Patents Examined by Mi?schita? Henson
  • Patent number: 8838409
    Abstract: An installation error estimating device has a predicted pattern acquirer which obtains a predicted positioning distribution pattern, which is obtained by computing a characteristic pattern of a predicted positioning distribution obtained by predicting a logical positioning distribution, at each observation point where a wireless tag is installed for positioning; and an observation data inputter to which positioning results obtained from the wireless tags by a tag reader are input as observation data. A dispersion pattern analyzer computes a characteristic pattern of a measured positioning distribution, which is obtained by statistical analysis of the applicable positioning result, as a measured positioning distribution pattern at each observation point based on the observation. An installation error estimator computes the installation error for the tag reader using the predicted positioning distribution patterns obtained and the measured positioning distribution patterns computed.
    Type: Grant
    Filed: November 20, 2009
    Date of Patent: September 16, 2014
    Assignee: Panasonic Corporation
    Inventors: Masamoto Tanabiki, Takashi Shimojima, Makoto Yasugi
  • Patent number: 8005632
    Abstract: A method and article of manufacture are provided to monitor a sensing system operative to monitor electrical current in a transmission line between an electrical storage device and an electrical machine. The sensing system comprises first and second sensors, operative to monitor first and second ranges of electrical current. The method comprises determining outputs of the first and second sensors are valid, and comparing outputs of the first and second sensors when current is substantially zero. The method comprises comparing magnitudes of the outputs of the first and second sensors when the monitored electrical current, and monitoring polarity of each of the outputs of the first and second sensors.
    Type: Grant
    Filed: November 7, 2007
    Date of Patent: August 23, 2011
    Assignee: GM Global Technology Operations LLC
    Inventors: Andrew M. Zettel, Jayanthi Padmanabhan, Michael J. Miller
  • Patent number: 8000926
    Abstract: A method for determining position and alignment is provided. The method includes monitoring a first and second sequence of ultrasonic signals transmitted from the first device to a second device, estimating a location of the first device from Time of Flight measurements of the ultrasonic signals at respective microphones on the second device, calculating a set of phase differences, weighting a difference of an expected location and estimated location of the first device with the set of phase differences to produce a relative displacement, and reporting a position of the first device based on the relative displacement.
    Type: Grant
    Filed: April 20, 2010
    Date of Patent: August 16, 2011
    Assignee: Orthosensor
    Inventors: Martin Roche, Marc Boillot, Jason McIntosh
  • Patent number: 7987055
    Abstract: A body fat measurement result providing method includes maintaining a body fat information database having stored therein at least one particular person's body fat information, which includes local body fat information for at least one body part of the at least one particular person, providing a user with a particular person list including the at least one particular person, and receiving a selection from the user of a first particular person selected from the particular person list, and generating a measurement result information by comparing the user's local body fat measured for at least one body part of the user, with corresponding local body fat information for the at least one body part of the first particular person.
    Type: Grant
    Filed: October 25, 2007
    Date of Patent: July 26, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Sang Kon Bae, In Duk Hwang, Sang Ryong Kim
  • Patent number: 7987062
    Abstract: A delay circuit includes a first delay element, a second delay element, and an initializing section that measures a delay amount generated by the first delay element with respect to each delay setting value. The initializing section includes a first loop path that inputs an output signal of the first delay element into the first delay element and a second loop path that inputs an output signal of the second delay element into the second delay element. The initialization section includes a first measuring section that sequentially sets delay setting values mutually different from the delay setting value in the first delay element and sequentially measures delay amounts in the first delay element, a second measuring section that measures a delay amount in the second delay element, and a delay amount computing section that corrects a delay amount measured by the first measuring section.
    Type: Grant
    Filed: June 15, 2007
    Date of Patent: July 26, 2011
    Assignee: Advantest Corporation
    Inventors: Kazuhiro Fujita, Masakatsu Suda, Takuya Hasumi
  • Patent number: 7953558
    Abstract: Disclosed embodiments of the present invention provide means to obtain correct gas density and flux measurements using (i) gas analyzer (open-path, or closed-path gas analyzers with short intake tube, for example 1 m long, or any combination of the two); (ii) fast temperature or sensible heat flux measurement device (such as, fine-wire thermocouple, sonic anemometer, or any other device providing fast accurate gas temperature measurements); (iii) fast air water content or latent heat flux measurement device (such as, hygrometer, NDIR analyzer, any other device providing fast accurate gas water content measurements); (iv) vertical wind or sampling device (such as sonic anemometer, scintillometer, or fast solenoid valve, etc.) and (v) algorithms in accordance with the present invention to compute the corrected gas flux, compensated for T-P effects.
