Patents Examined by Nikita Wells
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Patent number: 9035236Abstract: A method is proposed herein to detect high atomic number materials, such as Special Nuclear Materials, within a container based on muon tomography. The container is modeled as a plurality of volume elements. Information related to an initial trajectory and a final trajectory of each muon passing through the container is received. Additionally, a set of initial outer prong vectors and a set of final outer prong vectors are created. Then, a plurality of vector combinations are created from a selected initial vector and a selected final vector. A metric is determined and associated with each vector combination. A subset of the plurality of vector combinations is associated with each volume element and an estimated scattering density is determined and assigned to the volume element. Based on the estimated scattering density assigned to the volume elements, a three dimensional image of the container may be generated.Type: GrantFiled: June 7, 2012Date of Patent: May 19, 2015Assignee: Atomic Energy of Canada LimitedInventors: Vinicius Anghel, Guy Jonkmans, Cybele Jewett, Martin Thompson
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Patent number: 9031201Abstract: An X-ray imaging apparatus includes: an X-ray source including an electron source and a target, the target having a plurality of projections, each having an emitting surface; a diffraction grating configured to diffract X rays emitted from the X-ray source; and a detector configured to detect the X rays diffracted by the diffraction grating. Electron beams output from the electron source are incident on the emitting surfaces so that X rays are emitted from the emitting surfaces and are output to the diffraction grating. The X rays emitted from the emitting surfaces are diffracted by the diffraction grating so as to form a plurality of interference patterns. The projections are arranged such that bright portions of the interference patterns overlap each other and such that dark portions thereof overlap each other. Distances from the emitting surfaces to the diffraction grating are equal to each other.Type: GrantFiled: June 20, 2011Date of Patent: May 12, 2015Assignee: Canon Kabushiki KaishaInventor: Genta Sato
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Patent number: 9018596Abstract: A device for imparting an orbital angular momentum to a charged particle wave propagating along a beam axis in a charged particle beam generating apparatus is described. The device comprises a support element having a target region adapted for transmitting a charged particle wave propagating along a beam axis and an induction means for inducing a magnetic flux along an elongated profile having a free end portion located in the target region and the induction means is adapted for providing a magnetic flux in the elongated profile in order to induce an angular gradient, relative to the beam axis, of the phase of the charged particle wave when transmitted through the target region. A corresponding method is also disclosed, as well as the use thereof in electron microscopy.Type: GrantFiled: December 19, 2012Date of Patent: April 28, 2015Assignee: Universiteit AntwerpenInventors: Johan Verbeeck, Gustaaf Van Tendeloo
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Patent number: 9012839Abstract: A method of operating a mass spectrometer vacuum interface comprising a skimmer apparatus having a skimmer aperture and downstream ion extraction optics. An expanding plasma is skimmed through the skimmer aperture. Within the skimmer apparatus, a portion of the skimmed plasma adjacent the skimmer apparatus is separated from the remainder of the skimmed plasma by providing means to prevent, inhibit or impede, the separated portion from reaching the extraction optics while allowing the remainder to expand towards the extraction optics. This allows removal of ions liberated from deposition matter on the skimmer apparatus surface, thereby discriminating against such ions, and offering reduced memory effects. The remainder of the plasma can expand towards the extraction optics, so interaction and mixing between the boundary layer and the remainder of the plasma can be reduced or minimized.Type: GrantFiled: December 12, 2012Date of Patent: April 21, 2015Assignee: Thermo Fisher Scientific (Bremen) GmbHInventors: Alexander Alekseevich Makarov, Lothar Rottmann
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Patent number: 9014340Abstract: A radiation tomography system is provided. The radiation tomography system includes a radiation source configured to rotate around a subject and apply radiation to the subject, a plurality of radiation detecting elements disposed opposite the radiation source, a plurality of collimator plates partitioning the radiation detecting elements in a channel direction, the collimator plates erected such that plate surfaces of each of the plurality of collimator plates extend along a direction of radiation from the radiation source, and an aperture-width changing unit configured to change a width of each aperture formed by the plurality of collimator plates by moving a plurality of radiation absorbing members along respective end sides of the collimator plates close to the radiation source, the plurality of radiation absorbing members moveable between a first position at which the end sides are covered and a second position at which the end sides are exposed.Type: GrantFiled: December 20, 2012Date of Patent: April 21, 2015Assignee: GE Medical Systems Global Technology Company, LLCInventor: Haruo Kurochi
