Patents Examined by Anjan K. Deb
  • Patent number: 6867605
    Abstract: A device for measuring the probe impedance of a linear lambda probe of an internal combustion engine which is caused by an AC current measurement signal which is fed into the lambda probe, comprises a voltage amplifier for amplifying an AC voltage which drops across the probe impedance, and a rectifier for rectifying the amplified AC voltage, wherein the rectifier is a synchronous demodulator, by which in each case the upper and lower amplitude of the AC voltage signal is sampled with its frequency, filtered and stored, and by which the difference of the stored signals is amplified with a gain factor and made available as output signal at its output for controlling the temperature of the lambda probe.
    Type: Grant
    Filed: January 13, 2003
    Date of Patent: March 15, 2005
    Assignee: Siemens Aktiengesellschaft
    Inventor: Stephan Bolz
  • Patent number: 6864692
    Abstract: A sensor for determining the presence of an analyte is disclosed comprising a reactive layer disposed between a base plate and a movable plate. The reactive layer is configured to interact with an analyte effecting a change in capacitance between the base plate and movable plate. When the analyte has a polarity or overall Hildebrand solubility parameter that is similar to the reactive layer, the change in capacitance is caused by a swelling of the reactive layer as analyte is absorbed into the reactive layer. This results in a decrease in capacitance. When the analyte has a solubility parameter not near the reactive layer, the absorbed analyte causes the reactive layer's total polarity to increase, an effect that dominates swelling. This causes an increase in capacitance. A capacitive sensing circuit is included for measuring the change in capacitance which is indicative of the analyte exposed to the sensor.
    Type: Grant
    Filed: June 20, 2002
    Date of Patent: March 8, 2005
    Assignee: Xsilogy, Inc.
    Inventors: Sanjay V. Patel, Bernd Fruhberger, Robert J. Warmack, Todd E. Mlsna, David R. Baselt, Erno Klaassen
  • Patent number: 6864686
    Abstract: A high-frequency surgical device encompassing control electronics that control a power unit which utilizes a high-frequency transformer that is the only galvanic separation between the supply voltage and the patient/user unit.
    Type: Grant
    Filed: October 18, 2002
    Date of Patent: March 8, 2005
    Assignee: Storz Endoskop GmbH
    Inventors: Pavel Novak, Konrad Kellenberger, Felix Daners
  • Patent number: 6861845
    Abstract: A self-compensating fault locator (10) broadly comprises a testing unit (16) to take measurements across two test points (18), a processing unit (20) to locate faults by analyzing the measurements, and a switching unit (22) that can connect termination points (14) of an electrical circuit (12) to the test points (18) in a sequence controlled by the processing unit (20). The fault locator (10) may also include a harness (24) to connect the electrical circuit (12) to the switching unit (22). The processing unit (20) is preferably programed with the electrical circuit's (12) interconnection information. The processing unit (20) also preferably stores internal characteristics of the fault locator (10). Using the interconnection information and the internal characteristics, the processing unit (20) may accurately locate faults within the electrical circuit (12). Additionally, the processing unit (20) may locate faults within the fault locator (10) and/or the harness (24).
    Type: Grant
    Filed: December 2, 2002
    Date of Patent: March 1, 2005
    Assignee: DIT-MCO International Corporation
    Inventors: Ralph Taylor, Harold King, Michael Bequette
  • Patent number: 6859049
    Abstract: Assembly kit for an apparatus and a method for simultaneously obtaining biological sample and measuring its electrical resistance at at least two different frequencies for diagnosis of sample condition. The apparatus includes a main case; an aspirating needle connected to main case for obtaining biological liquid sample; a liquid collector connected to aspirating needle for receiving biological liquid has a metal conductor in electrical contact with the needle and a metal piston; and an electro-impedance meter. The method includes the steps of contacting biological tissue with an electrically conductive hook having a pointed end as a first electrode and a second electrode; measuring electrical impedance of the biological tissue contacted with the first and second electrodes at at least two different frequencies; and excising a part of the biological tissue with the pointed end of the hook to obtain a sample of the biological tissue.