    Type: Grant
    Filed: September 3, 2009
    Date of Patent: May 31, 2011
    Assignee: Li-Cor, Inc.
    Inventors: George Burba, Dayle McDermitt, Anatoly Komissarov, Tyler G. Anderson, Liukang Xu, Bradley A. Riensche
  • Patent number: 7941286
    Abstract: Systems and techniques for varying a scan rate in a measurement instrument. The techniques may be used in scanning probe instruments, including atomic force microscopes (AFMs) and other scanning probe microscopes, as well as profilometers and confocal optical microscopes. This allows the selective imaging of particular regions of a sample surface for accurate measurement of critical dimensions within a relatively small data acquisition time.
    Type: Grant
    Filed: November 28, 2006
    Date of Patent: May 10, 2011
    Assignee: Asylum Research Corporation
    Inventors: Roger B. Proksch, Roger C. Callahan
  • Patent number: 7937232
    Abstract: Embodiments of the present invention relate to managing timestamps associated with received data. According to one embodiment, data is collected from a device that generates data at a specified rate, but which lacks a built-in clock. An accurate timestamp is assigned to the data by first taking an absolute timestamp from a reference clock, and then adding a calculated amount of time to each subsequent data point based on an estimate of the sampling frequency of the device. As the generated timestamp drifts from the actual reference clock time, the sampling frequency is re-estimated based on the amount of detected drift.
    Type: Grant
    Filed: June 25, 2007
    Date of Patent: May 3, 2011
    Assignee: Pivotal Systems Corporation
    Inventors: Paxton Ming Kai Chow, Vera Alexandrova Snowball, Barton George Lane, III, Sophia Leonidovna Shtilman, Chalee Asavathiratham, Abhijit Majumdar, Sherk Chung, Yi Wang, Paul Tran
  • Patent number: 7933724
    Abstract: Method of tracking the performance of an industrial appliance (E), in which an estimate (We) of the quantity representing the electrical power consumed is calculated, in real-time, using the model (M), based on the values of the set (F) of operating parameters of the industrial appliance (E), the difference between the measured value (W) of the electrical power consumed (W) and the estimated value (We) provided by the model (M) is calculated, to obtain the overconsumption value, based on a statistical test on the overconsumption variable, using the distribution of this variable, an overconsumption score is deduced from this corresponding to a probability of overconsumption (p1) and an alarm is triggered if the probability of overconsumption (p1) exceeds a given overconsumption probability threshold (sp1), so constituting an overconsumption indicator.
    Type: Grant
    Filed: December 8, 2005
    Date of Patent: April 26, 2011
    Assignee: L'Air Liquide, Societe Anonyme a Directoire et Conseil de Surveillance pour l'Etude et l'Exploitation des Procedes Georges Claude
    Inventors: Caroline Drouart, Thierry Roba, Alain Donzel
  • Patent number: 7890286
    Abstract: A test circuit includes a first reset pulse generator configured to generate a first reset pulse when a test mode is performed or when power is up, a test mode maintenance signal generator configured to provide a test mode maintenance signal activated in response to a predetermined consecutive test information data, the activation of the test mode maintenance signal being controlled by the first reset pulse, a second reset pulse generator configured to generate a second reset pulse when the test information data is received as a predetermined test mode reset data or when power is up, and a test mode selection signal generator configured to receive the test information data provided from the test mode maintenance signal generator and the test mode maintenance signal and to generate a specific test mode selection signal, the activation of the specific test mode selection signal being controlled by the second reset pulse.
    Type: Grant
    Filed: June 2, 2009
    Date of Patent: February 15, 2011
    Assignee: Hynix Semiconductor Inc.
