Patents Examined by Howard Wisnia
  • Patent number: 5313846
    Abstract: A sample introduction valve for spectrometers for selectively directing sample flow from two or more sources in which a slideably mounted shuttle provides in one position a pass through for one source and a by-pass for the other source and in a second position the opposite result.
    Type: Grant
    Filed: June 10, 1991
    Date of Patent: May 24, 1994
    Assignee: Leeman Labs Inc.
    Inventors: David A. March, Peter G. Brown, David A. Hotham
  • Patent number: 5202632
    Abstract: At least one imaging parameter (e.g., the repetition interval TR or the initial nutation angle .theta.) is varied during the course of a single MR image sequence. This variation in at least one imaging parameter is preferably controlled so as to increase the contrast and signal-to-noise ratio of lower spatial frequency image components. For example, by using longer TR intervals (or smaller initial nutation angle .theta.) during lower spatial frequency phase encoding sub-sequences, relatively more signal is gathered from NMR nuclei having long T1 parameters thus providing a resultant image with many characteristics of a much longer overall sequence (e.g., one using uniform relatively long TR intervals for all spatial frequency phase encoding sub-sequences).
    Type: Grant
    Filed: August 3, 1990
    Date of Patent: April 13, 1993
    Assignee: The Regents of the University of California
    Inventors: Leon Kaufman, David M. Kramer, John M. Coleman
  • Patent number: 5195364
    Abstract: A method of testing the hardness of a workpiece having a continuously curved outer surface, in particular a pipe or rod, by the penetration method, includes (a) holding the workpiece in a horizontally and vertically fixed position; (b) arranging a machine tool and a hardness testing instrument having a penetration body above the workpiece for movement with respect to the workpiece; (c) linearly scanning a predetermined area of the curved surface of the workpiece for determining the distance between a distance sensor and the curved surface, the region lying in the horizontal path of the machine tool; (d) determining the summit point of the scanned curved surface area from the scanning operation of step (c); (e) selecting the scanned curved area as the test location for the horizontal positioning of the hardness testing instrument; (f) selecting a locus along the scanned curved area of the workpiece as the reference point for the vertical positioning of the machining tool; (g) machining a region into the surfac
    Type: Grant
    Filed: June 12, 1991
    Date of Patent: March 23, 1993
    Assignee: Mannesmann Aktiengesellschaft
    Inventors: Hans-Jurgen Dehe, Heinz Bosebeck, Wolfgang Ruyters
  • Patent number: 5187982
    Abstract: A controlled vibration experiment device having a vibration model structure to simulate actual mechanical vibration and to monitor and analyze the vibration by a computer monitor. The device has a base plate, a supporting frame, a T-shaped sliding rail, a servo motor, a connecting piece and a decoder with a rotatable shaft. The vibration produced is changed to an electrical signal and input to the computer to display the various type of waveforms. The vibration phenomena is then analyzed by a computerized monitor.
    Type: Grant
    Filed: April 26, 1991
    Date of Patent: February 23, 1993
    Inventor: Cheng Chu
  • Patent number: 5187987
    Abstract: Apparatus is disclosed for measuring creep stiffness of a specimen, for example, asphalt cement, or other viscoelastic material, having a flexural modulus greater than approximately 1,000 psi. The specimen and the lower part of a loading mechanism are submerged in a constant temperature coolant thereby providing buoyant support to the specimen, preventing it from deflecting under its own weight, as well as providing means for controlling the test temperature. The coolant temperature is maintained to within approximately +/-0.1.degree. C. of a desired temperature. The specimen, having known dimensions, is supported within the coolant on two spaced apart support members. A loading head actuated by an air bearing/pneumatic piston mechanism engages the specimen midway between the two support members. The deflection of the specimen is measured with an LVDT and the load imparted to the specimen by a load cell provided under at least one of the specimen support members.
