Patents Examined by Nasir U Ahmed
  • Patent number: 10359321
    Abstract: An integrated circuit and method are provided for accurately measuring the temperature of a die of the integrated circuit. Pairs of diodes are driven with different currents in order to generate a series of thermal voltages. The ADC measures the series of thermal voltages against an external reference voltage. Based on these thermal voltage measurements, the ADC calculates the die temperature. The different currents used to generate the series of thermal voltages are selected at specific ratios to each other in order to promote the ability of the ability of the ADC to calculate the die temperature using standard components and logic of an ADC. These thermal voltages are generated and measured using integrated components of the die for which a temperature measurement is being provided, thus reducing several sources of inaccuracies in conventional die temperature measurement techniques. Addition embodiments are provided for detecting defective diodes based on comparisons of the thermal voltage outputs.
    Type: Grant
    Filed: October 28, 2015
    Date of Patent: July 23, 2019
    Inventors: Dimitar Trifonov, Habib Sami Karaki
  • Patent number: 10352773
    Abstract: A sensor device includes a system carrier including at least a first planar support element and a second planar support element. The support elements are disposed in a mounting plane at a distance from one another. An integrated signal-processing component is disposed on the support elements. An encapsulation at least partially encloses the signal-processing component. At least two temperature sensors are integrated within the signal-processing component. Each of the temperature sensors is disposed in a vicinity of a respective one of the support elements.
    Type: Grant
    Filed: November 11, 2016
    Date of Patent: July 16, 2019
    Assignee: E+E ELEKTRONIK GES.M.B.H.
    Inventor: Albin Haider
  • Patent number: 10317285
    Abstract: A system for testing optical resolution of an optical device includes an optical resolution target assembly including a target that is heated. The target emits a first light beam at a first wavelength in response to being heated. The first light beam has first and second components that are discernible from one another when the target is heated. The system may also include an illuminator that emits light at a second wavelength that differs from the first wavelength onto the target. The target emits a second light beam having third and fourth components that are discernible from one another when the illuminator emits light at the second wavelength onto the target.
    Type: Grant
    Filed: July 13, 2015
    Date of Patent: June 11, 2019
    Assignee: The Boeing Company
    Inventor: Christopher D. Koresko
  • Patent number: 10309837
    Abstract: A measuring device, in particular for use in the process measurement technology, including a cylindrical sensor tip which includes a closed housing, a sensor element disposed within the housing in the form of a temperature dependent resistor and for generating a sensor signal, and electronic components, which are connected to the sensor element via electrical connecting lines and/or a conductor film, wherein said sensor element is thermally connected to the housing by means of a solder and a heat conducting, electrically insulating layer is disposed between the sensor element and the solder is provided.
    Type: Grant
    Filed: May 12, 2014
    Date of Patent: June 4, 2019
    Inventors: Sebastian Liehr, Stephan Reichart, Walter Reichart
  • Patent number: 10295490
    Abstract: A MEMS-based calorimeter includes a reference channel, a sample channel, and a thermopile configured to measure a temperature differential between the reference channel and a sample channel. The reference channel and the sample channel each include a passive mixer such as a splitting-and-recombination micromixer. The passive mixer can be formed by a first set of channels in a first layer and a second set of channels in a second layer. Methods for fabricating the MEMS-based calorimeter and methods of using the calorimeter to measure thermodynamic properties of chemical reactions are also provided.
    Type: Grant
    Filed: April 24, 2017
    Date of Patent: May 21, 2019
    Assignee: The Trustees of Columbia University in the City of New York
    Inventors: Yuan Jia, Zhixing Zhang, Qiao Lin
  • Patent number: 10295644
    Abstract: Embodiments relate to sensor systems and methods that can compensate for thermal EMF effects that can cause residual offset and other errors in sensor systems. In one embodiment, a sensor system comprises at least one temperature sensor arranged proximate a primary sensor element, e.g., a Hall plate in an embodiment in which the sensor system comprises a Hall-effect magnetic field sensing system, though other types of magnetic field and sensors more generally can be used in other embodiments. In another embodiment, a plurality of temperature sensors can be used, with each one arranged proximate a different sensor contact or element. In an example in which the Hall plate is operated according to a spinning operation scheme, the at least one temperature sensor can be configured to sense a temperature in each operating phase, and the individual sensed temperatures can be combined and used to provide a temperature-dependent compensation signal.
