Abstract: A power supply device includes a controller configured to output, to a power converter, a command value to control at least one of a voltage or a current of power output from the power converter, and acquire a measurement value measured by a measurement unit. The controller is configured to, while power conversion operation is being performed by the power converter, change the command value and determine a deterioration of the power converter based on a mode of a change in the measurement value measured by the measurement unit due to a change in the command value.

Abstract: A test circuit for testing a monitoring circuit includes: a ramp generator configured to generate a ramp signal in response to an activated first control signal; a counter configured to count pulses of a clock signal in response to the activated first control signal; at least one register configured to store an output value of the counter based on a change in at least one output signal generated by the monitoring circuit in response to the ramp signal in a test mode; and a controller configured to generate the first control signal and verify the monitoring circuit based on a ratio of a value stored in the at least one register to a duration during which the first control signal is activated.

Abstract: A probe device includes a first receiving terminal configured to receive a multi-level signal having M levels, where M is a natural number greater than 2; a second receiving terminal configured to receive a reference signal; a receiving buffer including a first input terminal connected to the first receiving terminal, a second input terminal connected to the second receiving terminal, and an output terminal configured to output the multi-level signal based on signals received from the first and second input terminals; and a resistor circuit comprising a plurality of resistors connected to the first and second receiving terminals and determining a magnitude of a termination resistance of the first and second receiving terminals.

Abstract: A seal enhancer for improving the patch clamp seal in a patch clamp method or apparatus is provided. The internal solution comprises particular anions and the external solution comprises one or more metal ions at low concentration.

Abstract: A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe comprises a probe body, a first cantilever extending from the probe body, and a first thermal detector extending from the probe body. The thermal detector is used to position the cantilever with respect to a test sample.

Abstract: The invention involves a multimeter with a meter probe module and phasing probe module capable of wireless communication, proximity measurements, and accurately reading phase degrees. The meter probe module and the phasing probe module can communicate wirelessly, via a wired cable interface, or any combination thereof. The meter probe module and phasing probe module have unique radio frequency serial numbers that allow the probe modules to only communicate with its paired partner probe module while ignoring all other probe modules. The multimeter has a measurement point capable of taking direct contact measurements. The multimeter also has a measurement point capable of taking a voltage measurement without directly contacting the object to be measured. This is accomplished by taking voltage readings from the electric field of the air surrounding said object. The improved multimeter may allow an operator to more safely gather accurate information about an object being measured.

Abstract: A low-profile impedance tuner uses a cam-driven piston-like vertical movement of a metallic tuning probe inside a low loss slabline, controlled by an eccentrically centered disc (cam), which is attached to the axis of a stepper motor and rotates parallel to the slabline walls. The structure combines the benefits of low profile rotating tuning probe control with the benign reflection factor phase trajectory of block tuning probes; this is critical for accurate interpolation and impedance synthesis (tuning) strategies using a limited number of calibration points, especially at high microwave and millimeter-wave frequencies.

Abstract: Various embodiments include methods for determining an electrical fault of a conductivity sensor for ascertaining the electrical conductivity of a medium using a conductivity principle, wherein the conductivity sensor comprises a first electrode pair fully disposed in the medium comprising: applying an electrical alternating voltage to the first electrode pair; measuring a temporal profile of the electrical alternating current at the first electrode pair resulting from application of the electrical alternating voltage at the first electrode pair; ascertaining a current-amplitude characteristic value from the temporal profile of the electrical alternating current; and identifying an electrical fault of the conductivity sensor if the current-amplitude characteristic value is below a first current threshold value or above a second current threshold value.

Abstract: Used batteries are screened based on a measured Constant-Current Impulse Ratio. A used battery is charged using a Constant Current (CC) until a voltage target is reached, and the current integrated to obtain the CC charge applied, QCC. Then the battery continues to be charged using a Constant Voltage (CV) of the voltage target until the charging current falls to a minimum current target. The current is integrated over the CV period to obtain the CV charge applied, QCV. The measured CCIR is the ratio of QCC to (QCC+QCV). The measured CCIR is input to a calibration curve function to obtain a modeled State of Health (SOH) value. The used battery is sorted for reuse or disposal based on the modeled SOH value. The calibration curve function is obtained by aging new batteries to obtain CCIR and SOH data that are modeled using a neural network.

Abstract: Examples described herein generally relate to wafer testing and structures implemented on a wafer for wafer testing. In an example method for testing a wafer, power is applied to a first pad in a test site (TS) region on the wafer. The TS region is electrically connected to a device under test (DUT) region on the wafer. The DUT region includes a DUT. The TS region and DUT region are in a first and second scribe line, respectively, on the wafer. A third scribe line is disposed on the wafer between the TS region and the DUT region. A signal is detected from a second pad in the TS region on the wafer. The signal is at least in part a response of the DUT to the power applied to the first pad.

