Patents Examined by Raul J Rios Russo
  • Patent number: 11181393
    Abstract: By configuring an encoder scale as a varying scale with successively increasing or decreasing pitch, sensors in a travel path of the scale can detect a phase difference to determine an absolute position of the scale for use in an industrial control system. Due to the successively increasing or decreasing pitch, each sensor can detect successively increasing or decreasing properties (such as magnetic fields) from the scale in a uniquely identifiable pattern. By taking the difference between readings of adjacent sensors, each sensor detecting properties of the scale, an absolute position of the scale between the sensors can be determined. The principle for feedback for the encoder system is analogous to a Nonius or Vernier principle to determine absolute position.
    Type: Grant
    Filed: April 14, 2020
    Date of Patent: November 23, 2021
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Peter M. Smit, Xikai Sun, Jadav Das
  • Patent number: 11175331
    Abstract: An aging detector for an electrical circuit component and a method for monitoring an aging of a circuit component includes an input of the aging detector recording a parameter of the circuit component, with the aging circuit being configured to, based on the recorded parameter, determine a corresponding response threshold and/or a response or adapt the response threshold and/or the response, and to initiate the response to the parameter exceeding the specific response threshold.
    Type: Grant
    Filed: January 18, 2017
    Date of Patent: November 16, 2021
    Assignee: Robert Bosch GmbH
    Inventors: Daniel Schneider, Franz Dietz
  • Patent number: 11175333
    Abstract: A process and system for testing includes: arranging devices in a temperature-controlled environment; applying a negative gate bias voltage (Vgs) to the devices; applying a drain voltage (Vds) to the devices; measuring currents and/or voltages of the devices to generate device test data; determining a failure of one or more of the devices based on the device test data generated from the device currents and/or the voltages to generate failure data; and outputting the failure data for the of devices.
    Type: Grant
    Filed: March 2, 2020
    Date of Patent: November 16, 2021
    Assignee: CREE, INC.
    Inventors: Daniel Jenner Lichtenwalner, Satyaki Ganguly
  • Patent number: 11169097
    Abstract: An apparatus for non-destructive testing of a sample includes a sample holder configured to contain or support the sample; an exciter configured to generate an oscillating electromagnetic field across the sample that operates with at least one predetermined excitation frequency; a receiver configured to detect harmonic electromagnetic signals resulting from induced electromagnetic fields oscillating with at least one frequency that is not equal to the at least one predetermined excitation frequency; a recorder configured to record the harmonic electromagnetic signals; and a processor programmed to construct an induced harmonic electromagnetic spectrum based on the harmonic electromagnetic signals.
    Type: Grant
    Filed: December 23, 2019
    Date of Patent: November 9, 2021
    Assignee: New York University
    Inventors: Daniel K. Sodickson, Martijn Anton Hendrik Cloos
  • Patent number: 11169013
    Abstract: A system (800) for determining frequency spacings to prevent intermodulation distortion signal interference is provided. The system (800) includes a sensor assembly (810) and a meter verification module (820) communicatively coupled to the sensor assembly (810). The meter verification module (820) is configured to determine a frequency of a first signal to be applied to a sensor assembly (810) of a vibratory meter and set a demodulation window about the frequency of the first signal. The meter verification module (800) is also configured to determine a frequency of the second signal to be applied to the sensor assembly such that a frequency of an intermodulation distortion signal generated by the first signal and the second signal is outside the demodulation window.
    Type: Grant
    Filed: June 14, 2017
    Date of Patent: November 9, 2021
    Assignee: Micro Motion, Inc.
    Inventors: Matthew Joseph Rensing, Timothy J. Cunningham
  • Patent number: 11162887
    Abstract: A metal plate corrosion sensing apparatus includes a conduit, and an electrical resistance probe mounted within the conduit, the electrical resistance probe configured to receive an electrical signal indicating a thickness of the metal plate, wherein the conduit comprises a plurality of slots configured to simulate an air/soil interface by permitting fluid access to the electrical resistance probe within the conduit through the slots.
    Type: Grant
    Filed: July 23, 2019
    Date of Patent: November 2, 2021
    Assignee: Saudi Arabian Oil Company
    Inventors: Faisal M. Al-Abbas, Mohammed Y. Salloum, Ala'a Edin M. Salameh
  • Patent number: 11162981
    Abstract: A magnetic field transducer mounting apparatus can include a first mount configured to fixedly couple to a side surface of a wafer test fixture magnet, and a second and third mount configured to adjustably position a magnetic field transducer in a predetermined location proximate a face of the wafer test fixture magnet.
    Type: Grant
    Filed: January 30, 2020
    Date of Patent: November 2, 2021
    Assignee: Integrated Silicon Solution, (Cayman) Inc.
