Patents Examined by Alexander J Nemtzow
  • Patent number: 8866489
    Abstract: A test apparatus that tests a device under test, including a power supply section that supplies the device under test with power, a comparing section that detects a characteristic value indicating a state of the device under test and compares the characteristic value to a predetermined threshold value, a cutoff section that cuts off the power supplied from the power supply section to the device under test, based on a result of the comparison by the comparing section, and a control section that changes at least one of the threshold value of the comparing section and a detection timing at which the characteristic value is detected.
    Type: Grant
    Filed: July 26, 2011
    Date of Patent: October 21, 2014
    Assignee: Advantest Corporation
    Inventor: Shinichi Hashimoto
  • Patent number: 8836341
    Abstract: There is provided a semiconductor circuit including: a selection circuit, to which are connected batteries in series, and which selects any one of the batteries; a difference detecting circuit, to which voltage of a high potential side of the selected battery inputted, and to which voltage of a low potential side of the selected battery is inputted, and which outputs a difference between the voltage at the high-potential side and the voltage at the low-potential side; and a voltage applying unit that applies diagnostic voltage to a wire that is for inputting the high potential voltage to the difference detecting circuit when diagnosing an abnormality of a wire associated with the selected battery if the selected battery is a battery of a highest position in the series or a battery of a lowest position in the series.
    Type: Grant
    Filed: October 25, 2011
    Date of Patent: September 16, 2014
    Assignee: Lapis Semiconductor Co., Ltd.
    Inventor: Kazutoshi Inoue
  • Patent number: 8829927
    Abstract: An apparatus and method are provided to rapidly and accurately measure the variation of capacitance in a panel load of a touch sensor and thus increase touch sensitivity and noise resistance. The apparatus includes a panel driver configured to drive a panel load in the touch sensor according to a reference voltage, and a capacitive load detector configured to measure capacitance of the panel load by sensing a panel load driving current that is applied to the panel load by the panel driver.
    Type: Grant
    Filed: October 24, 2011
    Date of Patent: September 9, 2014
    Assignee: Zinitix Co., Ltd.
    Inventor: Tae Gyu Kim
  • Patent number: 8829938
    Abstract: A measuring method and device for characterizing a semiconductor component (1) having a pn junction and a measuring surface, which has a contacting subarea, covered by a metallization. The method including: A. Planar application of electromagnetic excitation radiation onto the measuring area of the semiconductor component (1) for separating charge carrier pairs in the semiconductor component (1), and B. spatially resolved measurement of electromagnetic radiation originating from the semiconductor component (1) using a detection unit. In one step A, a predetermined excitation subarea of the measuring surface has a predetermined intensity of the excitation radiation and at least one sink subarea of the measuring surface has an intensity of the excitation radiation which is less than the intensity applied to the excitation subarea. The excitation and sink subareas are disposed on opposite sides of said contacting subarea and adjoin it and/or entirely or partially overlap it.
    Type: Grant
    Filed: February 23, 2009
    Date of Patent: September 9, 2014
    Assignees: Fraunhofer-Gesellschaft zur Föderung der angewandten Forschung e.V., Christian-Albrechts-Universität zu Kiel, Albert-Ludwigs-Universität Frieburg
    Inventors: Jürgen Carstensen, Andreas Schütt, Helmut Föll, Wilhelm Warta, Martin Kasemann
  • Patent number: 8829932
    Abstract: This application provides apparatus and methods for initiating tests in an interface circuit without using inputs of the interface circuit dedicated to initiating the tests. In an example, a test mode interface circuit can include a voltage comparator configured compare a first voltage to a second voltage, a ripple counter configured to count pulses from a processor when the voltage comparator indicates that the first voltage is greater than the second voltage, and wherein the test mode interface circuit is configured to provide a test mode enable signal and an indication of the a desired test mode an interface circuit that includes the test mode interface circuit.
