Patents Assigned to Pyramid Technical Consultants, Inc.
  • Patent number: 10456598
    Abstract: The present disclosure is directed to systems and methods for real-time control of a charged particle pencil beam system during therapeutic treatment of a patient. In an aspect, the present disclosure is directed to measuring an actual shape, an actual intensity distribution, and an actual location at isocenter of the charged particle pencil beam. The actual data is compared to model treatment data in real time to determine if a statistically significant variance occurs in which case the charged particle pencil beam can be stopped mid-treatment for correction and/or analysis.
    Type: Grant
    Filed: August 29, 2018
    Date of Patent: October 29, 2019
    Assignee: Pyramid Technical Consultants Inc.
    Inventors: Raymond Paul Boisseau, William P. Nett, John S. Gordon, Sashidar Kollipara, Yuriy Kozlov
  • Patent number: 10300304
    Abstract: An assembly for preventing an overdose of a charged particle beam during therapy to a patient includes a pixelated detector apparatus and a controller. The controller includes, for each pixel: a current integrator circuit that converts the local measured current into a total local detected charge integrated from a start time, the integrator circuit outputting an integrator voltage that corresponds to the total local detected charge; and a discriminator circuit that compares the integrator voltage with a reference voltage, the reference voltage corresponding to a maximum acceptable dose for the patient. A logic circuit generates an overdose fault signal if, at any of the pixels, the integrator voltage is higher than the reference voltage.
    Type: Grant
    Filed: February 26, 2018
    Date of Patent: May 28, 2019
    Assignee: Pyramid Technical Consultants Inc.
    Inventors: William P. Nett, John Gordon, Raymond Paul Boisseau
  • Patent number: 10195465
    Abstract: A control system for fine tuning or spreading a charged particle pencil beam includes a low-inductance, low-power compensation or fine-tuning magnet assembly. The feedback loop that includes the compensation magnet assembly has a faster response rate than the feedback loop that includes the scan nozzle. The compensation or fine-tuning magnet assembly is preferably disposed upstream of the scan nozzle magnet(s) with respect to the beam path to make rapid but minor adjustments to the beam position between iterations of the scan nozzle.
    Type: Grant
    Filed: December 13, 2017
    Date of Patent: February 5, 2019
    Assignee: Pyramid Technical Consultants Inc.
    Inventors: John Stuart Gordon, Raymond Paul Boisseau
  • Patent number: 10183178
    Abstract: A control system for providing a closed loop, real time control of a charged particle pencil beam is disclosed. The system includes a first detector apparatus, a second detector apparatus, a first orthogonal magnetic deflector apparatus, a second orthogonal magnetic deflector apparatus, and a controller. The controller compares the measured position and beam angle of the beam with a model position and beam angle of a model beam to determine an offset error and a beam angle error. The first orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a first component of the offset and beam angle errors. The second orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a second component of the offset and beam angle errors. The beam can be iteratively adjusted during patient therapy or short pauses in patient therapy.
    Type: Grant
    Filed: May 4, 2016
    Date of Patent: January 22, 2019
    Assignee: Pyramid Technical Consultants Inc.
    Inventors: Raymond Paul Boisseau, John Gordon, William P. Nett, Kan Ota
  • Patent number: 10092777
    Abstract: The present disclosure is directed to systems and methods for real-time control of a charged particle pencil beam system during therapeutic treatment of a patient. In an aspect, the present disclosure is directed to measuring an actual shape, an actual intensity distribution, and an actual location at isocenter of the charged particle pencil beam. The actual data is compared to model treatment data in real time to determine if a statistically significant variance occurs in which case the charged particle pencil beam can be stopped mid-treatment for correction and/or analysis.
    Type: Grant
    Filed: May 11, 2017
    Date of Patent: October 9, 2018
    Assignee: Pyramid Technical Consultants Inc.
    Inventors: Raymond Paul Boisseau, William P. Nett, John S. Gordon, Sashidar Kollipara, Yuriy Kozlov
  • Patent number: 9981146
    Abstract: A multi-layer charged particle beam characterization system is disclosed, and method for using the same. A typical embodiment includes a plurality of two-sided metal plates, arranged as a stack, each metal plate having an electrical contact tab extending from at least one common edge of the metal plate, and a plurality of insulator films disposed between adjacent metal plates, each insulator film is sized to match its corresponding metal plate. The tabs are coupled to a printed circuit board and connected to an external electrical connector to register a number of metal plates and insulator layers through which a charged particle beam has penetrated.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: May 29, 2018
    Assignee: Pyramid Technical Consultants, Inc.
    Inventors: Raymond P. Boisseau, John S. Gordon, Andrew Dart, Julia C. Nett
  • Patent number: 9901751
    Abstract: A multi-layer charged particle beam characterization system is disclosed, and method for using the same. A typical embodiment includes a plurality of two-sided metal plates, arranged as a stack, each metal plate having an electrical contact tab extending from at least one common edge of the metal plate, and a plurality of insulator films disposed between adjacent metal plates, each insulator film sized to match its corresponding metal plate. The tabs are coupled to a printed circuit board and connected to an external electrical connector to register a number of metal plates and insulator layers through which a charged particle beam has penetrated.
    Type: Grant
    Filed: August 29, 2016
    Date of Patent: February 27, 2018
    Assignee: Pyramid Technical Consultants, Inc.
    Inventors: Raymond P. Boisseau, John S. Gordon, Andrew Dart, Julia C. Nett
  • Patent number: 9731149
    Abstract: The present disclosure is directed to systems and methods for real-time control of a charged particle pencil beam system during therapeutic treatment of a patient. In an aspect, the present disclosure is directed to measuring an actual shape, an actual intensity distribution, and an actual location at isocenter of the charged particle pencil beam. The actual data is compared to model treatment data in real time to determine if a statistically significant variance occurs in which case the charged particle pencil beam can be stopped mid-treatment for correction and/or analysis.
