Patents Examined by Temilade S Rhodes-Vivour
  • Patent number: 9097559
    Abstract: The invention relates to an absolute position magnetic sensor for measuring the angular position, on a theta course, of a shaft passing through said sensor and comprising at least two systems for detecting the position of the shaft. Said invention is characterised in that: at least one of the detection systems generates a signal according to a “periodical” function of the theta/n period giving the periodical angular position of said shaft; at least one of the detection systems generates an absolute signal on a theta course of the shaft; and theta and n fit the equation: *theta/n=360*n>1.
    Type: Grant
    Filed: July 23, 2008
    Date of Patent: August 4, 2015
    Assignee: MOVING MAGNET TECHNOLOGIES
    Inventors: Yannick Ronnat, Gerald Masson
  • Patent number: 9091703
    Abstract: The disclosure relates to improvements in the measurement of shaft speed. The shaft has an end face and at least one detection mark provided on or in the end face of the shaft to enable the speed, angular displacement, position or movement of the shaft to be detected. The shaft is for use in a shaft assembly comprising a sensor positioned at a distance from the shaft end face. The sensor is configured to measure the speed, angular displacement, position or movement of the shaft by sensing movement of the detection marks.
    Type: Grant
    Filed: December 5, 2011
    Date of Patent: July 28, 2015
    Assignee: Turner Powertrain Systems Limited
    Inventor: Jonathan James Mulcaster
  • Patent number: 9091566
    Abstract: A differential amplifier generates an offset correction signal based on a rotation detection signal from a rotation detector apparatus and an offset signal. A comparator compares the offset correction signal with a threshold voltage, and outputs a binarized signal representing the comparison result. An average value signal generator circuit generates an average value signal representing the average value of the offset correction signal. The offset signal generator circuit generates the offset signal so that the signal voltage of the average value signal has a voltage value between a threshold voltage and a threshold voltage.
    Type: Grant
    Filed: November 29, 2010
    Date of Patent: July 28, 2015
    Assignee: Mitsubishi Electric Corporation
    Inventors: Manabu Tsukamoto, Kazuyasu Nishikawa, Takashi Tokunaga, Hideki Shimauchi, Yoshinori Tatenuma, Yuji Kawano, Hiroshi Kobayashi
  • Patent number: 9091709
    Abstract: A circuit arrangement detects a maximum in a profile of a measurement signal. The circuit arrangement has an operational amplifier with a non-inverting input connected to a reference potential and an output connected to an inverting input via a first resistor. The first resistor has an input connection, to which the measurement signal is applied and which is connected to the inverting input of the operational amplifier via a series circuit containing a capacitor and a second resistor. The connection point between the capacitor and the second resistor is connected to the negative supply potential of the operational amplifier via a third resistor and a first, reverse-biased diode. The connection point between the third resistor and the first diode is connected to the output of the operational amplifier via a second, forward-biased diode. The reference potential is a positive potential.
    Type: Grant
    Filed: April 29, 2011
    Date of Patent: July 28, 2015
    Assignee: Continental Automotive GmbH
    Inventor: Stephan Bolz
  • Patent number: 9086436
    Abstract: A high voltage detection device comprises a probe comprising an electrode for contacting a high voltage electrical line. The electrode is connected in series with a resistor. A meter comprises a housing enclosing an electrical circuit for measuring line voltage. The electrical circuit comprises an input circuit for connection to the probe. The input circuit is adapted to suppress high frequency noise pick up by the probe and develop a bipolar voltage representing measured line voltage. A voltage detection circuit comprises a differential amplifier circuit for converting the bipolar voltage to a proportionate voltage signal. A signal processing circuit receives the proportionate voltage signal and drives the display for displaying the measured line voltage.
    Type: Grant
    Filed: December 19, 2011
    Date of Patent: July 21, 2015
    Assignee: Honeywell International Inc.
