Patents Examined by Michael J. Schwartz
  • Patent number: 6219400
    Abstract: An X-ray optical system includes an X-ray illumination system having at least two mirrors, a driving system for moving the at least two mirrors, a detecting system having at least one sensor, for detecting at least one of tilt and incidence position of X-rays in the X-ray illumination system, and a control system for controlling movements of the at least two mirrors by the driving system on the basis of detection by the detecting system.
    Type: Grant
    Filed: April 17, 1998
    Date of Patent: April 17, 2001
    Assignee: Canon Kabushiki Kaishi
    Inventors: Takayuki Hasegawa, Yutaka Watanabe
  • Patent number: 6154517
    Abstract: Display is made of the spectrums of the fluorescent X-rays by using the ordinate axis as representing the square root of a fluorescent X-ray intensity and using the abscissa axis as representing the energy of the fluorescent X-rays.
    Type: Grant
    Filed: April 22, 1998
    Date of Patent: November 28, 2000
    Assignee: Seiko Instruments, Inc.
    Inventor: Haruo Takahashi
  • Patent number: 6122343
    Abstract: A method and an apparatus for analyzing a material, such as coal and iron ore, particularly with a view to identifying contaminants, is disclosed. The method and apparatus are based on the use of multiple (particularly dual) energy x-ray analysis with x-rays at different photon energies. X-rays are transmitted through a material and the detected x-rays are processed to produce an image of the material that combines together the separated images produced by the different photon energy x-rays. The combined image has enhanced contrast which minimizes the affects of non-compositional factors that otherwise would affect identifying constituents of the material.
    Type: Grant
    Filed: February 23, 1998
    Date of Patent: September 19, 2000
    Assignee: Technological Resources Pty Limited
    Inventor: Andrea Gabrielle Pidcock
  • Patent number: 6115448
    Abstract: A high density semiconductor array for a scalable multislice computed tomography system is described. In one embodiment, the semiconductor array includes a plurality of photodiodes arranged in rows and columns. A scintillator array is optically coupled to the semiconductor array. Each photodiode creates a low level analog output signal representative of the light output of each scintillator. The semiconductor array enables selection of the number of slices of data to be electrically transmitted for each rotation of the CT system.
    Type: Grant
    Filed: November 26, 1997
    Date of Patent: September 5, 2000
    Assignee: General Electric Company
    Inventor: David M. Hoffman
  • Patent number: 6104781
    Abstract: An X-ray generator for powering an X-ray tube, has at least two electron sources for forming focal spots of different sizes at the same area of the anode. The resolution can be adapted to relevant requirements by associating each electron source with a respective control unit which produces an electron flow between the associated electron source and the anode, which flow is dependent on a control signal at a control input of the control unit, the two control units being activatable during an X-ray exposure and each control signal being adjustable, and hence also the ratio of the mAs products supplied by the electron sources.
    Type: Grant
    Filed: September 13, 1993
    Date of Patent: August 15, 2000
    Assignee: U.S. Philips Corporation
    Inventor: Franz Buchmann
  • Patent number: 6101239
    Abstract: A medical imaging apparatus comprises magnetic resonance imaging means (30) for obtaining a MR tomogram of an object to be examined, X-ray radiographic means (11,12,13) for obtaining a radiographic image of the object and imaging control means for controlling overall timings of application of magnetic fields and acquisition of the nuclear magnetic resonance signals in the MRI means and timing of X-ray emission in the X-ray radiographic means. In the medical imaging apparatus, MR imaging is carried out in parallel with X-ray radiography by controlling the timing of X-ray emission to be noncoincident with both the timing of application of magnetic fields and the timing of acquisition of NMR signals to obtain X-ray images and MR images both having approximately the same time phase.
    Type: Grant
    Filed: April 23, 1998
    Date of Patent: August 8, 2000
    Assignee: Hitachi Medical Corporation
    Inventors: Shinji Kawasaki, Shigeyuki Ikeda
  • Patent number: 6081580
    Abstract: A tomography system for analyzing an object concealed within an enveloping surface. The system has multiple beams of penetrating radiation, each beam disposed with a distinct orientation with respect to the enveloping surface. Detectors are provided for measuring radiation backscattered by the contents of the enveloping surface and for measuring radiation transmitted through the enveloping surface. The enveloping surface is moved with respect to the multiple beams, and a timer provides for measurement of a time difference between the appearance of features in signals of respective detectors, allowing geometrical characteristics of the features to be determined and displayed.
    Type: Grant
    Filed: September 8, 1998
    Date of Patent: June 27, 2000
    Assignee: American Science and Engineering, Inc.
    Inventors: Lee Grodzins, William L. Adams
  • Patent number: 6058160
    Abstract: An x-ray diffraction system for determining stress in integrated circuit materials includes a source of x-rays (3) that are directed toward a sample holding mechanism for diffracting from the test sample (8). An x-ray detector (14) is arranged for detecting high back reflected diffracted x-ray intensity data representing stress in the test sample. A two-dimensional detection and storage arrangement (24) is arranged for detecting and storing the data representing stress in the test sample. A data processor (2) accesses the stored data from the two-dimensional detection and storage arrangement and processes the data representing stress in the test sample to determine stress in the test sample.