    Type: Grant
    Filed: July 22, 2011
    Date of Patent: September 9, 2014
    Assignee: Fairchild Semiconductor Corporation
    Inventors: John R. Turner, Nathan Charland
  • Patent number: 8823396
    Abstract: An apparatus including a sensor array, configured to produce an array output value in response to an environmental stimulus, and a controller, the sensor array including a plurality of sensors and a common output terminal connected to the respective outputs of the sensors, each sensor having first and second electrodes configured to output a respective sensor output value in a particular environment based on the areas of the first and second electrodes and/or the spacing therebetween, the controller configured to control which of the sensors are connected to the common output terminal using respective switches to vary the effective area and/or spacing of the sensor array such that the array output value at the common output terminal, based on the contribution of the respective sensor output values of the connected sensors, is held at a reference value.
    Type: Grant
    Filed: January 11, 2013
    Date of Patent: September 2, 2014
    Assignee: Nokia Corporation
    Inventors: Michael Robert Astley, Stefano Marco Borini, Jani Kivioja, Teuvo Tapani Ryhanen, Elisabetta Spigone, Di Wei, Richard White
  • Patent number: 8791691
    Abstract: A signal detector includes a summation unit connected to offset first and second input signals representing a differential input signal into two offset pairs of first and second signals. The signal detector also includes a detection unit connected to select the first signal from one of the offset pairs of first and second signals and the second signal from the other of the offset pairs in an overlap portion of the first and second signals to form a complementary pair of overlap signals and provide a differentially peak-detected output signal from the complementary pair of overlap signals. Additionally, the signal detector includes a comparator connected to provide a detection output signal corresponding to the differentially peak-detected output signal and a reference signal. A method of operating a signal detector is also included.
    Type: Grant
    Filed: March 24, 2011
    Date of Patent: July 29, 2014
    Assignee: LSI Corporation
    Inventor: Zichuan Cheng
  • Patent number: 8742779
    Abstract: A semiconductor device includes a first CPU, a second CPU having a configuration that is the same as or comparable to a configuration of the first CPU, and a comparator that compares an output of the first CPU with an output of the second CPU. The second CPU is made so as to have a lower operating margin than the first CPU. By supplying a same signal to the first CPU and the second CPU and then detecting a mismatch between the outputs of the first CPU and the second CPU as a result of comparison, the abnormality is predicted. The semiconductor device includes a reset control circuit that resets the device when the result of comparison by the comparator indicates an error.
    Type: Grant
    Filed: May 28, 2010
    Date of Patent: June 3, 2014
    Assignee: Renesas Electronics Corporation
    Inventors: Atsushi Takahashi, Hiroyuki Kii
  • Patent number: 8729890
    Abstract: A magnetic field sensor and a method used therein provide an output signal in angle units representative of an angle of rotation of a target of and also an output signal in speed units representative of a speed of rotation of the target object. A power control circuit can cycle a magnetic field sensor on and off in accordance with a sensed rotation speed of the object.
    Type: Grant
    Filed: April 12, 2011
    Date of Patent: May 20, 2014
    Assignee: Allegro Microsystems, LLC
    Inventors: Mark J. Donovan, Ryan Metivier, Michael C. Doogue
  • Patent number: 8723515
    Abstract: A vertical Hall sensor circuit includes an arrangement comprising a vertical Hall effect region of a first doping type, formed within a semiconductor substrate and having a stress dependency with respect to a Hall effect-related electrical characteristic. The vertical Hall sensor circuit further includes a stress compensation circuit which comprises at least one of a lateral resistor arrangement and a vertical resistor arrangement for generating a stress-dependent lateral resistor arrangement signal based on a reference signal provided to the stress compensation circuit, and for generating a stress-dependent vertical resistor arrangement signal based on the reference signal, respectively. The vertical Hall sensor circuit further includes a first circuit for providing a first signal to the arrangement based on at least one of the stress-dependent lateral resistor arrangement signal and the stress-dependent vertical resistor arrangement signal.
