Abstract: A method and system for routing a digital probe which signals either a triggered or non-triggered state to continuously scan a part surface without having to return to a rest position each time the probe is triggered. The probe is carried by manufacturing equipment capable of moving in response to control signals and providing manufacturing equipment feedback signals indicating the current position of the probe. Continuous movement of the digital probe is achieved by testing the probe to determine if it is triggered or not at a series of closely spaced time intervals, and rotating a move vector (corresponding to desired probe velocity) in each computation cycle to alter the probe trajectory as a function of the operating state of the probe and its position during the previous computation cycle. These techniques allow relatively inexpensive digital probing systems to gather data at speeds comparable to those of much more expensive analog systems.