Abstract: An apparatus for detecting the presence of assembly related defects on a semiconductor device including an edge ring having a resistance value and including one or more layers configured to at least partially cover the semiconductor device in a first direction. The one or more layers are divided into a first section and a second section. Each layer of the one or more layers are in electrical communication with one another. The resistance value of the edge ring is at a first resistance value associated with the first and second sections being intact. At least one of the first section and second section is configured to break in response to an assembly related defect, and the resistance value of the edge ring is configured to change from the first resistance value to a second resistance value in response to at least one of the first and second sections being broken.

Abstract: A state of a tripping solenoid in a circuit breaker is determined by a primary coil and a secondary coil wound around a hollow body of a solenoid. The secondary coil is positioned within magnetic coupling distance from the primary coil and is configured to produce a sensing voltage based on the primary coil voltage. A ferromagnetic plunger positioned in the hollow body, is configured to slide axially to a tripped position to trip the circuit breaker when a trip voltage is applied to the primary coil. A plunger position detecting circuit connected to the secondary coil, is configured to detect the position of the plunger in the hollow body of the solenoid based on the sensing voltage. A reduction or absence of the sensing voltage indicates a faulty or broken connection in the primary coil.

Abstract: A magnetic sensor device comprises a substrate. A first magnetic sensor, a second magnetic sensor, and one or more inductors are disposed over the substrate and are controlled by a magnetic sensor controller having a control circuit. The control circuit is adapted for controlling the first magnetic sensor to measure magnetic fields under presence of a first set of magnetic fields, and for controlling the second magnetic sensor to measure magnetic fields under presence of a second set of magnetic fields generated by the inductors. The control circuit calculates a relative sensitivity matching value that converts magnetic field values measured by the second magnetic sensor to a comparable magnetic field value measured by the first magnetic sensor or vice versa.

Abstract: The present disclosure relates to a system for detecting movement of a microelectromechanical system (MEMS) device. The system uses a drive voltage signal source for generating a low frequency drive voltage signal for driving the MEMS device. An excitation signal source may be used for generating an excitation signal which is also applied to the MEMS device. The excitation signal has a frequency which is above a physical response capability of the MEMS device, such that operation of the MEMS device is not significantly affected by the excitation signal. A sensing impedance is used to help generate a signal which is responsive to the capacitance of the MEMS device. The capacitance of the MEMS device changes in response to movement of the MEMS device. An output subsystem is provided which responds to changes sensed by the sensing impedance, and which produces an output voltage signal. A filter filters the output voltage signal to produce a filtered output voltage signal.

Abstract: An output module includes a first connection terminal, a second connection terminal, a power supply terminal, a controller, an output device, and a first cutoff switch. The first connection terminal is connected to a high potential side terminal of an external load. The second connection terminal is connected to a low potential side terminal of the external load. The power supply terminal is provided with an external power supply from an external power source. The output device is configured to operate by receiving a power supply generated by or based on the external power supply and to output an analog voltage or an analog current of a value instructed by the controller toward the first connection terminal. The first cutoff switch is configured to be controlled by the controller to open and close a first path between the second connection terminal and a ground.

Abstract: An oxygen concentration meter includes a zirconia sensor, a resistor, a constant-current circuit, a resistance detection section, and an oxygen concentration detection section. The resistor is connected in parallel to the zirconia sensor. The constant-current circuit is connected in parallel to the zirconia sensor and the resistor, and supplies an electric current. The resistance detection section detects the resistance of the zirconia sensor on the basis of the voltage of the zirconia sensor in accordance with the supplied electric current. The oxygen concentration detection section detects the oxygen concentration of gas to be measured that is supplied to the zirconia sensor, on the basis of the voltage of the zirconia sensor resulting from an oxygen concentration difference between the gas to be measured and reference gas.

Abstract: A method for monitoring a power line that carries electrical current, using a mobile inspection device, the mobile inspection device has a magnetic sensor and a camera, the method includes the following steps: measuring a magnetic field generated by the current, by the magnetic sensor; and capturing an image of the power line by the camera according to the measured magnetic field. A mobile inspection device, a computer program and a machine-readable storage medium implement the method.

Abstract: A semiconductor die includes: a SiC substrate; power and current sense transistors integrated in the substrate such that the current sense transistor mirrors current flow in the main power transistor; a gate terminal electrically connected to gate electrodes of both transistors; a drain terminal electrically connected to a drain region in the substrate and which is common to both transistors; a source terminal electrically connected to source and body regions of the power transistor; a dual mode sense terminal; and a doped resistor region in the substrate between the transistors. The dual mode sense terminal is electrically connected to source and body regions of the current sense transistor. The doped resistor region has a same conductivity type as the body regions of both transistors and is configured as a temperature sense resistor that electrically connects the source terminal to the dual mode sense terminal.

Abstract: A testing process for an electrical system is described. The electrical system includes a power converter and a direct current (DC) bus with two or more DC bus terminals and at least one DC bus capacitor. The testing process is a fully automated testing process where a sequence of different diagnostic tests are carried out on the electrical system, each diagnostic test testing one of the power converter and the DC bus to determine if it is responding as expected or operating within normal parameters.

Abstract: A turbine speed probe diagnostic system is provided. The turbine includes a speed probe and a speed reading circuit. A speed lead connects the speed probe and speed reading circuit together to transmit speed signals from the speed probe to the speed reading circuit. A speed probe diagnostic circuit is also provided for connection to the speed lead. An isolation switch is provided to isolate the speed probe diagnostic circuit during normal operation when the speed reading circuit is receiving speed signals from the speed probe. When no speed signals are being received, the isolation switch closes and the speed probe diagnostic circuit performs a test on the speed probe or speed lead.

