Patents Examined by Lam Nguyen
  • Patent number: 9834020
    Abstract: When it is determined by the post-process determination unit that a received top job requires a bookbinding process (post-process) and that a received subsequent job does not require a bookbinding process (post-process), the sheet setting determination unit determines whether or not there is a match between the sheet size (sheet setting) of the top job and the sheet size (sheet setting) of the subsequent job, and when it is determined by the sheet setting determination unit that there is a match between the sheet size (sheet setting) of the top job and the sheet size (sheet setting) of the subsequent job, the execution management unit causes the printing machine to perform the printing process on the basis of the subsequent job during the warm-up of the bookbinding device.
    Type: Grant
    Filed: November 15, 2016
    Date of Patent: December 5, 2017
    Assignee: RISO KAGAKU CORPORATION
    Inventor: Yukimori Matsumine
  • Patent number: 9835596
    Abstract: A method and software system for flaw identification, grouping and sizing for fatigue life assessment for rotors used in turbines and generators. The method includes providing ultrasonic data of a plurality of rotor slices and providing volume reconstruction of the ultrasonic data. The method also includes providing in-slice identification, grouping and sizing of flaw indications in the rotor based on the volume reconstruction. Further, the method includes providing inter-slice identification, grouping and sizing of the flaw indications based on the in-slice flaw indications and providing flaw location and size information. The method can be used in both phased-array and A-scan inspections.
    Type: Grant
    Filed: January 3, 2014
    Date of Patent: December 5, 2017
    Assignee: Siemens Energy, Inc.
    Inventors: Xuefei Guan, Jingdan Zhang, Shaohua Kevin Zhou, El Mahjoub Rasselkorde, Waheed A. Abbasi, Steve H. Radke, Chin-Sheng Lee, Ashley L. Lewis
  • Patent number: 9823369
    Abstract: Disclosed is a system and method for predicting internal multiples generators to correct near surface statics, by estimating a first timing or position associated with reflectors using internal multiple generators identified based on predictive deconvolution operators, estimating a second timing or position associated with the reflectors using the acquired seismic surface data, comparing the first timing or position with the second timing or position for each of the reflectors to determine a travel time delay associated with the reflectors, and correcting the acquired seismic surface data using the travel time delay.
    Type: Grant
    Filed: February 27, 2014
    Date of Patent: November 21, 2017
    Assignee: CGG SERVICES SAS
    Inventor: Antonio Pica
  • Patent number: 9824069
    Abstract: A method providing an analytical technique introducing label information into an anomaly detection model. The method includes the steps of: inputting measurement data having an anomalous or normal label and measurement data having no label as samples; determining a similarity matrix indicating the relationship between the samples based on the samples; defining a penalty based on the similarity matrix and calculating parameters in accordance with an updating equation having a term reducing the penalty; and calculating a degree of anomaly based on the calculated parameters. The present invention also provides a program and system for detecting an anomaly based on measurement data.
    Type: Grant
    Filed: May 12, 2016
    Date of Patent: November 21, 2017
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Tsuyoshi Ide, Tetsuro Morimura, Bin Tong
  • Patent number: 9824060
    Abstract: The present tool and method relate to device fault detection, diagnosis and prognosis. More particularly, the present tool and method store in a database a plurality of measured indicators representative of at least one dynamic condition of the device. The present tool and method further binarize by a processor the plurality of measured indicators, and analyze the plurality of binarized measured indicators using a machine learning data tool for extracting at least one pattern from the binarized measured indicators by adding at least one different constraint to each iteration. The at least one extracted pattern is indicative of whether the device has a fault or not.
