Patents Examined by Michael F. Vollero
  • Patent number: 4568188
    Abstract: The invention contemplates a photometer tube having a rotatably mounted slit-diaphragm insert, with provision for scanning a specimen object through the slit, in the direction perpendicular to the instantaneous longitudinal orientation of the slit. In a first embodiment, the rotatable slit is coupled with an angle transmitter which supplies a control signal for scanning by a motor-driven X-Y specimen stage. In a second embodiment, the diaphragm holder itself is mounted on a carrier, for lineal displacement on the carrier in the direction perpendicular to the direction of the slit, and the carrier is rotatable to permit slit orientation with respect to a pattern of interest in an observed specimen.
    Type: Grant
    Filed: March 16, 1983
    Date of Patent: February 4, 1986
    Assignee: Carl-Zeiss Stiftung, Heidenheim/Brenz
    Inventors: Klaus Weber, Wolfgang Schob
  • Patent number: 4549808
    Abstract: A photoelectric measuring instrument for determining position deviations of an object is provided with an illuminated aperture and an objective which cooperate to generate an image of the illuminated aperture on the object to be measured. The image of the illuminated aperture on the object is reflected by the object and in turn imaged onto the illuminated aperture. This aperture is firmly connected with a measuring graduation which is scanned by a scanning unit to measure the position of the aperture. In the preferred embodiments, both the aperture and the graduation are formed by photolithographic techniques on a photoimpermeable layer which is carried by a transparent plate.
    Type: Grant
    Filed: May 2, 1983
    Date of Patent: October 29, 1985
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Alfons Ernst
  • Patent number: 4545683
    Abstract: Zone plate alignment aids on a mask and semiconductor wafer are used in a projection type system for aligning the wafer and mask prior to transfer of a circuit pattern from the mask to the wafer in an exposure process. The condenser system includes an aperture in the shape of a chevron or other convenient alignment pattern while the viewing system of the device is provided with a complementary shaped pupil stop. The condenser aperture and the viewing system stop cofunction to enhance the image contrast seen through the viewing system.
    Type: Grant
    Filed: February 28, 1983
    Date of Patent: October 8, 1985
    Assignee: The Perkin-Elmer Corporation
    Inventor: David A. Markle
  • Patent number: 4541721
    Abstract: Apparatus for optically checking both the gap between two adjacent parts such as the hood-to-fender fit of a vehicle and the surface flushness of the parts employs a hand-held fixture which is adapted to engage edges of the part in order to orient the fixture in a preselected position relative to the gap. A laser and related optical system mounted on the fixture directs a line of collimated light onto the parts and across the gap. The optical system and a television camera on the fixture pick up light reflected from the parts surfaces and generate an image using the triangulation technique which contains measurement information relating to the size of the gap and the degree of surface flushness. A computerized controller converts the image to measurement data that is displayed on a CRT. The control system is used in a part fitting method to select and display the identity of any of a plurality of shims which on an assembly person may employ to create proper fit between the parts.
    Type: Grant
    Filed: March 17, 1983
    Date of Patent: September 17, 1985
    Assignee: Perceptron, Inc.
    Inventor: Robert Dewar
  • Patent number: 4538914
    Abstract: Disclosed is a transfer apparatus provided with a first body having a plurality of alignment marks, a second body having a plurality of alignment marks, a projection optical system for projecting the image of the first body upon the second body, a probing device for probing the alignment marks of the first body and probing the alignment marks of the second body through the projection optical system, an operation device electrically coupled to the probing device and deriving a transfer error from the alignment error of the alignment marks, and a compensation device coupled to the operation device for eliminating the transfer error and for compensating for the projection optical system.
    Type: Grant
    Filed: December 16, 1982
    Date of Patent: September 3, 1985
    Assignee: Canon Kabushiki Kaisha
    Inventors: Minoru Yomoda, Izumi Tsukamoto
  • Patent number: 4537510
    Abstract: Apparatus for controlling output signals from two light detectors in a photometer. The sensitivities of the light detectors, or the gains in amplifiers for amplifying output signals from the light detectors are controlled in such a manner that the sensitivity characteristics and output characteristics of the two light detectors are in agreement with one another, to thereby improve the measuring accuracy thereof.
    Type: Grant
    Filed: December 9, 1982
    Date of Patent: August 27, 1985
    Assignee: Hitachi, Ltd.
    Inventor: Kenichiro Takahasi
  • Patent number: 4534647
    Abstract: An apparatus for photometrically scanning gels comprises a monochromator from which the light beam passes through a stop aperture and a gel placed in a cell, which are installed one after the other along the path of the light beam. The cell is caused to move relative to the light beam by means of a drive and the light is received by a photometer. The cell is made in the form of two superposed discs each having on one side congruent grooves which define at least one compartment for placing the gels therein when the discs are superposed on one another.
    Type: Grant
    Filed: October 18, 1982
    Date of Patent: August 13, 1985
    Assignee: Institut Molekulyarnoi Biologii Biokhimii Akademii Nauk Kazakhskoi SSR
    Inventors: Valery N. Gross, Vyacheslav D. Stupnik
  • Patent number: 4531837
    Abstract: A method for measuring the transverse profile of the head of a rail of a railroad track according to which a luminous trace (1) is projected onto the surface of the head of a rail, in a direction perpendicular to the longitudinal axis of said rail, this trace (1) having a particular point (3). The trace obtained is observed from two directions forming an angle (.alpha.) between them, located on either side of a longitudinal plane of the rail (2) and forming an angle with the plan of projection of the trace. This observation creates two partial reproductions (1'; 1") of this trace (1). Finally the two partial representations (1', 1") are angularly displaced by an angle corresponding to the angles from which the trace is observed and the images (3', 3") of the particular point (3) of the trace (1) are superimposed to obtain the representation of the transverse profile of the rail in its totality.
