Abstract: An image processing device includes: an image sequence acquisition section that acquires an image sequence that includes a plurality of constituent images; and a processing section that performs an image summarization process that deletes some of the plurality of constituent images included in the image sequence to generate a summary image sequence, the processing section detecting an observation target area from each of the plurality of constituent images, selecting a reference image and a determination target image from the plurality of constituent images, calculating deformation information about a deformation estimation target area included in the reference image and the deformation estimation target area included in the determination target image, and determining whether or not the determination target image can be deleted based on the observation target area included in the reference image, the observation target area included in the determination target image, and the deformation information.

Abstract: A server is configured to identify items of visual content; assign the identified items to clusters; assign the identified items, of a particular cluster, to layers; generate a document that includes information regarding the identified items arranged according to the clusters and the layers; and provide the document. The document may include, for the particular cluster, a first item, corresponding to one of the identified items assigned to a first layer, and second items, corresponding to multiple ones of the identified items assigned to a second layer. The size of the first item may be greater than a size of each of the second items. The first item may be presented on top of the second items, within the document, to at least partially cover the second items, where at least one of the second items is at least partially visible within the document.

Abstract: Apparatus and methods for inspecting a specimen are disclosed. An inspection tool is used at one or more operating modes to obtain images of a plurality of training regions of a specimen, and the training regions are identified as defect-free. Three or more basis training images are derived from the images of the training regions. A classifier is formed based on the three or more basis training images. The inspection system is used at the one or more operating modes to obtain images of a plurality of test regions of a specimen. Three or more basis test images are derived from to the test regions. The classifier is applied to the three or more basis test images to find defects in the test regions.

Abstract: A method for biometrical identification of a user includes receiving, as an input, biometrical properties of a user, and encoding the biometrical properties. The encoded biometrical properties are checked with corresponding provided biometrical user information, Based on a result of the check, the user is identified and a response of the identification is outputted. Prior to encoding, the biometrical properties are encrypted, The encoded biometrical properties are provided as a biometrical challenge. The biometrical challenge is decrypted for performing the check. A verification of the response is provided for.

Abstract: Disclosed is an image processing device that includes: a storage unit that holds model information including information indicating a plurality of feature points of a detection object; a correspondence-relationship determination unit that extracts a plurality of feature points included in an input image as a two-dimensional image or a three-dimensional image and that determines a correspondence relationship between an extracted plurality of feature points and a plurality of feature points of the model information; and a position estimating unit that estimates, based on the correspondence relationship, one or a plurality of second positions of the input image corresponding to one or a plurality of first positions set relatively to the detection object. The one or plurality of first positions is included in a point, a line, or a region.

Abstract: A plurality of processes for emphasizing a stereoscopic effect of an image is supposed and a plurality of stereoscopic effect emphasis processes is integrated in a mode suitable for the image. An image processing device is provided with a stereoscopic effect emphasis processing unit and an integration processing unit. The stereoscopic effect emphasis processing unit executes a plurality of stereoscopic effect emphasis processes on an input image. The integration processing unit integrates results of a plurality of stereoscopic effect emphasis processes according to an integration coefficient used when a plurality of stereoscopic effect emphasis processes is integrated obtained by analyzing the input image. This may be further provided with an image analyzing unit which analyzes the input image to generate the integration coefficient used when a plurality of stereoscopic effect emphasis processes is integrated.

Abstract: There is provided an image processing method including acquiring an original image and a disparity map, the disparity map indicating distribution of disparity values associated with respective pixels in the original image, causing a processor to decide a dynamic range of disparity on the basis of the acquired original image and the acquired disparity map, and converting the disparity map in a manner that each disparity in the disparity map is distributed within the decided dynamic range of the disparity.

Abstract: The invention provides a method for iris based biometric recognition. The method includes receiving an image from an image sensor and determining whether the received image includes an iris. The steps of receiving and determining are repeated until the received image includes an iris. Responsive to determining that a received image includes an iris, iris information corresponding to such received image is compared with stored iris information corresponding to at least one iris and a match decision or a non-match decision is rendered based on an output of the comparison. The invention additionally provides a system and computer program product configured for iris based biometric recognition.

Abstract: Image inspecting apparatus compares first image data created as data representing a reference-image acting as an inspecting reference with second image data created as data representing an inspection-image acting as a target to automatically extract a difference point between first and second image data, and includes a storage means for the reference- and inspection-image, an image processing means for establishing correspondences between part of stored reference-image as first image data with part of stored target image as second image data at a pixel level to perform an image matching processing of them, a difference detecting means for comparing image-matched first and second image data to detect a difference between first and second image data, image producing means for comparing difference with a plurality of threshold values to produce error representing image data at each threshold value, and inspecting process using produced error representing image data at each threshold value.

Abstract: A method is performed to refocus a digital photographic image comprising a plurality of pixels. In the method, a set of images is computed corresponding to the digital photographic image and focused at different depths. Refocus depths for at least a subset of the pixels are identified and stored in a look-up table. At least a portion of the digital photographic image is refocused at a desired refocus depth determined from the look-up table.