    Type: Grant
    Filed: July 5, 2012
    Date of Patent: May 13, 2014
    Assignee: Infineon Technologies AG
    Inventors: Mario Motz, Udo Ausserlechner
  • Patent number: 8723506
    Abstract: A capacitor charging circuit is provided in a utility meter. The utility meter includes a measurement circuit configured to provide consumption data, a memory configured to store the consumption data from the measurement circuit, and a communications device configured to transmit the consumption data to a remote location. The utility meter also includes a power supply configured to supply an unregulated DC voltage and a regulated voltage within the utility meter. The regulated DC voltage is output from a voltage regulator and is provided to the measurement circuit. The unregulated DC voltage is supplied to the communications device. The capacitor charging circuit is configured to charge a capacitor with the unregulated DC voltage when the regulated DC voltage is provided to the charging circuit from the voltage regulator. The capacitor charging circuit may be a supercapacitor charging circuit.
    Type: Grant
    Filed: July 21, 2011
    Date of Patent: May 13, 2014
    Assignee: Landis+Gyr, Inc.
    Inventor: Anibal Diego Ramirez
  • Patent number: 8717032
    Abstract: A protection switching system in a power supply distribution system, comprises at least one protection switch (25) comprising a controllable semiconductor arranged to conduct current through the power supply line in a normal mode, a control unit (27) arranged to place the at least one protection switch in a test mode in which the current is reduced compared to the normal mode, registration means (28, 29) for registering a test mode value of at least one electrical characteristic in the power supply line that will be affected when the test mode is applied, a monitoring unit (30; 47) arranged to evaluate the at least one electrical characteristic and determine, based on the evaluation, whether or not an action should be taken. If a malfunction is detected an alarm is issued to indicate to service personnel that the protection switch should be replaced.
    Type: Grant
    Filed: January 28, 2009
    Date of Patent: May 6, 2014
    Assignee: Telefonaktiebolaget L M Ericsson (publ)
    Inventors: Johan Horman, Hans Kramer
  • Patent number: 8692572
    Abstract: A method of detecting a failure of an alternator supplying three-phase electricity to a load, the method comprising the steps of determining a duty ratio for each of the phases at the output of the alternator, determining phase differences between the phases at the output of the alternator; and determining the presence of a failure as a function of the phase differences and as a function of a comparison of the duty ratios. A power supply device is also provided for implementing the method.
    Type: Grant
    Filed: July 18, 2011
    Date of Patent: April 8, 2014
    Assignee: Sagem Defense Securite
    Inventors: Virginie Erdos, Thanh-Tuan Truong, Mehdi Dallagi
  • Patent number: 8686716
    Abstract: A current or voltage sensor for use with a busbar has a support body having a proximal end juxtaposed with the busbar and a distal end spaced therefrom and a U-shaped conducting bar in the proximal end and having a pair of arms having free ends transversely engaging the busbar. A Rogowski coil in the proximal end is juxtaposed with the U-shaped conducting bar. A grounded screening element at the distal end is conductive and forms a chamber open toward the U-shape conducting bar. A source electrode has a proximal end engaging the U-shaped conducting bar outside the first chamber and a distal end in the chamber. An electrical field sensor in the first chamber is juxtaposed with the distal end of the source electrode.
    Type: Grant
    Filed: November 11, 2009
    Date of Patent: April 1, 2014
    Assignee: Green Seas Venture, Ltd.
    Inventor: Lorenzo Peretto
  • Patent number: 8659303
    Abstract: A testing apparatus for testing whether an occupant detection sensor normally operates is disclosed. The testing apparatus includes: a ground that is an electrically-conductive structural member of the seat; an electrode plate that is electrically-conductive and is on the seat at a time of testing; multiple capacitors that are electrically connected between the electrode plate and the ground and are different in electrostatic capacity from each other; a switch mechanism that selects and switches one capacitor of the multiple capacitors; and a determination result check portion that determines, while switching the one capacitor by the switch mechanism, whether a signal outputted from the occupant detection sensor is a determination result corresponding to the switched one capacitor.