    Type: Grant
    Filed: November 19, 1991
    Date of Patent: February 23, 1993
    Assignee: The Pennsylvania Research Corporation
    Inventors: David A. Anderson, John G. Witzel, Don Christensen, Hussain Bahia
  • Patent number: 5184506
    Abstract: An apparatus for use with a transmission including an input shaft, and an oil pump rotatable in synchronism with the input shaft to detect a speed of rotation of the input shaft. The apparatus comprises a pressure sensor sensitive to an oil pressure discharged from the oil pump for producing an electrical signal indicative of a sensed pressure. The electrical signal is utilized to detect the input shaft rotation speed.
    Type: Grant
    Filed: June 28, 1991
    Date of Patent: February 9, 1993
    Assignee: Jatco Corporation
    Inventor: Michio Asada
  • Patent number: 5179863
    Abstract: An apparatus for setting the gap distance between a mask and a wafer, facing with each other to a predetermined distance, is arranged as follows. A wafer stage is movable along a reference plane defined as a plane parallel to the transferring direction of the wafer and supports the wafer. The wafer stage has a .theta..sub.Y table for tilting the wafer and a first displacement sensor. A mask stage supports the mask and has a .theta..sub.Y table for tilting the mask and two second displacement sensors. The first sensor scans the mask in response to the movement of the wafer stage, whereby an error in the parallelism of the wafer with respect to the reference plane is measured. The mask is kept parallel to the reference plane by tilting the mask so as to eliminate the error in the parallelism. Distances from the second sensors to two points on the wafer are measured by the second sensors.
    Type: Grant
    Filed: March 5, 1991
    Date of Patent: January 19, 1993
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Norio Uchida, Nobutaka Kikuiri
  • Patent number: 5168766
    Abstract: An automat for analyzing blood grouping, which includes a centrifuge for positioning and centrifuging micro-boards opposite supports articulated on the ends of a beam driven in rotation by a stepping motor, and a transfer clamp controlled along the x-axis XX' and y-axis YY' by two stepping motors so as to transport the micro-boards from the centrifuge to different work stations.
    Type: Grant
    Filed: February 26, 1991
    Date of Patent: December 8, 1992
    Assignee: Gespac Instruments
    Inventor: Francois Stoffel
  • Patent number: 5168756
    Abstract: A sensor (10) for measuring angular rate and linear acceleration of a body, in which first and second rotors (30, 31), each carrying a plurality of accelerometers (44, 49), are mounted for counter-rotating dithering motion on opposite sides of a base plate (11). A single permanent magnet (70) is mounted centrally of the base plate, with one pole (71) disposed adjacent the first rotor and the other pole (72) disposed adjacent the second rotor. First and second X-shaped pole pieces (80, 81) are mounted at the respective opposite poles of the magnet, and a plurality of velocity sensing pick-off coils (86) are mounted on the arms (82, 83, 84 and 85) of the pole pieces for cooperation with flux splitting protrusions (34, 35 and 36) on the rotors. The arms of the pole pieces are associated with the flux splitting protrusions so that differential flux splitting is obtained as the rotors are rotated in opposite directions.
    Type: Grant
    Filed: February 8, 1991
    Date of Patent: December 8, 1992
    Assignee: Sundstrand Corporation
    Inventor: Rand H. Hulsing, II
  • Patent number: 5167161
    Abstract: The present invention provides an automatic defect detection and correction system for a tape-mounted electronic components assembly which allows detection and correction of various types of defects in the production of a tape-mounted electronic components assembly without interrupting operation of a taping machine. A storing section allows storage of a length of tape coming out of the taping machine. A defect detecting section detects various types of defects of the tape coming out of the storing section. A defect correcting section enables correction of detected defects, and a take-up section winds the corrected tape on a reel. The tape coming out of the taping machine is continually wound between a fixed shaft and a movable shaft in the storing section and is thus temporarily stored in a specified length. When the tape leaves the storing section for the defect detecting section and the defect correction section, the movable shaft approaches the fixed shaft, forwarding the temporarily stored tape.