    Type: Grant
    Filed: July 21, 2011
    Date of Patent: November 21, 2017
    Assignee: POLYVALOR, LIMITED PARTNERSHIP
    Inventors: Soumaya Yacout, David Salamanca, Mohamad-Ali Mortada
  • Patent number: 9809028
    Abstract: A printer has a print head check unit that performs an ink ejection check to confirm whether or not ink is being ejected normally from nozzles, the printer sets a flag F to 1 so as to start an ink ejection check and starts a paper feed process. When the processes has been terminated, the printer starts printing. Accordingly, ink ejection check takes place concurrently with the paper feed process, the overall time required for the processes can be reduced. In this way, the overall time required for the processes of the ejection check of the print recording liquid and an image forming process can be reduced. Further, the ink ejection check may be performed in parallel with or partly overlapping with a process of receiving print data, a process of conversion into print data, a process of ejecting paper after printing, or a flashing process.
    Type: Grant
    Filed: December 28, 2012
    Date of Patent: November 7, 2017
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Seiji Izuo
  • Patent number: 9809022
    Abstract: A drying assembly is disclosed. An example apparatus includes fans; a temperature sensor; a print engine to access instructions to cause a printer to perform a printing operation on media; and a processor responsive to an output of the temperature sensor to control the fans to force air onto the media to cause a substantially uniform temperature to be maintained across a width of the media during the printing operation and to cause a sum of air flow output by the fans to be maintained at a substantially constant value.
    Type: Grant
    Filed: February 17, 2016
    Date of Patent: November 7, 2017
    Assignee: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
    Inventors: Francisco Javier Perez Gellida, Mikel Zuza Irurueta, Oriol Borrell Avila, Juan Manuel Valero Navazo, Roger Bastardas Puigoriol
  • Patent number: 9810549
    Abstract: Generally, implementations of the present invention include devices, systems, and methods for tracking intermittent motion. Such systems can be used to calibrate inertial measurement units (IMUs), which can be used to obtain acceleration, linear and angular velocities, orientation, and position of a moving body. Such systems also can be used to account and compensate for errors and imperfections present in an IMU prior to and during operation.
    Type: Grant
    Filed: January 6, 2012
    Date of Patent: November 7, 2017
    Assignee: University of Utah Research Foundation
    Inventors: Eric Allen Johnson, Mark A. Minor, Stacy J. Morris Bamberg
  • Patent number: 9805002
    Abstract: A method providing an analytical technique introducing label information into an anomaly detection model. The method includes the steps of: inputting measurement data having an anomalous or normal label and measurement data having no label as samples; determining a similarity matrix indicating the relationship between the samples based on the samples; defining a penalty based on the similarity matrix and calculating parameters in accordance with an updating equation having a term reducing the penalty; and calculating a degree of anomaly based on the calculated parameters. The present invention also provides a program and system for detecting an anomaly based on measurement data.
    Type: Grant
    Filed: May 12, 2016
    Date of Patent: October 31, 2017
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Tsuyoshi Ide, Tetsuro Morimura, Bin Tong
  • Patent number: 9797724
    Abstract: Provided is a capsize risk level calculation system which can calculate a capsize risk level providing an index of the capsize risk on an oscillation of hull without using hull information. This system includes an acceleration sensor detecting a reciprocating motion in an up-down direction of a vessel as an oscillation in an up-down direction of a virtual oscillation center axis; an angular velocity sensor detecting a simple pendulum motion in a rolling direction around the vessel center axis as a simple pendulum motion of the vessel COG around the oscillation center axis; and an arithmetic part calculating a capsize risk level from an oscillation radius connecting between the oscillation center axis and the vessel COG, and a capsize limit oscillation radius connecting between the oscillation center axis and the vessel metacenter, which are obtained on the results of detection by the acceleration sensor and the angular velocity sensor.
