Patents Examined by Alvaro Fortich
  • Patent number: 10295618
    Abstract: Each of the oscillation frequency of a first oscillation circuit performing oscillation in a state of including a coil and a capacitor and the oscillation frequency of a second oscillation circuit performing oscillation in a state of including a coil and a capacitor different from the coil and the capacitor of the first oscillation circuit is measured. Then, the difference of the measured oscillation frequencies is calculated and then the calculated difference is converted into a magnetic permeability or a dielectric permittivity. One sensor selectively detects a change in the magnetic permeability or a change in the dielectric permittivity of a subject material.
    Type: Grant
    Filed: June 19, 2015
    Date of Patent: May 21, 2019
    Assignee: Hitachi Metals, Ltd.
    Inventors: Kazuhiko Osumi, Yuuzo Maruyama, Osamu Shimoe
  • Patent number: 10274444
    Abstract: A device for resistive measurement of the moisture of a material, which is mineral, rigid and which has open porosity, the device including a block of material of which it is desired to measure the resistance variations as a function of its water content, at least two detection electrodes which are rigid, non-oxidising and bare, applied parallel against the material, and sealed on to the latter by a blend of powder of material and lime, wherein each detection electrode is connected to an electronic unit able to generate a measuring current and an electronic unit able to measure the resistance between the said electrodes.
    Type: Grant
    Filed: December 30, 2016
    Date of Patent: April 30, 2019
    Inventor: Dominique Lestelle
  • Patent number: 10267834
    Abstract: There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. A semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high-order frequency measuring portion that performs high-order frequency measurement; and a clock controller that supplies an electric power measuring portion with a first clock signal at a first sampling frequency and supplies a high-order frequency measuring portion with a second clock signal at a second sampling frequency. The second sampling frequency is higher than the first sampling frequency.
    Type: Grant
    Filed: October 30, 2017
    Date of Patent: April 23, 2019
    Assignee: Renesas Electronics Corporation
    Inventors: Makoto Shuto, Kazuyoshi Kawai, Mitsuya Fukazawa, Robert Nolf, Robert Dalby
  • Patent number: 10267875
    Abstract: A magnetic resonance (MR) system 10 includes at least one cable (30, 32, 34) that has at least one optic fiber component (31C, 31E, 33B, 35B) and an optical monitoring unit (37) in communication with the at least one optic fiber component (31C, 31E, 33B, 35B). The optical monitoring unit (37) is configured to determine temperatures at each of a plurality of positions along the at least one optic fiber component (31C, 31E, 33B, 35B). The optical monitoring unit (37) is further configured to halt an operation of the MR system (10) in response to at least one determined temperature. In accordance with the invention, the temperature of one or more cable traps forming part of the cable can be monitored and a faulty cable trap can be detected.
    Type: Grant
    Filed: October 31, 2013
    Date of Patent: April 23, 2019
    Inventors: Laurens Cornelis Van Leeuwen, Johan Mathieu Alfons Helsen, Paulus Cornelius Hendrikus Adrianus Haans
  • Patent number: 10260983
    Abstract: In at least one embodiment, an apparatus for diagnosing a state of a capacitive sensor is provided. The apparatus comprises a measuring circuit for being electrically coupled to a capacitive sensor. The measuring circuit is configured to measure a first impedance of the capacitive sensor at a first frequency and to determine a first capacitance of the capacitive sensor at the first frequency based on the first impedance. The measuring circuit is further configured to compare the first capacitance of the capacitive sensor to a first threshold and to a second threshold to diagnose the capacitive sensor.
    Type: Grant
    Filed: December 23, 2014
    Date of Patent: April 16, 2019
    Inventors: Antoni Ferré Fàbregas, Federico Giordano
  • Patent number: 10261141
    Abstract: Selection-focus coils de-signed for 3D FFL-based MPI may allow for spatial encoding without additional shift coils and provide relatively large FOV and field gradient with very flat FFL. Additionally, a single-sided FFL-based device which is capable of 3D imaging is disclosed. With sufficient current amplitudes, FFL could encode the whole volume of a small animal or penetrate deep into human organs such as the vascular system or lymph nodes. An MPI device based on the proposed selection scheme could be a compact and robust alternative to the state-of-the-art FFP (FFL)-based MPI scanners.
    Type: Grant
    Filed: November 11, 2016
    Date of Patent: April 16, 2019
    Inventor: Alexey Tonyushkin
  • Patent number: 10261123
    Abstract: A semiconductor device structure is provided. The semiconductor device structure includes a substrate, an electrical connection structure extending upwardly from an upper surface of the substrate by a first height, and a contact pad electrically disposed on the upper surface of the substrate. The contact pad has a solder-wettable surface with an area configured to support a solder ball having a second height at least twice the first height. The semiconductor device structure further includes a fuse element with a first end electrically coupled to the electrical connection structure and a second end electrically coupled to the contact pad.
