    Filed: December 26, 2018
    Date of Patent: October 22, 2019
    Assignees: TSINGHUA UNIVERSITY, NUCTECH COMPANY LIMITED
    Inventors: Liang Li, Zhiqiang Chen, Kejun Kang, Ziran Zhao, Li Zhang, Yuxiang Xing, Tiao Zhao, Jianmin Li, Bicheng Liu, Qian Yi
  • Patent number: 10446288
    Abstract: The present invention provides a ray beam guiding device for guiding a ray beam in a ray inspection apparatus. The ray beam guiding device is provided in a housing of the ray inspection apparatus, and two ends of the ray beam guiding device are connected to a front collimator and a rear collimator, respectively. The ray beam guiding device comprises a plurality of guiding walls and a guiding cavity surrounded by the guiding walls. The guiding wall is formed of a first material which is capable of absorbing rays or the first material is coated on an inside of the guiding wall, and the guiding cavity has a central axis extending in a direction from the rear collimator to the front collimator, and the ray beam guiding device further comprises at least one fin plate provided in the guiding cavity of the ray beam guiding device. The at least one fin plate is configured for blocking and/or absorbing scattered rays.
    Type: Grant
    Filed: July 12, 2016
    Date of Patent: October 15, 2019
    Assignees: Nuctech Company Limited, Nuctech Jiangsu Company Limited
    Inventors: Zhiqiang Chen, Yuanjing Li, Ziran Zhao, Wanlong Wu, Junli Li, Ming Ruan, Guangwei Ding
  • Patent number: 10436932
    Abstract: The present disclosure discloses an inspection system for quarantine and a method thereof. The CT technology is applied to the field of quarantine supervision, overcoming a problem of objects in an image of a single-view or a multi-view X-ray machine being overlapped, as well as a problem of organics including contrabands in a conventional CT image being not highlighted, not elaborated, and having bad contrast. Accuracy and efficiency of inspecting an object by human operator for quarantine inspection can be considerably improved, which is of a high application value.
    Type: Grant
    Filed: September 28, 2016
    Date of Patent: October 8, 2019
    Assignees: NUCTECH COMPANY LIMITED, CINTS CO., LTD.
    Inventors: Qitian Miao, Zhiqiang Chen, Li Zhang, Yunda Sun, Ming Huang, Qingping Huang, Ming Hu, Lei Lei, Jie Xia
  • Publication number: 20190301976
    Abstract: A method and a system for fast inspecting a vehicle based on a length measuring device, including: when a subject vehicle enters an inspection region, measuring a first length and a second length of the subject vehicle; determining whether the first length and the second length is respectively larger than or equal to a preset second length threshold; if so, determining whether a gap portion of the subject vehicle between a first portion and a second portion of the subject vehicle appears in a beam emitting region formed by a beam of radiation rays emitted by the system for fast inspecting a vehicle; and when the gap portion appears in the beam emitting region, emitting a beam of radiation rays of a first radiation dose to the subject vehicle according to the gap portion, wherein the subject vehicle moves with respect to the system for fast inspecting a vehicle.
    Type: Application
    Filed: May 20, 2019
    Publication date: October 3, 2019
    Applicant: Nuctech Company Limited
    Inventors: Yanwei XU, Weifeng YU
  • Patent number: 10429348
    Abstract: A detection apparatus and a detection method are disclosed. In one aspect, the detection apparatus includes a sampling device for collecting samples to be checked. It further includes a sample pre-processing device configured to pre-process the sample from the sampling device. It further includes a sample analyzing device for separating samples from the pre-processing device and for analyzing the separated samples. The detection apparatus is miniaturized and highly precise, and is capable of quickly and accurately detecting gaseous phase or particulate substances, and it has applications for safety inspections at airports, ports, and subway stations.
    Type: Grant
    Filed: April 5, 2019
    Date of Patent: October 1, 2019
    Assignee: Nuctech Company Limited
    Inventors: Qingjun Zhang, Yuanjing Li, Zhiqiang Chen, Ziran Zhao, Yinong Liu, Yaohong Liu, Huishao He, Qiufeng Ma, Weiping Zhu, Xiang Zou, Jianping Chang, Song Liang
  • Patent number: 10430669
    Abstract: A method, server and system for operating on security inspection data is disclosed. In one aspect, an example method performed by a server for operating on security inspection data includes receiving an operation request for target security inspection data from a client through a network. The target security inspection data is loaded from a storage server based on the operation request. Image processing on the loaded target security inspection data is performed. The processed target security inspection data or a graphic interface including the processed target security inspection data is encoded. The encoded target security inspection data or graphic interface is transmitted to the client through the network in a video stream.
