Patents Assigned to Shipley Company, L.L.C.
  • Patent number: 7246953
    Abstract: An optical device package includes a substrate having a top portion with an a recess for receiving an optical semiconductor component and an elongated linear groove for receiving an optical fiber. The optical fiber is positioned within the groove in said substrate such that the top surface of the optical fiber is substantially at or below the upper surface of the substrate and the optical fiber is operatively aligned with the optical semiconductor component for the transfer of optical signals therebetween. A frame is hermetically sealed to the upper surface of the substrate.
    Type: Grant
    Filed: March 15, 2005
    Date of Patent: July 24, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Dan A. Steinberg, David W. Sherrer, Mindaugas F. Dautargas
  • Patent number: 7244542
    Abstract: Provided are new resins that comprise carbocyclic aryl units with hetero substitution units and photoresists that contain such resins. Particularly preferred photoresists of the invention comprise a deblocking resin that contains hydroxy naphthyl units and can be effectively imaged with sub-200 nm radiation such as 193 nm radiation.
    Type: Grant
    Filed: May 30, 2003
    Date of Patent: July 17, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Young C. Bae, George G. Barclay
  • Patent number: 7238241
    Abstract: An apparatus for the manufacture of chemical vapor deposited domes. The apparatus has a vapor deposition chamber with a plurality of sides, a base and a top where the base has a reactant port for receiving a flow of chemical reactants. A male mandrel is joined to one of a plurality of sides of the deposition chamber such that the flow of chemical reactants in the vapor deposition chamber does not impinge on the mandrel.
    Type: Grant
    Filed: April 24, 2003
    Date of Patent: July 3, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Jitendra S. Goela, Zlatko Salihbegovic
  • Patent number: 7220486
    Abstract: New photoresists are provided that are suitable for short wavelength imaging, including sub-300 nm and sub-200 nm such as 193 nm and 157 nm. Photoresists of the invention contain a resin with photoacid-labile groups, one or more photoacid generator compounds, and an adhesion-promoting additive compound. Photoresists of the invention can exhibit significant adhesion to SiON and other inorganic surface layers.
    Type: Grant
    Filed: March 1, 2003
    Date of Patent: May 22, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Gary Ganghui Teng, Gary N. Taylor
  • Patent number: 7217490
    Abstract: The invention includes new Si-containing monomers, polymers containing such monomers and photoresists that contain the polymers. Synthetic methods of the invention include reacting a vinyl carbocyclic aryl ester compound with a reactive silane compound to provide the monomer.
    Type: Grant
    Filed: March 3, 2003
    Date of Patent: May 15, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: George G. Barclay, Subbareddy Kanagasabapathy, Matthew A. King
  • Patent number: 7214410
    Abstract: Disclosed herein is a process of forming a ferroelectric polymer film from a solution, wherein the solvent composition is selected so as to adjust the properties of the film. Films formed by this method have improved properties, particularly with respect to roughness and crystal domain size.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: May 8, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Charles R. Szmanda, Kathleen B. Spear-Alfonso, Lujia Bu
  • Patent number: 7211365
    Abstract: New negative-acting photoresist compositions are provided that are particularly useful for imaging at short wavelengths, particularly sub-200 nm wavelengths such as 193 nm. Resists of the invention provide contrast between exposed and unexposed coating layer regions through crosslinking or other solubility switching mechanism. Preferred resists of the invention include a resin component that contains repeat units that facilitate aqueous base solubility.
    Type: Grant
    Filed: March 4, 2003
    Date of Patent: May 1, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: George G. Barclay, Nicola Pugliano
  • Publication number: 20070092746
    Abstract: In a first aspect, organic coating compositions are provided, particularly spin-on antireflective coating compositions, that contain a polyester resin component. In a further aspect, coating compositions are provided that contain a resin component obtained by polymerization of a multi-hydroxy compound. Coating compositions of the invention are particularly useful employed in combination with an overcoated photoresist layer to manufacture integrated circuits.
    Type: Application
    Filed: December 5, 2006
    Publication date: April 26, 2007
    Applicant: Shipley Company, L.L.C.
    Inventors: Gerald Wayton, Peter Trefonas, Suzzanne Coley, Tomoki Kurihara
  • Patent number: 7208261
    Abstract: The invention includes new polymers and methods for providing such polymers and photoresists that comprises the polymers. Methods of the invention include those that comprise providing a reaction mixture and adding over the course of a polymerization reaction one or more polymerization reagents to the reaction mixture to provide the polymer. Photoresists containing a polymer of the invention can exhibit significantly improved lithographic properties.
    Type: Grant
    Filed: April 5, 2004
    Date of Patent: April 24, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: George G. Barclay, Stefan J. Caporale, Robert J. Kavanagh, Nick Pugliano
  • Patent number: 7205087
    Abstract: New photoresists are provided that are suitable for short wavelength imaging, including sub-200 nm, particularly 193 nm. Resists of the invention comprise a polymer that is preferably substantially free of aromatic moieties and comprises photoacid-labile repeat units, a photoactive components such as one or more photoacid generator compounds and a solvent component that comprises methyl isoamyl ketone (5-methyl-2-hexanone).
