Abstract: A radiation dosimeter includes a first radiation detector configured to operate in a counting mode, and a second radiation detector configured to operate in a current mode. A processor is configured to calculate a first detected dose of the first radiation detector, a second detected dose of the second radiation detector, and a total dose value using the first detected dose and the second detected dose. An alarm indicates when the total dose value is above a predetermined level.

Abstract: The present disclosure relates to a device that includes a light source, a detector; and a film having a first surface that includes a transition metal dichalcogenide, where the film is configured to interact with a volume of gas containing a concentration of water vapor, the light source is configured to shine a first light onto the first surface, the film is configured, as a result of the first light, to emit from the first surface a second light, the detector is configured to receive at least a portion of the second light, and the detector is configured to generate a signal proportional to an intensity of the second light.

Abstract: A fluorescence measurement apparatus includes a fluorescence image acquisition unit that acquires a fluorescence image containing an object, an interference image acquisition unit that acquires an interference image containing the object, and an operation unit. The operation unit determines an optical thickness image based on the interference image acquired by the interference image acquisition unit, and determines, in a region of interest set in common in both of the fluorescence image acquired by the fluorescence image acquisition unit and the optical thickness image, a fluorescence expression rate of the object based on an integrated value of a fluorescence intensity in the fluorescence image and an integrated value of an optical thickness in the optical thickness image.

Abstract: An inspection system includes one or more processors and an infrared (IR) camera operably coupled to the one or more processors. The one or more processors control a microwave transmitter to sequentially emit microwaves having different frequencies within a designated frequency range into an object during a first sweep. The IR camera generates thermal image data of the object after the object is heated by each of the different frequencies of microwaves. The one or more processors analyze the thermal image data and determine a selected frequency within the designated frequency range that provides greater heating of the object than one or more other frequencies in the designated frequency range. The one or more processors also analyze select thermal image data of the object, responsive to heating of the object by the selected frequency of microwaves, to detect an element in the object.

Abstract: The present invention relates to a system for measuring the power of electromagnetic radiation (EMR) using piezoelectric transducers (PZTs) and pyroelectric transducers (PRTs). According to an illustrative embodiment of the present disclosure, a target cell has a mirrored surface that can partially reflect and partially absorb EMR. Each target cell can include or be coupled to PZTs and PRTs. When incident EMR reflects off of targets cells, the reflected portion creates radiation pressure and the non-reflected portions creates heat. The PZTs convert the pressure into a first electric current, and the PRTs convert the heat into a second electric current. Measuring the first and/or second currents allows a user to calculate the original power of an EMR source. By utilizing multiple target cells placed in specially designed arrays, a user can calculate fluctuations of EMR power by time and location across the target cells.

Abstract: A scintillator plate provided with a scintillator having, on a substrate, a first surface facing the substrate and a second surface on an opposite side to the first surface is provided. The scintillator includes needle-like crystals each containing an alkali metal halide compound, thallium iodide, and copper and/or silver as an additive element. The additive element is contained in the second surface at a concentration of not less than 0.04 mol % and not more than 0.5 mol %, and has a higher concentration in the first surface than in the second surface. A thickness of a largest portion of each of the needle-like crystals becomes not less than one time and not more than nine times a thickness at a height of 10 ?m in a direction from the first surface to the second surface.

Abstract: A Detection element includes a substrate having a first surface and a second surface opposing the first surface, substrate comprising: a substrate provided with a through hole having inner diameters that differ from each other at two points along the thickness of substrate; a through electrode disposed in through hole; a first electrode connected to through electrode and disposed on the first surface; a patterned electrode connected to through electrode and disposed on the second surface; and a second electrode disposed on the first surface and spaced apart from the first electrode.

Abstract: The present invention is an underwater analysis device (10) for analyzing absorption capacity of water.

Abstract: One aspect of the present disclosure relates to systems and methods that can be used for super-sensitivity multiphoton frequency-domain fluorescence lifetime imaging microscopy (MPM-FD-FLIM). One or more laser light sources can deliver excitation light with an intensity modulated by a periodic function to a sample, which includes a fluorophore concentration. A receiver can receive a fluorescence signal emitted from the fluorophore concentration over a time period. A computing device can transform the fluorescence signal to the frequency domain and measure a fluorescence lifetime associated with the sample in the frequency domain based on a DC component and at least one higher harmonic component generated by non-linear optical mixing of the modulated excitation light. Using the DC component and the at least one higher harmonic component can increase the sensitivity of an image created by the MPM-FD-FLIM system.

Abstract: System and methods for calibrating gamma ray tools using blanket field calibrator models is provided. A counting rate of a first gamma ray tool is simulated based on a model of a first blanket calibrator. When it is determined that the simulated counting rate matches a measured counting rate associated with the first gamma ray tool, a tally multiplier and a corresponding material specification for the model of the first blanket calibrator is determined. A counting rate for a second gamma ray tool is simulated based on the tally multiplier and the material specification determined for the model of the first blanket calibrator. A sensitivity factor for the second gamma ray tool is determined based on the simulation. The second gamma ray tool is calibrated according to a nominal blanket activity calculated from the sensitivity factor of the second gamma ray tool.

