Abstract: The invention aims to provide a vertical type probe card in which a probe can scrape an oxide film on a surface of an electrode of the measurement object, thereby ensuring stable contact with the electrode of the measurement object.

Abstract: A method and apparatus allows adapting a standard flying prober system to manually or automatically determine the likelihood of error free probability of test point targets on Printed Circuit Assemblies (PCA's) which may have significant planarity irregularities. The method and apparatus provides a corrective function allowing error free probing of test target points on PCA's having planarity irregularities which otherwise make them impractical to test. The method and apparatus involves utilizing the camera system typically provided with a flying prober system and an auxiliary sighting system each having different optical axis angles, the use of which allows determination of height values.