Abstract: The invention concerns a method for measuring a power (Pe, Pm) of an electric motor, that involves measuring a real current (I) of the motor, by means of a measurement sensor (11), the invention being characterised in that it involves inputting, on an interface (20), at least one piece of nominal power data (Pn), one piece of nominal speed data (Wn), one piece of nominal current data (In), one piece of nominal voltage data (Un), one piece of power factor data (cos ?) and the real current (I) of the engine, calculating, in the computer, a no-load current of the motor according to a first stored function depending on at least the data (Pn, In, Un, cos ?), calculating, in the computer, the active power (Pe) and/or the mechanical power (Pm) and/or the active energy and/or the mechanical energy according to at least one second stored function depending on at least the data (Pn, In), the real current (I) and the no-load current that has been calculated, and providing the power that has been calculated on an output

Abstract: A tool, system, and method are disclosed for locating a hidden stud and identifying angles on a finished wall. The tool includes an elongated housing, at least one magnet, and at least one level. The housing has a generally planar contact surface disposed opposite a viewing surface. The at least one magnet is secured to the housing such that a magnetic field from the at least one magnet extends from the contact surface. The level is secured to the housing such that the level is viewable from the viewing surface. The at least one magnet, the level, and the housing are sized relative to each other such that a magnetic attraction between the at least one magnet and a metallic element in the wall is sufficient to maintain the tool on the wall without external support.

Abstract: A method and a measurement system for determining the noise power of a device under test especially the exact noise power is provided. The measurement method comprises determining a sideband gain of a measurement system using a calibration unit, connecting a device under test to the measurement system, measuring a noise power of the device under test with a receiver and correcting the measured noise power with the determined system gain including a sideband gain.

Abstract: According to an embodiment, a capacitor diagnosis device includes a sensor, a frequency spectrum analysis unit, a frequency component extraction unit, and a diagnosis processing unit. The sensor detects a physical quantity that changes with an current flowing through a capacitor in a power conversion unit (PCU) for converting DC power smoothed by the capacitor connected in parallel to DC link(s) into AC power according to a power running operation. The frequency spectrum analysis unit generates a frequency spectrum based on a detection result of the sensor detected during the power running operation of the PCU. The frequency component extraction unit extracts a component of a specific frequency band related to a frequency depending on a configuration of the PCU based on the frequency spectrum. The diagnosis processing unit diagnoses a state of the capacitor based on at least a magnitude of the extracted component of the specific frequency band.

Abstract: A metal detector includes a balanced coil system with a transmitter coil connected to a transmitter unit, which provides a transmitter signal (s1) with at least one fixed/selectable transmitter frequency or a waveform having at least two different transmitter frequencies. First and a second receiver coils provide output signals to a receiver unit, which can include first and second phase detectors in which the output signals are compared with reference signals that correspond to the at least one transmitter frequency and are offset to each other in phase in order to produce in-phase components and quadrature components, which are forwarded to a signal processing unit to suppress signal components originating from goods or noise, and to process signal components originating from metal contaminants.

Abstract: A testkey includes two switching circuits and two compensation circuits. The first switching circuit transmits a test signal to a first DUT when the first DUT is being tested and functions as high impedance when the first DUT is not being tested. The second switching circuit transmits the test signal to a second DUT when the second DUT is being tested and functions as high impedance when the second DUT is not being tested. When the first DUT is not being tested and the second DUT is being tested, the first compensation circuit provides first compensation current for reducing the leakage current of the first switching circuit. When the first DUT is being tested and the second DUT is not being tested, the second compensation circuit provides second compensation current for reducing the leakage current of the second switching circuit.

Abstract: A pyro igniter circuit and a method for testing the same is provided. The pyro igniter circuit includes a supervisory circuit configured to: transmit a test signal having a pulse duration time below an igniter activation pulse time of a pyro igniter disconnect element and/or an ignition control signal, in response to the transmitted test signal, has an amplitude below an igniter activation amplitude of the pyro igniter disconnect element; and receive a diagnostic response signal in response to the transmitted test signal.

Abstract: A test system of embodiments electrically connects one or more first semiconductor chips formed on a first wafer and one or more second semiconductor chips formed on a second wafer to perform tests on the one or more first and second semiconductor chips. The test system includes a test device that supplies a test signal to each of the one or more first semiconductor chips, a first probe device including a first probe to be connected to a first internal pad of each of the one or more first semiconductor chips and a first communication circuit configured to transmit and receive a signal, and a second probe device including a second probe to be connected to a second internal pad of each of the one or more second semiconductor chips and a second communication circuit configured to transmit and receive the signal to and from the first communication circuit.

Abstract: A method for automatically testing a relay is provided. The method includes applying power to a testing device for automatically testing the relay, determining a position of a selector switch based on a user selection for testing, selectively energizing the relay based on the position of the selector switch, detecting, by a hardware processor, an energize status signal from the selector switch, testing, by the hardware processor and based at least on the energize status signal, a control coil or a contact of the relay to generate a test result, and displaying, using display, the energize status signal and the test result.

Abstract: A current sensing method measures a fractional current through a coil having a plurality of coil windings by using a current sensing resistor to measure a current through a subset of the plurality of coil windings and using a voltage sensor to measure a voltage drop across the current sensing resistor. The measured current and voltage values are provided to a processor to determine the fractional current and phase of the coil. For example, the fractional current and phase of the coil may be determined by calculating a total current of the coil as I=n(V/Rx), where n is the number of coil windings of the coil, V is the measured voltage, and Rx is the impedance of the current sensing resistor. The coil may be a secondary winding used in a wireless power transfer system.