    Inventor: Young-Do Hur
  • Patent number: 7885779
    Abstract: A measurement error correcting method and electronic component characteristic measuring device capable of accurately coping with an electronic component which includes nonsignal line ports and whose electrical characteristics are changed by a jig. The method includes the steps of measuring an electrical characteristic, with correcting-data-acquisition samples mounted on a test jig enabling measuring nonsignal line ports, and the samples mounted on a reference jig; measuring a through device in which a signal line port and a nonsignal line port are electrically connected to each other; determining a numerical expression for calculating, from results of measurement on the test jig, an estimated electrical characteristic value obtained on the reference jig; measuring an arbitrary electronic component, on the test jig; and calculating the estimated electrical characteristic value obtained on the reference jig.
    Type: Grant
    Filed: November 27, 2006
    Date of Patent: February 8, 2011
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Taichi Mori, Gaku Kamitani, Hiroshi Tomohiro
  • Patent number: 7840361
    Abstract: A technology is provided in which it is not necessary to modify a system on a production side, and in which man-hours required for registering an environmental load value on a supplier side are not increased, in cases of an item having a mismatch between units, in a process of adding up the environmental load values of a post-production product. The technology includes generating correction information for calculating the environmental load that is registered by the supplier at design time, and calculating the environmental load value at design time by using the correction information. In cases of calculating the environmental load value of a product actually produced from a designed product, the environmental load value is calculated using the correction information generated at design time.
    Type: Grant
    Filed: November 21, 2007
    Date of Patent: November 23, 2010
    Assignee: Hitachi, Ltd.
    Inventors: Takaaki Kumazawa, Noriaki Yamamoto, Yoshiharu Sekiya
  • Patent number: 7840368
    Abstract: A test circuit includes a first reset pulse generator configured to generate a first reset pulse when a test mode is performed or when power is up, a test mode maintenance signal generator configured to provide a test mode maintenance signal activated in response to a predetermined consecutive test information data, the activation of the test mode maintenance signal being controlled by the first reset pulse, a second reset pulse generator configured to generate a second reset pulse when the test information data is received as a predetermined test mode reset data or when power is up, and a test mode selection signal generator configured to receive the test information data provided from the test mode maintenance signal generator and the test mode maintenance signal and to generate a specific test mode selection signal, the activation of the specific test mode selection signal being controlled by the second reset pulse.
    Type: Grant
    Filed: December 18, 2007
    Date of Patent: November 23, 2010
    Assignee: Hynix Semiconductor Inc.
    Inventor: Young Do Hur
  • Patent number: 7840363
    Abstract: System and method for determining total mill flow (TMF) in a biofuel production process. Measured slurry flow and density values from a process fed by mill(s), backset, and at least one water source, are received. The slurry includes biomass solids and water. Measured backset flow and density values, and a backset composition value are received, as well as a slurry composition value indicating % biomass solids of the slurry is received. A quantity of biomass solids and/or water of the slurry determined based on the slurry flow, density, and composition, and a quantity of the biomass solids and/or water of the backset determined based on the backset flow and density, backset composition, and a system filter characterizing time delays and lags between measurements of the backset flow and biomass slurry flow. Total mill flow is determined based on the quantities of biomass solids and/or water of the slurry and backset.
    Type: Grant
    Filed: March 20, 2008
    Date of Patent: November 23, 2010
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Brian K. Stephenson, Patrick D. Noll, Maina A. Macharia
  • Patent number: 7835878
    Abstract: In a travel angle detection system for a mobile object having a detector installed in the mobile object to produce angular velocity outputs successively, the detector outputs are read and one output is determined as a provisional calibration value indicative of zero-point. Integrated values of differences between the calibration value and successive outputs and output variation width are calculated. When they are within predetermined permissible ranges, the mobile object is determined to be in static condition and the calibration value is corrected by an average value of the integrated values. The travel angle of the mobile object is detected from the calibrated outputs of the detector, thereby achieving accurate calibration of detector output by enabling accurate determination of the static condition.
    Type: Grant
    Filed: December 19, 2007
    Date of Patent: November 16, 2010
    Assignee: Honda Motor Co., Ltd.
