Abstract: A method and apparatus for calibrating an impedance measurement device are provided. The impedance measurement device outputs a first AC signal to a phase-locked current generator. The phase-locked current generator generates a second AC signal having a phase that is locked to a phase of the first AC signal and having an amplitude that is representative of a presented impedance having a known impedance value. The phase-locked current generator outputs the second AC signal to the impedance measurement device. The impedance measurement device performs an impedance measurement based on the second AC signal to produce a measured impedance value associated with the presented impedance. The impedance measurement device is calibrated based on the measured impedance value and the known impedance value of the presented impedance.

Abstract: The present disclosure describes techniques for detecting foreign objects. In some aspects, an apparatus for detecting objects is provided. The apparatus includes a plurality of sense circuits, each of the plurality of sense circuits including a primary sense coil having a first terminal and a second terminal, a secondary sense coil having a first terminal and a second terminal, and a capacitor having a first terminal and a second terminal. The first terminal of the capacitor is electrically connected to the second terminals of each of the primary sense coil and the secondary sense coil. The apparatus further includes a driver circuit electrically connected to the first terminal of the primary sense coil of each of the plurality of sense circuits. The apparatus further includes a measurement circuit electrically connected to the first terminal of the secondary sense coil of each of the plurality of sense circuits.

Abstract: A circuit screening system includes a target circuit under test, a power circuit, and a clock generating circuit. The target circuit under test receives a first testing signal in a first period, and a second testing signal in a second period, and the first testing signal is different from the second testing signal. The power circuit provides a supply voltage to the target circuit under test, wherein a voltage level of the supply voltage maintains at a first voltage level in the first period, is pulled up to a second voltage level and back to the first level after the first period, and maintains at the first voltage level in a second period after the first period. The clock generating circuit provides a clock signal to the target circuit under test, wherein the clock signal has different profiles in the first period and the second period.

Abstract: A method and a system of detecting winding fault during online operation of an electrical machine, said method comprising, acquiring a set of signals from the machine over a period, said set of signals comprising two or more magnetic flux signals, each flux signal obtained from a respective flux sensor positioned on the external surface of the machine; extracting an internal winding fault indicator from the set of signals; comparing the internal winding fault indicator with a baseline indicator; and determining the internal winding fault when the internal winding fault indicator deviates from the baseline indicator by a threshold.

Abstract: A flaw detection apparatus for use with a tubular has a helixing conveyor adapted to receive the tubular thereon, a frame positioned over a center section of the helixing conveyor, and a plurality of inspection devices retained by the frame so as to detect flaws in the tubular as said helixing conveyor moves the tubular through the frame. The helixing conveyor has a plurality of sets of rollers that are angularly adjustable relative to a longitudinal axis of the helixing conveyor. The plurality of inspection devices include a longitudinal inspection device, a Hall Effect wall thickness inspection device, an oblique inspection device, a transverse inspection device, and a grade verification/comparator device.

Abstract: The invention relates to a broadband high power amplifier that comprises a signal input adapted to receive an input signal, at least one amplifier stage adapted to amplify the received input signal, a signal output adapted to output the signal amplified by the at least one amplifier stage as an output signal, a monitoring unit adapted to monitor signal characteristics of the input signal and the output signal and a control unit adapted to operate the at least one amplifier stage at an optimal operating point depending on the current signal characteristics monitored by said monitoring unit.

Abstract: A signal generating device for generation of measurement signals for an electrical system includes a housing which features an electrically conducting material, an energy reservoir arranged in the housing, a data interface arranged at the housing and designed to receive signal data, a coupling interface arranged at the housing and coupled to the electrical system, and a signal generator arranged in the housing. The signal generator is coupled to the electrical energy reservoir, to the data interface and to the coupling interface. The signal generator is designed, based on the signal data, to generate the measurement signals and to output them via the coupling interface. A corresponding measuring device is also included.

Abstract: A test system, a method for manufacturing an electronic device, and a method for testing a wafer or electronic device that includes coupling a transistor in a series circuit with a capacitor and a resistor, coupling a voltage source to the capacitor to charge the capacitor to a non-zero DC voltage while the transistor is turned off, disconnecting the voltage source from the capacitor while the transistor is turned off, turning the transistor on while the voltage source is disconnected from the capacitor, measuring a voltage signal across the resistor while the transistor is turned on, and determining a test result indicating whether the transistor has an acceptable dynamic on-state resistance according to the voltage signal across the resistor.

Abstract: A device having an impedance measurement circuit that allows for reduction of flicker noise can be implemented in a variety of applications. A carrier suppression technique can be implemented that substantially removes the carrier signal with removal of noise artifacts associated with the carrier signal from sidebands of the carrier signal. Carrier suppression in an AC impedance measurement circuit can be implemented by sensing a carrier signal of the measurement circuit at a transmit location of the measurement circuit and subtracting a weighted version of the carrier signal at a receive location of the measurement circuit. One or more compensation impedances can be used such that the sidebands of the carrier signal are received with the carrier signal suppressed with respect to the receive location.

Abstract: Sampling timings at a plurality of measurement points at which waveform data of a power line is sampled are easily synchronized to each other. A measurement device includes: a sampling unit configured to sample a waveform of at least one of a voltage and a current at a measurement point of a power line at a predetermined sampling timing; a processing unit configured to execute processing of the waveform sampled by the sampling unit; a time information acquisition unit configured to acquire time information from a time information provision device that is communicatively connected through a network; and an adjustment unit configured to adjust a processing timing of the processing on the basis of the time information acquired by the time information acquisition unit.