    Type: Grant
    Filed: March 12, 1991
    Date of Patent: December 1, 1992
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Yoshio Okamoto, Akinori Kikuchi
  • Patent number: 5168232
    Abstract: Determination of the shimming fields for a polarizing NMR magnet is performed by acquiring two NMR images with evolution times differing by .tau.. A pixel by pixel division of the images yields a third image whose phase is proportional to magnetic field inhomogeneity. Several such inhomogeneity images are acquired within a cylindrical volume and the data of the images is fit according to a set of polynomials approximating the fields of the magnet shim coils. The coefficients of this fitting procedure are used to set the current level in the corresponding shim coils. The interaction between correction fields is accommodated by an empirically derived correction matrix. This procedure may be repeated to provide more accurate shimming.
    Type: Grant
    Filed: June 29, 1990
    Date of Patent: December 1, 1992
    Assignee: General Electric Company
    Inventors: Gary H. Glover, Erika Schneider
  • Patent number: 5168233
    Abstract: An antenna joint for use in magnetic resonance reception wherein two portions of conductor or foil materials are secured to a splice plate. Electronic components are connected to the conductor materials over the splice plate which provides stress relief for the components. The splice plate can be of various geometric configurations and can have openings to accommodate the components.
    Type: Grant
    Filed: September 14, 1990
    Date of Patent: December 1, 1992
    Assignee: General Electric Company
    Inventor: Richard E. Zibolski
  • Patent number: 5168230
    Abstract: A dual frequency NMR coil pair is comprised of two individual coils tuned to separate resonant frequencies. Each coil is formed into approximately the same shape by a conductive loop which follows a serpentine path to define an inner area and a plurality of outer lobes. The two individual coils are positioned in close proximity overlying each other, but rotated with respect to each other such that the outer lobes of the two respective coils are interleaved, i.e. not overlaying each other. As a result, mutual loading between the two individual coils is essentially eliminated, permitting dual frequency operation with minimal degradation of Q or signal-to-noise ratio (SNR) in either coil.
    Type: Grant
    Filed: August 17, 1990
    Date of Patent: December 1, 1992
    Assignee: General Electric
    Inventors: Ralph S. Hashoian, Kenneth W. Belt
  • Patent number: 5161405
    Abstract: A non-volatile memory stores values defining a released position or a depressed position of a clutch pedal. A potentiometer mechanically linked to the clutch pedal produces an output signal whose value or magnitude represents the current position of the clutch pedal. When power is turned on, first and second end limit values which electrically define the depressed and released positions of the clutch pedal are read from the memory, a constant value is added to the first end limit value and subtracted from the second. Thereafter, each time the output signal is sensed for control purposes, the output signal is compared with the end limit values. If the output signal is less than the first end limit value it replaces that value in the memory and if the output signal is greater than the second end limit value it replaces that value. The sensor is thus calibrated in a manner transparent to the operator each time the system samples the sensor output signal for control purposes.
    Type: Grant
    Filed: June 3, 1991
    Date of Patent: November 10, 1992
    Assignee: Ford New Holland, Inc.
    Inventor: James W. Macqueene
  • Patent number: 5159829
    Abstract: A system for measuring gas permeability of membranes under precise temperature and humidity controls, by the use of a gas detector made from a single metallic block, wherein the gas flow passages are virtually entirely confined within the metallic block, and a temperature control passage is provided in the block for stabilizing temperature of the block and the passages therein, at any predetermined temperature. The detector device also includes passages for forming into liquid reservoirs, for providing a controllable relative humidity by passing the test gases through the mubidifier passages.
    Type: Grant
    Filed: January 17, 1992
    Date of Patent: November 3, 1992
    Assignee: Modern Controls, Inc.
