Abstract: X-ray inspection of moving cargo based on acquiring multiple image lines at one time or substantially at one time. An X-ray source with multiple-beam electron beam targets creates multiple parallel X-ray fan beams. X-ray inspection systems and methods employ such multiple-beam sources for purposes of inspecting fast moving cargo.

Abstract: Provided is a charged particle beam device or charged particle microscope permitting observation of even a large-sized specimen in the air atmosphere or a gaseous atmosphere. A charged particle beam device that adopts a thin film which partitions a vacuum atmosphere and the air atmosphere (or gaseous atmosphere) includes a charged particle optical lens barrel in which a charged particle optical system is stored, a housing in which a route along which a primary charged particle beam emitted from the charged particle optical lens barrel reaches the thin film is sustained in the vacuum atmosphere, and a mechanism that bears the charged particle optical lens barrel and first housing against a device installation surface. As the bearing mechanism, a housing having an opening through which a large-sized specimen is carried in or a mechanism having a shape other than the shape of the housing, such as, a post is adopted.

Abstract: An X-ray imaging system element (3) includes two compression elements (8a, 8b), which are movable relative to one another. An object (10) is introducible and compressible between the compression elements. At least one of the compression elements is adapted to alter its geometrical shape and/or alignment relative to the other during compression. At least one partly X-ray opaque marker element (24) is provided on one of the compression elements, which marker element is adapted to allow detection of an alteration of the geometrical shape of the respective compression element (8a, b).

Abstract: An x-ray apparatus includes an x-ray emitter having an x-ray tube, a rotary anode disposed in the x-ray tube, and a drive for the rotary anode. The drive includes a reluctance motor having a stator disposed outside the x-ray tube and a rotor disposed inside the x-ray tube. The rotor is mechanically connected to the rotary anode.

Abstract: A multistage quadrupole lens system in an ion implantation apparatus includes a first quadrupole lens and a third quadrupole lens. A first bore radius of the first quadrupole lens may be smaller than a third bore radius of the third quadrupole lens. The multistage quadrupole lens system may further include a second quadrupole lens placed between the first quadrupole lens and the third quadrupole lens. A second bore radius of the second quadrupole lens may take a value lying between the first bore radius of the first quadrupole lens and the third bore radius of the third quadrupole lens (i.e., an intermediate value between them).

Abstract: A rotary anode for an X-ray tube includes a ceramic base body that carries a focal path for emitting X-rays during electron irradiation. The ceramic base body is made of a mixture of silicon carbide and at least one high temperature-resistant diboride.

Abstract: A specimen holder is used for an optical microscope, comprising: a specimen support that supports a specimen to enable the specimen to tilt relative to the optical axis of the optical microscope; an adjustment plate that has an observation surface for making observations using the optical microscope; and an adjustment plate support that supports the adjustment plate, so that the angle formed by the optical axis and the observation surface is larger than the angle formed by the optical axis and a specimen surface of the specimen.

Abstract: A craniostat for an extraoral dental radiographic apparatus includes an upper portion connected to a lower portion by rods. The upper portion includes a crossbeam and rests for a patient's temples, the rests being formed by two arches articulated with the crossbeam. The arches lean on the patient's temples, and are blocked by a control system, which, in one embodiment, is configured as oscillating levers. The blocking action is caused by shape friction generated at the time of activation via the control levers. A method of use of a craniostat is also described.

Abstract: A method of operating a system comprising a chromatograph and a mass spectrometer comprises: (a) providing an abundance threshold and a list comprising respective entries for precursor ion species of interest comprising respective precursor-ion m/z ratios; (b) transmitting a first sample fraction portion comprising a plurality of sample-fraction ion species through an ion mobility spectrometer operated in non-dispersive mode to the mass spectrometer; (c) detecting a respective abundance at each of a plurality of sample-fraction m/z ratios; and (d) upon detection of an above-threshold ion abundance at an m/z-ratio corresponding to a first precursor ion species of interest: (d1) inletting a second sample fraction portion into the ion mobility spectrometer operated in dispersive mode such that ions of the first precursor-ion species are preferentially transmitted therethrough; (d2) fragmenting the preferentially-transmitted ions so as to generate product ion species; and (d3) detecting the product ion species.

Abstract: In an ion reflector (4) configured from a plurality of electrodes, electrodes 42 disposed in a second stage region (S2) for reflecting ions after deceleration are formed thinner than electrodes (41) disposed in a first stage region (S1) for decelerating the ions. The thin electrodes suppress unevenness of potential, in particular, in a path away from the center axis of the reflector, which results in improvement of isochronism of an ion packet passing on the path. The thick electrodes (41, 43) disposed in the first stage region (S1) prevents stretching of the grid electrodes (G1, G2) from being affected, and unevenness of potential in the first stage region (S1) hardly affects isochronism of the ions. By appropriately adjusting thicknesses and a pitch of the electrodes (41, 42, 43, 44) adjacent to one another so as to align intervals between the electrodes (41, 42, 43, 44), it is possible to use spacers having the same size in common.

