Patents Examined by MD Rahman
  • Patent number: 8928894
    Abstract: A method for optically monitoring an object within a monitoring area includes transmitting light rays with a light transmitting unit that form a line of light on the object. The line of light reflected from the object is imaged on an array of receiving elements that detects the reflected line of light and produces receiving element signals that correspond to measuring points on the object. The receiving element signals are evaluated to structure a distance profile of the object using a triangulation principle. The evaluating includes generating at least one evaluation window which covers in a first direction a local region extending along the line of light and in a second direction a distance range, and using the measuring points located farthest outside within the evaluation window for a left limit point and a right limit point for determining object data.
    Type: Grant
    Filed: October 9, 2012
    Date of Patent: January 6, 2015
    Assignee: Leuze Electronic GmbH + Co. KG
    Inventors: Horst Essig, Fabian Geiger, Dieter Klass, Juergen-Ralf Weber
  • Patent number: 8930007
    Abstract: A method and apparatus are set forth for modeling a coloring process in moving web manufacturing through dye response gain adaptation using measured sheet color spectrum; and dye response shape adaptation using measured color spectrum of the production sheet. The adaptation of colorant (dye) response gain uses the measured sheet color spectrum value at the value of maximum light absorbance of the dye. The adaptation of dye response spectrum uses the measured sheet color reflectance spectrum and sample sheet color spectrum with a corresponding response shape calculated using a formula to adapt the current sheet condition dye response shape using the dye response from the sample sheet on the assumption of a constant ratio of absorption change to dye concentration change.
    Type: Grant
    Filed: April 8, 2010
    Date of Patent: January 6, 2015
    Assignee: Metso Automation Inc.
    Inventors: Seyhan Nuyan, Calvin Fu, Tommi Loyttyniemi
  • Patent number: 8922770
    Abstract: Spectral device includes: diffraction element which disperses light for each wavelength; optical condensing system which condenses diffracted light of specific order generated by diffraction in the diffraction element; photo-detector arranged at position where the diffracted light of the specific order is condensed by the optical condensing system; first deflection device which inverts the direction of travel of second light as zeroth-order diffracted light generated by diffraction of first light which has entered the diffraction element as parallel luminous flux, and leads the second light into the diffraction element; and second deflection device which deflects the diffracted light of the specific order generated by diffraction of the second light which has entered the diffraction element in the same direction as the diffracted light of the specific order generated by the diffraction of the first light, and leads the deflected light into the optical condensing system.
    Type: Grant
    Filed: May 13, 2013
    Date of Patent: December 30, 2014
    Assignee: Olympus Corporation
    Inventor: Kentaro Yamazaki
  • Patent number: 8922760
    Abstract: There is provided an optical rotation measurement apparatus and a measuring system which are user-friendly, capable of measuring glucose concentration in drawn blood and living bodies with high accuracy in real time such that it is available for use at an actual medical site without depending on a reagent, and capable of measuring glucose concentration in a living body noninvasively with high accuracy, a new polarized light converting optical system that can be used for the measuring system, and an optical rotation measurement method using the optical system.
    Type: Grant
    Filed: May 18, 2011
    Date of Patent: December 30, 2014
    Assignee: Global Fiberoptics, Ltd.
    Inventor: Hiroshi Kajioka
  • Patent number: 8922766
    Abstract: A spectrometer includes a light source section that includes a plurality of LEDs having different emission wavelengths, a variable wavelength interference filter that selectively extracts light of a predetermined wavelength, a detector that detects the amount of light, and a control circuit section. The control circuit section includes a mode switching section that switches a calibration mode and a measurement mode, an outside light analysis section that analyzes characteristics of outside light in the calibration mode, a reference light setting section that set the amount of light emitted from each of the LEDs on the basis of the characteristics of the outside light, and a light source driving section that drives each of the LEDs on the basis of the amount of light emitted which is set in the measurement mode.
    Type: Grant
    Filed: October 8, 2012
    Date of Patent: December 30, 2014
    Assignee: Seiko Epson Corporation
    Inventor: Takeshi Nozawa
  • Patent number: 8917386
    Abstract: Testing the authenticity of a valuable document, whereby at least one intensity distribution of electromagnetic radiation passing through the valuable document in the dark field is detected in a spatially resolved manner and a spatially resolved dark field characteristic is determined therefrom. The actual authenticity test is then performed by a procedure in which selected test partial regions of the valuable document are assigned respectively to one of a plurality of suspicion classes, an interconnection region is formed from substantially interconnected test partial regions that were assigned to at least one specific suspicion class, and the valuable document, depending on the form and/or position of the interconnection region, is assigned to one of at least two authenticity categories which is linked to the at least one specific suspicion class.
