Patents Examined by Michelle M Iacoletti
  • Patent number: 12107396
    Abstract: A light-emitting device includes: a first light-emitting element array that includes plural first light-emitting elements arranged at a first interval; a second light-emitting element array that includes plural second light-emitting elements arranged at a second interval wider than the first interval, second light-emitting element array being configured to output a light output larger than a light output of the first light-emitting element array, and being configured to be driven independently from the first light-emitting element array; and a light diffusion member provided on an emission path of the second light-emitting element array.
    Type: Grant
    Filed: September 17, 2021
    Date of Patent: October 1, 2024
    Assignee: FUJIFILM Business Innovation Corp.
    Inventors: Takashi Kondo, Kenichi Ono, Daisuke Iguchi, Yoshinori Shirakawa, Tomoaki Sakita, Tsutomu Otsuka
  • Patent number: 12104954
    Abstract: An apparatus for detecting an ultraviolet blocking material includes a light receiver configured to acquire detection light from a target object; a spectrum signal generator configured to generate spectrum signals based on the detection light; and a processor configured to: select a reference wavelength from a range from about 290 nm to about 400 nm, and detect an ultraviolet blocking material based on a first spectrum signal of a first wavelength less than the reference wavelength and a second spectrum signal of a second wavelength greater than the reference wavelength, the first spectrum signal and the second spectrum signal being generated by the spectrum signal generator.
    Type: Grant
    Filed: June 21, 2022
    Date of Patent: October 1, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Suyeon Lee, Unjeong Kim, Hojung Kim
  • Patent number: 12098957
    Abstract: Disclosed are a colorimeter and a reflectivity measuring method based on a multichannel spectrum. The colorimeter includes a main unit and a calibration box, wherein the main unit includes an integrating sphere, a light source and a main sensor, a detection hole is formed in one side of a top of the integrating sphere, a light-through hole is formed in a side of the integrating sphere, and a measuring port is formed in a bottom of the integrating sphere, the light source is arranged outside the light-through hole, and the main sensor is arranged outside the detection hole; the calibration box includes a housing and a white board arranged at a top of the housing, the white board is correspondingly matched with the measuring port, and the calibration box is connected with the main unit; the sensor is a multichannel spectral sensor.
    Type: Grant
    Filed: March 15, 2022
    Date of Patent: September 24, 2024
    Assignee: CaiPu Technology (Zhejiang) Co., Ltd.
    Inventors: Kun Yuan, Yang Zhang, Jian Wang
  • Patent number: 12077880
    Abstract: Embodiments of the present disclosure generally relate to apparatus, systems, and methods for in-situ film growth rate monitoring. A thickness of a film on a substrate is monitored during a substrate processing operation that deposits the film on the substrate. The thickness is monitored while the substrate processing operation is conducted. The monitoring includes directing light in a direction toward a crystalline coupon. The direction is perpendicular to a heating direction. In one implementation, a reflectometer system to monitor film growth during substrate processing operations includes a first block that includes a first inner surface. The reflectometer system includes a light emitter disposed in the first block and oriented toward the first inner surface, and a light receiver disposed in the first block and oriented toward the first inner surface. The reflectometer system includes a second block opposing the first block.
    Type: Grant
    Filed: April 28, 2021
    Date of Patent: September 3, 2024
    Assignee: APPLIED MATERIALS, INC.
    Inventors: Zhepeng Cong, Nyi Oo Myo, Tao Sheng, Yong Zheng
  • Patent number: 12066433
    Abstract: Disclosed is an analytical method for analyzing a test substance contained in a measurement sample, the method comprising: generating a data set based on a plurality of optical spectra acquired from a plurality of locations in the measurement sample; inputting the data set into a deep learning algorithm having a neural network structure; and outputting information on the test substance, on the basis of an analytical result from the deep learning algorithm.
    Type: Grant
    Filed: March 4, 2022
    Date of Patent: August 20, 2024
    Assignees: SYSMEX CORPORATION, OSAKA UNIVERSITY, NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    Inventors: Masaya Okada, Yuki Shimaoka, Shigeki Iwanaga, Kazuki Bando, Katsumasa Fujita, Yasunori Nawa, Satoshi Fujita
  • Patent number: 12061192
    Abstract: A cholesterol measurement device includes a measuring instrument body; and a light-intensity check member mounted on and integrated with the measuring instrument body. The light intensity check member reflects light emitted from a light-emitting unit, allowing detecting abnormal light intensity and accurate assessing light intensity change, which prevents a measurement value change due to the change in light intensity and improves reliability of the measurement value. The device keeps a measurement unit clean all the time since the measurement unit can be easily cleaned by separating a strip fixation unit, when a specimen flows into the strip fixation unit in which a measurement strip is inserted.