    Inventor: Anil Nagpal
  • Patent number: 9075093
    Abstract: The invention relates to gas-discharge electrical instrumentation technology. The device for measuring electromagnetic field intensity comprises a measuring instrument for recording the glow of a gas discharge and a gas-discharge chamber that is formed between electrodes 1 and 2 separated by a dielectric 3. The electrode 1 is cylindrical, while the electrode 2 is in the form of a disk. The electrodes 1 and 2 are coupled to an electrical voltage source, wherein a capacitive element in the form of a pair comprising an antenna 5 and a connection to ground 6 is incorporated into the line coupling the cylindrical electrode 1 to the electrical voltage source. A capacitor 7 with variable capacitance is incorporated into the line coupling the cylindrical electrode 1 to the antenna 5. The technical result consists in providing the possibility of detecting a useful signal in a wide frequency range.
    Type: Grant
    Filed: December 17, 2010
    Date of Patent: July 7, 2015
    Inventor: Konstantin G. Korotkov
  • Patent number: 9076760
    Abstract: A junction field-effect transistor (JFET) includes a substrate having a first-type semiconductor surface including a topside surface, and a top gate of a second-type formed in the semiconductor surface. A first-type drain and a first-type source are formed on opposing sides of the top gate. A first deep trench isolation region has an inner first trench wall and an outer first trench wall surrounding the top gate, the drain and the source, and extends vertically to a deep trench depth from the topside surface. A second-type sinker formed in semiconductor surface extends laterally outside the outer first trench wall. The sinker extends vertically from the topside surface to a second-type deep portion which is both below the deep trench depth and laterally inside the inner first trench wall to provide a bottom gate.
    Type: Grant
    Filed: August 29, 2012
    Date of Patent: July 7, 2015
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Binghua Hu, Pinghai Hao, Sameer Pendharkar
  • Patent number: 9075022
    Abstract: A non-destructive test method for evaluating a synthetic rope made of strength member elements includes: treating at least one strength member element to be detectable by a magnetic NDT device, incorporating the at least one treated strength member element into the rope, scanning the synthetic rope with the magnetic NDT device, and obtaining magnetic flux leakage or eddy current output data from the magnetic NDT device, wherein the output data relates to a condition of the synthetic rope. A synthetic rope or cable is thereby made to be capable of being inspected by a magnetic flux leakage or eddy current non-destructive test (NDT) method.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: July 7, 2015
    Assignee: WHITEHILL MANUFACTURING CORPORATION
    Inventors: Elizabeth W. Huntley, Mark B. Huntley, A. Simeon Whitehill
  • Patent number: 9069014
    Abstract: A wire probe assembly and forming process is described. In one example, a method includes inserting a plurality of wires through a probe former and a tip retainer to contact a probe head substrate, attaching the wires to a surface of the substrate, pulling the probe former laterally with respect to the substrate surface and the tip retainer to bend the wires into test probes with a resiliency to transverse movement, and removing the tip retainer to form a test probe head.
    Type: Grant
    Filed: June 30, 2012
    Date of Patent: June 30, 2015
    Assignee: Intel Corporation
    Inventors: Todd P. Albertson, Michael T. Crocker, David Shia, Lothar R. Kress
  • Patent number: 9057757
    Abstract: Forward voltage drift in a probe system for the characterization of a light-emitting wafer is virtually eliminated by directing compressed air to the probe so as to ensure that the exact same temperature conditions exist during repeated measurements of the wafer. In one embodiment of the invention, an air flow at room temperature is used, either continuously or intermittently. In another embodiment, the temperature of the probe is controlled by flowing a liquid or a gas through micro-channels built into the probe. In yet another embodiment, the probe is connected to a solid-state Peltier cell that is computer-controlled to maintain the probe's temperature at a predetermined set-point. A temperature-controlled chamber or a thermal reservoir enclosing the probe could be used as well. The results obtained showed remarkable repeatability.
    Type: Grant
    Filed: December 21, 2011
    Date of Patent: June 16, 2015
    Assignee: BRUKER NANO, INC.
