Abstract: The present invention provides a measurement apparatus for measuring a shape of a test surface, comprising an optical system configured to irradiate a measurement point on the test surface and a reference surface with light, and cause test light and reference light reflected to interfere with each other, a detector configured to detect an optical path length difference between the test light and the reference light by using interfering light and a processor configured to determine a position of the measurement point based on a plurality of detection results by the detector, wherein a detection result includes an error which cyclically changes, and the plurality of detection results include n detection results obtained in n states in which optical path lengths of the test light are different from each other by 1/n (n?2) of a cycle of the error.

Abstract: The invention relates to an interferometric distance measuring arrangement for measuring surfaces, using at least one laser which can be tuned for generating measurement radiation modulated by a wave length ramp, an optical beam path with an optical transmitting system for emitting the measurement radiation to the surface and an optical capturing system for capturing the measurement radiation back-scattered by the surface, comprising a measuring arm and a reference arm and a radiation detector and an evaluation unit for determining the distance from a reference point of the distance measuring device to the surface. Channels are defined by at least one beamsplitter n?2 for the parallel emission of measurement radiation, respectively, one different sub area of the wave length ramp is allocated to said channels at a predetermined emission time point.

Abstract: [Solving Means] A signal processing apparatus is a signal processing apparatus for an optical tomographic measurement apparatus that generates measurement light and reference light and measures a tomographic structure of a measurement object on the basis of a signal intensity of interference light between the reference light and return light of the measurement light from the measurement object. An arithmetic unit is configured to calculate a signal intensity of simple reflection among the return light of the measurement light, the simple reflection being one time of reflection at a plurality of layers virtually set in a depth direction from a surface layer side of the measurement object. The arithmetic unit is configured to calculate a signal intensity of multiple reflection on the basis of the signal intensity of the simple reflection, the signal intensity of multiple reflection being a signal intensity of return light generated by being reflected at the plurality of layers three or more times.

Abstract: A system for providing optical actuation and optical sensing can include an optical coherence tomography (OCT) device that performs optical imaging of a sample based on optical interferometry from an optical sampling beam interacting with an optical sample and an optical reference beam; an OCT light source to provide an OCT imaging beam into the OCT device which splits the OCT imaging beam into the optical sampling beam and the optical reference beam; and a light source that produces an optical actuation beam comprising a plurality of wavelengths that is coupled along with the optical sampling beam to be directed to the sample to actuate particles or structures in the sample so that the optical imaging captures information of the sample under the optical actuation.

Abstract: Briefly, embodiments of methods and/or systems for tomographic imaging are disclosed. In an example embodiment, optical measurements may be obtained for at least a portion of an illuminated object at a plurality of focal positions between the illuminated object and an imaging lens and at a plurality of angular orientations. Rotated representations of the optical measurements may be projected onto a coordinate plane in which in-focus and out-of-focus rotated representations of the optical measurements may form a cross-sectional image of the illuminated portion of the object.

Abstract: A spectroscopic sensor 1 comprises an interference filter unit 20, having a cavity layer 21 and first and second mirror layers 22, 23 opposing each other through the cavity layer 21, for selectively transmitting therethrough light in a predetermined wavelength range according to an incident position thereof; a light-transmitting substrate 3, arranged on the first mirror layer 22 side, for transmitting therethrough light incident on the interference filter unit 20, a light-detecting substrate 4, arranged on the second mirror layer 23 side, for detecting the light transmitted through the interference filter unit 20, and a first coupling layer 11 arranged between the interference filter unit 20 and the light-transmitting substrate 3. The cavity layer 21 and the first coupling layer 11 are silicon oxide films.

Abstract: A method for characterizing a light beam includes separating the light beam by a separator optic into first and second sub-beams; propagating the first and second sub-beams over first and second optics, respectively, said first and second optics being respectively arranged so that the sub-beams on leaving the optics are separated by a time delay ?; recombining the sub-beams so that they spatially interfere and form a two-dimensional interference pattern; measuring the frequency spectrum of at least part of the interference pattern; calculating the Fourier transform in the time domain of at least one spatial point of the frequency spectrum, the Fourier transform in the time domain having a time central peak and first and second time side peaks; calculating the Fourier transform in the frequency domain for one of the side peaks; calculating the spectral amplitude AR(?) and the spatial-spectral phase ?R(x,y,?) for the Fourier transform in the frequency domain.

Abstract: A spectrum-inspection device includes: a sensor unit array including a first sensor unit and a second sensor unit; a dual-band pass filter disposed on the sensor unit array to cover the first sensor unit and the second sensor unit, wherein the dual-band pass filter allows a first waveband and a second waveband of a light beam to pass through; and a filter disposed on the dual-band pass filter to cover the second sensor unit, wherein the filter allows wavelengths of a light beam longer than a first wavelength to pass through, wherein the first wavelength is longer than a peak wavelength of the first waveband and shorter than a peak wavelength of the second waveband.

Abstract: The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.

Abstract: The present invention provides the Fabry-Perot (F-P) sensor compromising housing, measuring probe, longitudinal sling block, and displacement converting device. The optic fiber passes through upside sealing ring and extends into upside through hole with the optic fiber end surface disposed at the bottom; the upside of longitudinal sliding block is disposed with reflecting surface, thus a Fabry-Perot cavity is formed between part of the fiber end surface at the bottom of the fiber and the reflecting surface on the upside of longitudinal sliding block. The displacement converting device will convert the lateral slides of the measuring probe into the slides of the longitudinal sliding block, which thus changes the distance from the reflecting surface to the fiber end surface and changes the Fabry-Perot cavity length. Further, the sliding distance of the measuring probe can be calculated after the variation of the Fabry-Perot cavity length measured in according with the Fabry-Perot principle.