    Inventors: Danny Yam, Jorge Vasquez, Georg Wolf, Roberto Cordero
  • Patent number: 11163017
    Abstract: A monitoring system includes an array of optical sensors disposed within a transformer tank. Each optical sensor is configured to have an optical output that changes in response to a temperature within the transformer tank. An analyzer is coupled to the array of optical sensors. The analyzer is configured to determine a sensed temperature distribution based on the sensed temperature. The sensed temperature distribution is compared to an expected distribution. Exterior contamination of the transformer tank is detected based on the comparison.
    Type: Grant
    Filed: October 24, 2019
    Date of Patent: November 2, 2021
    Assignee: Palo Alto Research Center Incorporated
    Inventors: Saman Mostafavi, Hong Yu, Ajay Raghavan, Peter Kiesel
  • Patent number: 11156736
    Abstract: A device for locating studs on a surface such as a wall is disclosed. The device comprises a housing, a plurality of magnets disposed in the housing, a level placed between the plurality of magnets and line lasers in which one line laser is provided at one end of the housing and another line laser is provided at an opposite end of the housing. A flux density of the plurality of magnets is used to determine a location and a distance between the studs on the surface. The level is used to accurately determine the position of the studs. The line lasers are configured to emit laser beams at each side of the housing to label location of successive studs for remainder of the surface based on the distance calculated using the plurality of magnets and the level.
    Type: Grant
    Filed: August 29, 2019
    Date of Patent: October 26, 2021
    Inventor: Jesus De La Torre
  • Patent number: 11156644
    Abstract: Devices, systems, and methods that can facilitate in situ probing of a discrete time circuit components are provided. According to an embodiment, a device can comprise a hold circuit that can generate a sampled signal at a holding stage. The device can further comprise an in situ probe device that can be coupled to the hold circuit that can measure one or more operating voltage values at the holding stage based on the sampled signal.
    Type: Grant
    Filed: January 3, 2019
    Date of Patent: October 26, 2021
    Inventors: Martin Cochet, Troy James Beukema
  • Patent number: 11150072
    Abstract: There is provided a displacement measuring device that minimize unnecessary power consumption and improves power efficiency. A displacement measuring device includes a main scale and a detection head that is provided in such a manner as to be relatively displaceable to the main scale and outputs a periodic signal having a phase to be changed according to relative displacement to the main scale. The detection head outputs, as the periodic signal, a coarse scale signal having a coarse period and a fine scale signal having a fine period. A coarse phase detector calculates, from two pieces of phase information acquired from the coarse scale signal, the average phase of the coarse scale signal. A fine phase detector calculates, from four pieces of phase information acquired from the fine scale signal, the average phase of the fine scale signal.
    Type: Grant
    Filed: October 5, 2020
    Date of Patent: October 19, 2021
    Inventors: Masaki Matsushita, Satoshi Adachi
  • Patent number: 11143694
    Abstract: A system, method and apparatus for measuring carrier lifetime of a device comprises subjecting a test device to a voltage via a voltage source associated with the test system, disconnecting the test device from the voltage source, measuring the voltage as a function of time, measuring the current as a function of time, and determining a carrier lifetime of the test piece according to the slope of the measured voltage and the measured current.
    Type: Grant
    Filed: October 26, 2018
    Date of Patent: October 12, 2021
    Inventors: Shelby Lacouture, Stephen Bayne
  • Patent number: 11142345
    Abstract: A system and method for performing a test procedure on a system under test are provided. An actuation unit operatively coupled to the system under test is configured to perform at least one operation thereon. A visual recognition unit is configured to capture at least one image of the system under test in real-time. A test unit remotely interfaced with the system under test is configured to perform the test procedure. Using the test unit, the test procedure is retrieved from the memory, at least one control signal is output to the actuation unit for causing the at least one operation to be performed in real-time for testing the system under test in accordance with the one or more test instructions, and the at least one image of the system under test is monitored as the at least one operation is performed for validating the test procedure in real-time.
    Type: Grant
    Filed: August 20, 2019
    Date of Patent: October 12, 2021
    Assignee: Textron Innovations Inc.
    Inventors: Sébastien Giroux, Cédric Roche
  • Patent number: 11143716
    Abstract: A high-voltage power source device includes: a first terminal connected to a first end of an electrical wire disposed around a predetermined region; a second terminal connected to a second end of the electrical wire; a high-voltage generation circuit connected to the first terminal and generating high-voltage electricity; a voltage detection circuit connected to the second terminal, and measuring a voltage value of the high-voltage electricity at the second terminal and determining presence of an abnormality in the electrical wire, based on a measured voltage value; a timing circuit instructing the high-voltage generation circuit to generate high-voltage electricity at a timing when the high-voltage electricity is generated, and sending an instruction to measure a voltage value of the high-voltage electricity at the second terminal to the voltage detection circuit; and a notification circuit for notifying a determination result of the voltage detection circuit to outside.
    Type: Grant
    Filed: December 8, 2017
    Date of Patent: October 12, 2021
    Assignee: NEC Platforms, Ltd.