Abstract: The present invention provides a radiation imaging apparatus capable of maintaining the quality of an image obtained even when a dose incident on a radiation detector changes suddenly. The present invention is a radiation imaging apparatus including a radiation source, a radiation detector to detect radiation emitted from the radiation source, and a cooling unit to cool the radiation detector; and is characterized in that the radiation detector has a counting circuit to output a number of photons in radiation counted per unit time as a photon counting rate, and the cooling unit controls a coolability of the radiation detector in response to the photon counting rate.

Abstract: A radon sensor device using a polyhedral-shaped ionization chamber is proposed. The radon sensor device includes: an ionization chamber having an open side and inner sides surrounded by a first conductor and generating an electrical field therein by applying bias power to the first conductor; a cover having a first side covered with a second conductor and closing the open side of the ionization chamber such that that first conductor disposed on the inner sides of the ionization chamber and the second conductor are electrically connected; a probe unit disposed in the ionization chamber and absorbing ion charges produced when alpha (?) decay occurs in the ionization chamber; and a measurement circuit detecting an alpha particle detection signal by amplifying and processing an electrical micro-signal input from the probe unit into a predetermined magnitude.

Abstract: The present disclosure provides systems and methods for characterizing and monitoring biological material. In one aspect, a method for characterizing biological material includes acquiring optical data associated with a biological material, and analyzing the optical data to determine optical properties of the biological tissue. The method also includes determining, using the optical properties, phase information corresponding to the biological material, and generating a report characterizing the biological tissue using at least the phase information.

Abstract: A method and device for determining the depth and fluorophore concentration of a fluorophore concentration below the surface of an optically absorbing and scattering medium suitable for use in fluorescence-based surgical guidance such as in tumor resection is described. Long-wavelength stimulus light us used to obtain deep tissue penetration. Recovery of depth is performed by fitting measured modulation amplitudes for each spatial frequency to precomputed modulation amplitudes in a table of modulation amplitudes indexed by optical parameters and depth.

Abstract: A detector assembly is provided that includes a semiconductor detector, a collimator, and a processing unit. The semiconductor detector has a first surface and a second surface opposed to each other. The first surface includes pixelated anodes, and the second surface includes a cathode electrode. The collimator includes openings defined by septa. The collimator defines a pitch D between adjacent septa, with the septa defining a septa length L. A ratio of L/D is less than 14. The processing unit is configured to identify detected events within virtual sub-pixels distributed along a length and width of the semiconductor detector. Each pixel comprises a plurality of corresponding virtual sub-pixels, and absorbed photons are counted as events in a corresponding virtual sub-pixel.

Abstract: A spectrometer for downhole applications can be calibrated without using radioactive sources. A spectrum of measured gamma ray counts can be received from a spectrometer in a calibration mode. A spectrum-to-window ratio can be used to determine a relationship between voltage level applied to a photoreceptor of the spectrometer and gain factors. A voltage level associated with a gain factor of one can be identified for use by the spectrometer in a non-calibration mode. The measured gamma ray counts and reference shapes for a plurality of radioactive elements can be used in a least squares fit process to determine an offset to apply to the spectrometer in the non-calibration mode.

Abstract: A thickness measuring device is provided. The thickness measuring device may include a terahertz wave signal processing unit configured to receive a terahertz wave according to at least one mode of a reflection mode and a transmission mode, a refractive index information acquisition unit configured to acquire refractive index information of the thickness measurement sample in consideration of second-time difference information between a first reflected terahertz wave and a second reflected terahertz wave, and a thickness information acquisition unit configured to acquire thickness information of the thickness measurement sample in consideration of the refractive index information.

Abstract: A Detection element includes a substrate having a first surface and a second surface opposing the first surface, substrate comprising: a substrate provided with a through hole having inner diameters that differ from each other at two points along the thickness of substrate; a through electrode disposed in through hole; a first electrode connected to through electrode and disposed on the first surface; a patterned electrode connected to through electrode and disposed on the second surface; and a second electrode disposed on the first surface and spaced apart from the first electrode.

Abstract: Aspects of the subject technology relate to a system configured to apply a voltage setting to a sensor of a downhole tool. The system is configured to identify an active gain control model for a temperature-sensitive sensor for a downhole tool, receiving temperature data for the downhole tool, and apply a high voltage setting for the first sensor based on the temperature data and the active gain control model. The system is further configured to collect sensor data from the sensor operating in a wellbore using the high voltage setting and update the active gain control model based on the sensor data.

Abstract: A system includes a gantry of a medical imaging apparatus. In an embodiment, the gantry includes an X-ray source, and a radiation protection booth, which can be installed or suspended relative to the gantry.