Patents Examined by Jason D. Vierra Eisenberg
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Patent number: 5822052Abstract: A method and an apparatus for compensating illuminance error of a light source is adapted to be used in a transmission type scanner and utilizes the light signal directly transmitted from the light source to an image pickup device of the scanner without passing through any scanned object as an illuminance calibration reference to compensating illuminance error of the light source. The calibration light signal can be transmitted from the light source to the image pickup device through a light transmission region arranged beside a scanning region.Type: GrantFiled: December 23, 1996Date of Patent: October 13, 1998Assignee: Nustek Systems, Inc.Inventor: Jenn-Tsair Tsai
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Patent number: 5822055Abstract: A method and inspection system to inspect a first pattern on a specimen for defects against a second pattern that is intended to be the same where the second pattern has known responses to at least one probe. The inspection is performed by applying at least one probe to a point of the first pattern on the specimen to generate at least two responses from the specimen. Then the first and second responses are detected from the first pattern, and each of those responses is then compared with the corresponding response from the same point of the second pattern to develop first and second response difference signals. Those first and second response difference signals are then processed together to unilaterally determine a first pattern defect list.Type: GrantFiled: June 27, 1997Date of Patent: October 13, 1998Assignee: KLA Instruments CorporationInventors: Bin-Ming Benjamin Tsai, Russell M. Pon
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Patent number: 5822062Abstract: A particle analyzer which can maintain optical characteristics of an optical system which is one component thereof at a fixed level for a long period of time is provided. In the particle analyzer comprising a flow cell for forming a sheathed sample flow containing particulate components; an irradiating optical system for irradiating a sheathed sample flow formed in the flow cell; and a light receiving optical system for receiving light emitted from the sheathed sample flow in the flow cell irradiated by the irradiating optical system, the light receiving optical system comprises a rod lens to which the light emitted from the sheathed sample flow in the flow cell enters and an entrance surface of the rod lens is curved.Type: GrantFiled: September 13, 1996Date of Patent: October 13, 1998Assignee: Toa Medical Electronics Co., Ltd.Inventor: Hideo Kusuzawa
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Patent number: 5818587Abstract: An image measuring apparatus for measuring an image of a tooth or gum applies the radiation of a laser beam to permit extremely quick, reliable, safe detection of dental caries and other dental pathological conditions. The low incident power of the laser radiation would not cause damage or pain to the tissue, such as the tooth or gum. The image measuring apparatus is equipped with a light source which emits light having at least a wavelength in a range of 500 nm or more to less than 600 nm; it uses the light emitted from the light source to obtain 2-dimensional images or computed tomographic images of a tooth or gum from the light, which has been transmitted through the tooth or gum, by using an optical heterodyne detection method.Type: GrantFiled: May 10, 1996Date of Patent: October 6, 1998Assignee: Biophotonics Information Laboratories Ltd.Inventors: Balasigamani Devaraj, Masaki Kobayashi, Motohiro Takeda, Masashi Usa, Hiroshi Ishihata, Hiroshi Horiuchi, Humio Inaba
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Patent number: 5815265Abstract: For simplifying the optical measurement of a particle flow in a fluid and in particular for eliminating errors, in a device for measuring a particle flow in a fluid with at least one illumination system having a diaphragm and at least one receiver system having a diaphragm, the invention provides for a diaphragm (6a, 11a) to have an aperture (6, 11) with an edge (6b, 11b) constructed convexly towards the interior of the diaphragm aperture (6, 11). According to a method, the particle flow is illuminated and/or observed through a diaphragm aperture with an edge constructed convexly towards its interior and the maximum intensity of the particle flying through a first optical measuring range is measured and account is only taken of the particle if the intensity on flowing through a second measuring range exceeds a specific minimum percentage of the maximum intensity measured for this particle.Type: GrantFiled: July 10, 1997Date of Patent: September 29, 1998Assignee: Palas GmbH Partikel-und LasermeBtechnikInventors: Leander Molter, Friedrich Munzinger
