Patents Examined by Jamil Ahmed
  • Patent number: 11366057
    Abstract: In one illustrative configuration, an air quality monitoring system may enable wide-scale deployment of multiple air quality monitors with high-confidence and actionable data is provided. Further, the air quality monitoring system may enable identifying a target emission from a plurality of potential sources at a site based on simulating plume models. The simulation of plume models may take into consideration various simulation parameters including wind speed and direction. Further, methods of determining a plume flux of a plume of emissions at a site, and methods of transmitting data from an air quality monitor are disclosed.
    Type: Grant
    Filed: December 3, 2021
    Date of Patent: June 21, 2022
    Assignee: PROJECT CANARY, PBC
    Inventors: Anna Ailene Scott, Nasr E. Alkadi, Yan Azdoud, Nate Eichenlaub, William J. Foiles, Christopher Daniel Kelley, Shyla Kupis
  • Patent number: 11359916
    Abstract: A metrology system may include an illumination sub-system to illuminate a metrology target on a sample with illumination having a symmetric off-axis illumination profile, where the symmetric off-axis illumination profile is symmetric along one or more measurement directions, and where the illumination sub-system provides illumination from opposing angles in the symmetric off-axis illumination profile at least one of simultaneously or sequentially. The metrology target may include a first periodic structure on a first layer of the sample and a second periodic structure on a second layer of the sample. The metrology system may further include an imaging sub-system to generate images of the metrology target formed using two non-zero diffraction orders from each point of the symmetric off-axis illumination profile. The metrology subsystem may further determine an overlay error indicative of alignment between the first layer and the second layer based on the one or more images.
    Type: Grant
    Filed: August 18, 2020
    Date of Patent: June 14, 2022
    Assignee: KLA Corporation
    Inventors: Andrew V. Hill, Amnon Manassen
  • Patent number: 11353362
    Abstract: An apparatus includes a substrate transmissive of electromagnetic energy of at least a plurality of wavelengths, having a first end, a second end, a first major face, a second major face, at least one edge, a length, a width, and a thickness, at least a first output optic that outputs electromagnetic energy the substrate; and a first input optic oriented and positioned to provide electromagnetic energy into the substrate via at least one of the first or the second major face of the substrate. The first output optic is laterally spaced from the first input optic. A number of reflectors and optional absorbers may be positioned proximate the first major face and/or the second major face to structure electromagnetic energy and/or to translate such from the first input optic to the first output optic. The apparatus may be part of a spectrometer or other optical system.
    Type: Grant
    Filed: November 16, 2020
    Date of Patent: June 7, 2022
    Assignee: CHROMATION INC.
    Inventors: James Scholtz, Nadia Pervez, Ioannis Kymissis, Michael Gazes
  • Patent number: 11351734
    Abstract: A manufacturing device manufactures a stereoscopic object on the basis of manufacture information. The manufacturing device includes an output configured to display a given pattern on a stereoscopic object during manufacturing, an imager configured to generate an image of the stereoscopic object on which the given pattern is displayed; and a corrector configured to correct the manufacture information in accordance with shape information of the stereoscopic object based on the generated image.
    Type: Grant
    Filed: February 26, 2020
    Date of Patent: June 7, 2022
    Assignee: Ricoh Company, Ltd.
    Inventor: Takahisa Yoshigae
  • Patent number: 11346789
    Abstract: An optical inspection system includes a brightness inspection module for inspecting the brightness of a light emitting element, an integrated inspection module for inspecting the near field optical characteristic and the beam quality factor of the light emitting element, and a far field inspection module for inspecting the far field optical characteristic of the light emitting element. As a result, the optical inspection system is space-saving and capable of reducing the distance and time of the movement of the device under test.
    Type: Grant
    Filed: December 10, 2020
    Date of Patent: May 31, 2022
    Assignee: MPI CORPORATION
    Inventors: Ping-Ying Wu, Chiu-Wang Chen, Yung-Chin Liu
  • Patent number: 11346710
    Abstract: Certain aspects pertain to a combination sensor comprising a set of physical sensors facing different directions proximate a structure, and configured to measure solar radiation in different directions. The combination sensor also comprises a virtual facade-aligned sensor configured to determine a combi-sensor value at a facade of the structure based on solar radiation readings from the set of physical sensors.
    Type: Grant
    Filed: October 30, 2020
    Date of Patent: May 31, 2022
    Assignee: VIEW, INC.
    Inventors: Erich R. Klawuhn, Douglas S. Silkwood, Jason Zedlitz, Stephen C. Brown, Dhairya Shrivastava
  • Patent number: 11346720
    Abstract: In a spectrometry device, a control unit controls a light source so that input of excitation light to an internal space is maintained in a first period, and that the input of the excitation light to the internal space is stopped in a second period, and the analysis unit calculates the photoluminescence quantum yield of a long afterglow emission material on the basis of the number of absorbed photons of the long afterglow emission material obtained on the basis of excitation light spectral data in the first period and the number of light emission photons of the long afterglow emission material obtained on the basis of light emission spectral data in any of the first period, the second period, and a total period of the first period and the second period.
