Abstract: This patent delineates methods for quantifying and mitigating dip-induced azimuthal AVO effects in seismic fracture detection using Azimuthal AVO analysis by accurately accounting for the divergence correction and azimuthal dependence of the reflection angle. Solutions are provided for three cases: (1) dipping isotropic reservoirs; (2) anisotropic reservoirs with fractures aligned in arbitrary direction; and (3) anisotropic reservoirs where vertical fractures are aligned perpendicular to the dip direction.
Abstract: A method of checking the height of a mail item relative to at least one dimensional threshold SH defining a change in postage. The mail items are advanced at a constant speed V along a reference surface. The presence of a mail item is detected relative to a given point of the reference surface. First and second times t1, t2 for which the same mail item is present at the first and second distances d1, d2 relative to the reference surface is detected. The ratio t2/t1 is compared with a value equal to (1??), where ? represents a correction coefficient of less than 1 that depends on the tolerances for detection of the presence of a mail item. The height of a mail item is considered greater than the dimensional threshold SH if, and only if, the relationship t2/t1>1?? is true.
Abstract: A method to determine eccentricity of a rotor in a turbine including: collecting sensor data of rotor eccentricity for a plurality of startup operations; establishing a baseline eccentricity value using the sensor data corresponding to a selected startup operation; determining an eccentricity value using the filtered sensor data for each of a plurality of startup operations subsequent to the selected startup operation; determining a rotor eccentricity difference between the baseline eccentricity value and each of the eccentricity values for the plurality of startup operations subsequent to the selected startup operation, and reporting a rotor eccentricity condition based on the rotor eccentricity difference.
Type:
Grant
Filed:
August 2, 2007
Date of Patent:
June 22, 2010
Assignee:
General Electric Company
Inventors:
Vasanth Muralidharan, Abhay Sudhakarrao Kant, S. N. Arul Saravanapriyan, Mahalakshmi Balasubramaniam S B, Jitendra Kumar
Abstract: A test instrument and method for operating the same are disclosed. The data acquisition system within the instrument generates signals and couples the signals to a device and/or receives signals from the device. The data processor within the instrument includes measurement specific software that generates measurements from the received signals, a restricted software application that utilizes the measurement data, and a physics API that interfaces the measurement specific software with the data acquisition system. The physics API provides a plurality of internal physics functions that are used by the measurement specific software to access the measurement data. The instrument includes an external API that maps the physics functions to an external set of physics functions that are available to the restricted software application and that hide the internal physics functions from the restricted software while providing access to a portion of the measurement data.
Type:
Grant
Filed:
August 28, 2007
Date of Patent:
June 15, 2010
Assignee:
Agilent Technologies, Inc.
Inventors:
Thomas Ambler Rice, David William Grieve
Abstract: A method, system, and computer program product for calculating the residual stress equilibrium of two elastoplastic cylinders coldworked by expansion to obtain interference fit. The deformation state due to an internal expansion load applied to an inner cylinder that will result in interference of the inner cylinder with the outer cylinder can be calculated. The deformation state due to an unloading of the internal expansion load that will result in assembly of the inner cylinder and the outer cylinder can be calculated. The residual stresses, residual displacement and residual strains in the inner cylinder and the outer cylinder, whether they are eventually interference fitted or not, can all be calculated and recorded.
Type:
Grant
Filed:
July 16, 2007
Date of Patent:
June 15, 2010
Assignee:
Airbus France
Inventors:
Stephane Bianco, Romain Canivenc, Marc Sartor
Abstract: A probe card assembly, according to some embodiments of the invention, can comprise a tester interface configured to make electrical connections with a test controller, a plurality of electrically conductive probes disposed to contact terminals of an electronic device to be tested, and a plurality of electrically conductive data paths connecting the tester interface and the probes. At least one of the data paths can comprise an air bridge structure trace comprising an electrically conductive trace spaced away from an electrically conductive plate by a plurality of pylons.