    Type: Grant
    Filed: May 16, 2013
    Date of Patent: October 24, 2017
    Assignee: NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF MARINE SCIENCE AND TECHNOLOGY
    Inventor: Yutaka Watanabe
  • Patent number: 9798038
    Abstract: A directional filter for processing full-tensor gradiometer data is described. The filter processes input data using a method comprising receiving geophysical data collected based on characteristics of geographic features in an environment, and applying a directional filter to the received geophysical data in a first instance so as to provide first filtered data. A filtering direction of the directional filter is determined based on properties in the received geophysical data. The method also includes updating the filtering direction based on properties in the first filtered data, applying the directional filter to the received geophysical data in a subsequent instance using the updated filtering direction so as to provide subsequent filtered data, and based on the updated filtering direction having a subsequent update less than a threshold, outputting directionally filtered data. The subsequent update is determined due to properties in the subsequent filtered data output from the subsequent instance.
    Type: Grant
    Filed: August 14, 2013
    Date of Patent: October 24, 2017
    Assignee: Bell Geospace Inc.
    Inventor: James Brewster
  • Patent number: 9782983
    Abstract: An inkjet recording apparatus for curing ink ejected onto a base material and forming recorded matter on the base material is provided. The inkjet recording apparatus includes an ejection unit configured to eject the ink onto a first area of the base material and a second area surrounded by the first area, a curing unit configured to cure the ink ejected onto the base material, and a control unit configured to control the curing unit in such a way that a time from ink ejection onto the first area to ink curing is longer than a time from ink ejection onto the second area to ink curing.
    Type: Grant
    Filed: May 11, 2015
    Date of Patent: October 10, 2017
    Assignee: RICOH COMPANY, LTD.
    Inventor: Shinichi Hatanaka
  • Patent number: 9785526
    Abstract: A method for performing tests using automated test equipment (ATE) is presented. The method comprises obtaining information concerning a test class using a graphical user interface. Further, it comprises generating a first header file automatically, wherein the first header file comprises the information concerning the test class. Next, it comprises importing the first header file into a test plan operable to execute using a tester operating system wherein the test plan comprises instances of the test class. It further comprises, generating a second header file from the first header file automatically, wherein the second header file is a header file for the test class. The method also comprises validating the test plan using the tester operating system. Finally, the method comprises loading the test plan and a compiled module onto the tester operating system for execution, wherein the compiled module is a compiled translation of the test class.
    Type: Grant
    Filed: April 30, 2013
    Date of Patent: October 10, 2017
    Assignee: ADVANTEST CORPORATION
    Inventors: Mark Elston, Ankan Pramanick, Leon Chen, Chandra Pinjala
  • Patent number: 9776441
    Abstract: A method for determining a printing position, such as for image-on-paper registration in a printer or photocopying machine, is disclosed. A fiducial mark pattern comprising a plurality of fiducial marks at predefined relative distances is provided on a printing medium, and is scanned. The fiducial marks and a first edge of the printing medium are identified in a scanned representation of the printing medium. A first distance between the first edge and a first fiducial mark is determined, and a second distance between a second fiducial mark and a third fiducial mark are likewise determined from the scanned representation of the printing medium. The distance between the fiducial mark pattern and the first edge is computed based on both the determined first distance and the determined second distance. The invention also relates to a corresponding system and a computer-readable medium for determining a printing position.
    Type: Grant
    Filed: July 27, 2012
    Date of Patent: October 3, 2017
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Rodolfo Jodra Barron, Sagi Refael, Eyal Bodinger, Pavel Blinchuk
  • Patent number: 9778240
    Abstract: A system and a method for characterizing a crude oil sample from the weight and ultraviolet visible spectroscopy of the sample, including calculating a crude oil ultraviolet visible index and using the index to calculate the API gravity and the aromaticity of the sample.