    Type: Grant
    Filed: November 25, 2002
    Date of Patent: February 22, 2005
    Inventors: Robert G. Khatchatrian, Ashot P. Khatchatrian, Asmik Aruntyunyan
  • Patent number: 6856136
    Abstract: A test structure for testing a thick film thermoelectric device is presented. The test structure is able to test the thermoelectric device in the device's three modes of operation, namely as a cooling device, as a heat pump, and as a power generator. The test structure includes a pair of current electrode blocks for supporting and supplying power from a power supply to the thick film thermoelectric device being tested. Thermocouples are attached to different portions of the thick film thermoelectric device to indicate the temperature change across the device as it is being tested. Additionally, a heat source is provided when the device is being tested in an electrical generation mode. The test structure is able to compensate for the expansion and contraction of the thick film thermoelectric device during the testing. By way of the disclosed test structure, the thick film thermoelectric devices can be tested and characterized.
    Type: Grant
    Filed: May 22, 2002
    Date of Patent: February 15, 2005
    Assignee: Massachusetts Institute of Technology
    Inventor: Theodore C. Harman
  • Patent number: 6856147
    Abstract: An improved system for determining the value of a resistive load is provided. The system includes: a reference voltage source; a reference resistor of known value having a first and second terminal, the first terminal connected to the reference voltage source and the second terminal connected to the resistive load; and a software program stored in a control unit connected to the first and second terminal, the control unit operative to read a value of the reference voltage source and a voltage at the second terminal of the predetermined reference resistor and to calculate the value of the resistive load as a function of the readings of the reference voltage source and the second terminal voltages.
    Type: Grant
    Filed: January 15, 2003
    Date of Patent: February 15, 2005
    Assignee: DaimlerChrysler Corporation
    Inventors: Mikhail Zarkhin, Timothy P Philippart, Roger A. Moon
  • Patent number: 6853199
    Abstract: A separating drum 1 is provided with a device for determining the position, the composition and the nature of several layers of fluid settling upstream from barrier 8. The device comprises a first rod 12 provided with microwave beam emitters 13, a second rod 14 provided with microwave beam receivers 15, a microwave source 16 that can be connected to emitters 13, and means 17 for recording and analyzing the microwave beams received by receivers 15.
    Type: Grant
    Filed: December 6, 2002
    Date of Patent: February 8, 2005
    Assignee: Institut Francais du Petrole
    Inventors: Christine Noïk, Michel Constant
  • Patent number: 6853201
    Abstract: A capacitive actuating element is driven using a control signal of duration T1. This duration T1 is related to prescribed or measured values for charging, discharging and open periods T2, T3 and T4: (T1+T3?T2?T4)?|X| and is compared with a magnitude (limit value |X|). If a magnitude greater than |X| is obtained, then a fault is inferred.
    Type: Grant
    Filed: December 6, 2002
    Date of Patent: February 8, 2005
    Assignee: Siemens Aktiengesellschaft
    Inventors: Rainer Hirn, Michael Käsbauer
  • Patent number: 6853177
    Abstract: The invention provides a semiconductor device capable of appropriately debugging any fluctuation in element characteristic even when the element characteristic fluctuates exceeding a value estimated at the designing stage. This semiconductor device includes a process monitor circuit that monitors any fluctuation in process and outputs a monitor signal M representing a result of monitoring, in addition to circuit blocks that perform respectively required functions. And a timing control circuit that controls timing of an input signal inputted to a predetermined circuit element forming the circuit blocks based on the monitor signal M from the process monitor circuit is provided in the circuit blocks.
    Type: Grant
    Filed: March 28, 2002
    Date of Patent: February 8, 2005
    Assignee: Renesas Technology Corp.
    Inventors: Mari Shibayama, Yoshinori Fujiwara, Yoshihiro Nagura
  • Patent number: 6850079
    Abstract: An apparatus for measuring the thickness of thin-film cause electron beams of first and second energies to strike thin-film to be measured that is formed on a silicon substrate, and measures the first substrate current value of current flowing in the substrate when it is struck by an electron beam of a first energy and the second substrate current value of current flowing in the substrate when it is struck by an electron beam of a second energy. The thin-film measuring apparatus obtains reference data indicating a relationship between the film thickness and a reference function having as variables the substrate current for the case of an electron beam of the first energy striking a standard sample and the substrate current for the case of an electron beam of the second energy striking the standard sample, and calculates the thickness of the thin-film under measurement based on the first and second substrate current values, giving consideration to the reference data.