Abstract: A system for the automated serial testing and/or measuring of a plurality of substantially identical components by X-radiation, the system comprising a testing device with a support, a rotor mounted so as to be continuously rotatable on the support, and an X-ray device disposed on the rotor, a protective enclosure surrounding the testing device, a handling device for handling a component during X-ray testing, and a control/evaluation unit configured for automatically controlling the system as well as evaluating the X-ray signals by computer tomography. The handling device is configured for periodically reciprocating between a loading region and a testing region and comprises an end face element on which the component can be disposed on the side of the end face.

Abstract: An ion implantation apparatus including an enclosure defining a process chamber, a carriage slidably mounted on a shaft within the process chamber and coupled to a drive mechanism adapted to selectively move the carriage along the shaft. A platen assembly can be coupled to the carriage, and a linkage conduit can extend between a side wall of the enclosure and the carriage. The linkage conduit can include a plurality of pivotably interconnected linkage members that define a contiguous internal volume that is sealed from the process chamber. The contiguous volume can be held at a desired vacuum pressure separate from the vacuum environment of the process chamber.

Abstract: An X-ray CT apparatus includes: an X-ray generating unit configured to generate an X ray; an X-ray detecting unit including a plurality of X-ray detectors, each configured to detect the X ray generated from the X-ray generating unit and transmitted through an object; and an image generating unit configured to correct and reconstruct signals acquired by the X-ray detecting unit. While crosstalk correction of a plurality of the X-ray detectors is performed at the image generating unit, correction of a locally attenuating component is previously performed and correction of a whole component of the crosstalk is performed when the image is reconstructed.

Abstract: Provided is a charged particle beam exposure apparatus configured as follows. An electron beam emitted from an electron gun is deformed by an asymmetric illumination optical system to have an elongated section. The electron beam is then applied to a beam shaping aperture plate provided with a plurality of apertures arranged in a line, thereby generating a plurality of electron beams. Exposure of a predetermined pattern is performed on a semiconductor substrate by moving a stage device in a direction orthogonal to line patterns on the semiconductor substrate and turning the plurality of electron beams on or off in synchronization with the movement of the stage device by use of a blanker plate and a final aperture plate.

Abstract: An electron microscope has a large depth of focus in comparison with an optical microscope. Thus, information is superimposed on one image in the direction of depth. Therefore, it is necessary to accurately specify the three-dimensional position and density of a structure in a specimen so as to observe the three-dimensional structure of the interior of the specimen by using the electron microscope. Furthermore, a specimen that is observed with the optical microscope on a slide glass is not put into a TEM device of the related art. Thus, performing three-dimensional internal structure observation with the electron microscope on a location that is observed with the optical microscope requires very cumbersome preparation of the specimen.

Abstract: A method is disclosed for operating a mass spectrometer having a Fourier Transform (FT) analyzer, such as an orbital electrostatic trap mass analyzer, to avoid peak coalescence and/or other phenomena arising from frequency-shifting caused by ion-ion interactions. Ions of a first group are mass analyzed, for example in a quadrupole ion trap analyzer, to generate a mass spectrum. The estimated frequency shift of the characteristic periodic motion in the FT analyzer is calculated for one or more ion species of interest based on the intensities of adjacent (closely m/z-spaced) ion species. If the estimated frequency shift(s) for the one or more ion species exceeds a threshold, then a target ion population for an FT analyzer scan is adjusted downwardly to a value that produces a shift of acceptable value. An analytical scan of a second ion group is performed at the adjusted target ion population.

Abstract: The present invention provides a drawing apparatus for performing drawing on a substrate with a charged particle beam, including a stage configured to hold the substrate and be moved, a charged particle optical system configured to irradiate a plurality of charged particle beams arrayed along a first axis, and a controller configured to control the drawing so as to perform multiple irradiation of a target portion on the substrate with the plurality of charged particle beams, wherein the controller configured to control the drawing such that the stage is moved in one direction along the first axis with respect to a plurality of regions formed on the substrate along the first axis, and a deflection of charged particle beam for a displacement of charged particle beam along the first axis is performed with respect to drawing on each of the plurality of regions.

Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.

Abstract: A charged-particle beam drawing apparatus has an airtight first elastic tube that is provided on an outer surface of the vacuum chamber and communicates with an inner space of the vacuum chamber, a vibrator that is airtight and provided at an end of the first elastic tube at an opposite side to the vacuum chamber, and communicates with an inner space of the first elastic tube, a second elastic tube that is airtight and provided at an end of the vibrator at an opposite side to the first elastic tube and communicates with an inner space of the vibrator, a terminal closer that is provided at an end of the second elastic tube at an opposite side to the vibrator, and closes the end of the second elastic tube, and a gap holder to keep a gap between the outer surface of the vacuum chamber and the terminal member.

Abstract: Embodiments of the present disclosure relate to substance detection technology, and to signal extraction circuits and methods for ion mobility tubes, and ion mobility detectors, which can solve the problem with the conventional technologies that it is difficult to design and manufacture the leadout circuit for the pulsed voltage on the Faraday plates. A signal extraction circuit for an ion mobility tube includes an DC-blocking module configured to remove a DC voltage contained in a voltage extracted, by a signal leadin terminal, from the Faraday plate, and to output, by a signal leadout terminal, a pulsed voltage contained in the voltage extracted from the Faraday plate. An ion mobility detector includes the signal extraction circuit for an ion mobility tube according to the present invention.