Abstract: A passive loop antenna assembly is configured to detect distant rock fractures. The loop antenna assembly has a loop antenna spun around an enclosure ring. An enclosure is arranged around the enclosure ring and further has an opening portion exposing a portion of the loop antenna. A wave guide assembly is arranged over the loop antenna and has amplifier circuitry that is wired to two leads from the loop antenna. A support structure is joined to the enclosure, the wave guide, and a turntable. A base is joined to the turntable and further has roller guides, roller bearings, and base feet.

Abstract: The circuit comprises a computing center and at least three connection points (S.k) managing energy equipped with measuring devices (A.k), data-interconnected to the computing center. All connection points (S.k) are power-interconnected to the distribution network. The circuit comprises at least three logical control nodes (N.i.j) in a logically interconnected tree structure, wherein they are divided into at least two levels. The logical interconnection structure comprises at least one branching with at least two branches between logical control nodes (N.2.j) of the second level and the connection points (S.k). Each logical control node (N.i.j) is a part of the computing center which comprises processors, among which at least one real processor exists which is divided into at least two virtual processors. Each of the logical control nodes is assigned one of these virtual or real processors, and the logical interconnection between the logical control nodes (N.i.

Abstract: An apparatus for testing semiconductor devices is disclosed. In one example, the apparatus includes a rolling contactor comprising a first cylindrical rotatable holder, a plurality of test pin sets, each one of the test pin sets being connected to the cylindrical rotatable holder. Each one of the test pin sets comprises a plurality of test pins, and a substrate configured to support a plurality of semiconductor devices. The semiconductor devices comprising one or more contact elements on a main surface thereof remote from the substrate, wherein the first cylindrical rotatable holder and the substrate are arranged relative to each other so that due to a rotating movement of the first cylindrical rotatable holder the test pins of the test pin sets are successively contacted with the contact elements of the semiconductor devices.

Abstract: A method for determining a physical property related to a charge of a constituent of a sample, from field flow fractionation measurements with an additional electrical field, comprising the steps of obtaining a first fractogram of a first sample and a second fractogram of a second sample, wherein the first sample and the second sample are samples of a same substance, the first fractogram has been generated using a first electrical field, the second fractogram has been generated using a second electrical field, and a strength of the first electrical field and a strength of the second electrical field are different from each other; determining, by using a first mapping, from a first intensity value of the first fractogram, a first value and determining, by using a second mapping, from a second intensity value of the second fractogram, a second value; and determining, based on the first value and the second value, a physical property related to a charge of a constituent of at least one of the first sample and th

Abstract: The present disclosure provides a contact monitoring device for a vacuum circuit breaker. The contact monitoring device is provided in a vacuum circuit breaker comprising: a vacuum interrupter having a fixed electrode which is fixed in an insulating container and is provided with a fixed contact at one end, and a movable electrode which is installed in the insulating container to be able to be lifted or lowered wherein the vacuum interrupter is provided with a movable contact at one end, the movable contact contacting or being separated from the fixed contact when the movable electrode is lifted or lowered; and a push rod assembly which is coupled to the other end of the movable electrode and lifts or lowers the movable electrode. In addition, the present disclosure provides a vacuum circuit breaker having the contact monitoring device.

Abstract: A system for measuring the rotation of a throttle knob of a vehicle such as a motorcycle, snowmobile, personal watercraft or the like is disclosed, including a knob fitted onto a handlebar and capable of rotating around it. The knob has a magnet, provided for a fixed sensor suitable to detect the angular movement of the magnet following a rotation of the knob for the vehicle throttle control. The magnet has two sectors (N, S) with opposite polarity and different length, with the magnet therefore having asymmetric polarities.

Abstract: The invention relates to a method and a device for measuring the mechanical angular position of a rotor including, during a calibration phase and then a setting phase: acquiring Ns measurement signals, at measurement locations offset by a corresponding mechanical angle, modulo 2Pi/Nc radians of angle, to Pi/(2×Nc) radians for Ns=2 and 2Pi/3Nc radians for Ns=3; compute an instantaneous electrical angular position value taking into account the arctangent of the ratio of the values of the two measurement signals for the time under consideration, or the arctangent of the ratio of the values of the two transforms obtained by a Clarke transform, applied to three measurement signals; determine electrical calibration (SIGcb) and setting (Sigi) signatures; determine an angular measurement offset value by an operation of resetting the signatures.

Abstract: Disclosed is a system for monitoring parts in a machine is provided. The system includes a base unit, and an electronic circuitry. The base unit includes a generator for generating controllable frequency, an impedance unit to resonate impedance with a matching frequency, a controller for modulating the impedance with commands, a first electrode to emit an alternating electric field, a mixer, and a communication unit for communicating the data and commands over a communication network. Further, the controller decodes changes in the impedance.

Abstract: Disclosed are apparatus and method for measuring electric current flowing through an inductive load energized by a half-bridge circuit with at least two semiconductor switches. The semiconductor switches are switched on and off in a complementary manner according to PWM.