    Inventors: Daniel W. Mayer, Robert L. Neiss
  • Patent number: 5156049
    Abstract: A manual parameter input system for automotive test equipment such as a vehicle wheel balancer. Variable pressure input knobs supply rotation direction and "applied pressure" information to the balancer's internal computer. The computer updates the value displayed by digital visual displays at a rate corresponding to the applied pressure to the knob. The visual display output is independent of the actual rotational position of the input knobs, and hence is highly tolerant of mechanical slippage and other mechanical deficiencies in the input system.
    Type: Grant
    Filed: January 6, 1992
    Date of Patent: October 20, 1992
    Assignee: Hunter Engineering Company
    Inventor: Michael W. Douglas
  • Patent number: 5154086
    Abstract: An apparatus and method for measuring the tactility of a zipper of a reclosable thermoplastic zippered bag of the type described in commonly-assigned U.S. Pat. No. 5,070,584, including an opposed pair of mechanical fingers defining a gap therebetween through which the zipper is made to pass, means associated with the opposed pair of mechanical fingers for continuously measuring the resistance of the male and female profiles to being interlocked by such fingers as the zipper passes through the gap defined between such fingers, and means for recording, graphing, displaying and/or analyzing these measurements.
    Type: Grant
    Filed: June 28, 1991
    Date of Patent: October 13, 1992
    Assignee: Dowbrands L.P.
    Inventors: Jose Porchia, Brian C. Dais, Arnold M. Bartz, Francis D. Biel, James C. Cummins, Gary A. Douglass, James R. Hendershot, Ralph L. McCartney, James R. Wigle
  • Patent number: 5152168
    Abstract: A method for the quantitative assessment of the degree of geometrical deformation undergone by a surface profile of a wafer following the formation of a conformal surface layer employs a simple mechanical profilometer, whose stylus is run over a target morphological detail comprising at least two mutually parallel ridges or reliefs which rise above the plane of the surface of the wafer for a height of between 0.1 and 0.5 .mu.m, and which enclose between them a depression of a width of between 2 and 4 .mu.m, in order to determine the elevation of the bottom of the valley between the two ridges relative to the plane of the surface of the wafer from which the ridges rise following the formation of one or more similar surface layers. The vertical measurement of the elevation undergone by the bottom of the valley in itself represents a quantitative index of the vertical and horizontal geometrical deformation undergone by the details of the surface profile of the wafer.
    Type: Grant
    Filed: December 21, 1990
    Date of Patent: October 6, 1992
    Assignee: SGS-Thomson Microelectronics, s.r.l.
    Inventors: Gabriele Barlocchi, Fabrizio Ghironi
  • Patent number: 5150622
    Abstract: A device for sampling gas vapor underground has a probe tip designed to be driven into the ground. The probe tip has a removable sheath that covers a tube having an enlarged conical tip with the tube having multiplicity of apertures in the tube to gather soil gas vapors through the apertures and conduct them through a flexible plastic tube attached to the probe up to the surface of the ground to be monitored. The probe has a flexible disc attached thereto above the apertures to protect the apertures from being filled with earth from above. The apertures also have a screen around them to prevent earth from entering the apertures to plug them. After the probe is in place in the earth, the removable sheath is pulled above ground, leaving the probe to gather gas samples for collection and evaluation at a collection point above ground.
    Type: Grant
    Filed: February 19, 1991
    Date of Patent: September 29, 1992
    Inventor: Arthur R. Vollweiler
  • Patent number: 5140844
    Abstract: A testing fixture for use on a thruster machine for the purposes of testing ball and tube supplemental inflatable sensors for use in air bag applications for motor vehicles. The fixture is fabricated from light weight materials and has clamp 30 fabricated from resilient materials so as to locate and holding the sensors in place. Pneumatic tightening provides a torquing limit on the clamp to ensure that the desired clamping force is maintained regardless of the wear of the clamp 30.
    Type: Grant
    Filed: March 28, 1991
    Date of Patent: August 25, 1992
    Assignee: Siemens Automotive Limited
    Inventor: Victor R. Derbowka