Patents Examined by Iyabo S. Alli
  • Patent number: 8400644
    Abstract: A device and a method for measuring an elevator hoistway, includes at least one or more laser aligners and a measuring element. The measuring element is provided with an essentially long handle for extending the measuring element into the laser beams transmitted by the laser aligners.
    Type: Grant
    Filed: December 22, 2010
    Date of Patent: March 19, 2013
    Assignee: Kone Corporation
    Inventors: Harri Juvonen, Risto Laine
  • Patent number: 8401271
    Abstract: Systems and methods are provided for evaluating and sorting seeds based on characteristics of the seeds. One system includes an imaging and analysis subsystem that collects image data from the seeds and analyzes the collected image data for characteristics of the seeds. This subsystem can include an imaging theater having mirrors that reflect image data from the seeds to an imaging device for collection. The system can also include an off-loading and sorting subsystem configured to sort the seeds based on their characteristics. And, one method includes illuminating the seeds and collecting image data from the seeds for determining their characteristics. The image data can be collected from at least three portions of the seeds at each of a plurality of sequentially changing spectral wavelengths. In addition (or alternatively), the image data can be collected from top and bottom portions of the seeds using a single imaging device.
    Type: Grant
    Filed: May 25, 2012
    Date of Patent: March 19, 2013
    Assignee: Monsanto Technology LLC
    Inventors: Kevin L. Deppermann, James Crain, Sam R. Eathington, Mike Graham, Steven H. Modiano
  • Patent number: 8390815
    Abstract: Low-cost interface property measuring device and method enabling high-precision and simple measurement of an interface property.
    Type: Grant
    Filed: March 14, 2008
    Date of Patent: March 5, 2013
    Assignee: National University Corporation Shizuoka University
    Inventors: Takayuki Saito, Toshiyuki Sanada, Yusuke Ozawa
  • Patent number: 8390814
    Abstract: This disclosure relates generally to a sampling device, and more particularly, a sampling device that facilitates spectroscopic measurements with a variable path length and the necessary software controlled algorithms and methods for such a device.
    Type: Grant
    Filed: September 9, 2011
    Date of Patent: March 5, 2013
    Assignee: C Technologies
    Inventors: Mark Salerno, I-Tsung Shih, Craig Harrison
  • Patent number: 8390808
    Abstract: A semiconductor wafer may include a dummy field configured to enable overlay measurements. The enhanced dummy field may include a plurality of encoding blocs that enable OVL measurements to be made throughout the enhanced dummy field.
    Type: Grant
    Filed: July 13, 2012
    Date of Patent: March 5, 2013
    Assignee: KLA-Tencor Corporation
    Inventors: Vladimir Levinski, Michael E. Adel, Mark Ghinovker, Alexander Svizher
  • Patent number: 8384911
    Abstract: A measurement device includes a pattern light characteristic setting unit configured to set illumination light having a pattern light characteristic to be projected onto a measurement object, a reflected light measurement unit configured to measure reflected light when the measurement object is irradiated with the illumination light on, an image feature extraction unit configured to extract from the measured reflected light an image feature based on a physical characteristic of the measurement object, a feature distribution calculation unit configured to calculate a distribution characteristic for each local region of the image feature, and a pattern light control unit configured to control the pattern light characteristic of the illumination light, which includes a pattern light characteristic for distance measurement and a pattern light characteristic for image feature extraction, based on the calculated distribution characteristic for each local region.
    Type: Grant
    Filed: October 26, 2011
    Date of Patent: February 26, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventors: Osamu Nomura, Masakazu Matsugu
  • Patent number: 8369597
    Abstract: There are disclosed embodiments for non-rigid image registration between 3-dimensional ultrasound and CT images by using intensity and gradient information of vessels and diaphragm. An ultrasound image forming unit transmits/receives ultrasound signals to/from a target object to thereby output electrical receive signals, and forms 3-dimensional ultrasound images based on the electrical receive signals. A CT image forming unit forms 3-dimensional CT images of the target object. A registration unit determines first and second objective functions associated with diaphragm and vessel regions of the target object, respectively, based on intensity and gradient information upon portions corresponding to the diaphragm and vessel regions in each of the 3-dimensional ultrasound and CT images. The registration unit performs non-rigid image registration between the 3-dimensional ultrasound images and the 3-dimensional CT images based on the first and second objective functions.
    Type: Grant
    Filed: June 2, 2009
    Date of Patent: February 5, 2013
    Assignees: Medison Co., Ltd., Korea Advanced Institute of Science and Technology
    Inventors: Dong Gyu Hyun, Jong Beom Ra, Duhgoon Lee, Woo Hyun Nam
  • Patent number: 8368897
    Abstract: An instrument for measuring and analyzing surface plasmon resonance on a sensor surface has a polarized light source optically connected to the sensor surface by a plurality of optical elements, including in one embodiment an optical telescope that transfers light from a rotatable reflecting surface to the sensor surface. Selective positioning of a cylindrical lens into a first position within the path of light transforms collimated light to a rectangular wedge that is incident upon the sensor surface at numerous angles. In another embodiment, the light source is operated as a laser to excite fluorescence on the sensor surface and the fluorescence is selectively directed to a detector by appropriate optical elements positioned in specific configurations.
