Abstract: A strain gated transistor and associated methods are shown. In one example, a transistor channel region includes a metal dichalcogen layer that is stressed to improve electrical properties of the transistor.

Abstract: A semiconductor structure, a method for fabricating the semiconductor structure and a static random access memory are provided. The method includes providing a base substrate including a substrate and a plurality of discrete fins on the substrate. The substrate includes a pull-up transistor region and a pull-down transistor region. The method also includes forming a gate structure on each fin; and forming pull-up doped epitaxial layers, in the fin on both sides of the gate structure in the pull-up transistor region. In addition, the method includes forming a first pull-down doped region connected to an adjacent pull-up doped epitaxial layer in the fin on one side of the gate structure in the pull-down transistor region. Further, the method includes forming a second pull-down doped region by performing an ion-doped non-epitaxial layer process on the fin on another side of the gate structure in the pull-down transistor region.

Abstract: A temporary adhesive material for a wafer processing, used for temporarily bonding a support and a wafer having a circuit-forming front surface and a back surface to be processed, contains a complex temporary adhesive material layer having a three-layered structure that includes a first temporary adhesive layer composed of a non-silicone thermoplastic resin layer capable of releasably adhering to the front surface of the wafer, a second temporary adhesive layer composed of a thermosetting siloxane polymer layer laminated on the first temporary adhesive layer, and a third temporary adhesive layer composed of a thermosetting siloxane-modified polymer layer laminated on the second temporary adhesive layer and capable of releasably adhering to the support. A wafer processing laminate and temporary adhesive material for a wafer processing facilitate temporary adhesion and separation, have excellent CVD resistance, and can increase productivity of thin wafers, and a method manufactures a thin wafer using the same.

Abstract: A 3D device, including: a first layer including a first memory including a first transistor; a second layer including a second memory including a second transistor; and a Resistive RAM structure, where the second transistor is self-aligned to the first transistor, and where the Resistive RAM structure is overlaying the first layer and is overlaid by the second layer.

Abstract: A method of manufacturing a light emitting device includes: providing particles of a fluorescent material; providing a substrate having a light emitting element mounted thereon; providing a first resin solution and a second resin solution that are two components of a two-component type curable resin; mixing the particles of the fluorescent material in the first resin solution to obtain a first suspension; mixing the second resin solution with the first suspension to obtain a second suspension, and applying the second suspension on the light emitting element and curing the second suspension to obtain a sealing member.

Abstract: A simplified method for forming pairs of non-volatile memory cells using two polysilicon depositions. A first polysilicon layer is formed on and insulated from the semiconductor substrate in a first polysilicon deposition process. A pair of spaced apart insulation blocks are formed on the first polysilicon layer. Exposed portions of the first poly silicon layer are removed while maintaining a pair of polysilicon blocks of the first polysilicon layer each disposed under one of the pair of insulation blocks. A second polysilicon layer is formed over the substrate and the pair of insulation blocks in a second polysilicon deposition process. Portions of the second polysilicon layer are removed while maintaining a first polysilicon block (disposed between the pair of insulation blocks), a second polysilicon block (disposed adjacent an outer side of one insulation block), and a third polysilicon block (disposed adjacent an outer side of the other insulation block).

Abstract: Devices, packaging devices, and methods of packaging semiconductor devices are disclosed. In some embodiments, a packaged semiconductor device includes a molding material and a plurality of through-vias disposed within the molding material. A dummy through-via and an integrated circuit die are also disposed within the molding material. An interconnect structure is disposed over the molding material, the plurality of through-vias, the dummy through-via, and the integrated circuit die.

Abstract: A multi-layer metal core printed circuit board (MCPCB) has mounted on it at least one or more heat-generating LEDs and one or more devices configured to provide current to the one or more LEDs. The one or more devices may include a device that carries a steep slope voltage waveform. Since there is typically a very thin dielectric between the patterned copper layer and the metal substrate, the steep slope voltage waveform may produce a current in the metal substrate due to AC coupling via parasitic capacitance. This AC-coupled current may produce electromagnetic interference (EMI). To reduce the EMI, a local shielding area may be formed between the metal substrate and the device carrying the steep slope voltage waveform. The local shielding area may be conductive and may be electrically connected, to a DC voltage node adjacent to the one or more devices.

Abstract: An integrated circuit device and method for manufacturing the integrated circuit device is disclosed. The disclosed method provides improved protection for the bottom portion of the gate structure. In some embodiments, the method achieves improved protection for gate structure bottom by forming a recess on either side of the gate structure and placing spacers on the side walls of the gate structure, so that the spacers protect the portion of the gate structure below the gate dielectric layer.

Abstract: A method comprises connecting a substrate having a plurality of integrated circuit (IC) dies to a package substrate, so that the package substrate extends beyond at least two edges of the substrate, leaving first and second edge portions of the package substrate having exposed contacts. The first and second edge portions meet at a first corner of the package substrate. At least a first upper die package is placed over the substrate, so that first and second edge portions of the first upper die package extend beyond the at least two edges of the substrate. Pads on the first and second edge portions of the first upper die package are connected to the contacts of the first and second edge portions of the package substrate.

Abstract: Methods for processing a semiconductor workpiece can include providing a semiconductor workpiece that includes one or more kerf regions; forming one or more trenches in the workpiece by removing material from the one or more kerf regions from a first side of the workpiece; mounting the workpiece with the first side to a carrier; thinning the workpiece from a second side of the workpiece; and forming a metallization layer over the second side of the workpiece.

