Patents Examined by Edward R. Cosimano
  • Patent number: 7657389
    Abstract: A system and method using a touch probe device for eddy current inspection. The touch probe provides a simple approach for coming within close contact of the specimen while maintaining a normal angle and pressure at the right positions. The use of the touch probe further reduces the total time for the eddy current inspection. The touch probe aligns the probe to a specimen to be inspected, for the purpose of reducing measurement errors and increasing productivity.
    Type: Grant
    Filed: August 23, 2006
    Date of Patent: February 2, 2010
    Assignee: General Electric Company
    Inventors: Ui W. Suh, Richard C. Knepfle
  • Patent number: 7653512
    Abstract: According to the present invention, the most challenging issues in this work have been to find systematic ways of enabling maintenance engineers to decide an adequate time for the replacement of vacuum pumps on the basis of their current performance assessment result. Further, the comparison of the currently evaluated diagnostics analysis results and the initial (or reference) data set is shown to enable maintenance engineers to decide the replacement of the considered vacuum pump according to the evaluated pump performance indicators. This quantitative diagnostic analysis result is expected not only to enable maintenance engineers to decide an adequate time for the replacement of vacuum pumps on the basis of their current performance assessment results but also to improve the reliability and confidence of the predictive maintenance of low vacuum pumps.
    Type: Grant
    Filed: December 17, 2004
    Date of Patent: January 26, 2010
    Assignee: Korea Reserch Institute of Standards and Science
    Inventors: Wan Sup Cheung, Jong Yeon Lim, Kwang Hwa Chung, Soo Gab Lee
  • Patent number: 7653508
    Abstract: A method for monitoring human activity using an inertial sensor includes continuously determining an orientation of the inertial sensor, assigning a dominant axis, updating the dominant axis as the orientation of the inertial sensor changes, and counting periodic human motions by monitoring accelerations relative to the dominant axis.
    Type: Grant
    Filed: December 22, 2006
    Date of Patent: January 26, 2010
    Assignee: DP Technologies, Inc.
    Inventors: Philippe Kahn, Arthur Kinsolving, Mark Andrew Christensen, Brian Y. Lee, David Vogel
  • Patent number: 7653503
    Abstract: A temperature compensating fluid flow sensing system is provided that comprises a resistance-based sensor element that is included in a constant voltage anemometer circuit configured to establish and maintain a command voltage across the first sensor element and to provide a constant voltage anemometer (CVA) output voltage corresponding to the resistance change in the first sensor element due to heat transfer between the first sensor element and the fluid. A controller is configured to establish the command voltage based on a desired overheat across the sensor and an actual overheat across the first sensor element. A power dissipation (PDR) module is configured to determine at least one fluid flow parameter and an actual overheat value based at least in part on the CVA output voltage and to transmit to the controller the actual overheat for use by the controller in updating the command voltage.
    Type: Grant
    Filed: April 20, 2007
    Date of Patent: January 26, 2010
    Assignee: Tao of Systems Integration, Inc.
    Inventors: Arun S. Mangalam, Siva M. Mangalam
  • Patent number: 7647190
    Abstract: An analyzing system, comprising: a sample processor for processing a sample based on a designated dilution parameter; a measurement section for measuring the sample processed by the sample processor; a dilution parameter memory for storing a first dilution parameter and a second dilution parameter which is different from the first dilution parameter and can be supplied by a user of the analyzing system; and a measurement controller for controlling the sample processor and the measurement section so as to process the sample based on the first dilution parameter and obtain a measurement value by measuring the processed sample; wherein, when a comparison of the measurement value and a predetermined threshold indicates a retest, the second dilution parameter is used for the retest, is disclosed. A diagnostic processing device and computer program product thereof are also disclosed.
    Type: Grant
    Filed: July 24, 2006
    Date of Patent: January 12, 2010
    Assignee: Sysmex Corporation
    Inventors: Mamoru Uemura, Kenichi Takahashi, Yasutaka Arino, Akinobu Seko, Yuji Takano
  • Patent number: 7647195
    Abstract: A method and apparatus for a virtual accelerometer is described. The virtual accelerometer includes an active process identifier engine to identify any active application that may use accelerometer data. The virtual accelerometer also includes an intelligent signal interpretation and separation (ISIS) engine to separate raw accelerometer data for each of the active applications that use the accelerometer data. Additionally, the virtual accelerometer includes a universal application program interface (API) to provide separated accelerometer data to an application.
    Type: Grant
    Filed: July 11, 2007
    Date of Patent: January 12, 2010
    Assignee: DP Technologies, Inc.
