Patents Assigned to Silicon Test Technologies. Inc.
  • Patent number: 8271460
    Abstract: A program executed on a computer including storage, processing, output, and input units, the storage unit storing test-difficulty-calculation-elements-database, test-menu-database, and test-flow-database, for each test-menu-record, the program causing the processing unit to execute: calculating test-difficulty for each test-menu-record based on test-difficulty-calculation-formula by using at least one among pieces of information indicative of relationship with netlist, the number of package/test pins, expected operational clock frequency, process technology information, power consumption, and tester storage space; identifying all relationship between DFT scheme and priority, and causing the storage unit to store information indicative of the relationship between the DFT scheme and priority into the test-flow-database; and sorting the DFT scheme in an order of the priority based on the relationship between the DFT scheme and priority, causing the storage unit to store the DFT scheme as a test flow, and causing
    Type: Grant
    Filed: December 1, 2010
    Date of Patent: September 18, 2012
    Assignee: Silicon Test Technologies. Inc.
    Inventors: Kazuhiko Iwasaki, Masayuki Arai, Kenichi Ichino