Patents Examined by Ken Herton
  • Patent number: 5426071
    Abstract: A polyimide copolymer derived from 2,2-bis(3,4-dicarboxyphenyl)hexafluoropropane dianhydride, oxydiphthalic dianhydride, m-phenylene diamine and 4,4'-oxydianiline, for use as a high-temperature resistant lift-off layer in the fabrication of integrated circuit substrates.
    Type: Grant
    Filed: March 4, 1994
    Date of Patent: June 20, 1995
    Assignee: E. I. Du Pont de Nemours and Company
    Inventor: John D. Summers
  • Patent number: 5344634
    Abstract: A process for nitriding materials containing silicon to form a silicon nitride material predominantly in the alpha phase is disclosed which includes nitriding the silicon-containing material by (a) heating the silicon-containing material in an atmosphere containing at least hydrogen in the temperature range of about 0.degree. C. to about 1420.degree. C. and (b) thereafter, nitriding the silicon-containing material by heating the material in a nitriding atmosphere containing at least nitrogen gas in the temperature range of from about 1000.degree. C. to about 1450.degree. C.
    Type: Grant
    Filed: November 3, 1992
    Date of Patent: September 6, 1994
    Assignee: Eaton Corporation
    Inventor: James P. Edler
  • Patent number: 5304364
    Abstract: A method for preparing inorganic oxide-based materials of spherical form with substantially monomodal distribution, consisting of forming a sol of at least one of the inorganic oxides of interest, adding to said sol a solvent immiscible with the sol, finely dispersing the obtained two-phase mixture into a dispersion of particles of equal diameter, growing said particles by limited coalescence to the desired diameter, gelling said mixture by adding a second solvent containing a gelling agent, and removing the solvent.
    Type: Grant
    Filed: October 14, 1992
    Date of Patent: April 19, 1994
    Assignee: Istituto Guido Donegani S.p.A.
    Inventors: Lorenzo Costa, Giulio Boara, Guido Cogliati
  • Patent number: 5292670
    Abstract: A method of sidewall doping is described wherein the implantation of the dopant is done after the high temperature sidewall oxidation formation. Therefore, this method allows high concentrations of the dopant to be retained along the sidewall thus deceasing the corner coupling.
    Type: Grant
    Filed: June 10, 1991
    Date of Patent: March 8, 1994
    Assignee: Texas Instruments Incorporated
    Inventor: Ravishankar Sundaresan