Abstract: A portable connector assembly includes a belt having a clasp for creating a closed loop with the belt. A receiver has port and control electronics. A battery is removably securable in the port of the receiver. The assembly also includes an industrial connector electrically connected to the receiver for electrically connecting the control electronics with a product connector.

Abstract: A node for detecting local anomalies in an overhead power grid having at least one power line. The node includes a processing unit and a memory, wherein the node further includes: an electric field sensor configured to measure a first parameter related to an electric field around the at least one power line, and a magnetic field sensor configured to measure at least second parameter related to a magnetic field around the at least one power line. The processing unit is configured to: compare the measured first parameter and at least second parameter with historic data stored in the memory to identify local anomalies, and forward data related to the identified local anomalies to a system controller via a communication interface.

Abstract: A sensor includes a radio frequency interrogator, a responsive patch, a radio frequency resonance detector, and a transmission line. The radio frequency interrogator is configured to produce an electromagnetic interrogation pulse having a first frequency. The responsive patch includes a substrate and a resonant layer disposed on a surface of the substrate. The substrate includes a polymer. The resonant layer includes an electrically conductive nanomaterial. The resonant layer is configured to resonate at the first frequency in response to receiving the electromagnetic interrogation pulse. The radio frequency resonance detector is configured to detect a resonating response of the responsive patch. The transmission line couples the responsive patch to the radio frequency resonance detector. The transmission line is configured to transmit the resonating response of the responsive patch to the radio frequency resonance detector.

Abstract: A measuring method is provided. A probe and a first sensor are disposed over a jig including a bar protruding from the jig. The probe is moved until a first surface of the probe is laterally aligned with a second surface of the bar facing the jig. A first distance between the second surface of the bar and the first sensor is obtained by the first sensor. The probe and the first sensor are disposed over a magnetron. Magnetic field intensities at different elevations above the magnetron are measured by the probe. A method for forming a semiconductor structure is also provided.

Abstract: A gas sensor includes: a substrate; a first conductor and a second conductor that are disposed on the substrate; an insulating layer; and an adsorbent layer. The insulating layer covers the first conductor and the second conductor, and has a first opening that allows a part of a surface of the first conductor to be exposed therethrough and a second opening that allows a part of a surface of the second conductor to be exposed therethrough. The adsorbent layer contains a conductive material and an organic adsorbent that can adsorb a gas. The adsorbent layer is in contact with the first conductor and the second conductor respectively through the first opening and the second opening.

Abstract: Disclosed herein is an apparatus that includes a first semiconductor chip, and a first TSV penetrating the first semiconductor chip. The first semiconductor chip includes a first resistor coupled between a first power supply and a first node, a switch circuit coupled between the first node and the first TSV, a pad electrode operatively coupled to the first node, and a constant current source operatively coupled to either one of the first node and the pad electrode.

Abstract: The invention relates to a passage device comprising: at least one passage traversable by at least one person along a passage direction; at least two sidewalls spaced from each other along a direction extending perpendicularly to the passage direction, the sidewalls being connected with each other, wherein the passage is bounded along the direction by the sidewalls, and at least one capturing device by means of which a body temperature of the person located in front of at least a partial area of the passage along the passage direction can be contactlessly captured, wherein the passage device, considered on its own, is formed as a structural unit assembled and mobile.

Abstract: A method of manufacturing a housing and a housing for an inductive sensor having at least one sleeve-like housing part and at least one beaker-like end cap for a sensor element, wherein the beaker-like end cap, wherein the end cap is composed of plastic, wherein the end cap is arranged in the sleeve-like housing part, wherein the end cap has a peripheral annular pressing surface that has an excess size with respect to an inner diameter of the housing part along an outer diameter of the sleeve-like section so that a press fit is formed between the sleeve like housing part and the end cap, and wherein a jacket-like outer surface of the sleeve-like section of the end cap does not have a step that projects beyond the inner diameter of the sleeve-like housing part.

Abstract: A test apparatus for testing a foreign object detection (FOD) capability of a wireless power transmitter. The test apparatus includes a wireless power test receiver and at least one temperature sensor configured to sense a temperature of a foreign object between the wireless power test receiver and the wireless power transmitter during wireless power transfer between the wireless power transmitter and the wireless power test receiver. The test apparatus also includes a memory configured to store temperatures sensed by the at least one temperature sensor over a test period in which the wireless power transfer occurs and temporal information regarding times the temperatures are sensed, and a processor configured to calculate, based on the temperatures and the temporal information, a predicted temperature of the foreign object at a future point in time after the test period, and to determine a test result based on the predicted temperature.

Abstract: A closed-loop controlled chemical apparatus includes: a compound sensor including: an analyte sensor and that: produces, by the analyte sensor, a voltage signal; a reference sensor in electrical communication with the analyte sensor; a transistor including a gate terminal such that a drain current of the transistor is maintained at a constant value and operated at an optimal transduction condition of peak sensitivity and minimum noise of the transistor; a feedback controller in electrical communication with the transistor and that: receives a transduction signal; determining a deviation of the transduction signal from a setpoint, the setpoint determined by transfer characteristics of the transistor; produces the feedback control signal that minimizes the deviation of the transduction signal from the based on a control model; and communicates the feedback control signal to the reference sensor for suppression of electrical noise fluctuations in the closed-loop controlled chemical apparatus.