Patents Assigned to Tokyo Denshi Kagaku Kabushiki Kaisha
  • Patent number: 4694040
    Abstract: The invention provides a novel means for providing a highly heat-resistant and corrosion-resistant coating film on the surface of a substrate such as a semiconductor silicon wafer or glass plate by coating the surface with a liquid coating composition which is a solution of an oligomeric organopolysiloxane as a partial dehydration-condensation product of a monohydrocarbylsilane triol RSi(OH).sub.3, optionally, with admixture of a dihydrocarbylsilane diol R.sub.2 Si(OH).sub.2, R being a monovalent hydrocarbon group, e.g. methyl or phenyl, in an organic solvent followed by baking of the coated substrate to convert the coating layer into a cured resin film.
    Type: Grant
    Filed: August 25, 1986
    Date of Patent: September 15, 1987
    Assignee: Tokyo Denshi Kagaku Kabushiki Kaisha
    Inventors: Akira Hashimoto, Toshihiro Nishimura, Muneo Nakayama, Hisashi Nakane, Shozo Toda
  • Patent number: 4550242
    Abstract: An automatic plasma processing device having a substantially vertically disposed plasma chamber in which a plurality of semiconductor wafers are processed with plasma simultaneously. The device comprises a container cassette adapted to contain a plurality of wafers therein, a feeding mechanism for feeding the cassette to a predetermined position, a replacing mechanism for taking out the wafers from the cassette placed at the predetermined position, a holding frame operable to receive the wafers from the replacing mechanism and hold the same therein, a driving mechanism for moving the holding frame up and down into and out of the plasma chamber, a plasma generating mechanism for generating plasma in the plasma chamber, and a control system for controlling the aforesaid mechanisms. The automatic plasma processing device has a simplified construction and automatically and successively processes a large number of wafers, while at the same time being compact.
    Type: Grant
    Filed: September 27, 1982
    Date of Patent: October 29, 1985
    Assignee: Tokyo Denshi Kagaku Kabushiki Kaisha
    Inventors: Akira Uehara, Isamu Hijikata, Hisashi Nakane, Muneo Nakayama
  • Patent number: 4550239
    Abstract: An automatic plasma processing device having a substantially vertically disposed plasma chamber in which a plurality of semiconductor wafers can be simultaneously processed with plasma. The automatic plasma processing device comprises a container cassette adapted to contain a plurality of wafers therein, a feeding mechanism for taking out the wafers one by one from the cassette and for feeding the same, a holding frame for receiving the wafers one by one from the feeding mechanism and for holding the same therein, a driving mechanism for moving the holding frame up and down into and out of the plasma chamber, a plasma generating mechanism for generating plasma in the plasma chamber, and a control system for controlling the aforesaid mechanisms. The device is simplified in construction and can automatically and successively process a large number of wafers, while at the same time having a compact construction.
    Type: Grant
    Filed: September 27, 1982
    Date of Patent: October 29, 1985
    Assignee: Tokyo Denshi Kagaku Kabushiki Kaisha
    Inventors: Akira Uehara, Isamu Hijikata, Hisashi Nakane, Muneo Nakayama
  • Patent number: 4528934
    Abstract: A thin-film coating apparatus comprising a device for applying in a dropwise manner a film-forming coating solution onto a material to be treated, a spinner adapted to rotate the material, a casing for enclosing the material, and a wall surface provided within the casing such that the wall surface faces the material, the wall surface being wet with a solvent for a solute of the coating solution. The apparatus is effective in applying a high-quality uniform coating film at a high speed, thereby facilitating the mass-production of thin-film coated materials or articles.
    Type: Grant
    Filed: August 19, 1983
    Date of Patent: July 16, 1985
    Assignee: Tokyo Denshi Kagaku Kabushiki Kaisha
    Inventor: Muneo Nakayama
  • Patent number: 4277525
    Abstract: Liquid compositions suitable for providing silica-based coating films on to various substrate surfaces are prepared by the reaction of an alkoxy-containing silane, a lower carboxylic acid and an alcohol in the presence of a reaction accelerator which is an organic acid different from the above mentioned lower carboxylic acid. The reaction proceeds very smoothly even in the absence of any halogen-containing compounds, and the resultant liquid coating compositions are free from the problem of corrosion due to the presence of a halogen-containing ingredient.
    Type: Grant
    Filed: March 24, 1980
    Date of Patent: July 7, 1981
    Assignees: Tokyo Ohka Kogyo Kabushiki Kaisha, Tokyo Denshi Kagaku Kabushiki Kaisha
    Inventors: Muneo Nakayama, Toshihiro Nishimura, Hisashi Nakane, Shozo Toda, Yoshio Hotta, Mitsuaki Minato
  • Patent number: 4268539
    Abstract: A liquid coating composition for formation of a transparent conductive film, which comprises a solution of indium nitrate in a .beta.-diketone or a mixture of a .beta.-diketone and another organic solvent or a reaction product of indium nitrate with a .beta.-diketone, an activator and an organic solvent other than a .beta.-diketone, is disclosed.When this coating composition is coated on a substrate and the coated substrate is heat-treated at a temperature higher than about 350.degree. C., there can be obtained a transparent conductive film having excellent transparency, electrical conductivity and mechanical strength.
    Type: Grant
    Filed: November 14, 1978
    Date of Patent: May 19, 1981
    Assignee: Tokyo Denshi Kagaku Kabushiki Kaisha
    Inventors: Muneo Nakayama, Toshihiro Nishimura, Akira Hashimoto, Hisashi Nakane, Teruo Kimura