    Inventor: Mitsuyasu Ino
  • Patent number: 7831402
    Abstract: A method for estimating values assumed at a certain instant of each period by currents flowing respectively in two distinct windings of a poly-phase load controlled in a space vector modulation (SVM) mode, using a same measuring device, may include coupling the measuring device to the first winding and measuring a current flowing therethrough with an anticipation from the certain instant smaller than or equal to an SVM half-period. The method may also include coupling the measuring device to the second winding, measuring a current flowing therethrough at the certain instant, coupling the measuring device to the first winding, and measuring a current flowing therethrough with a delay equal to the anticipation. The method may also include estimating a value assumed at the certain instant by the current flowing through the first winding based upon the two measured values with the anticipation and with the delay respectively.
    Type: Grant
    Filed: January 16, 2008
    Date of Patent: November 9, 2010
    Assignee: STMicroelectronics S.R.L.
    Inventors: Giuseppe D'Angelo, Giovanni Moselli
  • Patent number: 7801702
    Abstract: A system and method for enhanced diagnostic fault detection and isolation is provided, wherein COTS/MOTS subsystems of a system under test are evaluated in a hierarchical manner providing improved test coverage and a reduction in ambiguity group size. The enhanced diagnostic fault detection and isolation method may proceed from automatic built-in-test to initiated built-in-test and finally to manual tests. At each stage of the testing, results may be evaluated to determine which, if any, components need replacing. The diagnostic system may report the results of testing in a fault log and/or a look-up table structure. The systems and methods of the present invention are suited to testing systems that incorporate COTS or MOTS subsystem components, and for use with an interactive electronic technical manual (IETM). Further, the diagnostic system is adaptable to a variety of subsystem interface protocols.
    Type: Grant
    Filed: November 30, 2004
    Date of Patent: September 21, 2010
    Assignee: Lockheed Martin Corporation
    Inventors: Richard D. Berbaum, Edward R. Bestle
  • Patent number: 7797135
    Abstract: A process for correcting the time stamp of recordings such as photographs, obtained in many locations. An onboard clock records a time stamp for each photograph. GPS tracking data is obtained during movement of the camera. A time correction is sought, to account for an unknown error in the onboard clock, relative to the trusted GPS time data. To this end, an assigned location of each photograph is generated from the location tracking data and from an estimated time correction. Indicators of an appropriate time correction include clustering of the assigned locations, and correlation of the assigned locations to locations of reduced velocity. A GUI can be used to enable user assessment of clustering and/or correlation, and indication of a suitable time correction. Or, algorithmic assessment can be used. The determined time correction can be used to correct each photograph's time stamp.
    Type: Grant
    Filed: September 1, 2006
    Date of Patent: September 14, 2010
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventor: Andrew Fitzhugh
  • Patent number: 7792644
    Abstract: A frequency selective surface (FSS) and associated methods for modeling, analyzing and designing the FSS are disclosed. The FSS includes a pattern of conductive material formed on a substrate to form an array of resonance elements. At least one aspect of the frequency selective surface is determined by defining a frequency range including multiple frequency values, determining a frequency dependent permittivity across the frequency range for the substrate, determining a frequency dependent conductivity across the frequency range for the conductive material, and analyzing the frequency selective surface using a method of moments analysis at each of the multiple frequency values for an incident electromagnetic energy impinging on the frequency selective surface. The frequency dependent permittivity and the frequency dependent conductivity are included in the method of moments analysis.
    Type: Grant
    Filed: November 13, 2007
    Date of Patent: September 7, 2010
    Assignee: Battelle Energy Alliance, LLC
    Inventors: Dale K. Kotter, David T. Rohrbaugh
  • Patent number: 7783455
    Abstract: The present invention is generally directed to various methods and systems for isolating process equipment using sensor data. In one illustrative embodiment, the method includes providing at least two processing tools wherein the tools produce different process results when performing a target process operation, acquiring support facility data using a plurality of sensors, and analyzing the acquired support facility data to determine a cause for the processing tools producing different process results.
    Type: Grant
    Filed: March 4, 2005
    Date of Patent: August 24, 2010
    Assignee: GlobalFoundries Inc.
    Inventor: Elfido Coss, Jr.