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Patent number: 9012874Abstract: An ion implantation system and process, in which the performance and lifetime of the ion source of the ion implantation system are enhanced, by utilizing isotopically enriched dopant materials, or by utilizing dopant materials with supplemental gas(es) effective to provide such enhancement.Type: GrantFiled: July 22, 2014Date of Patent: April 21, 2015Assignee: Entegris, Inc.Inventors: Robert Kaim, Joseph D. Sweeney, Anthony M. Avila, Richard S. Ray
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Patent number: 9012867Abstract: Ion sources, systems and methods are disclosed.Type: GrantFiled: May 23, 2014Date of Patent: April 21, 2015Assignee: Carl Zeiss Microscopy, LLCInventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
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Patent number: 9006650Abstract: Apparatus and methods for performing mass spectrometry of a nanoparticle or virus analyte. Apparatus may include a laser desorption plate, a mass analyzer configured to measure mass over the range of m/z from 105 to 1010, an electrical shield surrounding the mass analyzer, and a charge sensitive detector, wherein the laser firing is phase lock synchronized with the applied radiofrequency voltages.Type: GrantFiled: May 10, 2014Date of Patent: April 14, 2015Assignee: Academia SinicaInventors: Chung-Hsuan Chen, Jung-Lee Lin, Huan Chang Lin
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Patent number: 9006680Abstract: A solution for disinfecting flowable products, such as liquids, suspensions, creams, colloids, emulsions, powders, and/or the like, as well as accessories and products relating thereto, such as containers, caps, brushes, applicators, and/or the like, using ultraviolet radiation is provided. In an embodiment, an ultraviolet impermeable cap is configured to enclose a volume corresponding to a flowable product. At least one ultraviolet radiation source can be mounted on the cap and be configured to generate ultraviolet radiation for disinfecting the enclosed area. The ultraviolet radiation source can be configured to only generate ultraviolet radiation when the volume is enclosed by the ultraviolet impermeable cap.Type: GrantFiled: March 18, 2014Date of Patent: April 14, 2015Assignee: Sensor Electronic Technology, Inc.Inventors: Timothy James Bettles, Alexander Dobrinsky, Michael Shur, Remigijus Gaska
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Patent number: 9006681Abstract: A process of preparing a lamella from a substrate includes manufacturing a protection strip on an edge portion of the lamella to be prepared from the substrate, and preparing the lamella, wherein the manufacturing the protection strip includes a first phase of activating a surface area portion of the substrate, and a second phase of electron beam assisted deposition of the protective strip on the activated surface area portion from the gas phase.Type: GrantFiled: March 10, 2014Date of Patent: April 14, 2015Assignee: Carl Zeiss Microscopy GmbHInventors: Heinz Wanzenboeck, Wolfram Buehler, Holger Doemer, Carl Kuebler, Daniel Fischer, Gottfried Hochleitner, Emmerich Bertagnolli
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Patent number: 9000363Abstract: The present invention provides a radio frequency (RF) power supply in a mass spectrometer. The power supply provides an RF signal to electrodes of a storage device to create a trapping field. The RF field is usually collapsed prior to ion ejection. In an illustrative embodiment the RF power supply includes a RF signal supply; a coil arranged to receive the signal provided by the RF signal supply and to provide an output RF signal for supply to electrodes of an ion storage device; and a shunt including a switch operative to switch between a first open position and a second closed position in which the shunt shorts the coil output.Type: GrantFiled: November 7, 2013Date of Patent: April 7, 2015Assignee: Thermo Finnigan LLCInventors: Alexander A. Makarov, Eduard V. Denisov, Alexander Kholomeev
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Patent number: 9001962Abstract: The present invention pertains to an apparatus and method for medical imaging comprising rotating two X-ray source-detector pairs around an axis of rotation simultaneously to quickly acquire image data and form a computed tomography (CT) dataset. The sources can be configured to emit radiation from a plurality of discrete locations. The CT dataset can be utilized as a prior to reconstruct a three-dimensional image from subsequent bi-planar imaging with these source-detector pairs.Type: GrantFiled: December 20, 2012Date of Patent: April 7, 2015Assignee: Triple Ring Technologies, Inc.Inventor: Tobias Funk
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Patent number: 8993982Abstract: A switchable ion gun switchable between a cluster mode setting for producing an ion beam substantially comprising ionised gas clusters and an atomic mode setting for producing an ion beam substantially comprising ionised gas atoms, comprising: a source chamber having a first gas inlet; a gas expansion nozzle for producing gas clusters in the presence of gas atoms by expansion of a gas from the source chamber through the nozzle; an ionisation chamber for ionising the gas clusters and gas atoms; wherein the ionisation chamber has a second gas inlet for admitting gas directly into the ionisation chamber to form ionised gas atoms; and a variable mass selector for mass selecting the ionised gas clusters and ionised gas atoms to produce an ion beam variable between substantially comprising ionised gas clusters and substantially comprising ionised gas atoms.Type: GrantFiled: July 15, 2013Date of Patent: March 31, 2015Assignee: VG Systems LimitedInventor: Bryan Barnard