    Type: Grant
    Filed: September 1, 1998
    Date of Patent: May 2, 2000
    Assignee: Hypernex, Inc.
    Inventor: David S. Kurtz
  • Patent number: 6058157
    Abstract: Apparatus for bone densitometry of the wrist is programmed to acquire data from a trapezoidal area (12, 14) of the radius (10) or ulna (11) positioned close to the end plate of the bone avoiding the densely cortical area and extending beyond the turning points bone density measurements on this region of interest show increased responsiveness to biphosphonate and certain other treatment regimes. Other regions of interest may be selected for monitoring still further treatment regimes.
    Type: Grant
    Filed: November 9, 1998
    Date of Patent: May 2, 2000
    Assignee: Osteometer MediTech A/S
    Inventors: Claus Christiansen, Annette M.o slashed.llgaard, Steen V.ae butted.rnholdt
  • Patent number: 6048096
    Abstract: An image-forming system for radiological imaging is described consisting of an intensifying screen comprising on a support at least one layer of a green-light emitting phosphor and, in operative association therewith, a prehardened light-sensitive photographic silver halide film material, comprising a support and on both sides thereof one or more hydrophilic colloid layers having monodisperse cubic silver chloroiodide grains with a mean crystal diameter of from 0.40 .mu.m up to 0.65 .mu.m or {111} tabular silver chloroiodide grains having an aspect ratio of from 5 to 20 and a tabularity from 20 to 200; wherein said grains have been spectrally sensitized in the green wavelength range and have been coated in a total amount of silver per sq.m. of from 6 g up to 8 g, expressed as an equivalent amount of silver nitrate per sq.m.; wherein in the image-forming system silver chloroiodide grains have been chemically sensitized with one or more selenide compound(s) generating silver selenide.
    Type: Grant
    Filed: February 24, 1998
    Date of Patent: April 11, 2000
    Assignee: Agfa-Gevaert, N.V.
    Inventors: Ann Verbeeck, Freddy Henderickx, Johan Loccufier, Peter Verrept
  • Patent number: 6048097
    Abstract: In a stationary or mobile C-arm X-ray examination device with isocentric shifting of the C-arm, including rotation around a rotational axis, in order to enable an exact positioning of the patient, a light source is provided at the X-ray examination device which emits a light beam in the direction of the isocenter. For at least one position of the C-arm, the light beam and the rotational axis are assured to coincide, so that the projection of the light beam in a patient correctly identifies the isocenter.
    Type: Grant
    Filed: April 22, 1998
    Date of Patent: April 11, 2000
    Assignee: Siemens Aktiengesellschaft
    Inventor: Udo Heinze
  • Patent number: 6047043
    Abstract: An X-ray examination apparatus includes an X-ray detector (1) for deriving an image signal from an X-ray image and an exposure control system (2) for adjustment of the X-ray examination apparatus. The exposure control system includes an arithmetic unit (4) for forming a histogram of brightness values of the X-ray image and for deriving therefrom an image component which relates mainly to brightness values representing relevant image information. The exposure control system is arranged to adjust the X-ray examination apparatus on the basis of the image component.
    Type: Grant
    Filed: April 16, 1998
    Date of Patent: April 4, 2000
    Assignee: U.S. Philips Corporation
    Inventor: Hubert A. J. Kamps
  • Patent number: 6047042
    Abstract: An exposure control system for radiographic, fluoroscopic, or other diagnostic imaging includes an exposure sensor array and a control element. The exposure sensor array has a plurality of sensor elements directed to defined locations uniformly distributed over the imaging field and may make direct or indirect measurements of exposure rate or imaging converter brightness. A structure or region of diagnostic interest to examining personnel is identified, and only sensors which correspond to locations within the area of interest are selected for use in exposure control. Predefined examination parameters suitable for particular anatomical patient regions are stored. Upon request by examining personnel to perform an examination of an anatomical patient region, the parameters are retrieved for use. The parameters include a preselection of sensors typically suitable for examinations of such region.
    Type: Grant
    Filed: March 25, 1998
    Date of Patent: April 4, 2000
    Assignee: Continental X-Ray Corporation
    Inventors: Oscar Khutoryansky, Thomas Rosevear, Yevgeniy Maltsev, Thomas Simak, Gregory Pasman, James A. Princehorn
  • Patent number: 6045262
    Abstract: A control apparatus for controlling movement of a table supporting an object under inspection in a medical diagnosis system includes a driving power unit for moving the table, a position detector for outputting a signal indicating a position of the table, a positioning servo-control unit for controlling the driving power unit so that the detected position signal coincides with a given desired value, a manipulating force detector for outputting a force signal corresponding to a manipulating force applied by an operator, a force-to-position conversion unit for converting the force signal into a position change quantity for the table, a force control unit for controlling the driving power unit in accordance with the position change quantity so long as the manipulating force is being detected, and a change-over unit for selecting either the positioning servo-control unit or the force control unit in response to operation of the operator.