    Inventor: Dong Chen
  • Patent number: 9052350
    Abstract: A system configured to monitor an operating electrical device includes a testing channel coupled to the device. The device is coupled to an electric power source through at least one electric power transmission channel. The power source is configured to transmit electric power at a first frequency. The testing channel is coupled to the power transmission channel. The system also includes a signal generator coupled to the testing channel. The signal generator is configured to inject testing signals into the testing channel at a second frequency that is greater than the first frequency. The system further includes at least one apparatus magnetically coupled to the power transmission channel. The magnetically coupled apparatus is configured to present a first impedance to the electric power at the first frequency and present a second impedance to the test signals at the second frequency. The second impedance is greater than the first impedance.
    Type: Grant
    Filed: July 31, 2012
    Date of Patent: June 9, 2015
    Assignee: General Electric Company
    Inventors: Prabhakar Neti, Pinjia Zhang, Manoj Ramprasad Shah
  • Patent number: 9035657
    Abstract: The present disclosure relates to systems and methods for conducting an electromagnetic borehole-to-surface survey of a formation surrounding a borehole. Such methods include deploying a dipole transmitter into the borehole to a depth of investigation, deploying an array of electromagnetic receivers outside of the wellbore, and measuring a response of the formation at the array of electromagnetic receivers deployed outside of the wellbore, for example at the surface. From the response of the formation a property of the formation can be determined based on the response of the formation measured at the array of electromagnetic receivers. For the scenario of a cased well, a local reference receiver may be added at a location proximate the borehole to measure the effective magnetic moment of the transmitter inside the casing, and normalize the formation response in order for a more accurate determination of a formation characteristic, such as resistivity.
    Type: Grant
    Filed: February 15, 2010
    Date of Patent: May 19, 2015
    Assignee: Schlumberger Technology Corporation
    Inventors: Hong Zhang, Richard A. Rosthal
  • Patent number: 9030193
    Abstract: A system by which the proportion of ferromagnetic particles in a dielectric medium is measured. A magnetic field is generated by two signals in the medium: a low frequency feed and a relatively high frequency excitation. The feed magnetizes the ferromagnetic particles in the medium to the nonlinear range of the magnetization curve. The excitation is generated so that its spectrum is relatively wide and it is dense with frequency components. The level of the excitation is so high that the magnetic flux density in the medium corresponding to the excitation fluctuates nonlinearly, when the feed is at its peak value or near this. The magnetic field of the medium is measured by a secondary winding, and from the response signal produced by the sensor is detected the part resulting from the magnetic non-linearity, which part is the output signal. In the detection the response is multiplied by the signal, which arises magnetic field and includes the same random fluctuation as the response.
    Type: Grant
    Filed: January 19, 2011
    Date of Patent: May 12, 2015
    Assignee: Hemeltron
    Inventor: Arvi Kruusing
  • Patent number: 9007078
    Abstract: A pixel array module with a self-test function including a test circuit unit, a plurality of test lines, and a pixel array is provided. The test circuit unit provides the self-test function. The test lines are connected between the test circuit unit and the pixel array. The pixel array is connected to the test circuit unit through the test lines and includes a plurality of pixels. Each pixel includes a transistor. Each transistor has a first terminal and a second terminal. Regarding each of the pixels, a driving signal of the transistor is transmitted from the first terminal to the second terminal thereof under a normal mode, and a test signal of the transistor is transmitted from the second terminal to the first terminal thereof under a test mode. Furthermore, a self-test method of the foregoing pixel array module is also provided.
    Type: Grant
    Filed: July 1, 2012
    Date of Patent: April 14, 2015
    Assignee: Industrial Technology Research Institute
    Inventors: Chih-Cheng Hsieh, Shang-Fu Yeh, Ka-Yi Yeh
  • Patent number: 8994381
    Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal combined with two (or more) higher frequency signals to test a dynamic change in frequency response, gain, and or phase of the lower frequency signal from an audio device. This dynamic test can reveal frequency modulation effects via the two higher frequency signals emulate a modulated signal that provides a phase or frequency modulation frequency related to the difference of the two higher frequency signals. Another embodiment may include the use of a higher frequency signal and pulsed waveform to dynamically induce a time varying phase or frequency distortion of the pulsed waveform or components of the pulsed waveform from the device that has differential phase distortion.