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Patent number: 5815238Abstract: An apparatus and method for removing a molded ophthalmic lens from between the mold portions in which it is produced. A source of intense electromagnetic radiation is applied to at least one of the mold portions in a predetermined scanning pattern through the intermediary of galvanometer-driven mirrors. Differential expansion of the heated mold polymer relative to the cooler polymer shifts one surface with respect to the other, and the shear force breaks the polymerized lens/polymer mold adhesion and assists in the separation of mold portions. The greater the temperature gradient between the surfaces of the mold portions, the greater the shearing force and the easier the mold portions separate. The heated back mold portion is promptly removed so that very little energy is transferred to the polymer lens, avoiding the possibility of thermal decomposition of the lens.Type: GrantFiled: September 10, 1996Date of Patent: September 29, 1998Assignee: Johnson & Johnson Vision Products, Inc.Inventors: Stephen R. Beaton, Denwood F. Ross, Craig W. Walker
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Patent number: 5815274Abstract: The invention is a method and apparatus for measuring the dimensions of a parcel for use in a parcel processing application. The invention includes the placing of a parcel on a weighing scale. A movably mounted emitter apparatus projects lines of a known distance apart onto the parcel so that the number of lines may be counted by a scanner to determine a first linear dimension of the placed parcel. After the first count is performed, the emitter apparatus is rotated in place 90.sub.-- so as to project a second set of lines on the first surface of the placed parcel. The second set of lines is then counted so as to determine a second linear dimension of the placed parcel. After the second count is performed, the emitter apparatus is moved so as to project a third set of lines on a second surface of the parcel, wherein the second surface is perpendicular to the first surface. The third set of lines is counted to determine the third linear dimension of the placed parcel.Type: GrantFiled: December 31, 1996Date of Patent: September 29, 1998Assignee: Pitney Bowes Inc.Inventor: Daniel F. Dlugos
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Patent number: 5815252Abstract: A system for verifying that a card possessor is the authorized card owner compares scanned fingerprint data with fingerprint data encoded on an optical card. More than one of the person's fingerprints are encoded on the card, and the process of identification of the card possessor involves the random selection of separate fingerprints for scanning and comparison against the encoded fingerprints. A card reader/writer reads fingerprint characteristic information from an optical card inserted therein and a processing unit, connected to a fingerprint scanner and card reader/writer extracts from the scanned fingerprint certain well known indicators, and matches the recorded fingerprint characteristic data with the scanned fingerprint characteristics to establish identity therebetween.Type: GrantFiled: November 21, 1995Date of Patent: September 29, 1998Assignee: Canon Kabushiki KaishaInventor: Stephen Price-Francis
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Patent number: 5812236Abstract: A pair of multifocal contact lenses customized for a patient. A first corneal contact lens and a second corneal contact lens each have an anterior side with a power curve defined in part by (i) a central surface, (ii) an inner annular surface contiguous with the central surface, (iii) a second annular surface contiguous along a radially inner periphery with the inner annular surface, and, optionally, (iv) an outer annular surface contiguous along a radially inner periphery with the second annular surface. Each of the annular surfaces is concentric or coaxial with the central surface. The central surface corresponds to a distance vision correction zone, the second annular surface to a near vision correction zone, and the outer annular surface to a distant vision correction zone.Type: GrantFiled: November 15, 1996Date of Patent: September 22, 1998Assignee: Permeable Technologies, Inc.Inventors: Leonard Seidner, Maurice Poster
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Patent number: 5812264Abstract: A method of measuring surface reflectance of a polarizing film product and for producing an antireflective polarizing film. The method includes placing a linear polarizer between a polarizing film product and a light supplying part, and measuring light reflected by the surface of the film.Type: GrantFiled: October 31, 1995Date of Patent: September 22, 1998Assignee: Sumitomo Chemical Company, LimitedInventors: Kimishige Nakamura, Hiroshi Ishida, Akio Ohsaki