Abstract: A current sensing circuit includes a sensing resistor, a current monitor, a variable resistor, and a processor. The sensing resistor is disposed on a to-be-sensed circuit and coupled between first and second first voltage terminals of the to-be-sensed circuit. The current monitor includes first and second terminals. A first winding is coupled between the first terminal and the first voltage terminal, and a second winding is coupled between the second terminal and the second voltage terminal. The variable resistor is connected in series with the first winding between the first voltage terminal and the first terminal. The current monitor obtains a sensed current according to a first voltage on the first terminal, a second voltage on the second terminal, and an impedance of the sensing resistor and generates a sensing signal. The processor determines whether to adjust an impedance of the variable resistor according to the sensing signal.

Abstract: The present invention discloses a method for detecting open phase of a startup/standby transformer based on optical CT. A startup/standby transformer in a power plant is in a no-load condition for a long time as a standby power supply. Once a single-phase open phase fault occurs, there is no significant change in the voltage phasor and voltage sequence component of each side. If not found in time, the defect may pose a great threat to the safe operation of the power plant. In the present invention, the optical CT is used to detect a three-phase current of the high-voltage side of the startup/standby transformer. If the current satisfies an open phase criterion, it is determined that an open phase fault occurs, and then, an alarm signal is given after a delay and an operator is informed to handle the fault in time. Therefore, the operation reliability of the startup/standby transformer system in the power plant is enhanced.

Abstract: A current sensor is disclosed. The current sensor is substantially immune to stray fields due to the position and orientation of at least two magnetic field sensors and their respective axes of maximum sensitivity, as well as a total current sensor output that is a based on a difference of the individual magnetic field sensor outputs. The specific position and orientation of the magnetic field sensors allows for the current sensor to be smaller than known sensors of similar sensitivity.

Abstract: A transformer state evaluation method combining a FAHP method, a DEMATEL method, and a CRITIC method is provided and includes: selecting a plurality of groups of state quantities, building a hierarchical indicator system; calculating an influencing degree and an influenced degree by using the DEMATEL method on a subjective level, calculating a weight of each of a plurality of indicators of an indicator layer through the FAHP method and the DEMATEL method, calculating the weights of the indicators of the indicator layer through the CRITIC method on an objective level; calculating an optimal weight according to the indicator subjective weights and the indicator objective weights; and calculating state scores layer by layer, finally determining an actual health condition of each of a plurality of transformers by combining state level classification rules. In the disclosure, the weights are calculated based on the subjective level and the objective level.

Abstract: The present invention relates to a sensor suite comprising at least one sensor. More particularly, the present invention relates to a sensor suite for measuring absolute and/or relative position, location and orientation of an object on or in which the sensor suite is employed. The present invention further relates to improved, novel sensor types for use in the sensor suite. More particularly, the present invention relates to an improved, novel magnetometer that is self-calibrating and scalable. Still more particularly, the present invention relates to such a magnetometer that is miniaturized. Further embodiments of the present invention relate to systems and methods for providing location and guidance, and more particularly for providing location and guidance in environments where global position systems (GPS) are unavailable or unreliable (GPS denied and/or degraded environments).

Abstract: A shunt is composed of multiple pieces with at least some of the pieces being connected by a conductive channel that provides uniform flow of current. The conductive channel may be a recess, raised portion, stand-alone component, or other channel that directs current to flow from one piece of the shunt to another piece in a uniform manner, resulting in an accurate current reading for the shunt. Further, the shunt may include multiple pieces that are composed of different materials.

Abstract: A current sensor and measurement system including such a current sensor. The current sensor includes: an insulating substrate provided with a central opening; a winding surrounding the central opening and including a coil wound around a portion of the insulating substrate; wherein the current sensor includes at least one ferromagnetic layer incorporated within the portion of the insulating substrate, the coil surrounding the ferromagnetic layer.

Abstract: A system current sensor module can accurately sense or measure system current flowing through a sense current resistor by shunting current through a gain-setting resistor and using an amplifier to measure a resulting voltage, with an output transistor controlled by the amplifier controlling current through the gain setting resistor in a manner that tends to keep the amplifier inputs at the same voltage. The resistors can be thermally coupled to maintain similar temperatures when a system current is flowing. The thermal coupling can include conducting heat from a first resistor layer carrying the current sense resistor to a thermal cage layer located beyond a second resistor layer carrying the gain-setting resistor. This preserves accuracy, including during aging.

Abstract: A system for monitoring operation of rotating electrical machinery including electrical industrial machinery. The system comprises analog sensors configured to measure electrical signals corresponding to the voltage and the current of the rotating electrical machinery. A remote processor identifies the frequency components of the measured electrical signals. Based on the frequency components, the system is monitored and controlled. This may help allow electrical faults, mechanical faults and process faults to be predicted and/or prevented.

Abstract: A data processing device includes an internal volume for housing devices and an isolation test system. The isolation test system makes a determination that an electromagnetic interference suppression state of the data processing device is to be determined; in response to the determination: suppresses generation of electromagnetic radiation by the devices; while the generation of the electromagnetic radiation by the devices is suppressed: identifies a quantity of second electromagnetic radiation that propagated through a boundary of the internal volume; makes a second determination, based at least in part on the quantity, that the electromagnetic interference suppression state of the data processing device is an electromagnetic interference suppression compromised state; and initiates performance of an action set to remediate the electromagnetic interference suppression compromised state of the data processing device based on the second determination.