Abstract: A mounting system for an electronic device is disclosed. The mounting system includes a mounting plate; a plurality of fasteners for coupling the mounting plate with the electronic device; a single main gear mounted on the mounting plate; a plurality of secondary gears coupled, respectively, to the plurality of fasteners; and a plurality of intermediate gears mounted on the mounting plate and rotationally coupled between the single main gear and the plurality of secondary gears. Rotation of each of the plurality of secondary gears causes a fastening movement of a respective one of the plurality of fasteners. Simultaneous rotation of the plurality of intermediate gears causes the plurality of secondary gears to rotate simultaneously in response to a single rotational force being received by the main gear. The simultaneous rotation of the plurality of intermediate gears causes a simultaneous fastening movement of the plurality of secondary gears.

Abstract: A method for tracking performance of player including determining global direction of magnetic field at first court and computing first court specific data; providing rotation for rotating apparatus about spin axis via player, wherein rotating apparatus comprising XYZ-magnetic field sensor; measuring plurality of magnetic field values as function of time when rotating apparatus is rotating about spin axis; computing magnetic field component of magnetic field in direction of local body co-ordinate of spin axis of rotating apparatus; determining direction of spin axis using computed magnetic field component of magnetic field and determined global direction of magnetic field; determining player specific data comprising angle of spin axis with respect to horizontal ground plane and angle of shot direction with respect to horizontal component of spin axis; and calibrating and storing first court specific data and player specific data to track performance of player at first court.

Abstract: A system for determining at least one defect of a bearing providing a first ring and a second ring capable of rotating concentrically relative to one another, first and second distance sensors mounted on the first ring of the bearing for measuring first and second differential distances between the first ring and the second ring, a storage device for storing each measured differential distance, a device configured to determine a first temporal profile of a radial relative displacement between the first and second rings, and a second temporal profile of an axial relative displacement between the first and second rings according to the stored measured differential distances in the storage device, and a device that identifies a defect of the bearing from the temporal profile.

Abstract: Systems and methods for testing a photonic IC (PIC) with an optical probe having an out-of-plane edge coupler to convey test signals between the out-of-plane probe and an edge coupled photonic waveguide within a plane of the PIC. To accommodate dimensions of the optical probe, a test trench may be fabricated in the PIC near an edge coupler of the waveguide. The optical probe may be displaced along one or more axes relative to a prober to position a free end of the prober within the test trench and to align the probe's out-of-plane edge coupler with an edge coupler of a PIC waveguide. Accordingly, a PIC may be probed at the wafer-level, without first dicing a wafer into PIC chips or bars. The optical probe may be physically coupled to a prober through a contact sensor to detect and/or avoid physical contact between probe and PIC.

Abstract: A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal. Methods of testing a DUT using the measurement probe are also described, as well as a system for measuring signals from a DUT using the measurement probe.

Abstract: A mount board has a plurality of terminals electrically connected to a plurality of pins of a semiconductor device, and a conductor pattern. An electrostatic withstand voltage test device includes a metal plate on which the mount board is installed, a power supply for applying a voltage to the metal plate, an insulator disposed between the metal plate and the mount board, a switch circuit connected between the terminals and ground wiring, and a controller for controlling the switch circuit. The switch circuit includes a plurality of first switches provided corresponding to the terminals and each connecting a corresponding terminal to the ground wiring. The controller turns on at least one first switch selected from the first switches when an electric charge stored in the conductor pattern is discharged to the ground wiring through the semiconductor device.

Abstract: A wafer-level method of testing an integrated circuit (IC) device includes: (i) applying a plurality of test operation signals to a wafer containing the IC device, (ii) generating a test enable signal in response to detecting, on the wafer, a toggling of at least one of the plurality of test operation signals, and then (iii) testing at least a portion of the IC device in response to the generating the test enable signal. The generating may also include generating a test enable signal in response to detecting, on the wafer, an inactive-to-active transition of a toggle detection signal.

Abstract: A method for automatically detecting a sensor coupled to an electronic computer including steps of detecting the sensor and steps of configuring a hardware interface.

Abstract: A puff detection device (10) comprising a capacitive puff sensor (C2), a detection signal generator (140) for connection with the puff sensor (C2) and having an ESD diode (D2) at an input node (IN2), and a reference signal generator (120) which is configured to generate a train of reference pulses (CKI) having a reference frequency and comprises a reference capacitor (C1). The reference signal generator (120) includes a compensation device (D1) which is configured to provide a leakage current path at a charging node (IN1) of the reference capacitor (C1).

Abstract: A floor-mounted security device able to test personnel for metal material carried in or at the bottom of their footwear includes an induction module, a pressure sensing module, and an automatic alarm module. The pressure sensing module senses weight and pressure of a person standing, and outputs a trigger signal to the induction module to trigger operation of the induction module. The induction module can detect the presence of a metal mass by the change in a magnetic field, and output a control signal accordingly. The automatic alarm module outputs an alarm when prompted by the control signal.

Abstract: A probe assembly includes a multilayer structure including probe contact pads, an upper guide plate including an array of upper holes therethrough, a lower guide plate including an array of lower holes therethrough, a vertical stack of a plurality of dielectric spacer plates located between the upper guide plate and the lower guide plate and including a respective opening therethrough, and an array of probes attached to the probe contact pads, vertically extending through the array of upper holes and the array of lower holes, and vertically extending through the openings through the vertical stack of the plurality of dielectric spacer plates.