    Type: Grant
    Filed: May 3, 2017
    Date of Patent: May 21, 2019
    Assignee: Infineon Technologies AG
    Inventor: Udo Ausserlechner
  • Patent number: 10288496
    Abstract: Methods and circuits are disclosed for measuring temperature and/or voltage using ring oscillators. In an example implementation, temperature and/or voltage are determined using an iterative measurements of a ring oscillator. The ring oscillator oscillates with a different voltage-temperature response in each of the first, second and third modes. In each iteration, a first set of indications of frequency are determined for a ring oscillator in a first mode, a second mode, and a third mode. A coarse temperature estimate and a coarse voltage estimate of the ring oscillator are determined based on the indications of frequency measured in a first iteration. A more accurate temperature estimate and a more accurate voltage estimate of the ring oscillator are determined as a function of a second set of indications of frequency measured in a second iteration, the coarse temperature estimate, and the coarse voltage estimate.
    Type: Grant
    Filed: August 15, 2016
    Date of Patent: May 14, 2019
    Assignee: XILINX, INC.
    Inventors: James D. Wesselkamper, Frank C. Wirtz, II, Giulio Corradi, Jason J. Moore
  • Patent number: 10281337
    Abstract: A thermocouple that can stably perform direct temperature measurement under a high temperature environment (1500° C. or higher but 2300° C. or lower) and a manufacturing method for the same. A thermocouple according to a first embodiment is a thermocouple including at least a protective tube and element wires, the protective tube and the element wires are insulated from one another by an insulator, and the insulator is either one or both of a powder and a compact, and is composed of at least one of a zirconium oxide, a hafnium oxide, or a composite oxide of zirconium and hafnium.
    Type: Grant
    Filed: September 19, 2014
    Date of Patent: May 7, 2019
    Assignee: FURUYA METAL CO., LTD.
    Inventors: Tomohiro Maruko, Tomoaki Miyazawa, Atsushi Ito, Shoji Saito, Yasuhiro Sato
  • Patent number: 10261034
    Abstract: A heat flow distribution measurement device includes a sensor module having one multilayer substrate and a plurality of heat flow sensor portions arranged inside of the multilayer substrate. The multilayer substrate has one surface and another surface opposite to the one surface and includes a plurality of stacked insulating layers each formed of a thermoplastic resin. The heat flow sensor portions are each formed of thermoelectric conversion elements and are thermoelectrically independent. An arithmetic portion arithmetically determines a heat flow distribution based on an electromotive force generated in each of the heat flow sensor portions. The thermoelectric conversion elements are formed in the multilayer substrate and therefore manufactured by the same manufacturing process for manufacturing the multilayer substrate. This can minimize the performance difference between the individual thermoelectric conversion elements and allow the heat flow distribution to be measured with high precision.
    Type: Grant
    Filed: June 1, 2015
    Date of Patent: April 16, 2019
    Inventors: Yoshihiko Shiraishi, Atusi Sakaida, Norio Gouko, Toshihisa Taniguchi, Keiji Okamoto
  • Patent number: 10254172
    Abstract: A temperature sensor includes a temperature sensitive element, a sheath portion, a surrounding portion, and a holding member. This temperature sensor has a void formed forward of a temperature sensitive body. When the void is projected in an axial direction of the surrounding portion from a forward end side of the surrounding portion, the void contains at least a forward end surface of the temperature sensitive body.
    Type: Grant
    Filed: October 23, 2014
    Date of Patent: April 9, 2019
    Assignee: NGK SPARK PLUG CO., LTD.