    Type: Grant
    Filed: March 19, 1998
    Date of Patent: April 4, 2000
    Assignee: Hitachi Medical Corporation
    Inventors: Yoshikazu Igeta, Eiichi Makino, Mikio Mochitate, Hiroshi Abe, Takeshi Yano
  • Patent number: 6047040
    Abstract: A multi-slice or volumetric CT system has a 2D array of detector elements arranged in columns along the slice direction and rows along the in-slice direction. Channels in a digital acquisition system connect to the respective columns and a switch assembly is operated during a scan to sequentially enable detector elements in each column either one or two at a time. By enabling two elements at a time, the SNR of the acquired data is increased and the expected resolution loss in the slice direction is compensated for by detector wobbling.
    Type: Grant
    Filed: July 29, 1994
    Date of Patent: April 4, 2000
    Inventors: Hui Hu, Armin Horst Pfoh
  • Patent number: 6042267
    Abstract: A phosphor, an optical fiber plate containing lead particles, a CCD, and an X-ray shielding member consisting of copper tungsten are sequentially stacked on a substrate from an X-ray incident surface side and sealed in a container made of a light-shielding synthetic resin. The substrate has projecting portions projecting toward the direction of X-ray incident along three sides of the X-ray incident surface. Each of these projecting portions has an overhang portion projecting toward the optical fiber plate. The overhang portions are close to or in contact with corresponding side surfaces of the optical fiber plate so that the optical fiber plate is fixed at a predetermined position. The container has, in the inner surface, convex portions corresponding to the projecting portions, so the substrate is fixed in the container.
    Type: Grant
    Filed: April 8, 1998
    Date of Patent: March 28, 2000
    Assignees: Hamamatsu Photonics K.K., J. Morita Manufacturing Corporation
    Inventors: Tetsuhiko Muraki, Hitoshi Asai, Kazuhisa Miyaguchi, Akifumi Tachibana, Masakazu Suzuki, Susumu Kirimura
  • Patent number: 6044128
    Abstract: An X-ray imaging apparatus utilized in an imaging analysis apparatus that includes plural charge conversion devices for converting irradiated X-rays into electric charge and corresponding plural charge storage devices for storing the converted electric charge. Each charge conversion device and charge storage device represent a pixel in an image and are read by a thin film transistor. A thin film diode is connected to each charge storage device to discharge excessive stored voltage. The thin film diode has a Metal-Insulator-Metal (MIM structure), a Metal Semi-Insulator (MSI structure), or a Back-to-Back (BTB structure).
    Type: Grant
    Filed: February 4, 1998
    Date of Patent: March 28, 2000
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Manabu Tanaka, Mitsushi Ikeda, Kouhei Suzuki
  • Patent number: 6041100
    Abstract: An x-ray tube is disposed within an x-ray tube housing defining a chamber filled with oil or other cooling medium for cooling the x-ray tube. The x-ray tube includes an envelope enclosing an evacuated chamber in which an anode assembly is rotatably mounted to a bearing assembly and interacts with a cathode assembly for production of x-rays. The bearing assembly includes a bearing housing and a plurality of bearings disposed on a surface of the bearing housing. A heat sink is coupled to the bearing assembly and provides a thermally conductive path between the bearing assembly and the cooling medium in the x-ray tube housing for providing direct cooling of the bearing assembly during operation.
    Type: Grant
    Filed: April 21, 1998
    Date of Patent: March 21, 2000
    Assignee: Picker International, Inc.
    Inventors: Lester D. Miller, Mark S. Maska, Andrew R. Kaczmarek, Jr.
  • Patent number: 6041098
    Abstract: The present invention relates to X-ray devices for the investigation of material structure, density and geometry of reflected surfaces by measuring reflected, diffracted or scattered radiation. These X-ray optical devices are especially useful for measuring polished surfaces with large reflective areas which are used in the electronics and the computer industry (wafers, memory discs), high precision mechanics and optics. The present invention describes a device which increases the accuracy and efficiency in which X-ray reflectometry measurements can be made in different parts of the X-ray spectral region. The main technical advantages of the invention are a two-fold reduction in the ultimate error of angular measurements in different spectral regions, and a decrease in the random errors associated with the intensity measurements that are observed which are due in part to a drift in the electric parameters of the device.
    Type: Grant
    Filed: February 2, 1998
    Date of Patent: March 21, 2000
    Inventors: Alexander G. Touryanski, Alexander V. Vinogradov, Igor V. Pirshin
  • Patent number: 6041095
    Abstract: Apparatus for X-ray excitation of a sample, including a substantially stationary X-ray source and X-ray optics, including at least one secondary target and a movable element. The movable element has at least a first position wherein X-rays emitted by the source excite the sample directly, and a second position wherein X-rays emitted by the source strike the at least one secondary target, causing the secondary target to emit X-rays that excite the sample, while the X-rays emitted by the source are substantially prevented from exciting the sample.
    Type: Grant
    Filed: February 24, 1998
    Date of Patent: March 21, 2000
    Assignee: Jordan Valley Applied Radiation
    Inventor: Boris Yokhin