Abstract: A semiconductor structure includes a source drain region of a first material and an extension region of a second material. A semiconductor device fabrication process includes forming a sacrificial dielectric portion upon a semiconductor substrate, forming a sacrificial gate stack upon the sacrificial dielectric portion, forming a gate spacer upon the sacrificial dielectric portion against the sacrificial gate, forming a source drain region of a first doped material upon the semiconductor substrate against the gate spacer, forming a replacement gate trench by removing the sacrificial gate stack, forming an extension trench by removing the sacrificial dielectric portion, and forming an extension region of a second doped material within the extension trench.

Abstract: An alternating stack of layers of a first epitaxial semiconductor material and a second epitaxial semiconductor material is formed on a substrate. A fin stack is formed by patterning the alternating stack into a shape of a fin having a parallel pair of vertical sidewalls. After formation of a disposable gate structure and an optional gate spacer, raised active regions can be formed on end portions of the fin stack. A planarization dielectric layer is formed, and the disposable gate structure is subsequently removed to form a gate cavity. A crystallographic etch is performed on the first epitaxial semiconductor material to form vertically separated pairs of an upright triangular semiconductor nanowire and an inverted triangular semiconductor nanowire. Portions of the epitaxial disposable material are subsequently removed. After an optional anneal, the gate cavity is filled with a gate dielectric and a gate electrode to form a field effect transistor.

Abstract: A semiconductor structure and a method of fabricating thereof are provided. The method includes the following steps. A substrate with an upper surface and a lower surface is received. A first recess extending from the upper surface to the lower surface is formed and the first recess has a first depth. A second recess extending from the upper surface to the lower surface is formed and the second recess has a second depth less than the first depth. A first conducting layer is formed in the first recess and the second recess. A first insulating layer is formed over the first conducting layer. A second conducting layer is formed over the first insulating layer and isolated from the first conducting layer with the first insulating layer. The substrate is thinned from the lower surface to expose the second conducting layer in the first recess.

Abstract: The present application provides a method of fabricating a quantum dot color film substrate, red and green quantum dots are respectively formulating into red and green quantum dot inks, then formation is performed by an inkjet printing, and a color filter layer is obtained, thereby brightness and color saturation of displays can be increased; simultaneously, the red quantum dot ink and the green quantum dot ink at least have an ink of epoxy resin system therein, when the ink of epoxy resin system is yet cured, a graphene conductive layer is formed thereon to act as an electrode, so that a greatly improved adhesion of the graphene conductive layer and the color filter layer can be obtained. Additionally, to replace ITO by utilizing graphene as a conductive layer can alleviate current issues of few ITO sources and increasing price, and the graphene has conductivity and high transmittance that make display quality of TFT-LCD screen be guaranteed, and an overall thinned and lightened panel be achieved.

Abstract: An organic light emitting display device is discussed. The organic light emitting display device according to an embodiment includes a base substrate, a buffer layer disposed on the base substrate, and a thin film transistor disposed on the buffer layer. The organic light emitting display device further includes an organic light emitting diode connected to the thin film transistor and disposed on the thin film transistor. The thin film transistor includes a gate electrode, a source electrode, and a drain electrode. At least one of the gate, source, and drain electrodes of the thin film transistor includes a semi-transmissive metal layer, a transparent metal layer, and a reflective metal layer to improve outdoor visibility of a display panel by reducing reflectance of the electrodes even though a polarizer is removed.

Abstract: A semiconductor device package includes a conductive base, and a cavity defined from a first surface of the conductive base, the cavity having a bottom surface and a depth. A semiconductor die is disposed on the bottom surface of the cavity, the semiconductor die having a first surface and a second surface opposite the first surface. The second surface of the semiconductor die is bonded to the bottom surface of the cavity. A distance between the first surface of the semiconductor die and the first surface of the conductive base is about 20% of the depth of the cavity.

Abstract: A method for producing a plurality of semiconductor components (1) is provided, comprising the following steps: a) providing a semiconductor layer sequence (2) having a first semiconductor layer (21), a second semiconductor layer (22) and an active region (25), said active region being arranged between the first semiconductor layer and the second semiconductor layer for generating and/or receiving radiation; b) forming a first connection layer (31) on the side of the second connection layer facing away from the first semiconductor layer; c) forming a plurality of cut-outs (29) through the semiconductor layer sequence; d) forming a conducting layer (4) in the cut-outs for establishing an electrically conductive connection between the first semiconductor layer and the first connection layer; and e) separating into the plurality of semiconductor components, wherein a semiconductor body (20) having at least one of the plurality of cut-outs arises from the semiconductor layer sequence for each semiconductor compon

Abstract: In one embodiment, a magneto-resistive chip package includes a circuit board; a shielding body including a shielding base part positioned on the circuit board and a shielding intermediate part extending from one side of the shielding base part; a magneto-resistive chip positioned on the shielding base part and including a magneto-resistive cell array; an internal connection part electrically connecting the magneto-resistive chip to the circuit board; an encapsulation part encapsulating the magneto-resistive chip on the circuit board, and having an upper surface that is higher than an upper surface of the magneto-resistive chip; and a shielding cover positioned on the shielding intermediate part, and on the encapsulation part.

Abstract: A quantum computing system that includes a quantum circuit device having at least one operating frequency; a first substrate having a first surface on which the quantum circuit device is disposed; a second substrate having a first surface that defines a recess of the second substrate, the first and second substrates being arranged such that the recess of the second substrate forms an enclosure that houses the quantum circuit device; and an electrically conducting layer that covers at least a portion of the recess of the second substrate.