    Inventors: Akio Mori, Tatsuya Suzuki, Toshinori Nishi, Seiji Oya, Toshiya Oya
  • Patent number: 10247625
    Abstract: The present invention relates to an apparatus for correcting a temperature sensing signal of an IGBT temperature sensing device which outputs only a temperature sensing signal having a voltage value equal to or higher than a preset voltage value, by using an output limiting diode. The apparatus includes: a calculating part configured to calculate a conduction current value of the output limiting diode by using the resistance of an NTC thermistor included in the IGBT temperature sensing device; a determining part configured to determine a drop voltage value of a voltage drop occurring in the output limiting diode based on the conduction current value; and a correcting part configured to correct the temperature sensing signal by increasing the voltage of the temperature sensing signal output from the IGBT temperature sensing device by the drop voltage value.
    Type: Grant
    Filed: November 14, 2016
    Date of Patent: April 2, 2019
    Assignee: LSIS CO., LTD.
    Inventors: Hong-Seok Kim, Jae-Moon Lee, Chun-Suk Yang
  • Patent number: 10247685
    Abstract: Disclosed herein are a high-temperature structure for measuring properties of a curved thermoelectric device, which is capable of precisely measuring the properties of a medium-temperature curved thermoelectric device that is applied to a tube-type waste heat source and is used in research, and a system and a method for measuring the properties using the same. The high-temperature structure may include a plurality of rod-shaped cartridge heaters, and a heating element having a surface that is a curved surface coming into contact with a lower end of the curved thermoelectric device, having a plurality of holes for accommodating the plurality of cartridge heaters, and directly heating the lower end of the curved thermoelectric device.
    Type: Grant
    Filed: July 26, 2016
    Date of Patent: April 2, 2019
    Inventors: Sang Hyun Park, Chung-Yul Yoo, Hong Soo Kim, Min Soo Suh, Dong Kook Kim, Byung jin Cho
  • Patent number: 10215647
    Abstract: Methods and systems accurately determine an analyte concentration in a fluid sample. In an example embodiment, a receiving port receives a test sensor. The test sensor includes a fluid-receiving area for receiving a fluid sample. The fluid-receiving area contains a reagent that produces a measurable reaction with an analyte in the fluid sample. The test sensor has a test-sensor temperature and the reagent has a reagent temperature. A measurement system measures the reaction between the reagent and the analyte. A temperature-measuring system measures the test sensor temperature when the test sensor is received into the receiving port. A concentration of the analyte in the fluid sample is determined according to the measurement of the reaction and the measurement of the test sensor temperature. A diagnostic system determines an accuracy of the temperature-measuring system. The calculation of the analyte concentration may be adjusted according to the accuracy of temperature-measuring system.
    Type: Grant
    Filed: December 14, 2017
    Date of Patent: February 26, 2019
    Inventors: Narasinha Parasnis, Hoi-Cheong Steve Sun, Mu Wu
  • Patent number: 10216237
    Abstract: The present disclosure describes one or more systems, methods, routines and/or techniques for thermal management. One or more systems, methods, routines and/or techniques may provide advice or guidance (e.g., to a repair technician) regarding how to perform a hot bond repair, for example, on an aircraft component that has been damaged. The thermal management advisor may provide advice or guidance regarding how to prepare a repair field prior to running a thermal survey. For example, thermal management advisor may recommend a particular heat blanket, a configuration of the heat blanket, placement of various temperature sensors and other preparation guidance. The thermal management advisor may provide advice or guidance regarding how to alter or manage the repair setup during a thermal survey and during the actual curing process. For example, thermal management advisor may recommend particular temperature sensors or areas of the repair field that should be insulated.
    Type: Grant
    Filed: October 2, 2017
    Date of Patent: February 26, 2019
    Assignee: The Boeing Company
    Inventors: Michael W. Evens, Joseph Lawrence Hafenrichter, Joel Patrick Baldwin, Ronald G. Turner, Megan N. Watson
  • Patent number: 10203288
    Abstract: A multi-functional precious stone testing apparatus includes a microcontroller, a measuring unit for measuring properties of the testing object, and a functional unit. The measuring unit is arranged to measure one of a combination of ultraviolet and infrared distributions of the testing object and a combination of thermal and electrical conductivities of the testing object. The microcontroller analyzes a result from the measuring unit to generate a test result of the testing object, wherein the microcontroller includes a communication unit for connecting with an electronic device to transmit the test result thereto. The functional unit includes a voice indicator that generates a voice indication signal of the test result.