    Type: Grant
    Filed: October 10, 2018
    Date of Patent: May 31, 2022
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Kengo Suzuki, Shigeru Eura, Kazuya Iguchi
  • Patent number: 11333555
    Abstract: A method of quantifying at least one property of interest of an oil sands ore sample is provided using a laser-induced breakdown spectroscopy (LIBS) method. The property of interest may include bitumen content, water content, particle size information, cation exchange capacity, methylene blue index, mineralogical content (e.g., quartz, total clay, and clay components), amorphous material content, total ash content, and connate water parameter (e.g., conductivity, chloride content, or alkalinity).
    Type: Grant
    Filed: July 2, 2020
    Date of Patent: May 17, 2022
    Assignee: SYNCRUDE CANADA LTD.
    Inventors: Aïssa Harhira, Richard Paproski, Josette El Haddad, Mohamad Sabsabi, Alain Blouin
  • Patent number: 11333489
    Abstract: An imaging device includes a pixel. The pixel includes: a first electrode; a second electrode facing the first electrode; a photoelectric conversion layer between the first electrode and the second electrode, the photoelectric conversion layer converting light into signal charge; and a charge accumulation region coupled to the second electrode, the charge accumulation region accumulating the signal charge. The pixel captures first data in a first exposure period and captures second data in a second exposure period different from the first exposure period, the first exposure period and the second exposure period being included in a frame period. A length of the first exposure period is different from a length of the second exposure period. The imaging device generates multiple-exposure image data including at least the first data and the second data.
    Type: Grant
    Filed: October 28, 2019
    Date of Patent: May 17, 2022
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Kazuko Nishimura, Yasuo Miyake, Yoshiaki Satou, Osamu Shibata, Hiroshi Iwai
  • Patent number: 11307150
    Abstract: There is provided a system and method of automatic optimization of an examination recipe. The method includes obtaining one or more inspection images each representative of at least a portion of the semiconductor specimen, the one or more inspection images being indicative of respective defect candidates selected from a defect map using a first classifier included in the examination recipe; obtaining label data respectively associated with the one or more inspection images and informative of types of the respective defect candidates; extracting inspection features characterizing the one or more inspection images; retraining the first classifier using the first features and the label data, giving rise to a second classifier; and optimizing the examination recipe by replacing the first classifier with the second classifier; wherein the optimized examination recipe is usable for examining a subsequent semiconductor specimen.
    Type: Grant
    Filed: August 17, 2020
    Date of Patent: April 19, 2022
    Assignee: Applied Materials Israel Ltd.
    Inventor: Amir Bar
  • Patent number: 11306583
    Abstract: Systems and methods for transmitting power and information using acoustic energy produced by transducers are provided. The systems have particular application for powering and communication with electronics through drilling and pipe systems. Pairs of acoustic wedges holding transducers are provided for sending energy and information through a substrate which may be a steel pipe. Each wedge has an angled transducer which can be used to produce shear waves. The waves propagate through the substrate and are received by a second acoustic wedge. The shear waves, on reaching the second acoustic wedge, are converted back into electrical signals by a second transducer. Tangential shear waves, high, shallow wave transmission angles, and direct steel-steel bonding between wedges and substrates may be used.
    Type: Grant
    Filed: July 15, 2020
    Date of Patent: April 19, 2022
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Henry A. Scarton, Gary J. Saulnier, Kyle R. Wilt, R. Benjamin Litman
  • Patent number: 11293834
    Abstract: The present invention relates to a measuring device (3000) for measuring reflection in an optical fiber (1400), the device comprising: emitting means (3100) connected to the optical fiber (1400) and configured to emit light into the optical fiber (1400), measuring means (3300) connected to the optical fiber (1400) and configured to receive a reflected light from the optical fiber (1400), wherein the measuring means comprises a first photon detector (3310) and a second photon detector (3311), wherein the operation of the second photon detector (3311) and/or the reflected light reaching the second photon detector (3311) is controlled based on an output of the first photon detector (3310).
    Type: Grant
    Filed: December 21, 2017
    Date of Patent: April 5, 2022
    Assignee: ID QUANTIQUE SA
    Inventors: Felix Bussieres, Bruno Sanguinetti
  • Patent number: 11293864
    Abstract: The present invention relates to a device, use of the device and a method for high contrast imaging, particularly suitable for imaging of moving object of interest such as gas expanding from a gas jet or physical or chemical or biological processes in material. The device for high-contrast imaging comprises a beam splitter for splitting a beam into a probe beam and a reference-beam, wherein the probe beam is directed to an object; a self-imaging system for receiving the probe beam from the object and imaging the object on itself while in a preferred embodiment, the system preserves a reflected probe beam divergence. The beam interacts with the object at least twice; and the reflected probe beam is further directed to the splitter after the last interaction; and detection means receiving the probe beam from the splitter.
    Type: Grant
    Filed: November 10, 2020
    Date of Patent: April 5, 2022
    Assignee: FYZIKALNI USTAV AV CR, V.V.I.
