Abstract: A manipulator may include a base portion, an upright portion connected to the base portion, a test head attachment incorporated into the upright portion, and an upright quick connect assembly incorporated into the test head attachment. In some cases, the manipulator includes an automatic weight transfer mechanism, a mobile base portion with casters and/or steerable casters.

Abstract: Various implementations of automatic test equipment are disclosed having a number of innovative features. In one implementation, the equipment includes a test head having a probe card support apparatus that provides stiffening support and/or planarization to the device under test (DUT) area of a probe card. In another implementation, the test head can include a planar surface and the wafer prober can include a corresponding planar surface. The planar surfaces can be brought into contact with each other to planarize the DUT area of the probe card and the wafer chuck in the wafer prober relative to each other.

Abstract: A manipulator may include a base portion, an upright portion connected to the base portion, a test head attachment incorporated into the upright portion, and an upright quick connect assembly incorporated into the test head attachment. In some cases, the manipulator includes an automatic weight transfer mechanism, a mobile base portion with casters and/or steerable casters.

Abstract: A manipulator may include a base portion, an upright portion connected to the base portion, a test head attachment incorporated into the upright portion, and an upright quick connect assembly incorporated into the test head attachment. In some cases, the manipulator includes an automatic weight transfer mechanism, a mobile base portion with casters and/or steerable casters.

Abstract: A manipulator for a test head comprises a base and a tower having vertical tracks. The tower is mounted on the base. A vertical shaft is mounted on the base adjacent to the tower. An outer carriage is in engagement with the vertical tracks. The outer carriage is movable relative to the tower along a vertical axis of the vertical tracks. The inner carriage is in engagement with the vertical shaft. The inner carriage is moveable relative to the tower along a vertical axis of the vertical shaft. A spring is disposed between the inner carriage and the outer carriage. The spring supports the outer carriage. An arm is coupled to the outer carriage. The arm is adapted for supporting the test head.

Abstract: A package handling apparatus for presenting circuit packages to a test head is provided which uses a soft handling approach throughout the system. The handler works with a plurality of sticks, with each stick adapted for holding a plurality of packages in a substantially horizontal linear array, with the linear array defining a linear axis for the stick. The handler includes an input elevator element for receiving a first stick loaded with a first package, for moving the first stick vertically to an index level. An input drive moves the first stick horizontally to an index position. A first pick-up removes the first package from the first stick and then moves the first package to a stage pick-up position. A stage element receives the first package, and presents it to the test head for testing. Once tested, the stage element moves the package to a stage exit position. A stage pick-up then places the first package in a stage row stick.