    Type: Grant
    Filed: November 7, 2019
    Date of Patent: August 13, 2024
    Assignee: GREEN CROSS MEDICAL SCIENCE
    Inventors: Hyu Jeong Kim, Eun Myung Shin, Jung Sub Shin, Dong Han Kim, Soon Min Hong
  • Patent number: 12062583
    Abstract: An optical metrology model for in-line thickness measurements of a film overlying non-ideal structures on a substrate is generated by performing pre-measurements prior to deposition of the film and performing post-measurements after the deposition. The pre- and post-measurements are performed at at least one of multiple polarization angles or multiple orientations of the substrate. Differences in reflectance between the pre- and post-measurements are determined at the multiple polarization angles and the multiple orientations. At least one of the multiple polarization angles or the multiple orientations are identified where the differences in reflectance are indicative of a suppressed influence from the non-ideal structures. The optical metrology model is generated using the identified polarization angles and the identified orientations as inputs to a machine-learning algorithm.
    Type: Grant
    Filed: March 11, 2021
    Date of Patent: August 13, 2024
    Assignee: Applied Materials Israel Ltd.
    Inventors: Eric Chin Hong Ng, Edward Budiarto, Sergey Starik, Todd J. Egan
  • Patent number: 12061080
    Abstract: Disclosed herein is a method for validating parallelism of internal facets of a sample. The method includes: (i) providing a sample including a light transmissive substrate and internal facets, nominally parallel and nominally inclined at an angle ?nom relative to a flat surface of the sample; (ii) providing a prism having a substantially same refractive index as the substrate and including a flat, first surface and a flat, second surface, opposite to the first surface and inclined relative thereto at substantially the angle ?nom; (iii) positioning the sample and the prism, such that the surface of the sample is parallel and adjacent to the second surface of the prism; (iv) projecting on the first surface of the prism, substantially normally thereto an incident light beam; (v) sensing light returned from the prism following reflection off the internal facets; and (vi) computing deviation from parallelism between the internal facets.
    Type: Grant
    Filed: July 26, 2022
    Date of Patent: August 13, 2024
    Assignee: LUMUS LTD.
    Inventors: Jonathan Gelberg, Elad Sharlin, Eitan Ronen
  • Patent number: 12055803
    Abstract: Aspects of the present disclosure describe improved distributed acoustic sensing using dynamic range suppression of optical time domain reflectometry either by using a feedback loop comprising optical and electrical elements or using a nonlinear element in the electrical domain after coherent detection. When using a feedback loop, the amplitude of the periodic waveform of coherent OTDR can be inverted. This allows optical pre-compensation of the received optical signal before coherent detection with the goal of minimizing amplitude dynamic range. Alternatively, a nonlinear element in the electrical domain can reduce amplitude dynamic range before sampling by analog-to-digital converters (ADC).
    Type: Grant
    Filed: May 10, 2021
    Date of Patent: August 6, 2024
    Assignee: NEC Corporation
    Inventors: Ezra Ip, Yue-Kai Huang, Philip Ji, Shuji Murakami
  • Patent number: 12038311
    Abstract: A self-correcting assemblable optical fiber sensing system for a displacement field and a correction method thereof are provided. The system includes multiple assemblable flexible optical fiber sensing devices for measuring displacement field; multiple inclination angle self-sensing connection devices for connecting between assemblable flexible optical fiber sensing devices, and an optical fiber demodulation device for obtaining strain data of the assemblable flexible optical fiber sensing devices and two-axis inclination angle data of the inclination angle self-sensing connection devices, and correcting the displacement field measured by the assemblable flexible optical fiber sensing devices. The assemblable flexible optical fiber sensing devices are connected between the inclination angle self-sensing connection devices, and the optical fiber demodulation device is connected to a free end of the inclination angle self-sensing connection device.