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Patent number: 5812235Abstract: A pair of multifocal contact lenses for a patient comprises a first corneal contact lens having a concave posterior surface and a convex anterior surface. The anterior surface is formed with a power curve including a circular intermediate vision correction zone and an annular distance vision correction zone contiguous with the intermediate vision correction zone. The distance vision correction zone is concentric or coaxial with the intermediate vision correction zone. A second corneal contact lens of the pair also a concave posterior surface and a convex anterior surface. The anterior surface of the second lens is formed with a power curve including a circular intermediate vision correction zone and an annular near vision correction zone contiguous with the respective intermediate vision correction zone. The near vision correction zone is concentric or coaxial with the intermediate vision correction zone of the second lens.Type: GrantFiled: September 4, 1996Date of Patent: September 22, 1998Assignee: Pemrable Technologies Inc.Inventors: Leonard Seidner, Maurice Poster
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Patent number: 5808744Abstract: An apparatus for inspecting repetitive patterns includes a signal generation device for outputting a signal every time each of repetitive patterns reaches a predetermined observation area, and a flash generation device for generating a flash in synchronism with the signal to instantaneously illuminate each of the patterns sequentially reaching the observation area. The signal generation device may be a device for generating a signal upon detecting the predetermined shape of each pattern. The repetitive patterns may be those on a tape carrier which moves, e.g., in the longitudinal direction thereof. It is preferable to provide an image pickup device for picking up the image of each repetitive pattern on the observation area and a display device for displaying the picked-up image. The display device preferably keeps display of the picked-up image of each of the patterns illuminated by the flash for a predetermined period of time within between this illumination and the next illumination by the next flash.Type: GrantFiled: February 6, 1997Date of Patent: September 15, 1998Assignee: Mitsui Mining & Smelting Co., Ltd.Inventor: Kazuo Moriya
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Patent number: 5805263Abstract: The present invention concerns an optically non correcting lens blank for the manufacture of an optically non correcting lens, having a high curvature, corresponding to an average radius of curvature at most equal to about 90 mm, said lens blank comprising a transparent blade, and having on the one hand, a geometrical axis, passing through said blade and defining a geometrical center, and on the other hand, an optical axis defining an optical center, the blade, when seen in elevation, further having a generally non circular contour, the optical axis and geometrical axis, and thus the optical and geometrical centers, being physically separated by a predetermined distance from each other and angularly displaced, the blade further comprising stacking correction means, which are integrated with or affixed to the contour of the blank.Type: GrantFiled: October 15, 1996Date of Patent: September 8, 1998Assignee: Christian Dalloz S.A.Inventors: Bernard Reymondet, Etienne Billard
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Patent number: 5796480Abstract: Particle size distribution measuring equipment includes a flow cell that can be illuminated with light so that suspended particles can scatter the light and thereby measure both particle size and frequency. A dispenser unit is connected to the flow cell for delivering a sample. A fractionator unit can pretreat the sample to provide particles over a predetermined size in a sealed chamber resulting from the impact of compressed air. The fractionated sample can be delivered to the dispenser, and a controller can automatically coordinate the preparation of the dispenser unit, the flow cell, the measuring of scattered light, and the release of the fractionated sample from the sealed chamber.Type: GrantFiled: November 22, 1996Date of Patent: August 18, 1998Assignee: Horiba, Ltd.Inventor: Tatsuo Igushi
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Patent number: 5796472Abstract: An optical detector for determining the degree of translucency of a medium includes an elongate collector that gathers radiant energy along its length and transmits the gathered energy to its ends. A sensor is positioned in proximity to at least one of the collector ends to detect the amount of radiant energy received by the collector. The amount of radiant energy received by the collector and transmitted to the sensor is proportional to the degree of average translucency of the medium. In one embodiment, the medium is a filter and the degree of detected translucency is directly proportional to the degree of filter contamination. In another embodiment, the medium is a liquid and the degree of detected translucency is directly proportional to liquid level. The collector is preferably formed from one or more fluorescent-doped fiber optics.Type: GrantFiled: February 18, 1997Date of Patent: August 18, 1998Inventor: Alvin R. Wirthlin