    Inventors: Philippe Kahn, Arthur Kinsolving
  • Patent number: 7647202
    Abstract: A system (30) includes an analysis engine (34) and a notification engine (38) for selective notification of a condition (72) of an apparatus (26) monitored by a monitoring device (28). A method executed by the system (30) receives (116) data elements (58) from the monitoring device (28), processes (118) the data elements (58) to detect the condition (72) of the apparatus (26), and determines that the condition (72) defines an exception (74) to a normal condition (70) of the apparatus (26). A first notice (60) of the condition (72) is conveyed (146) to a responsible party (59) at a first instance of determination of the exception (74), and conveyance of a second notice (60) is prevented (140) at a second, subsequent, instance of determination of the exception (74). In addition, communication of the normal condition (70) of the apparatus (26) is prevented.
    Type: Grant
    Filed: July 5, 2006
    Date of Patent: January 12, 2010
    Assignee: Arizona Public Service Company
    Inventor: Donald R. Lamontagne
  • Patent number: 7643954
    Abstract: A master station includes a group of circuits for performing an optimization method. In such a system, the optimization is achieved by adjusting the pull-up resistance and by setting the best possible clock frequency to ensure that data/clock high and low voltage levels are within predetermined specifications. An optimization procedure is performed in a calibration phase invoked by a user or a system whenever a change is introduced to the system, such as addition or deletion of slave stations, a change of data/clock lines, or a change that may affect on the electrical and timing characteristics of the two-wire communication system.
    Type: Grant
    Filed: May 30, 2007
    Date of Patent: January 5, 2010
    Assignee: Opnext Japan, Inc.
    Inventors: Antony Cleitus, Hiroo Matsue, Tomonao Kikuchi, Shigeru Tokita
  • Patent number: 7643957
    Abstract: Techniques for bisecting a symmetric, substantially transmissive two-port network (a THRU structure) through an optimization solution of the relevant equations defined by transmission matrix mathematics are described. Bisect de-embedding may be performed using a single substantially symmetric THRU structure, a first half of a first substantially symmetric THRU structure and a second half of a second substantially symmetric THRU structure, and by combining bisect de-embedding with conventionally known de-embedding techniques.
    Type: Grant
    Filed: September 9, 2005
    Date of Patent: January 5, 2010
    Assignee: Mayo Foundation for Medical Education and Research
    Inventor: Erik S. Daniel
  • Patent number: 7640130
    Abstract: Systems and methods for effectuating verification and certification of verifiable devices. Preferably, but not necessarily, such certification occurs or is communicated remotely. A verifiable device may be directly or indirectly connected to an appropriate regulatory agency through a communication mechanism. One or more tests may be performed on the verifiable device to verify that the device is functioning properly. The test results are directly or indirectly transmitted to the regulatory agency. If the tests were passed then the verifiable device may be approved for use. When self-certification or remote certification is provided for, the need for in-person verification and certification procedures by agency personnel may be eliminated.
    Type: Grant
    Filed: October 24, 2007
    Date of Patent: December 29, 2009
    Assignee: Mettler-Toledo, Inc.
    Inventors: John Scott Churan, Philip Mark Metzler
  • Patent number: 7640120
    Abstract: An arc detection means for detecting arcs in a plasma process includes at least one comparator to which an evaluation signal such as an output signal or an internal signal of an AC generator relating to the output signal and a reference value are supplied. The comparator is connected to a logic component that generates a signal for an arc suppression device.
    Type: Grant
    Filed: December 19, 2006
    Date of Patent: December 29, 2009
    Assignee: Huettinger Elektronik GmbH + Co. KG
    Inventors: Sven Axenbeck, Markus Bannwarth, Martin Steuber, Peter Wiedemuth, Lothar Wolf
  • Patent number: 7640137
    Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.
    Type: Grant
    Filed: January 30, 2007
    Date of Patent: December 29, 2009
    Assignee: Hitachi, Ltd
    Inventors: Shouhei Numata, Noriyuki Sadaoka, Tarou Takagi
  • Patent number: 7636649
    Abstract: An optical metrology model for the structure is obtained. The optical metrology model comprising one or more profile parameters, one or more process parameters, and a dispersion. A dispersion function that relates the dispersion to at least one of the one or more process parameters is obtained. A simulated diffraction signal is generated using the optical metrology model and a value for the at least one of the process parameters and a value for the dispersion. The value for the dispersion is calculated using the value for the at least one of the process parameter and the dispersion function. A measured diffraction signal of the structure is obtained using an optical metrology tool. The measured diffraction signal is compared to the simulated diffraction signal to determine one or more profile parameters of the structure. The fabrication tool is controlled based on the determined one or more profile parameters of the structure.
    Type: Grant
    Filed: September 21, 2007
    Date of Patent: December 22, 2009
    Assignee: Tokyo Electron Limited
    Inventors: Shifang Li, Hanyou Chu, Manuel Madriaga
  • Patent number: 7634374
    Abstract: There is described a method of manufacturing a device to be used with a computer-aided surgery system, a method of calibrating the device, and the device itself. After fabrication, the device is measured to obtain true parameters thereof. The true parameters are stored on a storage medium associated with the device and include measurement data of high precision relating to dimensions of the device as well as to relative positioning of a tracker on the device with respect to the device. The true parameters are entered into the system and when the tracker is located in the 3D environment, the device can then be located in the 3D environment with a high degree of precision using the true parameters.