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Patent number: 8987663Abstract: An ion inlet for a mass spectrometer is disclosed comprising a housing having a sampling orifice and an atmospheric pressure orifice. One or more gas outlets are provided in the housing. Gas is drawn through the sampling orifice by a pump so that the gas exits via the one or more gas outlets.Type: GrantFiled: June 1, 2012Date of Patent: March 24, 2015Assignee: Micromass UK LimitedInventors: David Gordon, Daniel James Kenny, Steven Derek Pringle
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Patent number: 8989347Abstract: A phase retrieval method for differential phase contrast imaging includes receiving data corresponding to a differential phase image generated from a measured signal. The measured signal corresponds to an X-ray signal detected by a detector after passing through a subject located with a grating arrangement between an X-ray source and the detector. The method further includes generating a phase image corresponding to the integration of the differential phase image. Generating the phase image includes performing an iterative total variation regularized integration in the Fourier domain.Type: GrantFiled: December 19, 2012Date of Patent: March 24, 2015Assignee: General Electric CompanyInventors: Jonathan Immanuel Sperl, Dirk Wim Jos Beque
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Patent number: 8989346Abstract: From radiation images obtained by driving radiation tube with a plurality of tube voltages, including a normal tube voltage, a density gradient with respect to at least two sections of a reference substance having different radiation transmission characteristics is obtained for each of the plurality of tube voltages prior to obtaining a bone mineral density. If a radiation image captured for obtaining a bone mineral density is determined to have been captured under a tube voltage other than the normal tube voltage, an image signal representing the image and/or a bone mineral density analysis result is corrected so as to correspond to that which should have been obtained if the image had been captured under the normal tube voltage based on the relationship between the density gradient in the image and the density gradient in the radiation image captured under the normal tube voltage.Type: GrantFiled: December 20, 2012Date of Patent: March 24, 2015Assignee: FUJIFILM CorporationInventor: Kenji Yoshikawa
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Patent number: 8989344Abstract: A system and a method for measuring an ash content and a calorific value of a coal are provided. The system comprises: an X ray device, disposed over the coal and configured to emit an X ray to the coal; at least one X ray measuring device, disposed over the coal and configured to measure an energy spectrum of an X ray reflected by the coal; a distance sensor, disposed over the coal and configured to measure a distance between the coal and the at least one X ray measuring device; and a computing device, configured to receive the energy spectrum and the distance from the at least one X ray measuring device and the distance sensor and to compute the ash content and the calorific value of the coal according to the energy spectrum and the distance.Type: GrantFiled: December 20, 2012Date of Patent: March 24, 2015Assignee: Tsinghua UniversityInventors: Hongchang Yi, Qian Lin, Jianping Cheng
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Patent number: 8987682Abstract: A specimen positioning device (100) is for use in or with a charged particle beam system having a specimen chamber (1) and has: a base (10) provided with a hole (12) in operative communication with the specimen chamber (1); a specimen holder (20) movably mounted in the hole (12) and having a first portion (22) and a second portion (24); and a first portion support portion (40) supporting the first portion (22) in the specimen chamber (1). The second portion (24) supports the first portion (22) via a resilient member (34).Type: GrantFiled: December 10, 2013Date of Patent: March 24, 2015Assignee: JEOL Ltd.Inventor: Mitsuru Hamochi
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Patent number: 8981289Abstract: The present invention relates to an ultraviolet diode and an atomic mass analysis ionization source collecting device using an MCP. In the manufacturing of a portable atomic mass analyzer, an object of the present invention is to use an MCP electron multiplier plate, whereby ultraviolet photons emitted from an ultraviolet diode are irradiated on a front surface plate of the MCP electron multiplier plate to induce primary electrons, an amplified electron beam is collected from the electrons, and an electron beam is generated at a low temperature and low power and having a discharge time that is accurately controlled.Type: GrantFiled: December 16, 2011Date of Patent: March 17, 2015Assignee: Korea Basic Science InstituteInventors: Seung Yong Kim, Mo Yang, Hyun Sik Kim
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Patent number: 8981290Abstract: Apparatus and methods are provided that enable the interaction of low energy electrons and positrons with sample ions to facilitate electron capture dissociation (EGO) and positron capture dissociation (PGO), respectively, within multipole ion guide structures.Type: GrantFiled: March 28, 2014Date of Patent: March 17, 2015Assignee: PerkinElmer Health Sciences, Inc.Inventors: Craig M. Whitehouse, David G. Welkie, Gholamreza Javahery, Lisa Cousins, Sergey Rakov