    Type: Grant
    Filed: October 24, 2011
    Date of Patent: February 25, 2014
    Assignee: Denso Corporation
    Inventors: Hideyuki Hayakawa, Takashi Inoue
  • Patent number: 8653846
    Abstract: The electronic device mounting apparatus 1 comprises: a first camera 123 for imaging a flexible board 74 of a base member 70 of a test carrier 60 to generate a first image information; an image processing apparatus 40 for detecting a position of an alignment mark 79 of the flexible board 74 from the first image information and calculating a print start position 782 of the first interconnect patterns 78 on the flexible board 74 on the basis of the position of the alignment mark 79; a printing head 122 for forming a first interconnect pattern 78 on the flexible board 74 from the print start position 782; and a second conveyor arm 21 for mounting a die 90 on the flexible board 74 on which the first interconnect pattern 78 is formed.
    Type: Grant
    Filed: October 5, 2010
    Date of Patent: February 18, 2014
    Assignee: Advantest Corporation
    Inventors: Yoshinari Kogure, Yasuhide Takeda
  • Patent number: 8624601
    Abstract: System and methods are provided for monitoring a state of a switch element connecting a DC power supply to a load. A system includes a transformer having first and second windings, where a first end of the second winding electrically coupled to a first switch node of the switch element. The system also includes a transmit circuit configured for providing a waveform at the first winding and a sensor element having galvanically isolated input and output nodes for inducing a monitor signal at the output nodes in response to a signal at the input nodes. The system further includes a receive circuit coupled to the output nodes and configured for generating one or more output signals in response to the monitor signal. The system also includes capacitor elements for providing DC isolation for the second winding with respect to the first switch node and the sensor element.
    Type: Grant
    Filed: October 4, 2010
    Date of Patent: January 7, 2014
    Assignee: Enerdel, Inc.
    Inventors: Justin Kimes, David Albean, Ronald Jaeger, Charlie Capps, Timothy Scalzo, David Heady
  • Patent number: 8618811
    Abstract: An arc fault circuit interrupter test circuit is disclosed. The test circuit incorporates a controller along with at least one power transistor, a current sense circuit and a voltage sense circuit. When the power transistor is operated, the current flowing through the transistor is sensed, and if the current is not at least equal to a threshold value, the voltage at which the power transistor is operated is increased.
    Type: Grant
    Filed: April 6, 2011
    Date of Patent: December 31, 2013
    Assignee: Unique Technologies, LLC
    Inventors: Kerry Berland, Paul Berland, Mitch Budniak
  • Patent number: 8614591
    Abstract: A mother substrate including a plurality of organic light emitting display panels that include pixel circuits having a simple structure, is designed so that a sheet unit test may be performed while preventing or reducing brightness variation during sheet unit test, and a sheet unit test method for the mother substrate. The mother substrate also includes first and second wiring line groups and a compensating unit. The compensating unit is coupled to a coupling line for coupling a wiring line from among the first and second wiring line groups for transmitting a sheet unit test signal to the panels. The compensating unit is also for subtracting a voltage corresponding to a threshold voltage of a driving transistor included in a pixel of the panels from the sheet unit test signal before transmitting the sheet unit test signal to the panels.
    Type: Grant
    Filed: October 5, 2010
    Date of Patent: December 24, 2013
    Assignee: Samsung Display Co., Ltd.
    Inventors: Kwang-Min Kim, Won-Kyu Kwak, Ji-Hyun Ka, Sam-Il Han
  • Patent number: 8604774
    Abstract: A current sensing circuit includes a current sensing unit, a feedback control unit and a digital output unit. The current sensing unit senses a current and produces a pulse signal according to at least one reference signal and at least one feedback signal. The current sensing unit includes a first capacitor set and a second capacitor set. The current sensing unit selects at least one capacitor in the first capacitor set and at least one capacitor in the second capacitor set according to the current value so as to adjust the precision of the current sensing circuit. The feedback control unit is coupled to the current sensing unit and produces the feedback signals according to a clock signal and the pulse signal. The digital output unit is coupled to the current sensing unit and outputs a digital signal according to the pulse signal.
    Type: Grant
    Filed: December 7, 2010
    Date of Patent: December 10, 2013
    Assignee: Himax Technologies Limited
    Inventor: Chen-Ming Hsu