Abstract: According to a first preferred aspect of the instant invention, there is provided an efficient method of computing a 3D frequency domain waveform inversion based on 3D time domain modeling. In the preferred arrangement, 3D frequency domain wavefields are computed using 3D time-domain modeling and a discrete Fourier transformation that is preferably computed “on the fly” instead of solving the large systems of linear equations that have traditionally been required by direct frequency domain modeling. The instant invention makes use of the theory of gradient-based waveform inversion that estimates model parameters (for example velocities) by matching modeled data to field data sets. Preferably the modeled data are calculated using a forward modeling algorithm.
Type:
Grant
Filed:
May 31, 2007
Date of Patent:
May 25, 2010
Assignee:
BP Corporation North America Inc.
Inventors:
Laurent Sirgue, John T. Etgen, Uwe Albertin, Sverre Brandsberg-Dahl
Abstract: An improved method, apparatus, and computer instructions for generating trace data. In response to detecting a new trace event, a determination is made as to whether the new trace event occurred at an expected period of time with respect to a prior trace event. A time stamp in the trace data is placed in response to a determination that the new trace event did not occur at the expected period of time, wherein time stamps occurring at the expected period if time are eliminated from the trace data and wherein compression of the trace data occurs.
Type:
Grant
Filed:
December 13, 2007
Date of Patent:
May 25, 2010
Assignee:
International Business Machines Corporation
Inventors:
Frank Eliot Levine, Milena Milenkovic, Robert J. Urquhart
Abstract: An exemplary system for managing the deployment of a seismic data acquisition system uses a module configured to execute a plurality of task in the field by receiving one or more seismic devices. The module may include a power source that provides electrical power to the seismic devices. The module may also include a processor programmed to retrieve data stored in the seismic devices, perform diagnostics, facilitate inventory and logistics control, configure seismic devices and update data or pre-programmed instructions in the seismic device.
Type:
Grant
Filed:
September 28, 2007
Date of Patent:
May 25, 2010
Assignee:
Ion Geophysical Corporation
Inventors:
Dennis R. Pavel, Scott T. Hoenmans, Richard Eperjesi, Andra Streho, Gerardo Garcia, Richard Pedersen, Dmitry Grinblat
Abstract: Method for processing a set of seismic cubes corresponding to the same acquisition zone and at different source/receiver offset and/or angle of incidence values, characterized in that at least one seismic cube is determined, which is an estimation of the component common to at least two seismic cubes corresponding to different offset and/or angle of incidence values.
Abstract: A method and device, wherein the following steps are carried out: measurement or determination of waste gas concentration parameters, waste gas temperature, outside temperature, fuel power during a limited observation period; determination of the efficiency of the heating system in the area of observation over a period of time; determination of the average outside temperature in the area of observation; determination of heating performance produced in accordance with an average outside temperature on the basis of fuel power over a period of time and the efficiency of the heating system over a period of time in the area of observation; determination of maximum heating performance which is to be obtained in accordance with a minimum outside temperature from the average heating performance, minimum outside temperature, average inside temperature and average outside temperature in the area of observation; determination of the heat contact value of the heating system from the maximum heating performance and durati
Abstract: Natural-phenomenological information is personalized to the unique requirements of a subscriber and distributed to the subscriber. Natural-phenomenological data is gathered from a variety of sources, such as current ground observations, forecast conditions, satellite images, and radar data. Personal preferences of the subscribers are also gathered and stored, such as activities of the subscriber, geographic locations of the activities, sensitivities of the subscriber to natural-phenomenological conditions, calendar information of the subscriber, and modes of delivery. The personal preferences of the subscriber are used as a filter to identify the natural-phenomenological data that is particularly useful to the subscriber, and the resulting information is delivered to the subscriber. The subscriber identifies the destination device that the information is delivered to. The invention is extensible to support new sources of natural-phenomenological information and new output devices.
Type:
Grant
Filed:
December 3, 2001
Date of Patent:
May 18, 2010
Assignee:
Digital Cyclone, Inc.
Inventors:
Craig Burfeind, Douglas P. Kruhoeffer, Anthony W. Meys, Peter Resch
Abstract: A method and system for semiconductor wafer inspection is disclosed. Each of a plurality of dies on a wafer may be probed with a probe tool to produce probe data. The probe data may be used to generate one or more non-repeating care areas. An inspection tool may use the non-repeating care areas to perform an inspection of the semiconductor wafer.