    Type: Grant
    Filed: December 7, 2015
    Date of Patent: February 12, 2019
    Inventors: Xiuling Zhu, Gary Bruce Peckham
  • Patent number: 10197456
    Abstract: Systems and methods for measuring temperature in a gas turbine are disclosed. The method can include directing a first acoustic signal and a second acoustic signal towards a gas path in a turbine; receiving the first acoustic signal and the second acoustic signal at a downstream gas path location; combining the first acoustic signal and the second acoustic signal to create a combined acoustic signal, wherein the combined acoustic signal forms at least one of either a signal maxima or a signal minima; and based at least in part on the combined acoustic signal, determining a temperature of the gas path.
    Type: Grant
    Filed: August 5, 2016
    Date of Patent: February 5, 2019
    Assignee: General Electric Company
    Inventors: Eamon P. Gleeson, Fei Han
  • Patent number: 10183377
    Abstract: A method of standardizing a grinder burn etch test may include machining a test sample of substantially equivalent chemical composition and heat treatment to a manufactured part to be audited for grinder burn and receiving data on an expected range of thermal damage that may be caused on the manufactured part during grinding by grinder burn. The method may also include preparing the test sample by laser heat treating at least a portion of the test sample to create a range of thermal damage across predetermined areas on the test sample, wherein the range of thermal damage on the test sample encompasses the expected range of thermal damage that may be caused on the manufactured part during grinding by grinder burn. The method may still further include testing a grinder burn etch bath with the test sample to determine whether the etch bath can detect thermal damage across at least a threshold percentage of the expected range of thermal damage that may be caused on the manufactured part.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: January 22, 2019
    Assignee: Caterpillar Inc.
    Inventors: Jonathan Robert Crow, Trenton G. Jacobson
  • Patent number: 10175123
    Abstract: MEMS-based calorimeter including two microchambers supported in a thin film substrate formed on a polymeric layer is provided. The thin film substrate includes a thermoelectric sensor configured to measure temperature differential between the two microchambers, and also includes a thermally stable and high strength polymeric diaphragm. Methods for fabricating the MEMS-based calorimeter, as well as methods of using the calorimeter to measure thermal properties of materials, such as biomolecules, or thermodynamic properties of chemical reactions or physical interactions, are also provided.
    Type: Grant
    Filed: December 3, 2015
    Date of Patent: January 8, 2019
    Inventors: Qiao Lin, Bin Wang, Yuan Jia
  • Patent number: 10173492
    Abstract: A dispensing canister apparatus for controlled release of a stored fluid includes first and second thermochromic clips for providing a visual indication of the ambient air temperature; a hose member surrounding a channel and having first and second open ends, and the first open end being connected to the canister such that the channel is in fluid flow communication with the inner cavity; a control on the canister for selectively actuating the flow of the stored fluid from the inner cavity into the channel and through a coupler member at the second open end of the hose member; and wherein storage of the first thermochromic clip in the first receptacle positions the fastening member such that it obstructs movement of the control for actuating the flow of the stored fluid.
    Type: Grant
    Filed: November 23, 2016
    Date of Patent: January 8, 2019
    Assignee: TSI Products, Inc.
    Inventor: Michael E. Quest
  • Patent number: 10153185
    Abstract: Embodiments of the present disclosure generally provide apparatus and methods for monitoring one or more process parameters, such as temperature of substrate support, at various locations. One embodiment of the present disclosure provides a sensor column for measuring one or more parameters in a processing chamber. The sensor column includes a tip for contacting a chamber component being measured, a protective tube having an inner volume extending from a first end and second end, wherein the tip is attached to the first end of the protective tube and seals the protective tube at the first end, and a sensor disposed near the tip. The inner volume of the protective tube houses connectors of the sensor, and the tip is positioned in the processing chamber through an opening of the processing chamber during operation.
    Type: Grant
    Filed: February 7, 2014
    Date of Patent: December 11, 2018
    Inventors: Dale R. Du Bois, Bozhi Yang, Jianhua Zhou, Sanjeev Baluja, Amit Kumar Bansal, Juan Carlos Rocha-Alvarez