    Type: Grant
    Filed: May 26, 2011
    Date of Patent: December 23, 2014
    Assignee: Giesecke & Devrient GmbH
    Inventors: Norbert Holl, Dieter Stein, Shanchuan Su
  • Patent number: 8913238
    Abstract: The invention relates to a check-tile for validating instrument scales of color measurement instruments, in particular goniospectrophotometers, said check-tile comprising a non-transparent (opaque) substrate coated with a multi-layer coating, said multi-layer coating comprising: A) a pigmented ground coat, wherein said pigmented ground coat is opaque and made of a base coat coating composition I comprising at least one achromatic solid pigment, B) a pigmented mid-coat, wherein said pigmented mid-coat is translucent and made of a base coat coating composition II comprising at least one transparent interference pigment and at least one transparent or semi-transparent solid pigment, and C) a clear top coat made of a transparent clear coat coating composition on top of the mid-coat.
    Type: Grant
    Filed: December 20, 2011
    Date of Patent: December 16, 2014
    Assignee: Axalta Coating Systems IP Co., LLC
    Inventors: Wilhelm Kettler, Uwe Johansson
  • Patent number: 8908182
    Abstract: The invention relates to a check-tile for validating instrument scales of color measurement instruments, in particular goniospectrophotometers, said check-tile comprising a non-transparent (opaque) substrate coated with a multi-layer coating, said multi-layer coating comprising: A) a pigmented ground coat, wherein said pigmented ground coat is opaque and made of a base coat coating composition I comprising at least one opaque solid colored pigment, and B) a pigmented mid-coat, wherein said pigmented mid-coat is translucent and made of a base coat coating composition II comprising at least one transparent interference pigment.
    Type: Grant
    Filed: December 20, 2011
    Date of Patent: December 9, 2014
    Assignee: Axalta Coating Systems IP Co., LLC
    Inventors: Wilhelm Kettler, Uwe Johansson
  • Patent number: 8908195
    Abstract: The present invention relates to a method for measuring cracks remotely and the device thereof. First, multiple laser spots with known a shape are projected onto a remote wall and beside a crack. Then, by using geometric calculations, the relative coordinates of the laser spots on the wall and the real distance can be given and used as the reference length of the crack. Next, a camera is used for taking a picture of the remote crack along with the laser spots; the image identification technology is used for calculating the relevant parameters of the crack. Thereby, to acquire the parameters of the crack, a user needs not to be present at the site for measuring at a short distance or placing a reference object, and thus providing safety and convenience.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: December 9, 2014
    Assignee: National Applied Research Laboratories
    Inventors: Wen-Yi Chang, Franco Lin, Lung-Cheng Lee, Hung-Ta Hsiao, Shou-I Chen, Yu-Chi Sung, Tai-Shan Liao, Chih-Yen Chen
  • Patent number: 8902422
    Abstract: A method is described for providing a continuous flow of a target material past a laser to enable repeated firings of the laser beam at the material in a controlled and uniform fashion. The objective is to provide a means to characterize the target material using laser induced breakdown spectroscopy. The method can be employed in a laboratory or field environment providing improved methods for characterizing in real time the properties of bulk materials.
    Type: Grant
    Filed: October 16, 2012
    Date of Patent: December 2, 2014
    Assignee: Chesner Engineering, PC
    Inventors: Warren H. Chesner, Matteo Forgione, Henry G Justus
  • Patent number: 8902429
    Abstract: The disclosure is directed to focusing one or more detectors of an interferometry system. An initial focus position may be determined by focusing a detector on an edge of a sample by comparing image contrast of intensity frames collected by the detector. Data associated with an inner edge of a ring formed by the image of the sample reflected on a reference flat may be collected from one or more positions near the initial focus position. The detector can be focused to a selected position by comparing edge data collected at the various detector positions near the initial focus position.
    Type: Grant
    Filed: December 5, 2012
    Date of Patent: December 2, 2014
    Assignee: KLA-Tencor Corporation
    Inventors: Jie-Fei Zheng, Steve Cui
  • Patent number: 8902421
    Abstract: An active-illumination parallel Raman microspectroscopy scheme for simultaneously collecting Raman spectra from multiple points in a full-spectra range. A combination of multi-point laser illumination with wide-field Raman imaging is employed in order to allow for simultaneous imaging of multiple points not aligned on a single line.
    Type: Grant
    Filed: January 14, 2013
    Date of Patent: December 2, 2014
    Assignee: The University of Houston System
    Inventor: Wei-Chuan Shih
  • Patent number: 8896844
    Abstract: A high-speed, 3-D method and system for optically measuring a geometric dimension of manufactured parts such as cartridge cases are provided. The method includes consecutively transferring the parts so that the parts travel along a path which extends to a vision station at which each part has a predetermined position and orientation for optical measuring. A line of radiation having a predetermined orientation is projected onto spaced apart end surfaces of the part to obtain reflected line segments of radiation from the end surfaces of the part. The reflected line segments of radiation are detected at one or more image planes to obtain electrical signals and the electrical signals are processed to determine the geometric dimension such as primer pocket depth.
