Abstract: In an optical pattern tracer which uses sample and hold circuits for signal processing filtering of the signal to reduce undershoot can be attained by manipulation of the sample and hold processing circuits. The present application varies the holding capacitor to produce a varied low pass filter effect.

Abstract: A method for reading out signal charges in a solid-state image pickup unit providing either an improved resolution for a constant vertical integration density or a reduced vertical integration density while maintaining the same resolution. The photoelectric conversion elements of the unit are arranged in a matrix of rows and columns with m rows of photoelectric conversion elements being assigned to each scanning line. Signal charges generated in the photoelectric conversion elements during exposure are transferred to a vertical transfer section in the order of the m-th row to the first row in each scanning line, and then the charges are transferred to a horizontal charge transfer section using a four-phase driving method.

Abstract: An instrument for measuring radiation including a probe for collecting light. The probe includes a diffusive reflective surface at the forward end of the probe and an aperture block containing a pair of apertures to direct light reflected from the reflector to an optical waveguide and then to a light sensor and display unit.

Abstract: A system of detecting abrupt optical deviations in an object such as defects in a TV tube faceplate employing a line scan camera operated at a fixed scan frequency to feed analog video signals to a log amplifier the output of which is high-pass filtered to detect on an illumination invariant basis defect indicating deviations in light emanating from the object. The passed logarithmic deviation signals are compared with threshold signal magnitudes predetermined for the areas of the object from which the deviation signals are induced and if equal to the threshold an event signal is issued. The absolute magnitude of the event is measured by high pass filtering the analog video signal so that only the abrupt deviation from background light intensity is passed to a memory enable by the event signal. In defect analysis the size of the defect is measured as a pixel count of those pixels having signals exceeding one half the maximum pixel signal magnitude within the defect.