    Type: Grant
    Filed: August 21, 2009
    Date of Patent: February 5, 2013
    Assignee: Ciencia, Inc.
    Inventors: Michael T. Reilly, Ernest F. Guignon, George N. Gibson
  • Patent number: 8363228
    Abstract: Provided is a device for determining the surface topology and associated color of a structure, such as a teeth segment, including a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.
    Type: Grant
    Filed: December 21, 2011
    Date of Patent: January 29, 2013
    Assignee: Cadent Ltd.
    Inventor: Noam Babayoff
  • Patent number: 8358416
    Abstract: A processing system having a chamber for in-situ optical interrogation of plasma emission to quantitatively measure normalized optical emission spectra is provided. The processing chamber includes a confinement ring assembly, a flash lamp, and a set of quartz windows. The processing chamber also includes a plurality of collimated optical assemblies, the plurality of collimated optical assemblies are optically coupled to the set of quartz windows. The processing chamber also includes a plurality of fiber optic bundles. The processing chamber also includes a multi-channel spectrometer, the multi-channel spectrometer is configured with at least a signal channel and a reference channel, the signal channel is optically coupled to at least the flash lamp, the set of quartz windows, the set of collimated optical assemblies, the illuminated fiber optic bundle, and the collection fiber optic bundle to measure a first signal.
    Type: Grant
    Filed: March 8, 2012
    Date of Patent: January 22, 2013
    Assignee: Lam Research Corporation
    Inventors: Vijayakumar C. Venugopal, Eric Pape, Jean-Paul Booth
  • Patent number: 8345265
    Abstract: A lithographic apparatus includes an illumination system configured to condition a radiation beam; a support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate, and a sensor configured to measure a height level, curvature and/or angle of a surface of a patterning device supported on the support.
    Type: Grant
    Filed: November 11, 2009
    Date of Patent: January 1, 2013
    Assignee: ASML Netherlands B.V.
    Inventor: Dirk-Jan Bijvoet
  • Patent number: 8339613
    Abstract: A method for making a sample for evaluation of laser irradiation position and evaluating the sample, and an apparatus which is switchable between a first mode of modification of semiconductor and a second mode of making and evaluating the sample. Specifically, a sample is made by irradiating a semiconductor substrate for evaluation with a pulse laser beam while the semiconductor substrate is moved for evaluation at an evaluation speed higher than a modifying treatment speed, each relative positional information between pulse-irradiated regions in the sample is extracted, and stability of the each relative positional information between pulse-irradiated regions is evaluated. The evaluation speed is such a speed that separates the pulse-irradiated regions on the sample from each other in a moving direction.
    Type: Grant
    Filed: March 23, 2012
    Date of Patent: December 25, 2012
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Ryusuke Kawakami, Miyuki Masaki
  • Patent number: 8339598
    Abstract: Apparatus for performing Raman analysis may include a laser source module, a beam delivery and signal collection module, a spectrum analysis module, and a digital signal processing module. The laser source module delivers a laser beam to the beam delivery and signal collection module. The beam delivery and signal collection module delivers the laser source beam to a sample, collects Raman scattered light scattered from the sample, and delivers the collected Raman scattered light to the spectrum analysis module. The spectrum analysis module demultiplexes the Raman scattered light into discrete Raman bands of interest, detects the presence of signal energy in each of the Raman bands, and produces a digital signal that is representative of the signal energy present in each of the Raman bands. The digital signal processing module is adapted to perform a Raman analysis of the sample.
    Type: Grant
    Filed: January 30, 2012
    Date of Patent: December 25, 2012
    Assignee: PD-LD, Inc.
    Inventors: Vladimir Sinisa Ban, Boris Leonidovich Volodin, Neal R. Stoker
  • Patent number: 8334972
    Abstract: A device for detecting soiling, having a light source, which emits a light beam, and a layer having a first boundary surface and a second boundary surface, whereby the light beam emitted by the light source first impinges on the first boundary surface, and part of a light beam fraction, which is scattered at the second boundary surface, impinges on a receiver and forms a measuring signal, and hereby the first boundary surface is set up to scatter part of the incident light beam, and the part impinging on the receiver of the light beam, scattered at the first boundary surface, forms a reference signal, and the device is set up further to determine a measure for the soiling of the second boundary surface from the comparison of the reference signal and measuring signal.