    Type: Grant
    Filed: January 15, 2003
    Date of Patent: February 1, 2005
    Assignee: Fab Solutions, Inc.
    Inventors: Keizo Yamada, Yousuke Itagaki, Takeo Ushiki
  • Patent number: 6844715
    Abstract: Outputs of a linear RF detector and a logarithmic RF detector are multiplexed individually to a single digitizer or simultaneously to a respective digitizers. A process generates a composite waveform from the resulting digitized data, either at a later time in the former case or in real-time in the latter case. To achieve simultaneous routing, several routing relays are arranged in a specialized configuration between the outputs of the RF detectors and the inputs of the digitizers.
    Type: Grant
    Filed: December 3, 2002
    Date of Patent: January 18, 2005
    Assignee: Honeywell International Inc.
    Inventor: Shlomo Hoffmann
  • Patent number: 6842017
    Abstract: A sensor (40) includes a single capacitor (42) that operates in two different modes to obtain capacitance and conductance information when a mixture flows between the electrodes (44, 46) of the capacitor. The inventive sensor is particularly well-suited for making methanol content determinations within a mixture used to provide hydrogen to supply a fuel cell. Two different oscillators (180, 182) are selectively used to obtain the conductance and capacitance information. In a disclosed embodiment, a capacitor includes an outer electrode (44) that is received around an inner electrode (46) such that there is a spacing between the electrodes through which the mixture flows. The mixture acts as a dielectric of the capacitor allowing the conductance and capacitance measurements to be made. The example sensor includes a temperature sensor (76) conveniently supported within the inner electrode (46).
    Type: Grant
    Filed: October 30, 2002
    Date of Patent: January 11, 2005
    Assignee: Siemens VDO Automotive Corporation
    Inventors: Isabelle McKenzie, David Vanzuilen, Francois-Xavier Bernard
  • Patent number: 6842015
    Abstract: A capacitance element electrode (E1) and a reference electrode (E31) are formed on a substrate (20) so as to be opposite to a displacement electrode (40). A dome-shaped movable switch electrode (E21) is disposed so as to be in contact with the reference electrode (E31) and at a distance from a fixed switch electrode (E11) formed inside the reference electrode (E31), and to cover the fixed switch electrode (E11). When an operation is applied to a detective member (30) and a portion of the movable switch electrode (E21) in the vicinity of its top is displaced to be brought into contact with fixed switch electrode (E11), a switch is turned ON. On the other hand, from a change in capacitance value of a capacitance element (C1) formed between the displacement electrode (40) and the capacitance element electrode (E1), the intensity of the force to the detective member (30) can be recognized.
    Type: Grant
    Filed: May 23, 2001
    Date of Patent: January 11, 2005
    Assignee: Nitta Corporation
    Inventor: Hideo Morimoto
  • Patent number: 6838890
    Abstract: A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal conductor located between a pair of spaced apart guard conductors. The guard conductors of the probe card are electrically interconnected proximate the interconnection between the probe card and the membrane assembly. The guard conductors of the membrane assembly are electrically interconnected proximate the interconnection between the probe card and the membrane assembly.
    Type: Grant
    Filed: November 29, 2000
    Date of Patent: January 4, 2005
    Assignee: Cascade Microtech, Inc.
    Inventors: Paul A. Tervo, Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais, Martin J. Koxxy
  • Patent number: 6836127
    Abstract: Two reference voltages and two differential receivers are used to detect low-to-high and high-to-low transitions on an input signal and set a received signal output. One reference voltage is set near but under the electrical high voltage level and the other is set near but above the electrical low voltage level. The reference voltage that is closest to the input signal is designated as the active reference voltage. When the input signal crosses the active reference voltage digital value of the received signal output is changed. When the input signal then crosses the inactive reference voltage, the inactive reference voltage is made the active reference voltage. A dead-time is then waited where input signal crossings of the active reference voltage are ignored. After the dead-time, input signal crossings of the active reference voltage will change the received signal output.