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Patent number: 5796482Abstract: The optical measuring apparatus of this invention for measuring a physical amount of a specific component contained in a substance to be measured by the use of measurement light which passes through the substance to be measured and the use of predetermined reference light includes: a first interfering polarizing plate for obtaining a first light interference signal by interfering the measurement light; a second interfering polarizing plate for obtaining a second light interference signal by interfering the reference light; a first photoelectric converting section for converting the first light interference signal into a first electric signal; a second photoelectric converting section for converting the second light interference signal into a second electric signal; a first phase expanding section for expanding a phase of the first electric signal; a second phase expanding section for expanding a phase of the second electric signal; a phase difference measuring section for measuring a phase difference betweenType: GrantFiled: October 30, 1996Date of Patent: August 18, 1998Assignee: Kyoto Daiichi Kagaku Co., Ltd.Inventors: Kexin Xu, Michio Naka, Norihito Suzuki
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Patent number: 5796486Abstract: The presence and absence of a semiconductor wafer on a wafer holder in a vacuum chamber having an optically transparent window is detected by an optical system including a source of optical energy positioned outside the chamber and a receiver for the optical energy positioned outside the chamber. A light path extends from the source through the window and an opening in the wafer holder when no wafer is on the wafer holder. The optical path is bent downstream of the wafer holder, thence continues back through another opening in the wafer holder, and through the window to the receiver. The optical receiver is positioned and arranged so optical energy reflected from a wafer (even a wafer having dispersive mirror properties) in situ on the wafer holder cannot be reflected or otherwise incident on the optical receiver.Type: GrantFiled: March 31, 1997Date of Patent: August 18, 1998Assignee: LAM Research CorporationInventor: David E. Jacob
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Patent number: 5793465Abstract: An optical preform has a predetermined spherical curve on a concave surface of the optical preform, a predetermined spherical curve on a convex surface of the optical preform and a near add power. A thin resin is applied to the concave surface of the optical preform and molded to form a toric layer by a mold having a toric, convex mold surface. The resin layer is then cured and the mold removed to form a finished ophthalmic lens.Type: GrantFiled: October 8, 1996Date of Patent: August 11, 1998Assignee: Innotech, Inc.Inventors: Amitava Gupta, Ronald D. Blum
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Patent number: 5793467Abstract: A plastic reading lens using a microstructure to provide reading correction can be semi-permanently attached to a non-prescription sunglass using a water-soluble adhesive. The lens may be removed from the sunglass using an adhesive remover which is non-damaging to plastic or glass. The microstructure lens may also be applied to the sunglasses using a non-adhesive molecular attraction mechanism.Type: GrantFiled: September 26, 1996Date of Patent: August 11, 1998Assignee: Dean BaileyInventor: Dean Bailey
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Patent number: 5790246Abstract: An apparatus and method for determining a parameter of a particle in a fluid is disclosed and, in particular, an apparatus and method for determining contamination or machine wear by the measurement of contamination or wear particles in a fluid used in the machine is disclosed. In a first embodiment, a measurement cell is provided with a fluid flow path. A first hall probe is arranged adjacent to the flow path for detecting dia-magnetic, para-magnetic, ferro-magnetic particles and a second optical sensor formed of a light emitting diode and phototransistor are provided for optically detecting the particles. A correlation between the hall probes and the optical detector enables an indication of the particles to be obtained so that a parameter of those particles can be determined to provide an indication of contamination or machine wear.Type: GrantFiled: April 18, 1996Date of Patent: August 4, 1998Assignee: Montores Pty. Ltd.Inventors: Bruce Thomas Kuhnell, Jacek Stanislaw Stecki, Zbigniew Przelozny, Xi Huang, Christopher Eugene Doran