    Type: Grant
    Filed: July 24, 2012
    Date of Patent: March 31, 2015
    Inventor: Ronald Quan
  • Patent number: 8975899
    Abstract: An inverter device for feeding electrical energy from a DC-power source into a power grid includes a pair of bus lines to be connected to the DC-power source; a plurality of capacitors connected in series between the bus lines; a surveying topology surveying an integrity of the plurality of capacitors, and to provide a signal indicating a loss of integrity of one capacitor of the plurality of capacitors; a voltmeter measuring a voltage drop over the plurality of capacitors; a DC/AC-inverter; and a controller. in case of the signal indicating a loss of integrity of one capacitor of the plurality of capacitors, the controller compares the voltage drop over the plurality of capacitors to a lost integrity threshold voltage value, and reduces a current load to the plurality of capacitors by reducing the power uptake of the DC/AC-inverter, when the voltage drop exceeds the lost integrity threshold voltage value.
    Type: Grant
    Filed: July 13, 2012
    Date of Patent: March 10, 2015
    Assignee: SMA Solar Technology AG
    Inventors: Henrik Wolf, Thomas Wegener, Daniel Clemens, Harald Drangmeister
  • Patent number: 8975903
    Abstract: A vehicle proximity switch and method are provided having learned sensitivity control. The switch includes a proximity sensor, such as a capacitive sensor, installed in a vehicle and providing a sense activation field. Also included is sense control circuitry processing the activation field to sense user activation of the switch by comparing the activation field to a threshold. The switch further includes sensitivity control circuitry learning a user sensitivity based on user activation of a sensor and controlling the sensitivity of one or more proximity switches.
    Type: Grant
    Filed: June 9, 2011
    Date of Patent: March 10, 2015
    Assignee: Ford Global Technologies, LLC
    Inventors: Stuart C. Salter, Pietro Buttolo, Cornel Lewis Gardner, Thomas Lee Goodson
  • Patent number: 8963545
    Abstract: The present invention relates to a magnetic sensor that provides the sensitivity adjustment on a wafer and that has a superior mass productiveness and a small characteristic variation. The magnetic sensor includes a magnetic sensitive portion provided on a substrate that is made of a compound semiconductor and that has a cross-shaped pattern. This magnetic sensitive portion includes input terminals and output terminals. At least one of input terminals of the input terminal is series-connected to a trimming portion having a compound semiconductor via a connection electrode. By performing laser trimming on the trimming portion series-connected via the connection electrode to the magnetic sensitive portion while performing a wafer probing (electric test), the adjustment of the constant voltage sensitivity is provided.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: February 24, 2015
    Assignee: Asahi Kasei Microdevices Corporation
    Inventor: Satomi Watanabe
  • Patent number: 8963554
    Abstract: A pulsed discharge helium ionization detector for gas chromatography with multiple combined bias/collecting electrodes.
    Type: Grant
    Filed: August 23, 2012
    Date of Patent: February 24, 2015
    Assignee: Valco Instruments Company, L.P.
    Inventors: Stanley D. Stearns, Huamin Cai
  • Patent number: 8941402
    Abstract: An electromagnetic field measuring apparatus capable of measuring an electromagnetic field for a minuscule area in which electronic devices are densely packed with a high sensitivity is provided. In an electromagnetic field measuring apparatus according to the present invention, the amplitude level of signal light (pf) is adjusted by the analyzer (34) by adjusting its angle with respect to the plane of polarization of the signal light (pf) based on an amplitude level control signal (eb) supplied from the calculation control unit (40). An amplitude level control signal (eb) is supplied from the calculation control unit (40) to the analyzer (34) based on the spectrum (ea) of an electric signal (ed) measured by an RF spectrum analyzer (39). The amplitude level ration between the carrier and the sideband contained in the signal light (ph) incident on the optical receiver (38) is controlled to a fixed value.
    Type: Grant
    Filed: May 18, 2010
    Date of Patent: January 27, 2015
    Assignee: NEC Corporation
    Inventors: Mizuki Iwanami, Hiroshi Fukuda, Risato Ohhira