    Inventors: Yasushi Nobutaka, Kunihiko Endoh
  • Patent number: 11137358
    Abstract: A testing system for testing a workpiece for a characteristic by irradiating microwaves to the workpiece and also irradiating a laser beam at an irradiation position of the microwaves, receiving microwaves reflected at the irradiation position where the workpiece has a reflectivity increased by carriers generated through photoexcitation, and measuring a lifetime of the carriers. The testing system includes a chuck table that holds the workpiece, a microwave irradiation unit that irradiates the microwaves to the workpiece held on the chuck table, a microwave reception unit that receives microwaves reflected by the workpiece, and a laser beam irradiation unit that irradiates the laser beam onto the irradiation position to which the microwaves have been irradiated.
    Type: Grant
    Filed: January 21, 2020
    Date of Patent: October 5, 2021
    Inventors: Keiji Nomaru, Taiki Sawabe
  • Patent number: 11137418
    Abstract: A test probe assembly for use in testing a semiconductor wafer includes a probe card, a plurality of test probes mounted to the probe card and one or more piezoelectric elements mounted to each test probe. The piezoelectric elements are configured to move respective probe ends of the individual test probes in at least one direction to facilitate realignment of the probe ends for semiconductor wafer testing.
    Type: Grant
    Filed: March 4, 2019
    Date of Patent: October 5, 2021
    Assignee: International Business Machines Corporation
    Inventors: Kushagra Sinha, Pablo Nieves, Reinaldo Vega
  • Patent number: 11131787
    Abstract: An electromagnetic (EM) sensor includes a front end module generating an EM signal using electromagnetic waves transmitted from an external source, a sensor memory storing a portion of a plurality of machine learning models used to recognize the EM signal, and a microcontroller unit for recognizing the external electronic device emitting the electromagnetic waves by inputting feature values extracted from the EM signal to the machine learning models. If the machine learning models stored in the sensor memory are not able to recognize the external device, the feature values may be transmitted to a main processor, and the main processor may compare the feature values to another set of machine learning models.
    Type: Grant
    Filed: March 13, 2019
    Date of Patent: September 28, 2021
    Inventors: Seung Jae Lee, Soo Yong Kim, Sun Joo Hong
  • Patent number: 11125814
    Abstract: A test system configured to perform an electrical-characteristic test on a device under test, includes: a mount on which the device under test is to be mounted; a conveyance mechanism configured to convey the mount; a test head including a measurement circuit for performing the electrical-characteristic test; a probe configured to connect an electrode of the device under test to the measurement circuit; a lifting and lowering mechanism configured to move the mount along a first direction such that the electrode and the probe are in contact or spaced apart; and an alignment mechanism provided at the test head, the alignment mechanism being configured to move the probe on a plane crossing the first direction so as to align the probe with the electrode on the plane.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: September 21, 2021
    Assignee: SINTOKOGIO, LTD.
    Inventors: Takayuki Hamada, Yoichi Sakamoto
  • Patent number: 11125796
    Abstract: A method for electromagnetic imaging of containers receives uncalibrated first data corresponding to signals of a first plurality of different frequencies associated with an antenna array residing in a container having contents. The method estimates of a second data based on a computer model and simulation of signals of a second plurality of different frequencies associated with the antenna array, the second plurality of different frequencies including a subset of the first plurality of different frequencies. The method compares magnitudes, without corresponding phase comparisons, of the first and second data at each frequency of the second plurality of different frequencies. The method updates the second data based on the comparing. The method provides information about the contents within the container based on the updated second data.
    Type: Grant
    Filed: July 2, 2020
    Date of Patent: September 21, 2021
    Assignees: University of Manitoba, 151 Research Inc.
    Inventors: Colin Gerald Gilmore, Ian Jeffrey, Joe LoVetri, Mohammad Asefi, Nicholas Geddert, Kevin Brown
  • Patent number: 11125833
    Abstract: The invention relates to a method for testing a disconnection point (12) of a photovoltaic inverter (1) and to a photovoltaic inverter (1) of this type. According to the invention, in a testing mode, an auxiliary voltage (U_Lx) is applied between the input (E_Lx) of each line (Lx) of the disconnection point (12) and an intermediate circuit potential (M), in each case, the first switching contacts (SW_Lx,1) are closed and the second switching contacts (SW_Lx,2) are opened alternately and vice versa, according to a switching pattern, and, for each switching pattern, the voltages (U_Lx,GD; U_MN) between the output (A_Lx) of each line (Lx) of the disconnection point (12) and the intermediate circuit potential (M) are measured, and the functionality of each switching contact (SW_Lx,j) is derived from the measured voltages (U_Lx,GD; U_MN).
    Type: Grant
    Filed: October 3, 2019
    Date of Patent: September 21, 2021
    Assignee: Fronius International GmbH
    Inventors: Gerhard Wallisch, Joachim Danmayr