    Type: Grant
    Filed: October 16, 2023
    Date of Patent: July 16, 2024
    Assignee: SHANDONG UNIVERSITY
    Inventors: Zhengfang Wang, Jing Wang, Qingmei Sui, Lei Jia
  • Patent number: 12030152
    Abstract: A method for checking a tool uses a device with a light emitter for beam emission for tool scanning and with a beam receiver for beam reception and for outputting a shadow signal; and an evaluation unit for processing the shadow signal; rotation of the tool; moving the tool until it reaches a starting position in which the blade dips into the beam and shades this such that a threshold of a range of the evaluation unit is reached or undershot; moving the tool, starting from the starting position, out of the beam and registering the shadow signal; ascertaining that the shadow signal for a cutting edge does not fall below the lower switching threshold or exceed the upper switching threshold such that a shadow signal lies above the lower and below the upper switching threshold; wherein the feed is determined in proportion to a measurement range.
    Type: Grant
    Filed: August 19, 2019
    Date of Patent: July 9, 2024
    Assignee: BLUM-NOVOTEST GMBH
    Inventors: Steffen Stauber, Bruno Riedter
  • Patent number: 12025499
    Abstract: Apparatus for determining a property of products, in particular plant or animal products, the apparatus comprising: a conveyor configured for conveying products one-by-one along a transport path in a transport direction; a light source configured for illuminating a first illumination area of the transport path, wherein the first illumination area extends substantially across the transverse width of the transport path; and a sensor structure configured for receiving light from a sensing area of the transport path, wherein the sensing area extends substantially across the transverse width of the transport path, wherein the sensing area is adjacent to the first illumination area.
    Type: Grant
    Filed: June 5, 2020
    Date of Patent: July 2, 2024
    Assignee: AWETA G&P B.V.
    Inventors: Johannes Cornelis De Geus, Valéry Jean Georges Quenon
  • Patent number: 12025493
    Abstract: A color measuring apparatus includes an opening portion that is provided in a bottom portion of the apparatus and takes light from a measurement target into the apparatus, an incident light processing unit that processes light that enters the apparatus through the opening portion, a housing that covers an apparatus internal unit including the incident light processing unit, at least one protrusion member that is configured to switch between a first state in which the protrusion member protrudes from a bottom surface of the housing and a second state in which the protrusion member does not protrude from the bottom surface of the housing, and at least one pressing member that presses the protrusion member in a protruding direction from the bottom surface of the housing.
    Type: Grant
    Filed: April 12, 2022
    Date of Patent: July 2, 2024
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Tatsuya Shirane
  • Patent number: 12025609
    Abstract: Methods, systems, and apparatus for generating a recipe for a concrete mixture, comprising: obtaining an optical characterization of a set of particles; determining, based on the optical characterization, physical characteristics of the set of particles; generating a multispherical approximation of the set of particles; selecting, based on the physical characteristics of the set of particles and from a database of performance rules, performance rules applicable to the set of particles; predicting performance of a proposed recipe for a concrete mixture formed from the set of particles by: determining a wet flowability rating of the proposed recipe based on the selected performance rules; and determining a dry packing rating of the proposed recipe based on the multispherical approximation; iteratively altering the proposed recipe and predicting performance of the altered proposed recipe until the predicted performance satisfies performance criteria to obtain a final recipe; and outputting the final recipe.
    Type: Grant
    Filed: June 5, 2023
    Date of Patent: July 2, 2024
    Assignee: X Development LLC
    Inventors: Antonio Raymond Papania-Davis, Weishi Yan
  • Patent number: 12019250
    Abstract: The system includes: a sample holder configured to hold a stained tissue sample; an objective positioned to gather and focus light from the stained tissue sample; and a white light source that produces unpolarized white light and a polarizing beam splitter that allows one polarization direction of the white light to pass through to form an illumination beam having a first polarization direction, which is directed through the objective and onto the stained tissue sample causing the stained tissue sample to remit light that passes back through the objective and into the polarizing beam splitter. The polarizing beam splitter divides the remitted light into two orthogonally polarized remitted light beams, wherein one of the beams provides an imaging beam, which has a second polarization direction that is substantially orthogonal to the first polarization direction. Finally, the system includes an imaging device, which captures the imaging beam.