    Type: Grant
    Filed: August 24, 2017
    Date of Patent: April 16, 2019
    Assignee: Micron Technology, Inc.
    Inventor: Mark E. Tuttle
  • Patent number: 10254339
    Abstract: To improve test efficiency of addressable test chips, an addressable test chip test system includes a test equipment, a probe card and an addressable test chip, the test equipment connects to the addressable test chip through the probe card to constitute a test path, the test system includes a new type of address register, which can provide two test modes for users according to user's needs. A new type of high density addressable test chip can accommodate DUTs of more than 1000/mm2.
    Type: Grant
    Filed: December 29, 2017
    Date of Patent: April 9, 2019
    Assignee: Semitronix Corporation
    Inventors: Fan Lan, Shenzhi Yang, Yongjun Zheng, Weiwei Pan
  • Patent number: 10252801
    Abstract: A tow assembly for airborne geophysical surveying that comprises a frame incorporating geophysical surveying equipment; and a suspension assembly for suspending the frame from an aircraft. The suspension assembly has a plurality of suspension ropes connected to the frame at spaced apart connection points for suspending the frame from an aircraft. Lengths of the suspension ropes are adjustable with respect to at least four of the connection points to adjust an attitude of the frame during flight.
    Type: Grant
    Filed: February 26, 2016
    Date of Patent: April 9, 2019
    Assignee: GEOTECH LTD.
    Inventors: Edward Beverly Morrison, Ryan Raz
  • Patent number: 10247681
    Abstract: A microwave measuring device having a transmitting module and a receiving module and an apparatus having these modules are described. The two modules are accommodated either in a common housing or in separate housings. The transmitting module can be coupled to a transmitting antenna and the receiving module can be coupled to a receiving antenna. In order to compensate for measurement errors, in particular temperature-related measurement errors, at least one RF bypass cable runs outside the housing/the housings and can be used to couple the transmitting module and the receiving module while bridging the measuring section defined by the two antennas.
    Type: Grant
    Filed: July 28, 2016
    Date of Patent: April 2, 2019
    Assignee: ELISABETH KATZ
    Inventor: Elisabeth Katz
  • Patent number: 10247587
    Abstract: An operation input detection device includes an operation input section, a capacitive sensor, an operation input detecting section, and a sensor calibration section, which executes calibration of the capacitive sensor. The sensor calibration section includes an irregular calibration section. The irregular calibration section executes the calibration if the sensor output that has changed in the same direction as when the object to be detected approaches the operation input section exceeds a first threshold value, and the sensor output subsequently changes in the opposite direction and exceeds a second threshold value set in the opposite direction within a predetermined time.
    Type: Grant
    Filed: June 29, 2016
    Date of Patent: April 2, 2019
    Inventors: Seika Matsui, Junya Nakamura
  • Patent number: 10241146
    Abstract: Presented embodiments facilitate efficient and effective access to a device under test. In one embodiment, a test system comprises: a device interface board (DIB) configured to interface with a device under test (DUT); and a primitive configured to control the device interface board and testing of the device under test. The primitive is an independent self contained test control unit comprising: a backplane interface configured to couple with the device interface board; a power supply component configured to control power to the backplane interface; and a site module configured to control testing signals sent to the device interface board and device under test. The site module is reconfigurable for different test protocols. The primitive can be compatible with a distributed testing infrastructure. In one exemplary implementation, the primitive and device interface board are portable an operable to perform independent testing unfettered by other control components.
    Type: Grant
    Filed: May 1, 2017
    Date of Patent: March 26, 2019
    Assignee: Advantest Corporation
    Inventors: Mei-Mei Su, Ben Rogel-Favila
  • Patent number: 10234499
    Abstract: Techniques and test structures for determining reliability and performance characteristics of an integrated circuit (IC) device are disclosed. For example, an IC device includes multiple functional elements and multiple test elements. The test elements are electrically coupled in series between a first test port and a second test port. A method of testing the IC device includes applying an electrical stimulus between the first test port and the second test port, measuring a parametric value in response to the electrical stimulus, comparing the parametric value and a statistical value, and determining a pass or fail status of the IC device. The statistical value is representative of a predicted reliability of the IC device.
    Type: Grant
    Filed: August 1, 2016
    Date of Patent: March 19, 2019
    Assignee: Keysight Technologies, Inc.
    Inventors: Martin W. Dvorak, Ben Keppeler
  • Patent number: 10222240
    Abstract: In a resolver, a detecting stator core includes a first detection winding group, a second detection winding group, and a plurality of excitation windings. The first detection winding group includes a plurality of first windings as detection windings. The second detection winding group includes, as detection windings, a plurality of second windings different from the first windings in the phase of the detection voltage. The excitation windings are each wound around one of teeth of the detecting stator core. Each first winding and each second winding are wound around different teeth from each other without being wound around the same tooth. The detection winding and the excitation winding that are wound around the same tooth are arranged so as to be separated from each other in a radial direction.