    Type: Grant
    Filed: September 22, 2014
    Date of Patent: August 15, 2017
    Assignee: Pyramid Technical Consultants Inc.
    Inventors: Raymond Paul Boisseau, William P. Nett, John S. Gordon, Sashidar Kollipara, Yuriy Kozlov
  • Patent number: 9427599
    Abstract: A multi-resolution detector includes a high-resolution pixelated electrode and a low-resolution pixelated electrode. The high-resolution pixelated electrode includes a plurality of sub-arrays of first pixels. Each respective first pixel at each relative position in each sub-array is electrically connected in parallel with one another. The low-resolution pixelated electrode includes a plurality of second pixels. A control system receives as inputs an output from each pixelated detector. The control system uses the inputs to determine a physical position and a transverse intensity distribution of an incident charged particle pencil beam at the resolution of the high-resolution pixelated electrode.
    Type: Grant
    Filed: February 26, 2015
    Date of Patent: August 30, 2016
    Assignee: Pyramid Technical Consultants Inc.
    Inventors: R. Paul Boisseau, Andrew Dart, John Gordon, Kan Ota
  • Patent number: 9333376
    Abstract: A system for calibrating a charged particle pencil beam includes a first pixelated detector, a second pixelated detector, a beam stop, and a diagnostics system. The first and second pixelated detectors measure the pencil beam at positions proximal and/or distal to an isocenter plane. The beam stop is configured to detect an energy level of the pencil beam. The diagnostics system is configured to transmit a signal to request a generation of the charged particle pencil beam at different settings. The diagnostics system is also configured to update a calibration parameter for each setting based on the data received from the pixelated detectors and the beam stop.
    Type: Grant
    Filed: March 9, 2015
    Date of Patent: May 10, 2016
    Assignee: Pyramid Technical Consultants Inc.
    Inventors: R. Paul Boisseau, John Gordon, William P. Nett
  • Patent number: 9293310
    Abstract: An ionization chamber with spatial distribution electrode for monitor hadron beam currents used for therapeutic treatment. Ionization chamber comprises humidity control, environmental sensing and real-time correction thereof. A flexible hermetic seal provide for ambient pressure equalization. X-Y electrode planes measure Gaussian distribution of incident particle beam. Methods described herein are suitable to fabricate highly accurate, low scattering electrodes with high spatial resolutions.
    Type: Grant
    Filed: March 17, 2014
    Date of Patent: March 22, 2016
    Assignee: Pyramid Technical Consultants, Inc.
    Inventors: R. Paul Boisseau, Andrew Dart, John S Gordon, William P Nett
  • Publication number: 20140265823
    Abstract: An ionization chamber with spatial distribution electrode for monitor hadron beam currents used for therapeutic treatment. Ionization chamber comprises humidity control, environmental sensing and real-time correction thereof. A flexible hermetic seal provide for ambient pressure equalization. X-Y electrode planes measure Gaussian distribution of incident particle beam. Methods described herein are suitable to fabricate highly accurate, low scattering electrodes with high spatial resolutions.
    Type: Application
    Filed: March 17, 2014
    Publication date: September 18, 2014
    Applicant: Pyramid Technical Consultants, Inc.
    Inventors: R. Paul Boisseau, Andrew Dart, John S Gordon, William P Nett
  • Publication number: 20130043403
    Abstract: A variety of systems, apparatus and methods for deflecting a particle beam are described. An apparatus comprises at least six electromagnetic portions disposed on a plane. Each of the at least six electromagnetic portions is aligned with a radius emanating from an axis normal to the plane and is distanced from the axis to form a volume about the axis. At least six coils are configured for affecting a dipole magnetic field in the volume in response to electrical currents applied to physically opposing coils where a particle beam entering the volume is deflected. Each of the at least six coils is disposed about a one of the at least six electromagnetic portions. A yoke structure is configured for returning a generated magnetic flux.
    Type: Application
    Filed: August 19, 2011
    Publication date: February 21, 2013
    Applicant: Pyramid Technical Consultants, Inc.
    Inventors: John Gordon, Raymond Paul Boisseau, Andrew Dart
  • Patent number: 8378312
    Abstract: A variety of systems, apparatus and methods for deflecting a particle beam are described. An apparatus comprises at least six electromagnetic portions disposed on a plane. Each of the at least six electromagnetic portions is aligned with a radius emanating from an axis normal to the plane and is distanced from the axis to form a volume about the axis. At least six coils are configured for affecting a dipole magnetic field in the volume in response to electrical currents applied to physically opposing coils where a particle beam entering the volume is deflected. Each of the at least six coils is disposed about a one of the at least six electromagnetic portions. A yoke structure is configured for returning a generated magnetic flux.
    Type: Grant
    Filed: August 19, 2011
    Date of Patent: February 19, 2013
    Assignee: Pyramid Technical Consultants, Inc.
    Inventors: John Gordon, Raymond Paul Boisseau, Andrew Dart
  • Publication number: 20080116390
    Abstract: Delivering a beam of charged particles includes providing the beam along a first trajectory to a linear array of magnets and energizing two or more of the magnets in the linear array to deflect the beam to a second trajectory, in which the second trajectory is substantially orthogonal to the first trajectory. The beam can be deflected to any position along a straight linear path.
    Type: Application
    Filed: October 22, 2007
    Publication date: May 22, 2008
    Applicant: PYRAMID TECHNICAL CONSULTANTS, INC.
    Inventors: John Stuart Gordon, Raymond Paul Boisseau, William Philip Nett