    Type: Grant
    Filed: February 21, 2012
    Date of Patent: October 3, 2017
    Assignee: Saudi Arabian Oil Company
    Inventors: Omer Refa Koseoglu, Adnan Al-Hajji, Gordon Jamieson
  • Patent number: 9772976
    Abstract: An electron microscope and method of operating an electron microscope (1) has an electron beam source (11) for producing an electron beam, a noise canceling aperture (12) for detecting a part of the beam, an amplifier (42), an effective value calculating circuit (44) for extracting DC components of the output signal from the amplifier (42), a detector (15) for detecting a signal obtained in response to impingement of the beam on a sample (A), a preamplifier circuit (20), an amplifier circuit (30), a dividing circuit (54) for performing a division based on the output signal from the amplifier circuit (30) and on the output signal from the amplifier (42), and a multiplier circuit (58) for performing multiplication of the output signal from the dividing circuit (54) and the output from the effective value calculating circuit (44).
    Type: Grant
    Filed: June 12, 2013
    Date of Patent: September 26, 2017
    Assignee: JEOL Ltd.
    Inventor: Takashi Suzuki
  • Patent number: 9767258
    Abstract: A method and apparatus for photon, ion or particle counting described that provides seven orders of magnitude of linear dynamic range (LDR) for a single detector. By explicitly considering the log-normal probability distribution in voltage transients as a function of the number of photons, ions or particles present, the binomial distribution of observed counts for a given threshold, the mean number of photons, ions or particles can be determined well beyond the conventional limit.
    Type: Grant
    Filed: September 27, 2011
    Date of Patent: September 19, 2017
    Assignee: PURDUE RESEARCH FOUNDATION
    Inventors: Garth J. Simpson, David Joseph Kissick, Ryan Muir
  • Patent number: 9766635
    Abstract: A mass flow controller and method for operating the same is disclosed. The mass flow controller includes a mass flow control system to control the mass flow rate of a fluid, and a data logging component that obtains snapshots of condition-specific-data for each of a plurality of reoccurring condition types, and reduces each snapshot of condition-specific-data to functional parameter values that characterize each snapshot of condition-specific-data, and the data logging component generates statistical values that are stored in a short term data store that characterize multiple functional parameter values that are obtained during each separate occurrence of a specific condition type. A diagnostics component diagnoses failures using current functional parameter values and the statistical values stored in the short-term memory, and a prognostics component predicts failures based upon a collection of data sets that are stored in the long-term memory.
    Type: Grant
    Filed: January 26, 2016
    Date of Patent: September 19, 2017
    Assignee: HITACHI METALS, LTD.
    Inventors: Alexei V. Smirnov, Patrick Albright, Cy Jordan, Arun Nagarajan, Michael J. Zolock, Ryan Johnson, Alexander Fernandez
  • Patent number: 9759831
    Abstract: A method of processing data from an electromagnetic resistivity logging tool which includes a transmitter coil and a receiver coil is disclosed. The electromagnetic resistivity logging tool is placed at a desired location. The transmitter coil and the receiver coil are positioned at a first azimuthal angle. A signal is transmitted from the receiver coil. The receiver coil then receives a signal. The signal at the receiver coil, a tilt angle of the transmitter coil, a tilt angle of the receiver coil and the first azimuthal angle are then used to calculate a first complex voltage representing at least one component of the received signal.
    Type: Grant
    Filed: April 2, 2013
    Date of Patent: September 12, 2017
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Hsu-Hsiang Wu, Michael Bittar
  • Patent number: 9760465
    Abstract: Processor performance metrics are assessed by monitoring probes constructed using instruction sequences. A probe comprising an instruction sequence is selected. The instruction sequence can be configured to measure at least one hardware metric. A first probe value is received. The first probe value can be based, at least in part, on the hardware metric. The first probe value can be determined from execution of the probe in a first execution environment. The probe can be executed a second time to determine a second probe value. The second probe value can be based, at least in part, on the hardware metric. The second probe value is determined in a second execution environment including at least one workload. The first probe value and the second probe value can be compared to produce a performance assessment of the second execution environment.
    Type: Grant
    Filed: January 2, 2014
    Date of Patent: September 12, 2017
    Assignee: International Business Machines Corporation
    Inventors: Mark Robert Funk, Aaron Christoph Sawdey, Philip Lee Vitale