    Type: Grant
    Filed: April 18, 2003
    Date of Patent: April 17, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Robert J. Kavanagh, James W. Thackeray
  • Patent number: 7202009
    Abstract: This invention relates to resins and photoresist compositions that comprise such resins. Preferred polymers of the invention comprise adjacent saturated carbon atoms, either integral or pendant to the polymer backbone, that have a substantially gauche conformation. Polymers of the invention are particularly useful as a resin binder component of chemically-amplified positive-acting resists that can be effectively imaged at short wavelengths such as sub-200 nm and preferably about 157 nm. In such short-wavelength imaging applications, polymers of the invention that have a population of dihedral angles of adjacent saturated carbon atoms that are enriched in substantially gauche conformations can provide reduced undesired absorbance of the high energy exposure radiation.
    Type: Grant
    Filed: September 8, 2001
    Date of Patent: April 10, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Peter Trefonas, III, Gary N. Taylor, Charles R. Szmanda
  • Patent number: 7198727
    Abstract: The present invention provides an optical microbench having intersecting structures etched into a substrate. In particular, microbenches in accordance with the present invention include structures having a planar surfaces formed along selected crystallographic planes of a single crystal substrate. Two of the structures provided are an etch-stop pit and an anisotropically etched feature disposed adjacent the etch-stop pit. At the point of intersection between the etch-stop pit and the anisotropically etched feature the orientation of the crystallographic planes is maintained. The present invention also provides a method for micromachining a substrate to form an optical microbench. The method comprises the steps of forming an etch-stop pit and forming an anisotropically etched feature adjacent the etch-stop pit. The method may also comprise coating the surfaces of the etch-stop pit with an etch-stop layer.
    Type: Grant
    Filed: June 14, 2005
    Date of Patent: April 3, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Dan A. Steinberg, Larry J. Rasnake
  • Patent number: 7189490
    Abstract: Photoresist compositions that contain one or more components having sulfonamide and Si substitution. Preferred photoresist compositions of the invention contain an Si-polymer such as a silsesquioxane that has sulfonamide substitution and may be employed in multilayer resist systems. In preferred aspects, the Si-polymer has both sulfonamide substitution as well as moieties that can provide contrast upon exposure to photogenerated acid.
    Type: Grant
    Filed: October 21, 2003
    Date of Patent: March 13, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Subbareddy Kanagasabapathy, George G. Barclay
  • Patent number: 7183037
    Abstract: The present invention provides new light absorbing compositions suitable for use as an antireflective coating (“ARC”) with an overcoated resist layer. ARCs of the invention exhibit increased etch rates in standard plasma etchants. Preferred ARCs of invention have significantly increased oxygen content relative to prior compositions.
    Type: Grant
    Filed: August 17, 2001
    Date of Patent: February 27, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Zhibiao Mao, Suzanne Coley, Timothy G. Adams
  • Patent number: 7166414
    Abstract: The present invention provides radiation sensitive compositions and methods that comprise novel means for providing relief images of enhanced resolution. In one aspect the invention provides a method for controlling diffusion of photogenerated acid comprising adding a polar compound to a radiation sensitive composition and applying a layer of the composition to a substrate; exposing the composition layer to activating radiation whereby a latent image is generated comprising a distribution of acid moieties complexed with the polar compound; and treating the exposed composition layer to provide an activating amount of acid.
    Type: Grant
    Filed: October 12, 2005
    Date of Patent: January 23, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: James W. Thackeray, Angelo A. Lamola
  • Patent number: 7163751
    Abstract: In a first aspect, organic coating compositions are provided, particularly spin-on antireflective coating compositions, that contain a polyester resin component. In a further aspect, coating compositions are provided that contain a resin component obtained by polymerization of a multi-hydroxy compound. Coating compositions of the invention are particularly useful employed in combination with an overcoated photoresist layer to manufacture integrated circuits.
    Type: Grant
    Filed: May 12, 2004
    Date of Patent: January 16, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Gerald B. Wayton, Peter Trefonas, III, Suzanne Coley, Tomoki Kurihara
  • Patent number: 7163780
    Abstract: Disclosed are methods of manufacturing electronic devices, particularly integrated circuits. Such methods include the use of low dielectric constant material prepared by using a removable porogen material.
    Type: Grant
    Filed: March 22, 2003
    Date of Patent: January 16, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Michael K. Gallagher, Yujian You
  • Patent number: 7160629
    Abstract: Electrolyte compositions for the deposition of tin and tin-alloys on a substrate are disclosed, along with methods of electroplating tin and tin-alloys using such compositions. These electrolyte compositions are useful for high speed tin plating.
    Type: Grant
    Filed: October 31, 2005
    Date of Patent: January 9, 2007
    Assignee: Shipley Company, L.L.C.
    Inventor: Jeffrey N. Crosby
  • Patent number: 7158701
    Abstract: The present invention provides a method for forming a vertical taper in a waveguide. In the present invention, a shadow mask is disposed above a waveguide requiring a vertical taper. Then, the waveguide is exposed to a directional etching process (e.g. deep reactive ion etching) while the mask is moved. Ask the mask moves, different regions of the waveguide will be etched different depths, resulting in a vertical taper in the waveguide.
    Type: Grant
    Filed: February 21, 2002
    Date of Patent: January 2, 2007
    Assignee: Shipley Company, L.L.C.
    Inventor: Mindaugas F. Dautartas
  • Patent number: RE39476
    Abstract: Disclosed are electrolyte compositions for depositing tin or tin-alloys at various current densities. Also disclosed are methods of plating such tin or tin-alloys on substrates, such as the high speed tin plating of steel.
    Type: Grant
    Filed: January 10, 2005
    Date of Patent: January 23, 2007
    Assignee: Shipley Company, L.L.C.
    Inventors: Neil D. Brown, George A. Federman, Angelo B. Chirafisi, Gregory Lai