    Type: Grant
    Filed: September 28, 2017
    Date of Patent: October 1, 2019
    Assignee: Nuctech Company Limited
    Inventors: Hu Tang, Li Zhang, Zhiqiang Chen, Jiamin Zhang
  • Patent number: 10422889
    Abstract: A radiation detector assembly and a method of manufacturing the same are provided. The radiation detector assembly includes a base and an outer encapsulation layer. The base includes a scintillator having a light-entering surface and a light-exiting surface on both ends thereof, respectively; a reflection layer provided on the light-entering surface and an outer peripheral surface of the scintillator; a photosensor comprising a photosensitive surface and an encapsulation housing, the photosensitive surface is coupled to the light-exiting surface via an optical adhesive; and an inner encapsulation layer adhered to an outer surface of the reflection layer and hermetically encapsulates a coupling portion where the scintillator and the photosensor connected with each other. The outer encapsulation layer is provided on the outer surface of the base.
    Type: Grant
    Filed: December 28, 2017
    Date of Patent: September 24, 2019
    Assignee: NUCTECH COMPANY LIMITED
    Inventors: Bozhen Zhao, Qingjun Zhang, Ziran Zhao, Shuwei Li, Lifeng Sun, Wenjian Zhang
  • Patent number: 10416344
    Abstract: An inspection device for quarantine that includes a dual-energy CT apparatus capable of distinguishing substances, a DR apparatus, a substance identification system capable of enhancing display of an object (plant, animal, meat, etc.) focused for quarantine and automatically so labeling, and an image processing system capable of highlighting a suspect of quarantine and providing a corresponding automatic alarm. Compared to the prior art, the present disclosure can highlight a focused object for quarantine, which may improve accuracy and efficiency of inspection for quarantine at a port.
    Type: Grant
    Filed: September 28, 2016
    Date of Patent: September 17, 2019
    Assignees: CINTS CO. LTD., NUCTECH COMPANY LIMITED
    Inventors: Qitian Miao, Zhiqiang Chen, Li Zhang, Ming Huang, Yunda Sun, Ming Hu, Qingping Huang, Jie Xia, Lei Lei
  • Patent number: 10408804
    Abstract: A darkroom type security inspection apparatus and a method of performing an inspection using the darkroom type security inspection apparatus. An apparatus includes a housing constituting a closed darkroom, and assemblies disposed inside the housing. The assemblies disposed inside the housing include: a sample collecting unit configured to collect a sample, a conveyor unit, and a X-ray detection unit to detect a position of the objected to be inspected, wherein the X-ray detection unit is configured to determine the position of the objected to be inspected within the sampling assembly so that the object to be inspected together with the conveyor unit is conveyed to an expected position; and a sample processing assembly, wherein the assemblies disposed inside the housing are communicated by fittings or connectors.
    Type: Grant
    Filed: September 26, 2016
    Date of Patent: September 10, 2019
    Assignees: TSINGHUA UNIVERSITY, NUCTECH COMPANY LIMITED
    Inventors: Qingjun Zhang, Yuanjing Li, Zhiqiang Chen, Ziran Zhao, Weiping Zhu, Yaohong Liu, Qiufeng Ma, Xiang Zou, Huishao He, Jianping Chang, Song Liang
  • Patent number: 10408966
    Abstract: The present disclosure discloses an inspection device, an inspection method and an inspection system. The device comprises a distributed ray source comprising multiple source points; a light source collimator configured to converge the rays generated by the distributed ray source to form an inverted fan-shaped ray beam; a scatter collimator configured to only allow rays scattered at one or more particular scattering angles which are generated by the rays from the light source collimator interacting with inspected objects to pass; at least one detector each comprising multiple detection units which have an energy resolution capability and are substantially arranged in a cylindrical surface to receive the scattered rays passing through the scatter collimator; and a processing apparatus configured to calculate energy spectrum information of the scattered rays from the inspected objects based on a signal output by the detectors.