Type:
Grant
Filed:
September 11, 2007
Date of Patent:
May 11, 2010
Assignee:
KLA-Tencor Technologies Corporation
Inventors:
Garrett John Long, Saju Francis Olakengil, Pramod Gaud, John Jacob Roberts
Abstract: It is shown that a pressure pulse originating in a well is correlated to a pulse observed at a distant well with a characteristic time. The correlation time is directly related to the diffusion time scale arising out of the pressure diffusion equation. The relationship is affected by the source-observer or observer-observer distance but the correction is small for large distances. In practice, further corrections have to be included for finite width pulses. For these pulses, a practical scheme for continuous permeability monitoring is presented.
Type:
Grant
Filed:
November 5, 2007
Date of Patent:
May 11, 2010
Assignee:
Schlumberger Technology Corporation
Inventors:
Terizhandur S. Ramakrishnan, Bhavani Raghuraman
Abstract: Systems and methods are provided for monitoring a machine. In one implementation, a system for monitoring the machine includes a monitoring server in communication with a machine. The monitoring server receives data from the machine, estimates, based on the received data, an operating condition of the machine, and estimates a depreciation value of the machine based on the operating condition.
Abstract: Circuits, methods and apparatus are provided to reduce skew among signals being provided or transmitted by a data interface. Signal path delays are varied such that signals transmitted by a memory interface are calibrated or aligned with each other along a rising and/or falling edge. For example, self-calibration, external circuitry, or design tools can provide skew adjustment of each output channel by determining one or more delays for each output channel path. When aligning multiple edges, the edges of the output signals may be aligned independently, e.g., using edge specific delay elements.
Type:
Grant
Filed:
April 13, 2007
Date of Patent:
April 27, 2010
Assignee:
Altera Corporation
Inventors:
Yan Chong, Chiakang Sung, Joseph Huang, Michael H. M. Chu
Abstract: The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a precision measurement unit, a signal transformation module, and a microprocessor. The precision measurement unit is coupled to the device under test for providing a testing signal and receiving a measurement signal generated according to the testing signal. The signal transformation module is coupled to the precision measurement unit for receiving the measurement signal and transforming the measurement signal to a signal measurement result according to a predetermined manner. The microprocessor is coupled to the precision measurement unit and the signal transformation module for examining the signal measurement result to determine a test result for the device under test.
Abstract: A measuring device is disclosed for capacitive pressure and/or temperature measurement, particularly for tire pressure control systems, having at least one sensor, which has a capacitive measuring element to detect a state value, which is applied at an output-side measuring node of the measuring element, with at least one A/D converter operating according to the dual-slope method, with a charging/discharging circuit, for mutual charging and discharging of the measuring element and for generating a sawtooth-shaped measuring potential at the measuring node as a measure for the capacitance of the measuring element, with a period counter, which determines the periods of the measuring potential, and with a clock counter, which determines the cycles of a clock signal, which lie within the duration of at least one period of the measuring potential. The invention relates to a measuring method for capacitive pressure and/or temperature measurement.
Abstract: A program circuit activates a pass signal when a first program unit is programmed. The first program unit is programmed when a test of an internal circuit is passed. A mode setting circuit switches an operation mode to a normal operation mode or a test mode by external control. A state machine allows a partial circuit of the internal circuit to perform an unusual operation different from a normal operation when the pass signal is inactivated during the normal operation mode. By recognizing the unusual operation during the normal operation mode, it can be easily recognized that a semiconductor integrated circuit is bad. Since a failure can be recognized without shifting to the test mode, for example, a user who purchases the semiconductor integrated circuit can also easily recognize the failure.
Abstract: An index detection unit (2030) detects indices allocated or set on an object from a sensed image. An evaluation amount calculation unit (2060) calculates evaluation amounts of the indices using two-dimensional geometric features of the indices on the image and/or three-dimensional geometric features that represent relationships between an image sensing device (2010) and the indices on a three-dimensional space. A reliability calculation unit (2070) calculates reliabilities of the indices according to the calculated evaluation amounts of the indices. A position and orientation calculation unit (2080) calculates the position and orientation of the object or the image sensing device (2010) using at least the calculated reliabilities of the indices and information associated with the image coordinates of the detected indices.