    Type: Grant
    Filed: February 1, 1983
    Date of Patent: July 30, 1985
    Assignee: Speno International S.A.
    Inventor: Romolo Panetti
  • Patent number: 4527898
    Abstract: In order to obtain an objective measurement of paint gloss on a flat or slightly curved surface, a distinctness of image instrument is provided having a light source for projecting a light beam onto the test surface, a detector responsive to reflected light from the surface, an aperture at the detector, a chopper near the light source and a lens for imaging the chopper blade on the plane of the aperture so that the sharpness of the image depends upon the reflective quality of the test surface. The rate of change of the detector output signal is large for a high glass surface while the rate of change is low for a low gloss surface. For use of the instrument on curved as well as flat surfaces the chopper is provided with a plurality of blades spaced at different distances from the light source.
    Type: Grant
    Filed: December 27, 1982
    Date of Patent: July 9, 1985
    Assignee: General Motors Corporation
    Inventor: Thomas T. Stapleton
  • Patent number: 4523842
    Abstract: An optic surface apparatus capable of handling aspheric surfaces uses dir measurement of the blur circle of the image created by the test surface. Direct measurement of the blur circle is obtained by providing a collimated light beam which includes the test surface in its optical path to an ultimate focal point. The focal point is occupied by an apertured screen with apertures of varying diameter. A light detector is placed behind the apertured screen to measure the intensity of light as a function of aperture size. The apertured screen and detector are mounted on a three-axis translator. For apertures less than the effective diameter of the blur circle, less than 100% light is received by the detector. For apertures equal to or greater than the effective diameter of the blur circle, 100% of the light reaches the light detector. A folding mirror is used in the optical path to permit the device to be physically compact.
    Type: Grant
    Filed: March 18, 1983
    Date of Patent: June 18, 1985
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Edwin M. Allen, Eugene C. Foust, Steven A. Sievert, William C. Fitzgerald, Max L. Moffitt
  • Patent number: 4523850
    Abstract: A system for positioning a body having two opposed edges and having a first axis oriented to pass through the two edges. A beam of light oriented along a second axis orthogonal to the first axis images one or both of the edges onto all or a portion of a photodetector array which is aligned in a direction parallel to the first axis. The array is scanned to obtain a light intensity transition profile of all or part of the projected image whereby the profile has either one or two 50% intensity points. The body is then shifted until both of the 50% intensity points strike predetermined locations on the array indicating that both the edges are included in the image. The body is shifted along the first axis until the fifty percent (50%) intensity point along the transition profile strikes a predetermined location along the photodetector array. The body is also moved along the second axis until the slope of the intensity transition profile is maximized, thereby obtaining an in-focus position.
    Type: Grant
    Filed: October 14, 1982
    Date of Patent: June 18, 1985
    Assignee: RCA Corporation
    Inventors: Robert L. Covey, Michael T. Gale
  • Patent number: 4521112
    Abstract: An optical measuring device comprising a parallel scanning ray beam generator, condensing means for condensing said parallel scanning ray beams after said parallel scanning ray beams have passed through a workpiece being measured, and a single light receiving element for sensing the brightness of said scanning ray beams condensed by said condensing means to convert the same into an electric signal, whereby the dimensions of the workpiece being measured are measured from the time length of a dark portion or a bright portion generated due to the obstruction of said parallel scanning ray beams by the workpiece being measured, which has been interposed between the parallel scanning ray beam generator and said light receiving element, a plurality of light emitting elements are arranged in opposed relations to the scanning scope of the parallel scanning ray beams, an output from the light receiving element during a single scanning time is time-shorn in accordance with the number of the light emitting elements to th
    Type: Grant
    Filed: December 22, 1982
    Date of Patent: June 4, 1985
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventors: Yoshiharu Kuwabara, Hiroyoshi Hamada, Masayuki Kuwata
  • Patent number: 4519709
    Abstract: A photoelectric incremental length or angle measuring device capable of alternate embodiments using transillumination or reflected-light arrangements and having a scanning grid slidable with respect to a spaced measuring scale grid. The ratio of the widths of the photopermeable to the photoimpermeable lines of the scanning grid of such a device is changed from the conventional ratio of 1:1 to a higher ratio which is greater than 2:1, preferably 3:1, while the ratio for these areas of the measurement division grid remains at 1:1. This change of the scanning grid ratio acts to increase the range of acceptable scanning distances.
    Type: Grant
    Filed: November 19, 1982
    Date of Patent: May 28, 1985
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Gunther Nelle
  • Patent number: 4500206
    Abstract: An optical system for measuring azimuth and elevation angular data for making a shadowgraph of an object under study. The system includes a pair of scaled assemblies which are secured together perpendicular to each other, with each of the scaled assemblies having degree markings thereon. An object under study, such as a scale model of an aircraft, is positioned within an imaginary sphere formed by the two scaled assemblies. Azimuth and elevation angular measurements are then obtained by the use of laser systems as the model aircraft is rotated within the imaginary sphere of the ring assemblies.
    Type: Grant
    Filed: October 15, 1982
    Date of Patent: February 19, 1985
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: Eugene O. Cole, Vahan H. Yeterian