    Type: Grant
    Filed: July 27, 2001
    Date of Patent: December 28, 2004
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: David Marshall, John E Tillema
  • Patent number: 6833707
    Abstract: Characterizing electrochemical cell components and a response of an electrochemical cell to a specified operating condition involves preparing a sample of an electrode material in contact with an electrolyte. Self-heating, power-temperature or power-time data is obtained for the sample using a calorimetry technique, such as by use of an accelerating rate calorimetry technique or a differential scanning calorimetry technique. A power function is developed for the sample using the self-heating, power-temperature or power-time data. The power function is representative of thermal power per unit mass of the sample as a function of temperature and amount of reactant remaining from a reaction of the sample electrode material and electrolyte.
    Type: Grant
    Filed: December 29, 1999
    Date of Patent: December 21, 2004
    Assignee: 3M Innovative Properties Company
    Inventors: Jeffery R. Dahn, Dean D. MacNeil, Timothy D. Hatchard
  • Patent number: 6833712
    Abstract: A system for detecting a board-insertion power-on versus a chassis power-on is disclosed. By using recessed circuit board sense contacts, recessed chassis sense contacts, or equivalent, a circuit can detect when power reaches a circuit board's power contacts before the circuit board sense contacts mate with corresponding chassis sense contacts. On the other hand, if a circuit board is fully seated when chassis power is first applied, the circuit will not detect that power has reached the power contacts before the sense contacts are mated, resulting in a different output. The circuit can include a latch, the output of the latch representing either a board-insertion power-on or a chassis power-on. The output of the latch can be used to modify a software or hardware condition or state, resulting in improved operation.
    Type: Grant
    Filed: September 27, 2002
    Date of Patent: December 21, 2004
    Assignee: 3Com Corporation
    Inventors: Brian Fitzpatrick, Dwight Dipert, Russ Panzarella
  • Patent number: 6828806
    Abstract: An electrostatic capacitance sensor, includes an electrostatic capacitance detector, an operational amplifier in which a feedback impedance circuit is connected between an output terminal and an inverse input terminal of the operational amplifier, a signal line connected between the inverse input terminal of the operational amplifier and the electrostatic capacitance detector, an alternating-current signal generator connected to a non-inverse input terminal of the operational amplifier, and a shield for shielding at least a portion of the signal line, the shield being connected to the non-inverse input terminal of the operational amplifier and the alternating-current signal generator. The electrostatic capacitance detector includes a detecting electrode and a shield electrode. The detecting electrode includes a detector-detecting electrode for detecting an object to be detected and an electrode introducer-detecting electrode for introducing an electrode to the detector-detecting electrode.
    Type: Grant
    Filed: July 19, 2000
    Date of Patent: December 7, 2004
    Assignee: Sumitomo Metal Industries, Ltd.
    Inventors: Yoshihiro Hirota, Toshiyuki Matsumoto, Tatsuo Hiroshima
  • Patent number: 6828771
    Abstract: An electric power meter measures the value of an electrical power parameter, e.g., Universal Apparent Power or Universal Power Factor, of an electrical power signal in the time domain by: calculating a first instantaneous power component as the product of an instantaneous voltage signal and an instantaneous current signal of the electrical power signal, carrying out a relative phase shift between the instantaneous voltage signal and the instantaneous current signal; and calculating a second instantaneous power component as the product of the relatively phase-shifted instantaneous voltage and instantaneous current signals. The first and second instantaneous power components are then RMS averaged to determine their respective magnitudes. Both of the calculated magnitudes are then used to determine the value of the electrical power parameter. The method can alternatively be implemented in the frequency domain to produce equivalent measurement values.
    Type: Grant
    Filed: June 5, 2000
    Date of Patent: December 7, 2004
    Assignee: Electric Power Research Limited
    Inventor: Foroozan Ghassemi