    Type: Grant
    Filed: March 3, 2015
    Date of Patent: September 10, 2019
    Assignees: TSINGHUA UNIVERSITY, NUCTECH COMPANY LIMITED
    Inventors: Zhiqiang Chen, Li Zhang, Tianyi Yangdai, Qingping Huang
  • Patent number: 10408760
    Abstract: A Raman spectrum detecting method and electronic device are disclosed. In one aspect, an example method includes detecting and obtaining a first Raman spectrum signal of a package. A second Raman spectrum signal of the object is detected and obtained with the package. The first Raman spectrum signal is successively subtracting from the second Raman spectrum signal to obtain a series of third Raman spectrum signals with package interference eliminated. Information entropies of the third and first Raman spectrum signals are calculated and compared with information entropy of the first Raman spectrum signal. Information entropies of third Raman spectrum signals greater than the first Raman spectrum signal are set into an information entropy sequence to be selected, and a minimum information entropy from the sequence is selected. The third Raman spectrum signal corresponding to the minimum information entropy is used as an optimized Raman spectrum signal with package interference eliminated.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: September 10, 2019
    Assignee: Nuctech Company Limited
    Inventors: Hongqiu Wang, Wei Gou
  • Patent number: 10411051
    Abstract: A coplanar electrode photodiode array and a manufacturing method thereof are disclosed. On a top side of a low resistance rate substrate, a high resistance epitaxial silicon wafer, a first conductive type heavily doped region and a second conductive type doped region are formed, which are a cathode and an anode of a photodiode respectively. The structure includes a trench structure formed between the anode and the cathode, the trench structure may be form by a gap, an insulating material, a conductive structure, a reflective material, and ion implantation, and also includes a first conductive type heavily doped region, an insulating isolation layer or a conductive structure with an insulating layer, and the like formed under the anode and the cathode.
    Type: Grant
    Filed: August 31, 2016
    Date of Patent: September 10, 2019
    Assignee: Nuctech Company Limited
    Inventors: Lan Zhang, Yuanjing Li, Yinong Liu, Haifan Hu, Jun Li
  • Patent number: 10401308
    Abstract: The present application relates to a dual-energy detection method, system and apparatus. The apparatus includes: a first pixel detector array proximal to a ray source, configured to detect ray source photons having relatively low energy; and a second pixel detector array distal from the ray source, configured to detect ray source photons having relatively high energy; wherein the first pixel detector array includes a plurality of rows of first pixel detectors, the first pixel detector including a first sensitive medium, a first photosensitive device, a first incidence plane, and a first window; the second pixel detector array includes a single row of second pixel detectors, the second pixel detector including a second sensitive medium, a second photosensitive device, a second incidence plane, and a second window; and each of the second pixel detectors has the same pixel area as corresponding plurality of first pixel detectors thereof.
    Type: Grant
    Filed: September 28, 2016
    Date of Patent: September 3, 2019
    Assignee: NUCTECH COMPANY LIMITED
    Inventors: Qingjun Zhang, Yuanjing Li, Shuwei Li, Ziran Zhao, Weibin Zhu, Junxiao Wang, Jianhua Li
  • Patent number: 10397491
    Abstract: The present invention relates to a photogrammetry system and method. The photogrammetry system comprises: photographing devices capable of photographing an object at a predetermined time interval; and, a data processing device capable of calculating an actual length of the object or a certain portion on the object according to a length of the object or a certain portion on the object in the images obtained by the photographing devices and a distance of the object in the two images, wherein the object moves at a speed V; the photographing devices photograph the object for two times at a time interval t; the distance of the object in the two images obtained by the two times of photographing is Dp; the length of the object or a certain portion on the object in the images is Lp; and, the actual length L of the object or a certain portion on the object may be obtained by the following formula: L = Lp × Vt Dp .
    Type: Grant
    Filed: December 29, 2015
    Date of Patent: August 27, 2019
    Assignee: NUCTECH COMPANY LIMITED
    Inventors: Mingliang Li, Yuanjing Li, Jianmin Li, Ying Li, Zhiqiang Chen, Kejun Kang
  • Patent number: 10386509
    Abstract: The disclosed technology relates to a ray energy calibration device and method, and a ray imaging system. In one aspect, the ray energy calibration device includes a plurality of wheels arranged to be rotatable about a common shaft and each provided with one or more protruding blocks at respective specific positions of an outer circumference thereof. The ray energy calibration device further includes a plurality of calibration members, with each of the calibration members being configured such that through rotation of a corresponding one of the wheels, the calibration member can be moved to a calibration position by the protruding block at a specific position on the outer circumference of the wheel.
    Type: Grant
    Filed: September 19, 2018
    Date of Patent: August 20, 2019
    Assignee: Nuctech Company Limited
    Inventors: Yumei Chen, Xinshui Yan, Quanwei Song, Wei Yin, Weiqiang Guan