Abstract: A reference density profile is generated in an outer circumference direction of a pipe having a reference welded portion on the basis of a reference fluoroscopic image generated from a radiation detection medium when a radiation source is disposed on a central axis of the pipe. A weld inspection density profile is generated in an outer circumference direction of a pipe having an inspection target welded portion on the basis of a weld inspection fluoroscopic image. On the basis of the reference density profile and the weld inspection density profile, density correction information is calculated. The density correction information is for correcting density irregularities in the weld inspection fluoroscopic image in the outer circumference direction of the pipe. On the basis of the density correction information, the density irregularities in the weld inspection fluoroscopic image are corrected.

Abstract: Image inspecting apparatus compares first image data created as data representing a reference-image acting as an inspecting reference with second image data created as data representing an inspection-image acting as a target to automatically extract a difference point between first and second image data, and includes a storage means for the reference-and inspection-image, an image processing means for establishing correspondences between part of stored reference-image as first image data with part of stored target image as second image data at a pixel level to perform an image matching processing of them, a difference detecting means for comparing image-matched first and second image data to detect a difference between first and second image data, image producing means for comparing difference with a plurality of threshold values to produce error representing image data at each threshold value, and inspecting process using produced error representing image data at each threshold value.

Abstract: Methods, systems, and computer-readable media related to a technique for providing handwriting input functionality on a user device. A handwriting recognition module is trained to have a repertoire comprising multiple non-overlapping scripts and capable of recognizing tens of thousands of characters using a single handwriting recognition model. The handwriting input module provides real-time, stroke-order and stroke-direction independent handwriting recognition. User interfaces for providing the handwriting input functionality are also disclosed.

Abstract: An estimator training method and a pose estimating method using a depth image are disclosed, in which the estimator training method may train an estimator configured to estimate a pose of an object, based on an association between synthetic data and real data, and the pose estimating method may estimate the pose of the object using the trained estimator.

Abstract: Apparatus and methods for inspecting a photolithographic reticle are disclosed. A reticle inspection tool is used at one or more operating modes to obtain images of a plurality of training regions of a reticle, and the training regions are identified as defect-free. Three or more basis training images are derived from the images of the training regions. A classifier is formed based on the three or more basis training images. The inspection system is used at the one or more operating modes to obtain images of a plurality of test regions of a reticle. Three or more basis test images are derived from to the test regions. The classifier is applied to the three or more basis test images to find defects in the test regions.

Abstract: There is provided a defect inspection method capable of detecting a crack with high accuracy. The defect inspection method includes the steps of: obtaining a shot image comprising pixels; and scanning the shot image in predetermined directions, and assigning a high evaluation value to a pixel M for each scanning direction when the luminance of the pixel M is lower than the luminances of first adjacent pixels K, O, located on both sides of the pixel M in the scanning direction and, in addition, the luminance of each of second adjacent pixels C, W, located on both sides of the pixel M in a direction perpendicular to the scanning direction, is lower than the luminances of third adjacent pixels A, E or U, Y located on both sides of the second adjacent pixel in the scanning direction.

Abstract: Apparatus, systems, and methods fusing material classification with spatio-spectral edge detection in spectral imagery can be used in a variety of applications. In various embodiments, a classifier can be applied to neighboring pixels in data for an image to determine, based on material changes, if the neighboring pixels are correlated to two different materials with respect to a candidate location for an edge. Results of the classification can be used with a spatio-spectral mask to accept or reject the candidate location as an edge. Additional apparatus, systems, and methods are disclosed.

Abstract: A method and an apparatus for detecting and removing a false contour, a method and an apparatus for verifying whether a pixel is included in a contour, and a method and an apparatus for calculating simplicity are provided. The method for detecting and removing the false contour includes: verifying whether a pixel of an input video is included in a contour; calculating simplicity of the pixel; determining whether the pixel is included in a false contour based on the simplicity and based on whether the pixel is included in the contour; and removing the false contour from the input video via smoothing with respect to the false contour.

Abstract: A machine vision system includes a computer with one or more processors and software that has a plurality of tool routines each performing a different image analysis function. A machine vision application program is created by selecting certain ones of the plurality of tool routines to analyze the image. A maximum number of processors on the computer is designated as available for executing a machine vision application, wherein the maximum number may be less than the total number of processors on the computer. When the machine vision application program operates execution of each tool routine is limited to using simultaneously no more than the maximum number of processors.

Abstract: Method of measuring a point cloud of an object includes obtaining the point cloud of the object from a storage device of the electronic device. Based on the point cloud, a triangular mesh surface is constructed and triangles of the triangular mesh surface are determined. According to the triangles, a reference plane is determined. According to the reference plane, a three dimensional (3D) object coordinate system is established. 3D object coordinates of points in the point cloud are calculated in the 3D object coordinate system. Measurement elements of a profile of the point cloud are determined and points in the point cloud corresponding to each of the measurement elements are determined. According to the 3D object coordinates of the determined points corresponding to each of the measurement elements, each of the measurement elements are fit. A distance and an angle of two fit measurement elements are calculated.