Abstract: An optical position-measuring device includes a scale and a scanning reticle, whose relative position is determinable in three linearly independent spatial directions using interfering light beams. A splitter grating is disposed on the scanning reticle and adapted to split light into sub-beams of different diffraction orders. An optical grating is disposed on the scale and adapted to further split the sub-beams and to recombine them after they have been reflected back from the scanning reticle. Grating fields configured as phase gratings are disposed on a side of the scanning reticle that faces the scale. The grating fields act as diffractive optics that influence the further split sub-beams. The grating fields have different step heights. An output grating is disposed on the scanning reticle and adapted to output, as interfering sub-beams, light that has been multiply reflected between the scale and the scanning reticle.

Abstract: Improved line-field imaging systems incorporating planar waveguides are presented. In one embodiment the optics of the system are configured such that a line of light on the light scattering object is imaged to the planar waveguide in at least one dimension. Embodiments where the waveguide incorporates a beamsplitter of an interferometer, where the beam divider and waveguide are referenced to one or more common surfaces, and wherein the source and waveguide are optically coupled, are also considered. In another embodiment, the planar waveguide is in contact or close proximity to the light scattering object.

Abstract: Generally, in accordance with the various illustrative embodiments disclosed herein, a homodyne optical interferometer can include a multi-phase beam combining system that receives a composite beam from an optical beam guidance system and uses a diffraction grating to produce a diffracted plurality of light beam members. Each of the diffracted plurality of light beam members is propagated through a birefringent optical element that imposes a differential phase shift on each member based on polarization and differing optical path lengths. In one example implementation, the birefringent optical element can be a parallel plate optical element arranged at an angle with respect to a light-propagation axis of the multi-phase beam combining system and in a second example implementation, the birefringent optical element can be a multifaceted optical element having a first planar external surface that is sloped with respect to an opposing external planar surface.

Abstract: An instantaneous phase-shift interferometer uses a light source having a coherence length shorter than a difference in optical path length between the light reflected from a reference surface and the light reflected from a measured surface. A beam from the light source is split and, using an adjustable delay optical path, a first beam is delayed to cause a difference in optical path length and is superimposed on the same optical axis as a second beam, after which the reference beam and the measurement beam are generated. The optical path length of the delay optical path is changed during adjustment, a plurality of interference fringe images are individually captured, and at least one of a bias, amplitude, and phase shift amount of the interference fringes obtained in each of the interference fringe images is calculated. A shape of a measured object is measured based on bias calculation results, amplitude calculation results, and phase shift amount calculation results.

Abstract: The invention relates to a method for observing a sample, in particular an anatomopathological slide formed from a thin thickness of a sampled biological tissue. It includes a step of illuminating the sample with a light source and acquiring, with an image sensor, an image representing the light transmitted by the sample. The image undergoes holographic reconstruction, so as to obtain a representation, in the plane of the sample, of the light wave transmitted by the latter. The method includes applying an impregnating fluid to the sample, such that the sample is impregnated with said impregnating liquid, said impregnating liquid having a refractive index strictly higher than 1.

Abstract: An interferometry system including a first telescope for simultaneously receiving a first optical/infrared signal and a first radio signal from a target; a second telescope configured to simultaneously receive a second optical/infrared signal and a second radio signal from the target; a first beam splitter communicatively connected to the first telescope, where the first beam splitter is configured to separate the first optical/infrared signal from the first radio signal; a second beam splitter communicatively connected to the second telescope, where the second beam splitter is configured to separate the second optical/infrared signal from the second radio; and a first optical/infrared interferometer configured to detect an interferometry image of the target using the first and second optical/infrared and radio signals.

Abstract: Described herein is an apparatus for non-destructive testing that includes a cavity. The apparatus also includes an input element coupled with the cavity and configured to receive a laser beam and to direct the laser beam into the cavity. The apparatus additionally includes multiple output elements formed in the cavity and spaced apart along the cavity. Each output element of the multiple output elements is configured to direct a portion of the laser beam out of the cavity such that each portion of the laser beam directed out of a respective one of the multiple output elements has a substantially similar intensity.

Abstract: Disclosed are devices and techniques based on optical coherence tomography (OCT) technology in combination with optical actuation. A system for providing optical actuation and optical sensing can include an optical coherence tomography (OCT) device that performs optical imaging of a sample based on optical interferometry from an optical sampling beam interacting with an optical sample and an optical reference beam; an OCT light source to provide an OCT imaging beam into the OCT device which splits the OCT imaging beam into the optical sampling beam and the optical reference beam; and a light source that produces an optical actuation beam that is coupled along with the optical sampling beam to be directed to the sample to actuate particles or structures in the sample so that the optical imaging captures information of the sample under the optical actuation.

Abstract: An encoder interferometry system includes an encoder scale arranged to receive and diffract a measurement beam. The system further includes one or more optical elements configured and arranged to receive a first diffracted measurement beam and a second diffracted measurement beam from the encoder scale and to redirect the first diffracted measurement beam and the second diffracted measurement beam toward the encoder scale such that the first diffracted measurement beam and the second diffracted measurement beam propagate along non-parallel beam paths having an angular separation ? following a second diffraction at the encoder scale. The system further includes a first detector arranged to receive the first diffracted measurement beam and a second detector arranged to receive the second diffracted measurement beam.

Abstract: Frequency domain optical coherence imaging systems have an optical source, an optical detector and an optical transmission path between the optical source and the optical detector. The optical transmission path between the optical source and the optical detector reduces an effective linewidth of the imaging system. The optical source may be a broadband source and the optical transmission path may include a periodic optical filter.