    Inventors: Jaroslav Nejdl, Martin Albrecht, Jakub Van{hacek over (c)}ura
  • Patent number: 11293804
    Abstract: A system of optical sensors determines whether an object is placed on the system by passing light through the sensor layer, detecting light reflected from the object above the sensor layer, and identifying the object based on whether a color detected in the light corresponds to a color of the side of the object that is positioned on the system over the sensor layer. When the system includes multiple optical sensor units, the system may determine where the object has been placed by determining which of the sensor units detect light reflected from the side of the object.
    Type: Grant
    Filed: December 24, 2019
    Date of Patent: April 5, 2022
    Assignee: Palo Alto Research Center Incorporated
    Inventor: Robert Anthony Street
  • Patent number: 11293750
    Abstract: A film thickness measuring apparatus including: a measurement light path for irradiating a measurement target object with light from a light source; a correction light path for irradiating a reference member with light from the light source; and a light switching unit that selectively guides reflected light from the measurement target object or reflected light from the reference member, to a spectroscope.
    Type: Grant
    Filed: September 28, 2020
    Date of Patent: April 5, 2022
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Shiro Kawaguchi, Kazuya Nakajima
  • Patent number: 11287370
    Abstract: Provided are a method and a device that do not require any pretreatment and measure and analyze impurities or hydrogen fluoride in corrosive gas with high sensitivity. The method and the device measure a fluorine-based gas in a sample containing a corrosive gas with a Fourier transform infrared spectrophotometer, wherein the Fourier transform infrared spectrophotometer includes a detector having an InGaAs detection element and a single-path gas cell having an optical path length of 0.01 m to 2 m, a cell window is made of a corrosion-resistant material, a measurement region ranges from 3800 to 14300 cm?1 in wavenumber, and the concentration of the fluorine-based gas is quantified based on an amount of absorption of light having a predetermined wavenumber by the sample and a calibration curve.
    Type: Grant
    Filed: March 5, 2019
    Date of Patent: March 29, 2022
    Assignee: Kanto Denka Kogyo Co., Ltd.
    Inventor: Shinichi Kawaguchi
  • Patent number: 11290653
    Abstract: This application discloses a method for controlling an optical sensing circuit, an optical sensing circuit, and an imaging device. The optical sensing circuit includes an optical sensor and a voltage dividing circuit connected in series, an input voltage (a voltage of the voltage dividing circuit) and an output voltage are obtained, a resistance value of the optical sensor is calculated according to the input voltage, a light intensity value is obtained according to the resistance value of the optical sensor, and then, different loads are controlled based on a level of the output voltage for light intensity in different ranges to perform corresponding operations. This application has high flexibility and strong adaptability, and can effectively broaden an application scope of a photosensitive device.
    Type: Grant
    Filed: September 9, 2021
    Date of Patent: March 29, 2022
    Assignee: Shenzhen Reolink Technology Co., Ltd.
    Inventors: Lei Tang, Yulong Que
  • Patent number: 11280775
    Abstract: A cavity ring down measurement system comprising a light source in optical communication with a detector through an optical cavity wherein the detector is in electronic communication through a gating circuit with a first integrating circuit and a second integrating circuit, controlled to obtain a ring up signal simultaneous with a ring down signal of a plurality of ON-OFF cycles over a single period of time. A process to utilize the system is also disclosed.
    Type: Grant
    Filed: December 8, 2020
    Date of Patent: March 22, 2022
    Assignee: ALTI, LLC
    Inventors: James McChesney Hargrove, John Hargrove
  • Patent number: 11280744
    Abstract: Accuracy of detecting abnormalities on the surface of a workpiece is improved. An appearance inspection apparatus for inspecting the appearance of a workpiece is provided. The appearance inspection apparatus for inspecting the appearance of the workpiece includes a first lighting unit that irradiates the workpiece with light, a first imaging unit that images the workpiece irradiated by the first lighting unit, a first detection unit that detects a first defect from an image captured by the first imaging unit, a second lighting unit that irradiates the workpiece with light, a second imaging unit that images the workpiece irradiated by the second lighting unit, and a second detection unit that detects a second defect from an image captured by the second imaging unit. The first lighting unit uses coaxial epi-illumination, and the second lighting unit uses coaxial epi-illumination and dome illumination.
    Type: Grant
    Filed: July 10, 2018
    Date of Patent: March 22, 2022
    Assignee: NIDEC CORPORATION
    Inventor: Eiji Yamada
  • Patent number: 11274967
    Abstract: A multi-analyte sensor system based on hollow core photonic bandgap fiber and Raman anti-Stokes spectroscopy. The system includes: i) an inlet to introduce an analyte sample into an analyzer chamber which analyzer includes; ii) a measurement system to derive the anti-Stokes spectral peaks and/or spectra of the sample; iii) a set of reference calibrants corresponding to the analytes of which the sample is primarily comprised; iv) a second inlet to introduce said calibrants into the analyzer chamber; v) a second measurement system to derive the anti-Stokes spectral peaks and/or spectra of the calibrants vi) an outlet through which the sample and calibrants are expelled from the analyzer chamber.
    Type: Grant
    Filed: September 4, 2020
    Date of Patent: March 15, 2022
    Assignee: Finesse Solutions, Inc.
    Inventors: Mark Selker, Barbara Paldus