    Type: Grant
    Filed: April 26, 2005
    Date of Patent: December 15, 2009
    Assignee: Orthosoft Inc.
    Inventors: Benoît Chouinard, Louis Brillon, Benoît Pelletier, Sébastien Jutras
  • Patent number: 7634367
    Abstract: A method for improving the accuracy or precision of a metered fluid includes: estimating a fluidic property of the fluid being metered; and adjusting one or more control parameters based on the estimated property to improve the accuracy or precision of a metered fluid. Preferably, the estimating the property of the fluid being metered includes: monitoring a physical event during the metering operation to collect sensed data; extracting features from the sensed data; and using the features to estimate fluid properties. In another preferred embodiment, the estimated fluidic property is viscosity and the sensed data is a pressure profile during a fluid aspiration. In another preferred embodiment, the method includes a diagnostic analyzer which includes a metering probe having a hard probe or a probe having a disposable tip and wherein the fluid is a body fluid sample.
    Type: Grant
    Filed: July 11, 2006
    Date of Patent: December 15, 2009
    Assignee: Ortho-clinical Diagnostics, Inc.
    Inventors: Zhong Ding, Mark Sawczuk, Scott Stearns
  • Patent number: 7630848
    Abstract: A distributed analysis system may include at least one analysis instrument for generating sample data from a sample at a local site. A storage device may hold a library of calibration models at a site remote from the local site). A data processor, which may be integral with or separate from the analysis instrument, may determine a trait of the sample using a calibration model selected from the library and the sample data. The data processor may be located at the local site and may be connectable to the storage device via a telecommunications link. The data processor may temporarily retain the selected calibration model received via the telecommunications link.
    Type: Grant
    Filed: June 29, 2005
    Date of Patent: December 8, 2009
    Assignee: Foss Analytical A/B
    Inventor: Raivo Loosme
  • Patent number: 7627452
    Abstract: A device and a method for predicting the mean time period between two failures of a technical system, for example a manufacturing system or an assembly system for motor vehicle components. The device includes a components list (130.1, 130.2). Those components of the technical system which are included in this components list are the maintenance-intensive components. Every failure of a component of the list leads to a failure of the system. Furthermore, the device includes an apparatus for acquiring setpoint MTBF values of all the components of the list. A setpoint MTBF value of a component is a requested or planned mean time period between two failures of this component. The apparatus predicts the planned mean time period between two failures of the technical system as a function of the setpoint MTBF values of the components.
    Type: Grant
    Filed: July 6, 2004
    Date of Patent: December 1, 2009
    Assignee: Daimler AG
    Inventors: Volker Albrecht, Dieter Nau, Stefan Odermatt
  • Patent number: 7627456
    Abstract: In one embodiment, a system for dynamically tasking one or more surveillance resources includes a first logical layer identifying a collection requirement (CR) and a second logical layer identifying one or more surveillance resources in the CR. Each of the surveillance resources includes one or more sensors. The system also includes a third logical layer specifying how each of the sensors in the surveillance resources in the CR should carry out surveillance.
    Type: Grant
    Filed: February 3, 2005
    Date of Patent: December 1, 2009
    Assignee: Raytheon Company
    Inventor: Eric L. Hansen
  • Patent number: 7620523
    Abstract: According to a feature of the present disclosure, a method is provided for the determination of anomalous events in complex systems, such as problems, inefficiencies, and failures, and a tool is provided for the detection of these events. Many complex systems are non-stationary or experience periodic fluctuations or spikes in values that are outside of normal ranges, but constitute normal behavior nevertheless. The method accounts for both non-stationarity, as well as fluctuations and spikes. Additional novel features include both a threshold setting initialization method and a regression method for the determination of the start points and end points of events.
    Type: Grant
    Filed: April 30, 2007
    Date of Patent: November 17, 2009
    Assignee: Integrien Corporation
    Inventors: Mazda A. Marvasti, Daniel R. Jeske
  • Patent number: 7620521
    Abstract: Arrangement and method for classifying an occupying item in a seat includes at least one force sensor arranged to measure the force applied to the seat at time intervals, and a processor coupled to the force sensor(s) for receiving the force measurements therefrom. The processor analyzes the force measurements from each force sensor over time to discern patterns in the force measurements and analyzes any discerned pattern to determine if it approximates a known pattern indicative of an animate object or an inanimate object. The processor may be trained to discern patterns providing information about the occupying item by conducting tests in which different occupying items are placed in the seat and measurements of the force applied to the seat are obtained by the force sensor, before, during and after placement of the occupying item in the seat.
    Type: Grant
    Filed: October 26, 2007
    Date of Patent: November 17, 2009
    Assignee: Automotive Technologies International, Inc.
    Inventors: David S. Breed, Wilbur E. DuVall, Wendell C. Johnson