    Type: Grant
    Filed: June 5, 2015
    Date of Patent: March 5, 2019
    Inventors: Shunta Kashima, Toshinori Tanaka, Morishige Minobe, Satoru Nakada, Ryuichi Takiguchi, Takanori Komatsu
  • Patent number: 10215816
    Abstract: The present invention addresses the problem of stabilizing signals in magnetic field measurement using optical pumping. In order to solve the problem, disclosed is a light source apparatus (10) that is characterized in having: a light intensity fluctuation detection circuit (130) that detects intensity fluctuation of light outputted from a laser output unit (11); and an acousto-optic modulator (121) that corrects light intensity on the basis of light intensity fluctuation detected by means of the light intensity fluctuation detection circuit (130) such that the light intensity is constant Furthermore, a magnetic field measuring apparatus of the present invention is characterized in having: one sensor unit that passes therethrough light outputted from a light source unit: and a signal control processor that eliminates the light intensity fluctuation on the basis of two lights passed through the sensor unit.
    Type: Grant
    Filed: December 3, 2013
    Date of Patent: February 26, 2019
    Assignee: Hitachi, Ltd.
    Inventors: Ryuzo Kawabata, Akihiko Kandori
  • Patent number: 10209290
    Abstract: A method of locating incipient faults that generate partial discharges in an AC power distribution system includes detecting at least one spike in a PD pattern generated by such system; getting the voltage wave of the AC power in the system; detecting a phase of such spike with respect to the voltage of the AC power; and locating an incipient fault where such phase is below a predetermined threshold. An apparatus includes at least one sensor of electrical pulses, means for getting a synchronism signal with a power supply of the power distribution system, and modules adapted to carry out the method.
    Type: Grant
    Filed: December 30, 2010
    Date of Patent: February 19, 2019
    Assignee: PRYSMIAN S.P.A.
    Inventors: Lluis-Ramon Sales Casals, Stefano Franchi Bononi, Roberto Candela, Manuel Lopez Gonzalez
  • Patent number: 10209388
    Abstract: Systems, methods, and apparatuses to generate a crosswell data set are described. In certain aspects, a method includes producing a first electromagnetic field at the earth's surface with a transmitter at a first location, detecting in a first borehole a first field signal induced by the first electromagnetic field, detecting in a second borehole a second field signal induced by the first electromagnetic field, and generating a crosswell data set from the first field signal and the second field signal. A formation model may be created from the crosswell data set.
    Type: Grant
    Filed: March 24, 2014
    Date of Patent: February 19, 2019
    Inventors: Michael Wilt, Ping Zhang, Nestor Cuevas, Jiuping Chen
  • Patent number: 10197420
    Abstract: A magnetic sensor circuit includes: a first Hall element configured to output a first signal and a second signal; a second Hall element configured to output a third signal and a fourth signal; a signal switching unit configured to select signals among the first to the fourth signal to provide at least two different types of signals as first output signals, by selecting signals each having the signal component having the opposite phase when the offset components each have the same phase, and by selecting signals each having the signal component having the same phase when the offset components each have the opposite phase; and a signal processing unit configured to output second output signals in which the respective offset components of the first output signals are reduced.
    Type: Grant
    Filed: January 31, 2018
    Date of Patent: February 5, 2019
    Assignee: ABLIC INC.
    Inventor: Ryosuke Mori
  • Patent number: 10197617
    Abstract: A loading apparatus is provided which includes a package jig, a transfer unit, and a load port. The package jig is fixed to a package. The transfer unit includes a hand for holding the package jig and transferring the package. The package transferred by the transfer unit is loaded on the load port. The load port and the hand include first alignment pins and first alignment sockets for aligning the package to the load port.
    Type: Grant
    Filed: December 1, 2015
    Date of Patent: February 5, 2019
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Youngin Kim, Jongsam Kim, Byung-Soo Park, Sookil Park, Byungkook Yoo, Younghyen Lee, Seong Sil Jeong, Wooseong Choi
  • Patent number: 10197546
    Abstract: A method, system and apparatus for continuously determining the watercut of production fluid flowing in a pipeline from an oil reservoir. The method includes providing an electrochemical impedance sensor at a fixed location in the pipeline for continuously measuring the impedance value of the flowing production fluid at such location. A sample of the production fluid is obtained from the pipeline to determine the watercut value of the sample. From such watercut values from the sample, a correlation formula is determined of the watercut value of the sample with the measured impedance value at the fixed location. Subsequently the continuously measured impedance values are inputted into the correlation formula to continuously calculate the watercut value of the flowing production fluid to thereby continuously determine the watercut of the flowing production fluid with the impedance sensor.
    Type: Grant
    Filed: December 9, 2016
    Date of Patent: February 5, 2019
    Inventors: Aleksander Rahaliou, Aliaksander Chakhouski, Aliaksei Sottsau, Ramir Akbashev, Sergei Orel