    Type: Grant
    Filed: September 7, 2010
    Date of Patent: December 18, 2012
    Assignee: Pepperl & Fuchs GmbH
    Inventor: Marcus Thien
  • Patent number: 8326009
    Abstract: In a continuous mammography procedure, the breast of a subject is fixed in place in a retention device, and a first x-ray image is generated by irradiating the breast in the retention device. While the breast is still held in the retention device, the first x-ray image is evaluated to define a condition for generating a second x-ray image. The second x-ray image is then generated according to the defined condition, with the breast still in the same position in the retention device.
    Type: Grant
    Filed: October 15, 2007
    Date of Patent: December 4, 2012
    Assignee: Siemens Aktiengesellschaft
    Inventors: Wilhelm Hanke, Thomas Mertelmeier
  • Patent number: 8319968
    Abstract: A method of determining a position of a substrate relative to an imprint template is described, wherein the imprint template has at least three gratings and the substrate has at least three gratings positioned such that each imprint template grating forms a composite grating with an associated substrate grating, the at least three imprint template gratings and associated substrate gratings having offsets relative to one another. The method includes detecting an intensity of radiation which is reflected by the three composite gratings, and using the detected intensities to determine displacement of the substrate or imprint template from a position.
    Type: Grant
    Filed: September 10, 2009
    Date of Patent: November 27, 2012
    Assignee: ASML Netherlands B.V.
    Inventors: Arie Jeffrey Den Boef, Andre Bernardus Jeunink, Johannes Petrus Martinus Bernardus Vermeulen, Pascal Antonius Smits, Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman, Catharinus De Schiffart
  • Patent number: 8319965
    Abstract: Aerosol and hydrosol particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.
    Type: Grant
    Filed: August 6, 2010
    Date of Patent: November 27, 2012
    Assignee: Massachusetts Institute of Technology
    Inventors: Thomas H. Jeys, Antonio Sanchez-Rubio, Ronald H. Hoffeld, Jonathan Z. Lin, Nicholas M. F. Judson, George S. Haldeman, Vincenzo Daneu
  • Patent number: 8310676
    Abstract: An object of the present invention is to detect a small biomolecule in a sample using simple and inexpensive equipment. To achieve this, the small biomolecule in a sample S is detected optically. Specifically, the sample S containing an aptamer capable of interacting with the small biomolecule is irradiated with an excitation light Le and irradiated with a measurement light L2 for measuring the photothermal effect produced in the sample S by the irradiation with the excitation light Le. The photothermal effect induced in the sample S by the excitation light Le is measured from the phase change in the measurement light L2, and the presence or absence of the interaction between the biomolecule and the aptamer is assessed based on the temporal variation in the measurement signal.
    Type: Grant
    Filed: July 3, 2008
    Date of Patent: November 13, 2012
    Assignee: Kobe Steel, Ltd.
    Inventors: Kazunori Ikebukuro, Ryo Katayama, Eiji Takahashi
  • Patent number: 8300224
    Abstract: A photoacoustic apparatus obtains information on a specimen by receiving photoacoustic waves which are generated from the specimen resulting from light irradiated to the specimen. The apparatus includes a light source for irradiating light to the specimen, an acoustic wave receiver for receiving the photoacoustic waves, and a light reflection member for causing the light, which is radiated out of the specimen by optical diffusion thereof after having entered an interior of the specimen from the light source, to reenter the interior of the specimen, wherein the light reflection member allows elastic waves to pass therethrough. As a result, a photoacoustic apparatus and a probe are provided which can confine scattered light from the specimen into the specimen, and which can reliably prevent photoacoustic waves from being generated from a receiving element region of the probe by the scattered light.
    Type: Grant
    Filed: February 7, 2012
    Date of Patent: October 30, 2012
    Assignee: Canon Kabushiki Kaisha
    Inventors: Takao Nakajima, Kazuhiko Fukutani, Yasufumi Asao, Ryuichi Nanaumi
  • Patent number: 8279454
    Abstract: A method of measuring a length of sections of extrados or intrados curves of an elongated workpiece travelling in a bending machine along a forwarding direction, the elongated workpiece having cross-sections each of which is separated by a neutral axis in both an extended portion and a compressed portion when the elongated workpiece is subjected to bending, and at least a neutral cross-section, i.e. not subjected to bending, neutral cross-section beyond which the bending of the elongated workpiece begins along the forwarding direction thereof, provides a measuring instrument positioned so that it engages either an extrados or an intrados point of the elongated workpiece near the neutral cross-section, but displaced therefrom in the forwarding direction of the elongated workpiece. Further, a measuring instrument on a bending machine that embodies the method is described.
    Type: Grant
    Filed: August 5, 2010
    Date of Patent: October 2, 2012
    Assignee: CML International S.p.A.
    Inventors: Alessandro Caporusso, Silvio Rea