    Type: Grant
    Filed: June 4, 2021
    Date of Patent: June 25, 2024
    Assignee: The Regents of the University of California
    Inventors: Farzad Fereidouni, Richard M. Levenson
  • Patent number: 12007250
    Abstract: A variable synthetic wavelength absolute distance measuring device locked to a dynamic sideband and a method thereof are disclosed. A high-frequency electro-optic phase modulator driven by an adjustable clock source to modulate a single-frequency reference laser to generate laser sidebands with equal frequency intervals. The tunable laser is locked to the fifth-order sideband through an offset frequency locking technology. After locking, the interval frequency of the sideband is determined by the adjustable clock source, namely dynamic sideband. The frequency of the adjustable clock source is dynamically adjusted, the interval frequency of the sideband and the frequency difference between the two lasers will change accordingly. Combined with the multi-wavelength interferometry, the constructed synthetic wavelength is also determined by the adjustable clock source, that is, the variable synthetic wavelength.
    Type: Grant
    Filed: August 7, 2020
    Date of Patent: June 11, 2024
    Assignee: ZHEJIANG SCI-TECH UNIVERSITY
    Inventors: Liping Yan, Jiandong Xie, Benyong Chen
  • Patent number: 12000771
    Abstract: A light irradiation device including an injection unit to inject a sample, and a light source to apply light to the sample to identify an abnormal cell in the sample, the light source including a substrate and a light emitter including a light emitting diode, in which the light emitted is to cut a genetic material in the sample into sections of different sizes, and to deform the genetic material to different degrees, such that a determination of an abnormality of the sample is based on the degree of deformation, and an irradiation amount or intensity of the light is at an intensity in which a cytotoxicity value of the sample is greater than or equal to a predetermined value, and a ratio of a degree of deformation of the genetic material of the normal sample to that of the abnormal sample is set to be a minimum value.
    Type: Grant
    Filed: July 27, 2020
    Date of Patent: June 4, 2024
    Assignee: Seoul Viosys Co., Ltd.
    Inventors: Hee Ho Bae, Yeong Min Yoon, A Young Lee
  • Patent number: 11977023
    Abstract: Provided is a spectrophotometric device including a base plate including a first surface to accommodate a sample thereon, a rotatable plate including a second surface corresponding to and spaced a certain distance apart from the first surface, a test beam radiator connected to the first surface through a first beam guide to radiate a test beam to the sample accommodated on a beam path between the first and second surfaces, a spectrophotometer connected to the second surface through a second beam guide to analyze spectroscopic properties of the sample by analyzing a characteristic beam having passed through the sample accommodated on the beam path, and a state determiner provided near the beam path to determine whether the sample accommodated between the first and second surfaces is in a state in which analysis of optical properties is enabled.
    Type: Grant
    Filed: September 24, 2020
    Date of Patent: May 7, 2024
    Assignee: MICRO DIGITAL CO., LTD.
    Inventor: Kyung Nam Kim
  • Patent number: 11977155
    Abstract: In a distance measurement apparatus, a light emitter emits pulse-like light. A light receiver receives reflected light of the emitted light and converts the received light to an electrical signal. An AD converter converts the electrical signal to a digital value at a predetermined sampling rate to generate a conversion data series. An interpolation processor upsamples the outputted conversion data series by inserting interpolation data therein to generate an up-data series. A distance calculator calculates a distance to an object that reflects light using a signal waveform indicated by the up-data series. The interpolation processor inserts the interpolation data having an interpolation value between pieces of data belonging to the conversion data series, and smooths the data series in which the interpolation data is inserted using a low-pass filter that has characteristics in which waveform distortion caused by ringing does not occur.
    Type: Grant
    Filed: August 12, 2020
    Date of Patent: May 7, 2024
    Assignee: DENSO CORPORATION
    Inventors: Tamotsu Mizuno, Mitsuo Nakamura
  • Patent number: 11971321
    Abstract: A system (100) and method can monitor a reflectance of a mirror target that includes at least one curved mirror (M). The system (100) can take a first irradiance measurement of the sun (S), the first irradiance measurement representing a direct solar irradiance. The system (100) can take a second irradiance measurement that represents an irradiance from a reflection of the sun (S) from the mirror target plus background irradiance from a reflection of the sky from the mirror target. The system (100) can take a third irradiance measurement that represents the background irradiance from the reflection of the sky from the mirror target. The system (100) can determine a reflectance of the mirror target from the first, second, and third irradiance measurements. The system (100) can compare the reflectance to a specified reflectance threshold, and, upon determining that the reflectance of the mirror target is less than the specified reflectance threshold, can generate an alert signal.
    Type: Grant
    Filed: May 22, 2019
    Date of Patent: April 30, 2024
    Assignee: Raytheon Company
    Inventor: Stephen J. Schiller