Patents Examined by La Charles Keesee
  • Patent number: 5343291
    Abstract: A device for measuring an interval between two plate-like objects includes a light source for projecting a light toward the objects, a detector for detecting a position of incidence, upon a predetermined surface, of the light projected by the light source and deflected by the two objects, and a calculating portion for measuring the interval of the two objects on the basis of the detection by the detector.
    Type: Grant
    Filed: March 16, 1992
    Date of Patent: August 30, 1994
    Assignee: Canon Kabushiki Kaisha
    Inventors: Mitsutoshi Ohwada, Masakazu Matsugu, Shigeyuki Suda, Minoru Yoshii, Yukichi Niwa, Noriyuki Nose, Kenji Saitoh, Masanobu Hasegawa
  • Patent number: 5321491
    Abstract: In the grading of shell eggs passing in a stream through a candling bed, images of the eggs are compared with image data characteristic of eggs of known grade so as to assign a grade to each egg in the stream. Positional information representative of the movement of the eggs is combined with the assigned grade to control a mechanical egg routing device. Images of multiple egg streams may be multiplexed and processed together. The images may be Fourier transformed before comparison.
    Type: Grant
    Filed: June 11, 1992
    Date of Patent: June 14, 1994
    Assignee: Ovascan Pty. Ltd.
    Inventors: Ian R. Summers, Donald S. Bloser, Blake R. Painter
  • Patent number: 5243408
    Abstract: The detection of abrupt changes in opacity of a moving sheet resulting from, for example, an overlap type splice is provided. The web material is fed between two identical light emitter/detector pairs such that its opacity is measured. An abrupt change in web thickness passing through one light emitter/detector pair is sensed as a change in web opacity. The difference and resulting imbalance with the opacity signal from the other light emitter/detector pair, not yet interrupted with the abrupt change, is utilized to indicate the presence of the defect which, in this application, could be an overlap splice. The disclosed invention, although adaptable to thicker textile webs, specifically relates to a device for the detection of overlap splices in a moving sheet representative of all the paper types required by the cigarette, printing, and labeling industries.
    Type: Grant
    Filed: July 17, 1991
    Date of Patent: September 7, 1993
    Assignee: P. H. Glatfelter Company
    Inventor: Hobart A. Whitman, III
  • Patent number: 5235399
    Abstract: An apparatus for measuring the temperature of an object placed in a plasma by utilizing radiation includes measuring means for measuring the intensity of radiation from the object and the intensity of plasma light in different directions at the same time. The measuring means includes a first lens for receiving the radiation from the object and the plasma light, a second lens for converting the output beam of the first lens into parallel light rays, a third lens for focusing the parallel light rays, and an interference filter disposed rotatably between the second lens and the third lens.
    Type: Grant
    Filed: June 24, 1991
    Date of Patent: August 10, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Tatehito Usui, Tomoji Watanabe, Junichi Kobayashi, Takehiko Ooshima, Shunji Sasabe
  • Patent number: 5229832
    Abstract: A dual-interferometer apparatus for simultaneously measuring in-plane and out-of-plane ultrasonic displacements of the surface of materials comprising a single laser source, optical fibers, optical couplers and dividers, a phase-conjugate mirror, and a path length stabilizing system including a piezoelectric compensator. The present invention is unique in providing for the automatic alignment of the beams of the two interferometers, thus eliminating the need for time-consuming alignment procedures. The automatic alignment of the interferometers is achieved because a phase conjugate mirror is used to generate a counterpropagating beam used by both interferometers, and because the beams for the out-of-plane interferometer are derived from the beams used for the in-plane interferometer.
    Type: Grant
    Filed: July 8, 1991
    Date of Patent: July 20, 1993
    Assignee: Industrial Quality, Inc.
    Inventor: Edwin S. Gaynor
  • Patent number: 5220405
    Abstract: An interferometer 10 for measuring the position of the process surface 21 of a substrate 20 includes a coherent light source 12 for providing a light beam 14 which is partially transmitted and partially reflected by a beam splitter 16. The reflected light beam 18 is reflected off of the process surface 21 and the transmitted light beam 30 is reflected off of a translator 32 which vibrates a predetermined distance at a predetermined frequency. The phase shift between the light beams 22, 31 reflected off of translator 32 and the process surface 21 is measured using a photodetector 24, which provides an output signal 26 to a feedback servo unit 28. The servo unit 28 provides an output signal 38 which controls the vibration of translator 32. The output signal 38 of servo unit 28 is also indicative of the position of the process surface 21.
    Type: Grant
    Filed: December 20, 1991
    Date of Patent: June 15, 1993
    Assignee: International Business Machines Corporation
    Inventors: Steven G. Barbee, Leping Li, Victor J. Silvestri
  • Patent number: 5148236
    Abstract: An information retrieval system for extracting information from a pair of substantially coherent electromagnetic waves represented by phase differences therebetween each of which is incident on a photodetector, and having a demodulator which receives the photodetector output signal and which also receives a reference signal. The reference signal is obtained through use of a phase shift detector which receives the photodetector signal to determine certain phase shifts occurring therein and provides this information to a reference signal supply to adjust the phase of its output signal which then serves as the reference signal for the demodulator.
    Type: Grant
    Filed: June 18, 1990
    Date of Patent: September 15, 1992
    Assignee: Honeywell Inc.
    Inventors: James Blake, Preston Dane, Rudolf Dankwort
  • Patent number: 5047652
    Abstract: Systems for the on-line optical measurement of properties of a translucent moving web, such as paper or plastic, as it is continually produced, colored or otherwise converted. Measured properties include color, reflectance and opacity. A backing roll has a cylindrical or approximately cylindrical surface which comprises at least one optical standard. The roll is positioned such that a circumferential portion of the roll surface contacts the back web surface where the web characteristic is to be measured, with the web curving around the circumferential portion. An optical sensing device is positioned so as to view the front web surface backed by the optical standard or standards. In several embodiments, two sets of reflectance data are collected, one with a "white" optical standard backing and the other with a "black" optical standard backing.
    Type: Grant
    Filed: April 16, 1990
    Date of Patent: September 10, 1991
    Assignee: International Paper Company
    Inventors: Khaim Lisnyansky, Martin A. Hubbe