    Type: Grant
    Filed: December 14, 2012
    Date of Patent: November 25, 2014
    Assignee: GII Acquisition, LLC
    Inventors: Michael G. Nygaard, Kyle M. Harmer, Nathan Andrew-Paul Kujacznski, James W. St. Onge
  • Patent number: 8896825
    Abstract: An optical inspector includes a radiating source, a time varying beam reflector, a telecentric scan lens, a first and second lens, a field stop, and a detector. The radiating source irradiates a first position of on the time varying beam reflector with a source beam. The time varying beam reflector directs the source beam to the telecentric scan lens, which in turn directs the source beam to a sample. The first lens focuses scattered radiation from the sample to generate multiple scan lines at a first focal plane. The field stop is positioned at the first focal plane to block one or more scan lines at the first focal plane. The scan line not blocked by the field stop propagates to the second lens. The second lens de-scans the scan line and generates a point of scattered radiation at a second focal plane where the detector input is located.
    Type: Grant
    Filed: February 1, 2013
    Date of Patent: November 25, 2014
    Assignee: Zeta Instruments, Inc.
    Inventors: Steven W. Meeks, Rusmin Kudinar, Hung P. Nguyen
  • Patent number: 8879060
    Abstract: A Raman signal detection and analyzing system and a method thereof are disclosed. The Raman signal is generated by emitting an excitation light to a sample. The Raman signal is then modulated by passing through a plurality of optical filter and modulator. The resulting modulated Raman signal comprises two orthogonal components, which intensities are to be computed based on the first harmonic of said modulated Raman signal. The content of a specific analyte within the sample can then be determined based on the ratio of the intensities of the two components.
    Type: Grant
    Filed: April 2, 2013
    Date of Patent: November 4, 2014
    Assignee: Hong Kong Applied Science and Technology Research Institute Company Limited
    Inventors: Ka Cheung Kwok, Lut Hey Chu, Chun Zhang, Lap Wai Lydia Leung
  • Patent number: 8873068
    Abstract: The present invention relates to a portable industrial instrument for performing, in an integrated and two-way manner, an interferometric fringe projection and shearography, on a object to be tested, so that, when the two-way interferometer (1) is associated with the coherent or quasi-coherent projection device (2), the instrument is able to measure the 3D shape of the object by interferometric fringe projection, also known as moiré method, and, when the two-way interferometer (1) is associated with the recording or imaging device (4), the instrument is able to perform shearographic measurements on the object, the direction of the traversing light beam in the interferometer (1) being reversed when shifting from one measurement configuration to the other one.
    Type: Grant
    Filed: December 4, 2012
    Date of Patent: October 28, 2014
    Assignees: Cockerill Maintenance & Ingenierie S.A., Universite de Liege
    Inventors: Pascal Blain, Yvon Renotte, Serge Habraken, Pascal Waroux
  • Patent number: 8867028
    Abstract: Subject matter disclosed herein relates to measuring modes of a waveguide.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: October 21, 2014
    Assignee: Interfiber Analysis, LLC
    Inventors: Andrew D. Yablon, Jayesh Jasapara
  • Patent number: 8867035
    Abstract: The invention relates to a particle detector including a substrate (10, 30, 40) made of a semiconductor material, in which at least one through-cavity (11, 31, 41) is formed, defined by an input section (110) and an output section (111), wherein the input section thereof is to be connected to an airflow source, said substrate supporting: an optical means including at least one laser source (12, 32, 42), and at least one waveguide (13, 33, 43) connected to said at least one laser source and leading into the vicinity of the output section of said cavity; and photodetector means (14, 34, 44) located near the output section of said cavity and offset relative to the optical axis of the optical means.
    Type: Grant
    Filed: July 19, 2011
    Date of Patent: October 21, 2014
    Assignee: Commissariat a l'Energie Atomique et aux Energies Alternatives
    Inventor: Sergio Nicoletti
  • Patent number: 8848181
    Abstract: An optical inspector includes a radiating source, a time varying beam reflector, a telecentric scan lens, a first and second waveplate, a polarizing beam splitter, a first detector, a focusing lens, a blocker, and a second detector. The radiating source irradiates the first waveplate generating circularly polarized source beam that irradiates a first position of on the time varying beam reflector with a source beam. The time varying beam reflector directs the source beam to the telecentric scan lens, which in turn directs the source beam to a sample. Reflected radiation from a sample is directed to the second waveplate generating linearly polarized beam that irradiates the polarizing beam splitter which directs a portion of the reflected radiation to the first detector. Scattered radiation from the sample is directed by the focusing lens to the second detector. Contemporaneous measurements by the first and second detectors are compared to differentiate.
    Type: Grant
    Filed: April 12, 2013
    Date of Patent: September 30, 2014
    Assignee: Zeta Instruments, Inc.
    Inventors: Steven W. Meeks, Rusmin Kudinar, Hung P. Nguyen
  • Patent number: 8848173
    Abstract: An enhanced photoemission spectroscopy (EPS) system uses at least three photoelectric detection processes to identify a substance or substances in a target. The target can be in a container, and the EPS system accounts for this in the identification process. The photoelectric detection processes include Raman scattering, fluorescence and spectral reflection. The EPS system uses all three processes to generate spectral data that is then combined to derive a target signature. The target signature is then compared to stored signature data to determine the substance or substances in the target.
    Type: Grant
    Filed: November 9, 2012
    Date of Patent: September 30, 2014
    Assignee: CDEX, Inc.
    Inventors: Wade M. Poteet, Carey W. Starzinger, Jeffery K. Brumfield